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YUNG-EUN SUNG∗
School of Chemical Engineering & Research Center for Energy Conversion and Storage, Seoul National
University, Seoul 151-744, S. Korea
ysung@snu.ac.kr
Abstract. Nickel oxide thin films, which are well known anodic coloration materials that are used in electrochromic
devices, were prepared by a sol–gel method, and their electrochemical and electrochromic properties were investi-
gated. The sol was prepared from Ni(OH)2 powder with an average size of 7 nm, in a mixture of ethylene glycol
and absolute ethanol. The films were coated on an ITO substrate using the powder, dispersed in the solution. When
additive materials, acetyl acetone and glycerol, were added to the sol its hardness and adhesion properties were
improved. The optimized thin film formed an amorphous, porous structure, and showed a large current density
during continuous potential and pulse potential cycling. The film also was transparent and had a high coloration
efficiency (33.5 cm2 /C) and a rapid response time (1.0–2.5 s) during the coloring/bleaching process.
3.1. Powder Characterization Figure 2. TEM image and diffraction pattern of Ni(OH)2 nanopar-
ticles.
Figure 1(a) shows the XRD patterns of Ni(OH)2 pow-
der on glass plate, XRD patterns of which are shown in
Fig. 1(b). The difference between α-phase and β-phase size of the crystallites, about 0.1 µm (1,000 Å) [23].
Ni(OH)2 is the location of the lowest 2θ diffraction Crystallite size can be determined by an analysis of
peaks. For the β-phase Ni(OH)2 , the (001) diffraction peak shapes for several diffraction orders, since the
peak appears at 2θ = 19.2◦ and the inter-sheet distance crystallite size affects the peak width [24]. Crystallite
(d) is c0 = 4.605 Å, while the lowest diffraction located size can also be estimated from the peak width using
at 2θ = 11.0◦ corresponds to α-phase Ni(OH)2 [22]. the Debye-Scherrer Eq. (3) [23]:
As shown in Fig. 1, the presence of (001) diffraction at
2θ = 19.2◦ confirms that the as-synthesized powder is 0.9λ 82.941
t= [ Å] = (3)
β-phase Ni(OH)2 . B cos θ B B × cos(θ/2)
XRD also provides information concerning crystal-
lite size. The peak broadening is caused by the finite In this formula, B denotes the full width at half maxi-
mum. To obtain this value, the diffraction peaks were
fitted to a Gaussian function. The average particle size
of the powder was 7 nm when the above formula is
used.
Figure 2 shows TEM image and diffraction pattern
of Ni(OH)2 particles. It was confirmed that the parti-
cle size was 6–7 nm from this image, which has good
agreement with the results of XRD analysis. Also, the
TEM image indicates the presence of (101) lattices
with 0.233 nm inter-sheet distances. Furthermore, the
diffused circular shape of the patterns in the inset in-
dicates that these nanosized particles are formed from
polycrystalline powder.
Figure 1. XRD patterns of Ni(OH)2 nanoparticles: (a) Ni(OH)2 Figure 3(a) and (b) are XRD patterns of NiO films
particles on glass and (b) a glass plate. heat-treated at 420 and 330◦ C, respectively. It is well
326 Park et al.
OD(λ)
η(λ) = [cm2 /C] (4)
Q
Tb
OD(λ) = log . (5)
Tc
4. Conclusions
and a response time of 1.0–2.5 s during the color- 11. A. Donnadieu, in Large-Area Chromogenics; Materials and
ing/bleaching process. However, the modulation can Devices for Transmittance Control, edited by C.M. Lampert
be improved by optimizing the film thickness, and cor- and C.G. Granqvist (SPIE Optical Engineering, Bellingham,
1990).
responding investigations are currently underway. 12. E. Andrukaitis, P.W.M. Jacobs, and J.W. Lorimer, Solid State
Ionics 27, 19 (1998).
13. N. Ozer and C.M. Lampert, Sol. Energy Mater. & Sol. Cells 54,
Acknowledgment 147 (1998).
14. J.L.G. Miquel, Q. Zhang, S.J. Allen, A. Rougier, A. Blyr, H.O.
The authors gratefully acknowledge the financial sup- Davies, A.C. Jones, R.J. Leedham, P.A. Williams, and S.A.
port of the Sol–Gel Innovation Project (SOLIP) funded Impey, Thin Solid Films 424, 165 (2003).
by Ministry of Commerce, Industry, and Energy 15. A.E.J. Gonüalez and J.G. Cambray, Surf. Eng. 16, 73 (2000).
16. P.K. Sharma, M.C.A. Fantini, and A. Gorenstein, Solid State
(MOCIE) in Korea and the KOSEF through the Re- Ionics 113–115, 457 (1998).
search Center for Energy Conversion and Storage. 17. L. Wnag, Z. Zhang, and Y. Cao, J. Ceramic Soc. Jpn. 101, 227
(1993).
18. F.H. Moser and M.R. Lyman, United States Patent No. 4959247,
References 25 September 1990.
19. A. Surca, B. Orel, and B. Pihlar, J. Sol-Gel Sci. Tech. 8, 743
1. P.M.S. Monk, R.J. Mortimer, and D.R. Rosseinsky, Elec- (1997).
trochromism: Fundamentals and Applications (VCH, 20. M.A. Aegerter and N.A. Dahoudi, J. Sol-Gel Sci. & Tech. 27,
Weinheim, 1995), p. 4. 81 (2003).
2. K. von Rottkay, M. Rubin, and S.-J. Wen, Thin Solid Films 306, 21. Z. Xuping and C. Guoping, Thin Solid Films 298, 53
10 (1997). (1997).
3. C. Bechinger, J.N. Bullock, J.-G.. Zhang, C.E. Tracy, D.K. 22. C.-C. Yang, Int. J. of Hydrogen Energy 27 1071 (2002).
Benson, S.K. Deb, and H.M. Branz, J. Appl. Phys. 80, 1226 23. B.D. Cullity, Elements of X-Ray Diffraction, 2nd edn.
(1996). (University of Notre Dame, 1997).
4. K.-S. Ahn, Y.-C. Nah, J.-H. Yum, and Y.-E. Sung, Jpn. J. Appl. 24. C.R. Brundle, C.A. Evans. Jr., and S. Wilson, Encyclope-
Phys. 41, L212 (2002). dia of Materials Characterization: Surfaces, Interfaces, Thin
5. K. Bande and R. Gamnke, Adv. Mater. 2, 10 (1990). Films, Materials Characterization Series (Boston, Butterworth-
6. B. Scrosati, Applications of Electroactive Polymers (Chapman Heinemann, 1992).
& Hall, London, 1993). 25. R.C. Korošec, P. Bukovec, B. Pihlar, and J.P. Gomilšek, Ther-
7. Z. Xuping and C. Guoping, Thin Solid Films 298, 53 (1997). mochim. Acta 71187, 1 (2002).
8. J.S.E.M. Svensson and C.G. Granqvist, Sol. Energy Mater. 16, 26. Y. Wu, G. Wu, X. Ni, and X. Wu, in Proc. 4th Int. Conf. on Thin
19 (1987). Film Phys. & Appl. Proc. (SPIE, 2000), vol. 4086, p. 418.
9. Y. Fujita, K. Miyazaki, and C. Tatsuyama, Jpn. J. Appl. Phys. 27. K.-S. Ahn, Y.-C. Nah, and Y.-E. Sung, J. Vac. Sci. Technol. A20,
24, 1082 (1985). 1468 (2002).
10. A. Deneuville, P. Genard, and R. Billat, Thin Solid Films 70, 28. D.-J. Jeong, W.-S. Kim, and Y.-E. Sung, Jpn. J. Appl. Phys. 40,
203 (1986). L708 (2001).