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Volume 12 / Issue 1

March, 2002

Common Deposition Techniques


Electron-beam
to 20 E-5 Torr and deposition rates 2 to available, either in the form of the
The most common deposition tech- 5 Å/s at substrate temperatures of 200 momentum of the arriving adatoms or
nique for metal-oxide film materials is – 250°C. These conditions promote surface and species activation, the
electron-beam evaporation because complete oxidation and the correct adatoms have the mobility to find sites
their temperatures are generally in stiochiometry of the oxide compound, to nucleate on and to grow with a more
excess of ~1200°C. Some oxides, which is important for producing the compact and finer grain structure.
notably SiO (1100°C) and ITO desired physical properties of the film High substrate temperatures assist
(600°C), can be evaporated using re- layer such as refractive index, trans- with the surface mobility, but not nec-
sistance heating. With the exception parency, and mechanical durability. essarily with densification. Often
of the common materials: Al2O3 and Demands in critical applications such surface energy barriers are present if
SiO2, metal oxides require a partial as imaging, displays, high ophthalmic atomic contamination is present on the
pressure of oxygen in the range of 0.5 AR coatings, laser applications, etc. surface or if the surface is otherwise
require that thin film layers also pos- chemically inert.
sess the following properties: stable
One of the main goals of optical and mechanical/chemical prop- Ion-Assisted
Coating Materials News erties and low light scatter.
(CMN) is to provide informa- Deposition, IAD
Unfortunately, e-beam deposited films
tion on advances in thin-film grow with a columnar microstructure, In this technique, kinetic energy is sup-
material development and pro- meaning that there are sub-micro- plied by a beam of ionized Ar atoms
cesses. This information often scopic voids in the structures of the that are directed onto the growing film.
takes the form of process re- layers. This under-dense structure Momentum transfer of energy at val-
finements reported either from can and will absorb moisture and other ues of 10 to 100’s eV discourages
direct experience or from gaseous-state materials, and in doing columnar growth, thus densifying the
work in progress reports that so, change in all of the above desired layer. IAD films are harder, smoother,
appear in current literature. properties. Such films can have high and exhibit more stable optical prop-
This issue first briefly reviews scatter properties and sometimes high erties than E-beam films. A
the current three most com- stress. Changes in optical properties percentage of oxygen is mixed with
monly applied deposition with environmental exposure are evi- argon to produce films with complete
technologies for oxide thin denced by shifts in performance stiochiometry and low optical absorp-
films, then discusses material wavelength of filters and in reflection tion in this process. The quality of the
choices for optical applica- value for AR coatings. Mechanical IAD film is influenced by the energy
tions. Finally, we offer more degradation may take the form of loss of the incident ions and their density.
specifically, deposition pa- of adhesion, strength, or hardness be- Ion sources with grids are designed
rameters related to titanium cause the grain sizes are large and to direct a narrow energy spectrum
dioxide layers that are the loosely bound. For these reasons, beam toward the substrates for maxi-
workhorse of optical coatings other, more energetic forms of film mum density; gridless ion sources
for the visible region. deposition and growth were devel-
oped. When more energy is made continued on page 3

3
High Refractive Index Materials for Optical Applications
Optical coatings generally are com- they either have a bandgap absorp- with OH or are slightly oxygen defi-
posed of low-index layers coupled with tion starting near 400 nm or another cient and exhibit slight absorption at
high-index layers. Examples are all type of absorption in the NIR (outside wavelengths >900 nm where most
types of AR coatings, bandpass and the visible range). This is the case for oxides are free of absorption. This
edge filters, and high reflection coat- TiO2, which begins to absorb near 450 problem with TiO2 prevents its use for
ings. For many filters, using a high nm wavelength. Listed in Table 1 are WDM filters in the 1300 – 1600 nm
index ratio, nH : nL simplifies the de- high index oxide compounds depos- region. Such filters have as many as
sign and deposition complexity ited either with E-beam, E-beam + 60 high-index layers. Ta2O5 is used
because with a higher ratio, the band IAD, or sputtering, and their approxi- instead.
of reflected wavelengths is wider and mate ranges of low absorption.
the number of layers smaller for a hot An example of process-dependent in-
or cold mirror, for example. In the The availability of high-index materi- dex is shown in Figure 1, where TiO2
Visible and Near-IR region, 400 nm als transparent below ~300 nm deposited by e-beam alone and e-
to 1100 nm, the material pair that has wavelength is limited to those listed, beam with IAD shows an index
the maximum index ratio is TiO2 and creating a challenge for UV coating difference ~0.16 [1]. The e-beam
MgF2, with nH / nL = 1.73 at 550 nm. manufacture. alone films were deposited at substrate
We are considering hard coatings and temperatures near 300° C; the higher
therefore exclude soft coatings that The achieved refractive index of a index IAD films at 50 to 175° C. Even
might have a higher ratio, specifically, layer is a strong function of deposition higher indices have been reported with
ZnS (n = 2.4) and the soft, water sen- process and of the particular deposi- ion-beam sputter deposition and ion or
sitive cryolite compositions (n = 1.35). tion parameters within a process. It plasma plating [2], both being very high
The all-oxide combination, TiO2 / SiO2 is possible to create a film index energy processes. In the latter cases,
has the next highest ratio, 1.62. The greater than that of the bulk material and to some degree with sputter depo-
optical properties and their values: in- despite the fact that films are never sition, more of the rutile form of
dex n and absorption k, determine a fully dense. This artifact results when titanium dioxide is present compared
material’s suitability for optical appli- the k value, the extinction coefficient, with the lower index anatase form.
cations. For MgF2 and SiO2, these is not zero, indicating incomplete oxi-
values are useful over wavelengths dation. Absorption in this case, shows Since TiO2 is so important a material
from <200 nm in the UV to beyond up at the short wavelengths and some- for optical coatings, process develop-
2000 nm in the NIR. The same can- times the film can be used successfully ment for the optimum deposition
not be said for all candidate high-index at near-IR wavelengths. Some ma- parameters continues. The starting
metal oxide compound partners since terials, TiO2 for example, form bonds material might be Ti metal or one of
the many sub-oxidation state forms
Table 1 from TiO to Ti3O5. If one were sput-
tering TiO2, the starting material would
Transparency
naturally be Ti metal sputtered in a
Metal Oxide Index at 550 nm Range
reactive plasma containing oxygen.
TiO2 2.31 E-B; 2.35 sput; 450 – 10,000 nm What is the most technology ready
starting material for e-beam deposi-
2.47 IAD tion? This question has been the
Nb2O5 2.25 E-B; 2.32 sput. 400 – 10,000? subject of many studies. In a recent
study [1], it was concluded that the
Ta2O5 2.04 – 2.10 E-B 400 – 10,000
sub-oxides Ti2O3 and Ti3O5 are pre-
HfO2 1.93 – 1.97 E-B 250 – 10,000 ferred. They both melt under e-beam
ZrO2 2.05 E-B; 2.22 sput. 270 – 7,000 and thus yield more homogeneous film
layer indices and good mechanical
properties, even with low temperature
continued on page 3

2
Common Deposition Techniques... From Page 1
produce a distributed spectrum of low tering techniques. DC techniques in- References
energy, high current-density beam that volve the sputter removal of metal
1. Hubert Selhofer, Elmar Ritter, and
is effective for maximum oxidation. atoms which are subsequently oxidized Robert Linsbod, Applied Optics,
The IAD process may be added to in an energetic plasma of an oxygen / V41 No. 4, 756 (2002).
resistance-heated or E-beam deposi- Ar mixture that is established between 2. Jean M. Bennett, Emile Pelletier, G.
tion equipment to achieve denser, more the target and the substrate. The sub- Albrand, J. P. Borgogno, B.
stable film layers on glass, or polymer strate might be biased with respect to Lazarides, Charles K. Carniglia, R.
substrates where high substrate tem- the target to accelerate ionized spe- A. Schmell, Thomas A. Allen, Trudy
peratures cannot be used. cies and thus produce dense layer Tuttle-Hart, Karl H. Guenther, and
growth. AC techniques permit the use Andreas Saxer, Applied Optics V28,
Sputter Deposition of a compound target. Higher depo- No. 15, 3303 (1989).
sition rates are generally achieved
CMN has discussed the techniques starting with metal targets that are also
and merits of sputter deposition in less expensive than compound targets.
many past issues. There are many
variations of AC or RF and DC sput- continued on page 4

CERAC Coating Materials News


is a quarterly publication of
Refractive Indices of TiO2 CERAC, inc.
P.O.Box 1178
2.800
Milwaukee, WI 53201-1178
Phone: 414-289-9800
2.700 FAX: 414-289-9805
web: www.cerac.com
2.600
e-mail: marketing@cerac.com
2.500 E-B
Editor:
n

2.400 IAD
Russ De Long
2.300 Materials Applications Manager,
CERAC, inc.
2.200

2.100
Principal Contributor:
400 450 500 550 600 650 700 750 800 850 900 950 1000
Samuel Pellicori
Pellicori Optical Consulting
WVL (um) P.O. Box 60723
Santa Barbara, CA 93160
Figure 1. Refractive indices of e-beam deposited TiO2 alone and with IAD [1]. Phone/FAX: 805-682-1922
e-mail: pellopt@silcom.com
High Refractive Index...from page 2

depositions on polymer ophthalmic The refractive index is ~10-15% lower For a free subscription to CMN, please
E-mail your name and address to
lenses. Consistent properties from run on unheated substrates, as is the case marketing@cerac.com or send us a fax at
to run from the same source charge for ophthalmic AR coatings, which are 414-289-9805.
are not obtained with the other oxida- deposited at lower temparatures be-
Guest articles or topic suggestions are
tion states because they do not melt cause of the lower packing density. welcome. Questions and comments can
and sequential evaporations change An increase will be seen as the film be e-mailed to marketing@cerac.com or
the composition of the source mate- faxed to 414-289-9805.
absorbs water from the air. This
rial. This problem is not experienced change must be allowed for in the An electronic version of this publication
with Ti2O3 and Ti3O5. design and deposition process of the can be accessed from the Technical
Publications page of the CERAC web
production environment. site at www.cerac.com. From there,
The deposition parameters suggested link to the CMN Archives to view back
for TiO2 layers using the preferred Using these suggestions, it is possible issues. Printed copies of issues earlier
than vol. 6 can be obtained by contact-
starting compositions are: O2 pressure to develop an optimal deposition pro- ing CERAC directly.
~2 E-04 Torr; rate 5 Å/s; temperature cess for TiO2 without undertaking a
250° C; container: Molybdenum liner. ©Copyright 2002, CERAC, inc.
research project.

3
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While sputtered films are deposited in deposition onto low- temperature sub- window applications are coated each
relatively high pressure conditions, strates such as polymers. Millions of year in sputter roll (web) coating sys-
they are generally denser and more square meters of polymer substrates tems.
adherent that E-beamed films because intended for window laminations in
the higher energy of deposition over- display, architectural and automotive
comes surface contamination barriers
and micro-crystalline forces that would
normally tend to aggregate adatoms
CERAC Optical Coating Materials
in a low-energy column form. Fur- CERAC thin-film materials are manufacutred for today’s most demanding
thermore, stress, microstructure and coating applications. Visit www.cerac.com for a complete listing of catalog
items or contact a CERAC sales representative at 414-289-9800 or
grain size can be controlled by vary-
sales@cerac.com for a quotation.
ing the bias energy and O 2 /Ar
pressure parameters. For example,
the relative amounts of the various Powders Metals
crystal phases in materials such as Pieces Alloys
Tablets Oxides
ZrO2 and TiO2 can be controlled.
Rods Fluorides
These crystal phases possess differ- Cones Nitrides
ent stress levels and microcrystalline Crucibles Sulfides
sizes and orientations, leading to me- Disks Intermetallics
chanical as well as optical (index) Sputtering Targets Rare Earths
inhomogeneities. Sputtering permits

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