MSE 2020 - Characterization of Materials

Fall Semester - 2010

Lecture: MWF – 11:05-11:55, Rm 299 (Love)

Laboratory: Monday-Friday -6:00-7:30

Learning Objectives: To teach the principals of external and internal characterization of

materials by presenting the theory and operating principals of x-ray diffraction and scattering,
scanning and electron microscopy SEM), x-ray chemical microanalysis, and stereological
characterization. The student should complete the course with sufficient experience to utilize x-
ray diffraction, optical microscope and SEM on a practical basis.

Catalog Description:
MSE 2020 - Characterization of Materials - Credit: 4 (3-3-4)
Prerequisites: PHYS 2XXX (Optics and Modern Physics) and MSE 2001

Description: The object is to provide theory and an operating knowledge of crystallography,

powder x-ray diffraction, stereology and phase quantification, optical microscopy, scanning
electron microscopy and energy dispersive micro-chemical analysis. The student is provided the
basis for selecting the optimum means of observing and analyzing the morphology and internal
structure of materials.

Textbooks: 1- Elements of X-ray Diffraction, Cullity and Stock

2- Microstructural Characterization of Materials, David Brandon and
Wayne D. Kaplan, Wiley
Reference Books: 1- ASM Handbook, Volume 9, pages 257-268, 325-367, 428-447, 0-
87170-706-3
2- Class notes,..

Instructor: Hamid Garmestani, 361 (Love Building)

Topics and Scheduling

General Overview
1. Relevant concepts in characterization and class outline

Properties of Photons and Electrons

1. Wave and particle properties of light
2. Wave properties of electrons: deBroglie relationship

Atomic Structure
1. Quantum numbers and their meaning
2. Electron transitions and Fluorescence
3. Introduction to Crystal Structure: lattice and basis
4. Interaction Between Radiation and Matter: Absorption, scattering, secondary photons and
electrons
Optical Microscopy
1. Geometry of Optics, Resolution
2. Construction of a Microscope

Quantitative Stereology
1. Quantitative metallography
2. Stereology, Line Intercept Method
3. Specimen preparation techniques for metallography

Scanning Electron Microscopy -

1. Electron Optics - Cathodes, Electron Lenses, Aberrations, Resolution.
2. Interaction of Electrons and Matter - Elastic and Inelastic Scattering, Backscattered
Electrons, Secondary Electrons,
3. Scanning Electron Microscopy - Image Formation, Magnification, Depth of Field,
Distortion, Detectors, Contrast, and Resolution.
4. Electron optics and SEM Examination
5. Sample preparation techniques, thin film deposition, and resolution
6. X-ray microanalysis: Energy dispersive X-ray spectroscopy (EDS) and
Quantitative microanalysis using EDS in SEM

Microstructure and Crystallography

1. Microstructure
2. Crystallography Lecture

X-ray Diffraction
1. X-ray production, Bragg’s Law, Laue’s Equation
2. Diffraction Methods
3. Diffraction Intensities
4. Particle size and strain

Laboratory Experiments:
Stereology

1. Operation of optical metallography, Specimen mounting, polishing, and etching for

metallography
2. Qualitative microstructural observations and micro-hardness measurements on
specimens of Al, Mg, and Cu alloys, and steels
3. Quantitative metallography

SEM
 4. Operation of Field Emission Scanning Electron Microscope.
5. Calibration of SEM - Magnification Depth of Field.
6. EDS Analysis, Hardware, Software, Quantitative Analysis.

X-ray Diffraction
7. Operation of powder diffractometer and qualitative identification of single unknown
using JCPDS files.
8. Quantitative analysis of mixtures of multiple phases

Grading -
Three Midterm Exams - 30%,
Final Exam – 15%
In-class presentations or projects– 5%,
All Labs Combined - 40 %,
In-class Quizzes -10%

Class Policy:
•No make-ups for any of the exams and quizzes (unless for medical excuse)
•Office hours: any time (open door policy…). You can also make an appointment.
•Attendance: Attendance is required and will be checked periodically through pop-
quizzes. Three absences are accepted (with valid excuse). Students with the least
number of absences will be given extra attention during the decision for the final
grade.
•Please
–arrive in class and the lab on time.
–do not leave the class before the end of the class.
–do not ask for a make up for quizzes if you are late or missed it for any reason.
–do not ask if you can violate the above for any reasons