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PERFORMANCE AND
CHARACTERISTIC ANALYSIS OF
DOUBLE GATE MOSFET OVER SINGLE
GATE MOSFET
Abstract- In modern world, low power portable devices B. Double Gate MOSFET
requires more devices to be integrated on a single chip In double gate MOSFET the gate
since single gate MOSFET occupies large space due to is surrounded by the electrode on both the sides. The
its design construction, therefore in order to reduce the operation of the double Gate MOSFET is when a
size of the device, to obtain high speed and reduction in voltage is applied to the gate it will control the
cost we go for double gate MOSFET and analysis of
electric field and determine the flow of the current
characteristic parameters such as (drain current,
through the channel. This has a common operation
capacitance, gate/control voltage, on-resistance, power
that both the gates can operate simultaneously.
or voltage gain, thickness of oxide layer and resistance
Another mode of operation is switching only one gate
of poly/gate are discussed.
at a time and applying bias to the next gate (or) the
Keywords-single gate MOSFET; double gate MOSFET; second gate it is called as back gate.
MOSFET is achieved by increase in the cross co meaning [5]. The drain acts as the output and the
relation of the drain and the gate currents. It is proved source acts as the input, the blue color represents the
by the presence of residual undesired charged metal and green represents the n-diffusion and red for
impurity in the DG MOSFETs [2]. The noise due to poly silicon.
the thermal radiation is generated by the carrier
The performance analyzing of the double gate and
velocity fluctuation it is established by MONTE
single gate MOSFET is achieved by applying a gate
CARLO device simulation. The carrier velocity
voltage of about 1.2 V with the start time, rise time,
fluctuation is higher in the double gate MOSFETs.
pulse time and fall time respectively. This design
Noise figure is the amount of degradation of the noise
includes the poly drain and the source. The source
to signal ratio which is caused by various
and the drain have equal capacitances and
components in the radio frequency signal chain. The
resistances.
noise figure ratio is lower for double gate MOSFETs.
Double gate and single gate MOSFET sensitivity due
to the distribution of residual discrete doping in the
channel as follows, the double gate which is less
sensitive to doping perturbation than the single gate
MOSFET. The reduction of IOIl reaches about 10% in
single gate and 6.5% in double gate MOSFETs.
Using doped channel in the device will increase the
transport properties of the device; this property
makes the device less sensItive to doping
perturbation. The transport in the channel is achieved
with the help of 3D MONTE CARLO simulation; the
single gate MOSFETs shows poor sub-threshold
voltage due to its form factor which is very small for
controlling the short channel effect, but the double
gate MOSFETs shows better sub-threshold voltage
[3]. Figure I. Layout of SO MOSFET
, jI
(1) I
I ,
I, .
I
!
The metal gate work function impacts on the !I
double gate MOSFET is considered and the threshold I
""
voltage and the leakage current can be determined !I
when the work function of the metal gate is raised the I
!
Ioff decreases and the threshold voltage get increased i ,
I, .
rapidly. For maintaining the Ioff as low the metal
!
work function must be increased as well as the on !I
resistance should be low as possible. I
III. RESULTS
..
!I +
I II
-----'"
!
I I
•
13
" " II � "
i
,
15 1I
1 15 " -' ,�
I
I
i
,
Figure 4. Output voltage with gate and control voltage for double
I gate MOSFET
-
:m
13
i.
obtained for the single gate MOSFET is 0.90V.
..
Hence the conventional charge can be found out by
j
the equation as follows
I
" (2)
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2014 International Conference on Electronics and Communication Systems (lCECS -2014), Feb.13 -14, 2014, Coimbatore, INDIA
10.11-
11i114l��I� [I] Viranjay M.Srivastava , K.S.Yadav b, G.Singh,"Design And
Performance analysis of double-gate MOSFET over single
IO� l- I I I
I,
'
J ! gate MOSFET for RF switch", Microelectronics Journal
10'\ I J volume 42, pp. 527-534, January 2011.
[2] S. Ahmed, C. Ringhofer, D. Vasileska, "An effective
·'t
.'
_''¥1Iff'i1f
I� ON-current fluctuations in 45nm device technology due to
j ""'� charged random traps",1.Compu!. Electron. volume 9(3),
It. • ppI28-134, October 2010.
... -
I" [4] K. Bernstein, "High-performance CMOS variability in the 65
.�.
,�
1 ,I nm regime and beyond", IBM 1. Res. Dev. volume 50 (4) pp
433- 449, September 2006.
,� II
f
[5] Yun Ye, Yu Cao, " Random variability modeling and its
'"
...
I \ I'
w ,
impact on scaled CMOS circuits", 1. Compu!. Electron.
volume 9. pp 108-113. October 27, 2010
".. " I I " " " , . " _.
[6] P.Dollfus, Retailleau, "Thermal noise in nanometric DG -
MOSFET", 1. Compu!. Electron. volume 5. pp 479-482.
Figure 6. Current of DG MOSFET with output voltage January 2007.
[7] P. Dollfus, " Sensitivity of single and double-gate MOS
architectures to residual discrete dopant distribution in the the
In the above figure 5& 6, since in DG MOSFET,
channel", J. Compu!. Electron.volume 5, pp 119.
the drain current is 0.015mA and becomes stable at
[8] S. Sharma, P. Kumar, "Non overlapped single and double
0.01 f..l A. Since in DG MOSFET, the drain current is
gate SOl/GOI MOSFET for enhanced short channel
0.018mA and becomes stable at 0.01 f..lA.
immunity", 1. Semicond. Techno!. Sci. volume 9 (3), pp 136-
TABLE T. COMPARISON OF THE CIRCUIT PARAMETERS 147. September 2009.
OF THE SG AND DG MOSFETS. [9] S. Sharma, P. Kumar, "Optimizing effective channel length
length to minimize short channel effects in sub 50 nm
single/double-gate SOl MOSFETs", J. Semicond. Techno!.
Parameters SG MOSFET DG MOSFET
Sci.volume 8 (2) pp 170-177.june 2008.
[10] T.c. Lim, "G. A. Armstrong, Scaling issues for analogue
Gate/Control voltage(V) 1.2 1.2 circuits using double gate SOl transistors", Solid State
Electron. volume 51 (2) pp 320-327.2007.
[11] D. Rechem, S. Latreche, C. Gontrand, "Channel length
Output voltage 0.90 0.53
scaling and the impact of metal-gate work function on the
Drain to Source current O.oI8J.1A 0.015J.1A performance of double-gate metal oxide semiconductor field
Capacitance Less More effect transistors", 1. Phys.volume 72 (3). pp 587 599. March
2009.
On-Resistance Ron (More) 0.5Ron (Less)
Resistance of poly-Gate 32 68
IV CONCLUSION