User Manual: Defectotest Ds2000

User Manual DEFECTOTEST DS2000 Foreword
IFR-Lutz:
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DEFECTOTEST DS2000
Software Version 1.2
DEFECTOMAT DS 2.815
CIRCOGRAPH DS 6.430
CIRCOGRAPH DS 6.430 with DEFECTOMAT channel
STATOGRAPH DS 6.440
User Manual
 Registered trademark
Foreword User Manual DEFECTOTEST DS2000
Foreword
This User Manual has been written to be read, understood and heeded in all its aspects
by those responsible for the operation of the test system.
The complete User Manual comprises the chapters
1. Safety
2. Description
3. Installation
4. Operation
5. Maintenance and Servicing
Technical Data
It is only through familiarisation with the contents of this User Manual that errors can be
avoided in working with the test system and that safe and trouble-free operation can be
guaranteed.
The company operating the system is to ensure that all responsible persons are aware
of the full extent of the User Manual and have understood its contents. The
INSTITUT DR. FOERSTER provides corresponding staff training courses for this
purpose.
As a result of the rapid further development of the software, it may be the case that the
delivered software is a later version than the User Manual. For this reason, please read
the latest information contained in the file "readme.txt" on the CD-ROM prior to
commissioning. In the case of online updates carried out via modem, you will also find
important information in this file.
Any suggestions you may have with a view to improving this User Manual further are
gladly accepted by our Service Department or by one of our agencies. These contacts
also provide swift and comprehensive answers to any questions that are not answered
by this Manual.
This User Manual describes the setup and operation of the following instruments:
• DEFECTOMAT DS 2.815
• CIRCOGRAPH DS 6.430
• CIRCOGRAPH DS 6.430 with DEFECTOMAT channel
• STATOGRAPH DS 6.440
All instrument types are based on the same instrument platform and are operated and
controlled by the same software. The instrument platform and the software are
designated by DEFECTOTEST DS2000.
The equipment and performance features of the different instruments are described in
Chapter 2.
This User Manual does not include the description of the sensor systems! Information
on the sensor systems can be found in the separate user manuals for the sensor
systems.
Copyrights
User Manual
This User Manual contains information protected by copyright. All rights are reserved by
INSTITUT DR. FOERSTER GmbH & Co KG.
This User Manual is intended for the assembly, operating and supervising personnel.
The duplication, reproduction or translation of this User Manual into other languages, in
whole or in part, requires explicit written permission from INSTITUT DR. FOERSTER
GmbH & Co KG.
© 2000 INSTITUT DR. FOERSTER GmbH & Co KG.
In Laisen 70, D-72766 Reutlingen
Software
The software delivered with or installed in the system is subject to the legal provisions
of copyright law. It must only be implemented to operate the accompanying system as
described in the sales documentation or in the User Manual. Other applications are
expressly precluded. Violations of this stipulation render the offending parties liable for
damages and can also be criminally prosecuted.
Trademarks and Other Property Rights

CIRCOGRAPH®, DEFECTOMAT®; STATOGRAPH®; DEFECTOTEST® are
registered trademarks or brand names of INSTITUT DR. FOERSTER GmbH & Co KG.
The reproduction of utility names, trade names, product designations etc. in this User
Manual does not justify the assumption, even without special designation, that such
names can be considered exempt from proprietary brand and trademark protection
laws and may therefore be freely used by anyone.
User Manual DEFECTOTEST DS2000 Table of Contents
Table of Contents
1 SAFETY .................................................................................................................................................1-1
1.1 Use as intended .........................................................................................................................1-1
1.2 Safety class and enclosure ......................................................................................................1-1
1.3 Dangers and safety information...............................................................................................1-1
1.3.1 General.........................................................................................................................1-1
1.3.2 Safety measures ..........................................................................................................1-1
1.3.2.1 Prior to commissioning .............................................................................................................. 1-1
1.3.2.2 Handling the instrument ............................................................................................................ 1-2
1.3.2.3 In the event of malfunctions....................................................................................................... 1-2
1.3.2.4 Repairs and modifications ......................................................................................................... 1-2
1.3.2.5 Additional cooling device on the rear panel door....................................................................... 1-3
1.3.2.6 Field effects on persons and medical aids if DC Magnetising yokes are used .......................... 1-4
1.3.2.7 Field effects on magnetic data medium and mechanical watches............................................. 1-5
1.3.2.8 Protection against burns............................................................................................................ 1-5
1.4 CE Declaration of Conformity ..................................................................................................1-6
2 DESCRIPTION.......................................................................................................................................2-1
2.1 DEFECTOMAT DS 2.815............................................................................................................2-1
2.1.1 Application and performance features .........................................................................2-1
2.2 CIRCOGRAPH DS 6.430 ............................................................................................................2-2
2.3 STATOGRAPH DS 6.440............................................................................................................2-3
2.4 Instrument-specific sections of the User Manual ..................................................................2-3
3 INSTALLATION.....................................................................................................................................3-1
3.1 Installing the instrument on the testing line ...........................................................................3-1
3.1.1 Before starting operation for the first time ....................................................................3-1

3.1.2 Location ........................................................................................................................3-2
3.1.2.1 Protecting the instrument against dust penetration ................................................................... 3-2
3.1.2.2 Elimination of static charges...................................................................................................... 3-2
3.1.2.3 Laying cables ............................................................................................................................ 3-2
3.1.2.4 Installation of the Sensor system............................................................................................... 3-3
3.1.2.5 Protective conductor connection (PE) according to EN 61010 (VDE 0411) .............................. 3-3
3.2 Line connections .......................................................................................................................3-4
3.2.1 Back view of the test electronics ..................................................................................3-4

3.2.2 Sensor connections......................................................................................................3-4
3.2.3 Servicing connection (RS 232 socket) .........................................................................3-5
3.2.4 I/O connections (I/O block) for testing line components ..............................................3-5
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Table of Contents User Manual DEFECTOTEST DS2000
3.2.4.1 Functions of the logical ports ..................................................................................................... 3-5

3.2.4.2 Detailed description of the I/O signals ....................................................................................... 3-7
3.2.5 Configuring I/O connections for line operation .......................................................... 3-13
3.2.5.1 Defined ports ........................................................................................................................... 3-14
3.3 Installing/updating the software, customising the language ............................................. 3-15
3.3.1 Installing/updating the software ................................................................................. 3-15

3.3.2 Deactivating Auto Logon............................................................................................ 3-16
3.3.3 Starting the DEFECTOTEST DS2000 software ..................................................... 3-16
3.3.4 Setting the language of the software ......................................................................... 3-16
3.3.5 Adjustments after a software update ......................................................................... 3-17
4 OPERATION ......................................................................................................................................... 4-1
4.1 Basic functions of the GUI ....................................................................................................... 4-1
4.1.1 Start procedure ............................................................................................................ 4-1

4.1.2 Ending the DEFECTOTEST DS2000 software......................................................... 4-2
4.1.3 Elements of the graphical user interface ..................................................................... 4-3
4.1.3.1 GUI of DEFECTOTEST DS2000 ............................................................................................ 4-3
4.1.3.2 Windows menu bar.................................................................................................................... 4-3
4.1.3.3 Status bar .................................................................................................................................. 4-4
4.1.3.4 Result field................................................................................................................................. 4-9
4.1.3.5 Toolbar .................................................................................................................................... 4-10
4.1.4 Options (additional software functions)...................................................................... 4-10
4.1.4.1 Result Investigation ................................................................................................................. 4-11
4.1.4.2 Tail Marking ............................................................................................................................. 4-11
4.1.4.3 Circumferential Marking........................................................................................................... 4-11
4.1.4.4 Test Report Design.................................................................................................................. 4-12
4.1.4.5 Foerster Net............................................................................................................................. 4-12
4.1.4.6 Software Interface ................................................................................................................... 4-12
4.1.5 Selection and arrangement of Result windows in the Result field (layout)................ 4-13
4.1.5.1 Creating a layout ..................................................................................................................... 4-13
4.1.5.2 Saving a layout ........................................................................................................................ 4-16
4.1.5.3 Retrieving a layout................................................................................................................... 4-16
4.1.5.4 Structure of the Result window Piece Image ........................................................................... 4-16
4.1.5.5 Numerical Display of the Test Results..................................................................................... 4-17
4.1.6 Offline mode of the result windows (only with option Result-Investigation)............... 4-18
4.1.6.1 Activating the Offline mode...................................................................................................... 4-18
4.1.6.2 Navigating step by step ........................................................................................................... 4-18
4.1.6.3 Navigating by Selection ........................................................................................................... 4-19
4.1.6.4 Interpretation of the result window displays ............................................................................. 4-20
4.1.7 Key levels (access control) ........................................................................................ 4-21
4.1.8 Setting the test instrument ......................................................................................... 4-24
4.1.8.1 Quick window .......................................................................................................................... 4-24
4.1.8.2 Parameter list .......................................................................................................................... 4-26
4.1.8.3 Saving and retrieving a test instrument setting ........................................................................ 4-31
4.1.9 Operating the oscilloscope ........................................................................................ 4-34
4.1.9.1 Scope modes for DEFECTOMAT............................................................................................ 4-34
4.1.9.2 Scope modes for CIRCOGRAPH ............................................................................................ 4-35
4.1.10 Adjusting the test instrument ..................................................................................... 4-37
4.1.10.1 Calling up adjustment procedures using the toolbar................................................................ 4-37
1.1.1.2 DEFECTOMAT-adjustment to reference defect in motion (adjust procedure M) ..................... 4-37
4.1.10.3 CIRCOGRAPH-adjustment to reference defect stationary (adjust procedure C)..................... 4-39
4.1.10.4 CIRCOGRAPH-adjustment of the probes (adjust procedure K) .............................................. 4-42
4.1.11 Logging test requests................................................................................................. 4-45
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4.1.11.1 Preparing the test report.......................................................................................................... 4-45

4.1.11.2 Printing out test results............................................................................................................ 4-46
4.1.11.3 Printout of the Test piece display ............................................................................................ 4-47
4.1.11.4 Printout from screen ................................................................................................................ 4-49
4.1.11.5 Printout of test reports ............................................................................................................. 4-49
4.1.11.6 Setup of the printouts .............................................................................................................. 4-52
4.1.11.7 Setup of the printer.................................................................................................................. 4-53
4.1.12 Error messages and displays .....................................................................................4-54
4.1.13 Starting Test operating mode.....................................................................................4-56
4.1.13.1 Basic information on the Test operating mode ........................................................................ 4-56
4.1.13.2 Preparations ............................................................................................................................ 4-56
4.1.13.3 Monitoring Test operating mode.............................................................................................. 4-57
4.1.13.4 Inserting a reference run in test operating mode ..................................................................... 4-57
4.1.13.5 End of test ............................................................................................................................... 4-57
4.1.14 Instrument monitoring (noise monitoring)...................................................................4-58
4.1.14.1 System Window....................................................................................................................... 4-58
4.1.14.2 Setup of the noise monitoring.................................................................................................. 4-59
4.1.15 Typical system configurations ....................................................................................4-59
4.1.15.1 DEFECTOMAT sensor system................................................................................................ 4-59
4.1.15.2 CIRCOGRAPH sensor system ................................................................................................ 4-61
4.1.16 Supplementary programme Save Result DS .............................................................4-64
4.1.16.1 Main window Save Result DS ................................................................................................. 4-64
4.1.16.2 Menus ..................................................................................................................................... 4-65
4.1.16.3 Button bar................................................................................................................................ 4-65
4.1.16.4 Display Requests area ............................................................................................................ 4-66
4.1.16.5 Request List ............................................................................................................................ 4-67
4.1.16.6 Save Request window............................................................................................................. 4-68
4.1.16.7 Show Log window ................................................................................................................... 4-69
4.1.16.8 Config Display window ............................................................................................................ 4-70
4.1.16.9 Config Save window................................................................................................................ 4-71
4.1.16.10 Error messages, Fatal Error ................................................................................................... 4-73
4.1.16.11 Typical operating sequences................................................................................................... 4-74
4.2 Setting the test instrument to the test material....................................................................4-76
4.2.1 Basic information on the setup...................................................................................4-76

4.2.2 Initial setting ...............................................................................................................4-76
4.2.3 Implementing adjustment procedures ........................................................................4-89
4.3 Evaluation operating modes ..................................................................................................4-93
4.3.1 Sequence of the evaluation process ..........................................................................4-93

4.3.2 Scanning the evaluation tracks ..................................................................................4-94
4.3.3 Evaluation options ......................................................................................................4-94
4.3.3.1 Short flaw suppression ............................................................................................................ 4-94
4.3.3.2 Flaw evaluation in accordance with EN1971 ........................................................................... 4-95
4.3.3.3 Minimum defect distance (Combination of neighbouring flaws)............................................... 4-99
4.3.4 Recording the flaw ranks..........................................................................................4-100
4.3.4.1 Determining the number of flaws (flaw count) ....................................................................... 4-100
4.3.4.2 Determining the flaw length ................................................................................................... 4-101
4.3.4.3 Determining the flaw density ................................................................................................. 4-101
4.3.5 Assessment, classification (sorting and quality classes) ........................................4-102
4.3.5.1 Sorting by flaw count limits .................................................................................................... 4-102
4.3.5.2 Sorting by flaw length limits ................................................................................................... 4-102
4.3.5.3 Generation of quality numbers .............................................................................................. 4-103
4.3.6 Line positions for the evaluation...............................................................................4-103
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4.3.7 Application examples ............................................................................................... 4-105

4.3.7.1 Piece testing .......................................................................................................................... 4-105
4.3.7.2 Cropping/Coil to coil .............................................................................................................. 4-106
4.3.7.3 Continuous ............................................................................................................................ 4-107
4.3.7.4 Wire ....................................................................................................................................... 4-108
4.3.7.5 Hot wire ................................................................................................................................. 4-109
4.4 Configuration/adjusting the software to the testing environment................................... 4-110
4.4.1 Basic information ..................................................................................................... 4-110

4.4.2 Settings of the sensor system.................................................................................. 4-111
4.4.2.1 Activating and deactivating the sensor system (Operation) .................................................. 4-111
4.4.2.2 Effective probe width (Nominal.Probe.Width) ........................................................................ 4-111
4.4.2.3 HF preamplifier (HF.Preamplifier).......................................................................................... 4-112
4.4.2.4 Track assignment (Trace.Assignment) .................................................................................. 4-112
4.4.2.5 Combination of channels (Channel.Mode) ........................................................................... 4-113
4.4.2.6 Limitation of the frequency range (Frequency.Max, Frequency.Min)..................................... 4-114
4.4.2.7 Further parameters for CIRCOGRAPH or CIRCOSCAN sensor systems ............................. 4-114
4.4.3 Setting the display and evaluation depth ................................................................. 4-117
4.4.3.1 Number of segments (Segments.Per.Revolution) ................................................................. 4-117
4.4.3.2 Number of sectors (No.Sectors) ............................................................................................ 4-117
4.4.3.3 Sector names (Sector.Names) .............................................................................................. 4-118
4.4.4 Setting the differential channel ................................................................................ 4-118
4.4.4.1 Activating and deactivating the differential channel (Channel) .............................................. 4-118
4.4.4.2 Frequency (Frequency kHz) .................................................................................................. 4-118
4.4.4.3 Filter setting in normal and manual mode (Filter) .................................................................. 4-120
4.4.4.4 High pass filter correction (Filter.Corr) Only for CIRCOGRAPH sensor system .................... 4-121
4.4.4.5 Filter bandwidth (Filter.Bandwidth) Only for CIRCOGRAPH sensor system ......................... 4-121
4.4.4.6 Gain (Gain dB)....................................................................................................................... 4-121
4.4.4.7 Gain readjustment range (Readjust.Range) .......................................................................... 4-122
4.4.4.8 Y gain (Y.Gain dB)................................................................................................................. 4-122
4.4.4.9 Phase angle (Phase deg) ...................................................................................................... 4-122
4.4.5 Setting the absolute channel ................................................................................... 4-123
4.4.5.1 Switching the absolute channel on and off (Channel)............................................................ 4-123
4.4.5.2 Gain of the absolute channel (Abs.Gain dB) ......................................................................... 4-123
4.4.5.3 Zero compensation of the absolute channel (Abs.Compensate) ........................................... 4-123
4.4.5.4 Automatic zero tracking (Auto.Track) .................................................................................... 4-123
4.4.5.5 Tracking speed (Track.Speed) .............................................................................................. 4-123
4.4.6 Setting the clearance channel ................................................................................. 4-124
4.4.6.1 Activating and deactivating the clearance channel (Channel) ............................................... 4-124
4.4.6.2 Zero compensation of the clearance channel (Compensation) ............................................. 4-124
4.4.7 Setting the evaluation parameters ........................................................................... 4-125
4.4.7.1 Counting units (Count.Dimension)......................................................................................... 4-125
4.4.7.2 Statistics (Statistics) .............................................................................................................. 4-125
4.4.7.3 Count mode (Count.Mode) .................................................................................................... 4-125
4.4.7.4 Section length (Section.Length m)......................................................................................... 4-126
4.4.7.5 Quality coefficients (Quality.Coefficient.AX) .......................................................................... 4-126
4.4.7.6 Additional evaluation options (Eval.Option) ........................................................................... 4-128
4.4.7.7 Cropping length suppression (Cropping.Suppression) .......................................................... 4-129
4.4.7.8 Leading end length (Cropping.Section.Begin m) ................................................................... 4-129
4.4.7.9 Trailing end length (Cropping.Section.End m) ....................................................................... 4-129
4.4.7.10 Piece length evaluation (Piece.Length.Evaluation)................................................................ 4-129
4.4.7.11 Maximum piece length (Piece.Length.Max m)....................................................................... 4-129
4.4.7.12 Minimum piece length (Piece.Length.Min m)......................................................................... 4-129
4.4.7.13 Maximum evaluation length (Max.Eval.Length) ..................................................................... 4-129
4.4.7.14 Minimum defect distance (Min.Defect.Distance).................................................................... 4-130
4.4.8 Setting the analysis parameters .............................................................................. 4-131
4.4.8.1 Evaluation mode (Eval.Mode)................................................................................................ 4-131
4.4.8.2 EN1971 evaluation lengths (Eval.Length.FX mm) ................................................................. 4-132
4.4.8.3 SFS evaluation lengths (SFS.Length.FX mm) ....................................................................... 4-132
4.4.8.4 Flaw thresholds (FX.Threshold %) ........................................................................................ 4-132
4.4.8.5 Flaw count limits (Min.Defect.Counts.FX).............................................................................. 4-132
4.4.8.6 Sector position (Sector.Position.deg) .................................................................................... 4-132
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4.4.8.7 Sector width (Sectors.Width.deg) .......................................................................................... 4-133

4.4.8.8 Defect extend (Defect.Extend mm) ....................................................................................... 4-133
4.4.9 Setting the marking parameters ...............................................................................4-133
4.4.9.1 Number of marking guns (Marking.Equipment) ..................................................................... 4-133
4.4.9.2 Clearance LS2 – marking gun (Marking.Distance.Gate.X) .................................................... 4-133
4.4.9.3 Response time of the marking guns (Response.Time ms).................................................... 4-133
4.4.9.4 Minimum marking duration (Min.Marking.Duration)............................................................... 4-134
4.4.9.5 Activating marking (Marking.Output) ..................................................................................... 4-134
4.4.9.6 Coding of the flaw information (Marking.Assignment.FX)...................................................... 4-135
4.4.9.7 End marking (Tail.Marking) ................................................................................................... 4-135
4.4.9.8 Start of end marking (Tail.Marking.Begin mm) ...................................................................... 4-135
4.4.9.9 End of end marking (Tail.Marking.End mm) .......................................................................... 4-136
4.4.9.10 Coding of the end marking information (Tail.Marking.Assignment.SX/QX) ........................... 4-136
4.4.9.11 Marking in reference mode (Marking.Input.Ref) .................................................................... 4-136
4.4.10 Setting the sorting parameters .................................................................................4-136
4.4.10.1 Number of sorting gates (Sorting.Equipment) ....................................................................... 4-136
4.4.10.2 Sorting monitoring (Sorting.Control, Sorting.FIFO.Length).................................................... 4-136
4.4.10.3 Sorting pulse length (Sorting.Pulse ms) ................................................................................ 4-138
4.4.10.4 Sorting information for Test operating mode (Sorting.Mode.Test)......................................... 4-138
4.4.10.5 Sorting information for reference mode (Sorting.Mode.Ref) .................................................. 4-138
4.4.10.6 Sorting limits (S1.Limits.FX, S2.Limits.FX) ............................................................................ 4-138
4.4.10.7 Sorting clas in case of evaluation disturbances (Sorting.Clas.CatX) ..................................... 4-138
4.4.11 Settings for the automatic test sequence .................................................................4-139
4.4.11.1 Signal gate (Signal.Gate.Control).......................................................................................... 4-139
4.4.11.2 Initialisation of the signal gate (Signal.Gate.Init).................................................................... 4-139
4.4.11.3 Signal gate in Setup mode (Signal.Gate.Set) ........................................................................ 4-141
4.4.11.4 Activation of the cutter (Test.Procedure) ............................................................................... 4-141
4.4.11.5 Distance between light barrier 2 and sensor system (LS2.Distance mm) ............................. 4-141
4.4.11.6 Untested leading edge (Untested.Front mm) ........................................................................ 4-141
4.4.11.7 Untested trailing edge (Untested.Tail mm) ............................................................................ 4-142
4.4.11.8 Distance LS2 to cutting position (Cut.Position mm)............................................................... 4-142
4.4.11.9 Cutting tolerance (Cutting.Tolerance mm)............................................................................. 4-143
4.4.11.10 Virtual cutting (Virtual.Piece.Length m) ................................................................................. 4-143
4.4.11.11 Test piece confirmation (Piece.Confirmation)........................................................................ 4-143
4.4.11.12 Signal gate in reference mode (Signal.Gate.Ref) .................................................................. 4-144
4.4.11.13 Material diameter (Material.Diameter mm) ............................................................................ 4-144
4.4.12 Settings for speed determination .............................................................................4-144
4.4.12.1 Speed unit (Speed.Unit) ........................................................................................................ 4-144
4.4.12.2 Minimum speed (Min.Speed m/s; m/min) .............................................................................. 4-144
4.4.12.3 Maximum speed (Max.Speed m/s; m/min) ............................................................................ 4-144
4.4.12.4 Speed measurement with light barriers (Measure.Distance mm) ......................................... 4-145
4.4.12.5 Speed measurement with external pulse generator (Clock.Multiplier)................................... 4-145
4.4.12.6 Internal speed (Internal.Speed m/s; m/min)........................................................................... 4-145
4.4.12.7 Motion clock for setup mode (Speed.Clock.Set).................................................................... 4-145
4.4.12.8 Motion clock for test operating mode (Speed.Clock.Test) ..................................................... 4-146
4.4.12.9 Motion clock for reference mode (Speed.Clock.Ref) ............................................................. 4-146
4.4.12.10 Freezing the clock (Freeze.Mode)......................................................................................... 4-147
4.4.13 Setting of the instrument monitoring ........................................................................4-147
4.4.13.1 Activation of the noise monitoring (Noise.Channel.Monitor) .................................................. 4-147
4.4.13.2 Noise monitoring limits (Noise.Upper.Limit, Noise.Lower.Limit) ............................................ 4-147
4.4.13.3 Categrories of messages (Noise.Lower.Limit.Message, Noise.Upper.Limit.Message) ......... 4-147
4.4.13.4 Generation of the noise values (Noise.Lower.Average.Length, Noise.Upper.Average.Length)4-147
4.4.14 Configuring the result display...................................................................................4-148
4.4.14.1 Activation and configuration of the scroll mode (PclmgScroll; PclmgScale) .......................... 4-148
4.4.15 Integrating a customised logo ..................................................................................4-148
4.5 CHECKLIST Size change for CIRCOGRAPH sensor system ...........................................4-149
4.6 CHECKLIST Size change for DEFECTOMAT sensor system ...........................................4-153
5 MAINTENANCE AND SERVICING.......................................................................................................5-1
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5.1 Cleaning ..................................................................................................................................... 5-1
5.2 Calibration.................................................................................................................................. 5-1
5.3 Remote Service ......................................................................................................................... 5-1
6 TECHNICAL DATA............................................................................................................................... 6-1
6.1 General ....................................................................................................................................... 6-1
6.2 Function ..................................................................................................................................... 6-1
6.3 Dimensions ................................................................................................................................ 6-1
6.4 Weight......................................................................................................................................... 6-1
6.5 Power supply ............................................................................................................................. 6-1
6.6 Ambient conditions................................................................................................................... 6-1
6.7 Interfaces ................................................................................................................................... 6-3
6.7.1 I/O connections ............................................................................................................ 6-3

6.7.2 PC interfaces ............................................................................................................... 6-4
6.8 Characteristic parameters for FOERSTER standard sensor systems................................. 6-5
6.8.1 CIRCOGRAPH rotating probes ................................................................................... 6-5

6.8.2 DEFECTOMAT coils .................................................................................................... 6-7
7 IMPRINT ................................................................................................................................................ 7-1
7.1 How to contact us ..................................................................................................................... 7-1
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DEFECTOTEST DS2000 User Manual Safety
1 Safety
1.1 Use as intended

The instrument may be used only under the conditions and for the purposes for which it
was designed. In particular, do not connect sensor systems which are not designed for
the instrument.
Application and connectable sensor systems: see Section 2.1.1 and 2.2.1.
Operating conditions: see Section 6.6.
1.2 Safety class and enclosure

The instrument complies with the conditions of safety class 1 to EN 61010-1 (IEC Publ.
1010-1). The supplied mains cable contains a protective earth conductor.
The enclosure according to DIN 40050 is IP 54.
The mains plug must only be inserted in protective contact sockets.
The protective earth conductor must never be interrupted, neither within nor outside the
housing!
1.3 Dangers and safety information

1.3.1 General
The instrument has been constructed on the basis of the state of the art and the
recognised technical safety rules and left our plant in perfect condition. Improper
handling and operation in conditions other than those specified may pose risks and
dangers caused by electrical current. This may endanger persons and damage the
instrument.
All persons involved in commissioning, operation and maintenance of the instrument
must
• be appropriately qualified
• strictly follow the instructions in this User Manual
Your safety is at stake!
1.3.2 Safety measures
1.3.2.1 Prior to commissioning

Inspect the instrument for visible signs of damage resulting from transport or incorrect
storage.
6.430/2.815/6.440 1-1
Safety DEFECTOTEST DS2000 User Manual
Check that the mains voltage of the instrument corresponds to your local supply
voltage.
The instrument may be operated only in conjunction with a 230 V AC mains with a rated
frequency of 50 or 60 Hz. In the case of other voltages, a voltage adapter must be
preconnected. This is available as an accessory.
Do not operate an instrument if it is damaged or set to a different mains voltage!
Danger as the result of contact with electrically live components!
Risk of damage or consequential damage to the instrument!
Call the Servicing Department!
1.3.2.2 Handling the instrument

Take the level of care which is customary when handling electrical and electronic
equipment.
Do not subject the instrument to mechanical stresses such as shock, vibration or heavy
loads.
Protect the instrument against dampness and humidity.
1.3.2.3 In the event of malfunctions

If there is reason to assume that safe operation is no longer guaranteed, take the
instrument out of service and lock it to prevent it being switched back on. In particular,
this will be the case
• if the instrument shows visible signs of damage
• if the instrument is no longer operating
• after any kind of load or stress that exceeds the permitted limits
1.3.2.4 Repairs and modifications

Repairs may only be carried out by the INSTITUT DR. FOERSTER Servicing
Department!
The housing may only be opened by qualified personnel!
Only original spare parts may be used when carrying out modifications (e.g. retrofitting
options)!
Electrically live components may be exposed when opening the housing and when
removing parts using tools. Terminals may also be electrically live.
1-2 6.430/2.815/6.440
Capacitors may still be charged even after disconnecting them from the electrical power
supply.
Consequently: switch off the mains switch and disconnect the mains cable before
opening the housing!
1.3.2.5 Additional cooling device on the rear panel door

Risk of injury!
The instrument can become instable and tip over when opening the rear panel door!
Test instruments with an additional cooling device on the rear panel door must be firmly
fastened against a wall, floor or ceiling.
6.430/2.815/6.440 1-3
1.3.2.6 Field effects on persons and medical aids if DC Magnetising yokes are
used
Today no mandatory standard values exist for persons with heart pacemakers. All
relevant standards are withdrawn. Individual measurements are necessary at the
working place to take into account the individual circumstances (type of heart
pacemaker and kind of implantation).
The user is responsible for the proper application of the warning sign “Forbidden
for persons with heart pacemakers”!
Values for the DC yokes are listed in the following table. The user is responsible for
defining the working areas according to national regulations and for informing the
operators of possible risks.
Yoke Max. Flux Density Max. Flux Density Flux Density Flux Density
in mT in mT of 21,22 mT1 of 0,5 mT
within yoke or coil at the surface of at a distance in cm at a distance in
yoke cm
P 12 upper edge
64 1,5 26
P 40 upper edge
30 0,5 16
LSP 180 upper edge
64 1,5 26
M 22* coil entry
M 40* coil yoke coil entry

45 145 6 - 15
M 90* coil yoke coil entry
53 89 7 - 25
M 140/170* coil yoke coil entry
100 126 11 2,0 40
LSM 180* coil yoke coil yoke
40 42 10 10 50
*with max. current
[1] Source: Social insurance regulations concerning safety and health in the workplace BGV
B11 (VBG 25): “Accident prevention regulation for electromagnetic fields” dated 1st June 2001.
Furthermore all national regulations must be observed!
1
Limit value between exposure areas 1 and 2 according to BGV B11
1-4 6.430/2.815/6.440
1.3.2.7 Field effects on magnetic data medium and mechanical watches

Due to the strong function-related fields of the yokes, stored data may be lost if
magnetic data carriers (check cards, etc.) are brought into the proximity of the
yokes. Even wearing watches in the vicinity of the yokes may cause the watches to
malfunction or even break down.
1.3.2.8 Protection against burns

For functional reasons, the surface of the electromagnetic yokes is heated to
extremely high temperatures. Therefore the designation “Hot surface” must be
observed!
6.430/2.815/6.440 1-5
1.4 CE Declaration of Conformity
DECLARATION of CONFORMITY
We declare in our own responsibility that this product complies with the requirements of
the following European Directives and corresponding standards:
• European Directive 73/23/EEC: Safety of electrical apparatus

• European Standard EN 61010
• European Directive 89/336/EEC: Electromagnetic Compatibility

• European Standards EN 61326 - 1
• European Standards EN 61326 / A 1
July 1, 2001
INSTITUT DR. FOERSTER

Division Test Systems
Dr. Jürgen Schröder
1-6 6.430/2.815/6.440
DEFECTOTEST DS2000 User Manual Description
2 Description
2.1 DEFECTOMAT DS 2.815

2.1.1 Application and performance features
The DEFECTOMAT DS is an instrument for the non-destructive testing of ferrous,
austenitic and non-ferrous round stock (wires, bars and tubes) or profile-section
material (e.g. hexagonal bars), operating on the basis of the eddy-current method (DIN
54 140) with through-type coils.
Test material
• Material diameter depending on sensor system
− M40/90/170 1 to 40/90/170 mm
− H40/90 1 to 44/100 mm
− P12/40 0.3 to 15/44 mm
− S(LSP/LSM) 10 to 500 mm
• Materials: ferromagnetic, austenitic and non-ferromagnetic
Connectable sensor systems

All conventional coil types (through-type, segment and scanning coils):
• Sensor system M40 – M90 – M170
• Sensor system P12 – P40 – P40T
• Sensor system H40 – H90
• Sensor system T60
• Sensor system S
Note: This User Manual does not include the description of the sensor systems.
Information on the sensor systems can be found in the separate user manuals for the
sensor systems.
Testing performance
• Takes the place of leakage testing on tubes and pipes
• Detection of slowly changing or long-drawn-out material inhomogeneities, typically
on unwelded tubes with absolute channel
• Single or multi-channel version
• Multi-channel version for testing with several sensors consecutively on one testing
line
• Single or dual-frequency operation
6.430/2.815/6.440 2-1
Description DEFECTOTEST DS2000 User Manual
2.2 CIRCOGRAPH DS 6.430

The CIRCOGRAPH DS is an instrument for non-destructive testing of ferrous,
austenitic and non-ferrous round stock (wires, bars, rods and tubes), operating on the
basis of the eddy-current method (DIN 54 140) with rotating scanning coils. This
method offers extremely high flaw detection sensitivity and, at the same time, a high
throughput.
The CIRCOGRAPH DS can be expanded by one or two DEFECTOMAT sensor

systems (CIRCOGRAPH with DEFECTOMAT channel).
Test material
• Round stock in the diameter range 2 – 130 mm (dependent on the connected sensor
system)
− Ro 20 2 to 20 mm
− Ro 35 2 to 35 mm
− Ro 65 5 to 65 mm
− Ro 130 10 to 130 mm
• Materials: ferromagnetic, austenitic and non-ferromagnetic
• Material surface free of scale, bright (bare) wherever possible
Connectable sensor systems

Rotating heads with rotating probes, preferably FOERSTER high-performance rotating
heads
• Sensor system Ro 20 6.460
• Sensor system Ro 35 P 6.461.01
• Sensor system Ro 35 L 6.461.21
Note: This User Manual does not include the description of the sensor systems.
Information on the sensor systems can be found in the separate user manuals for the
sensor systems.
Testing performance
• Detection of surface flaws, in particular longitudinal flaws
• Flaw depth resolution upwards of 30 µm
• Single-frequency operation 30 kHz to 3 MHz
• Testing without omission and continuously
• Test speed up to 3 m/s depending on sensor system
• Number of channels corresponding to the sensor system used
• Test channel sensitivity correction by automatic clearance compensation if the test
piece lies eccentrically in the sensor system
2-2 6.430/2.815/6.440
DEFECTOTEST DS2000 User Manual Description
• Expansion with a DEFECTOMAT channel for additional surface testing for

transverse flaws or punctiform flaws in conjunction with an H or M sensor system
and through-type coils
2.3 STATOGRAPH DS 6.440

The STATOGRAPH DS is an instrument for non-destructive testing of metal finished
products and components operating on the basis of the eddy-current test method (DIN
54 140). Depending on the type of the product different sensor systems are necessary,
typically several different sensor systems in combination; either with rotating scanning
probes or with fixed probes or through-type coils or segment coils.
The kind of sensor systems, the number of channels and the testing performance is
subject of a project specific clarification and planing.
2.4 Instrument-specific sections of the User Manual

Sections (chapters, paragraphs) of this User Manual which only apply to a specific
sensor system are explicitly designated with the term CIRCOGRAPH sensor system
or DEFECTOMAT sensor system.
Example:
DEFECTOMAT sensor system

For a DEFECTOMAT sensor system, the signals of the absolute channel can be
displayed.
CIRCOGRAPH sensor system
For a CIRCOGRAPH sensor system, the signals of the differential channels as
well as the curve of the clearance compensation can be displayed.
The sections designated with DEFECTOMAT sensor system apply to the sensor
system/s with the following instrument types:
• DEFECTOMAT DS 2.815
• CIRCOGRAPH DS 6.430 with DEFECTOMAT channel
• STATOGRAPH DS 6.440 regarding the sensor systems in non rotating operaton like
fixed probes, through-type-coils or segment coils.
The sections designated with CIRCOGRAPH sensor system apply to the sensor
system with the following instrument types:
• CIRCOGRAPH DS 6.430 (without DEFECTOMAT channel)
• CIRCOGRAPH DS 6.430 with DEFECTOMAT channel
• STATOGRAPH DS 6.440 regarding the sensor sytems with rotating probes – and in
case of rotating test pieces with fixed probes.
6.430/2.815/6.440 2-3
Description DEFECTOTEST DS2000 User Manual
The sections of this User Manual which have no supplement apply to all sensor
systems and thus to all instrument types.
2-4 6.430/2.815/6.440
DEFECTOTEST DS2000 User Manual Installation
3 Installation
3.1 Installing the instrument on the testing line

3.1.1 Before starting operation for the first time
The instrument left our works in perfect condition. Please inspect it for visible signs of
damage resulting from transportation or incorrect storage.
Check that the mains voltage of the instrument corresponds to your local supply
voltage. The mains voltage of the instrument is engraved on the rating plate. On the
cabinet version of the instrument, the rating plate can be found on the outside of the
rear cabinet door.
Warning: A damaged instrument or an instrument set to a different mains voltage must

not be operated! Danger of electric shock!
The instrument complies with the conditions of safety class 1 in accordance with EN
61010-1 (IEC Publ. 1010-1). The supplied mains cable contains a protective earth
conductor.
Warning: If operation occurs without the protective earth conductor, there is a risk of
electric shock in the event of electrical malfunction!
The mains plug may only be plugged into socket outlets with earthing contact.
Never disconnect the protective earth conductor, either inside or outside the instrument.
Warning: Electrically live components may be exposed when the housing is opened.
Capacitors may still be charged even with the power supply switched off → risk of
electric shock! Therefore:
The housing may only be opened by specialist personnel!
Switch off the mains switch and disconnect the mains cable before
opening the housing!
6.430/2.815/6.440 3-1
Installation DEFECTOTEST DS2000 User Manual
3.1.2 Location
Install the instrument at a location from which you have a good view of the testing line.
Other requirements applicable to the installation site:
• The instrument must be installed on a flat and stable surface which is not subject to
shaking or vibration
• Relative humidity: up to 85%
• Ambient temperature: +5 to +40°C
• Ensure that there is at least 0.5 m clearance behind the instrument to prevent the
connection cables from being kinked
3.1.2.1 Protecting the instrument against dust penetration

The instrument is designed for use under harsh industrial conditions and is largely
insensitive to dust and dirt thanks to its highly protective enclosure (IP 54).
However, if operating under conditions subject to high dust contamination, the regular
inspection of the filter mats at the ventilator (rear side of the instrument) is
recommended. In the event of strong contamination, the filter mats must be replaced.
3.1.2.2 Elimination of static charges

Conveying test pieces on rubber or plastic-coated rollers or belts frequently leads to
static charges on the test material; these are discharged again through sparks at more
or less regular intervals. These sparks may cause very high pseudo flaw indications
and render testing virtually impossible. Static charges must be eliminated in all cases,
e.g. by using braided copper strips which touch the test pieces lightly as they pass
through.
3.1.2.3 Laying cables

General
We recommend that the connection cables be laid in cable ducts in the foundation. The
length of the standard connection cable to the Sensor system and to the test periphery
is 10 m.
Information on laying long cables (in particular coil cables)

Laying
The cables should be laid in closed steel conduits in order to protect against
mechanical damage and in order to screen them against electromagnetic pick-up.
Route the steel conduits in such a way that they do not run parallel to cable racks used
to route high-voltage cables or thyristor control cables. If this cannot be avoided, ensure
that the conduits are approx. 1 m away from the cable racks.
3-2 6.430/2.815/6.440
Drawing in the cables

Provide cable draw-in openings at suitable points along the route of the conduit. The
pull-in tape for drawing in the cables must be attached behind the plug on the cable.
Secure the plug with adhesive tape at the draw-in tape. Mask the exposed contacts
with adhesive tape.
Excess lengths
If long excess lengths are left over after drawing in ready-to-use cables, these can be
wound up near to the test instrument. Please note the minimum bending radius.
Technical data
Steel conduits:
Diameter: approx. 100 mm
Type: ferrous conduits closed on all sides
Wall thickness: approx. 3 – 4 mm
Bending radius of the cables:
See cable list in the technical customer documentation.
3.1.2.4 Installation of the Sensor system

If necessary, please refer to the corresponding user manual for instructions on installing
the sensor system.
3.1.2.5 Protective conductor connection (PE) according to EN 61010 (VDE 0411)

Connect the protective conductor terminal of the electronics cabinet and the other
system components, e.g. control cabinets, motor control, rotating heads with the
nearest main protective conductor terminal 16 mm2. A green/yellow lead with 16 mm2
Cu is to be used for that.
6.430/2.815/6.440 3-3
3.2 Line connections

3.2.1 Back view of the test electronics
All connections of the test electronics are located on the rear panel of the test
equipment cabinet. This includes the connections of the sensors and the connections of
the testing line components (e.g. marking guns and sorting gates).
The illustration below shows the rear side of the test equipment cabinet.
Fig. 1 Rear panel of the test electronics
3.2.2 Sensor connections

Various sockets for the sensor connections are provided, depending on the type of
sensor systems used.
• One connection socket per coil or probe
• Standard CIRCOGRAPH → 1 connection socket
• Special 8-channel rotating heads → 2 connection sockets
3-4 6.430/2.815/6.440
3.2.3 Servicing connection (RS 232 socket)

The "RS 232" socket is intended for servicing purposes only. As operator, you must not
make any connections to the "RS 232" socket.
Only plugs with EMC filter can be connected to the "RS 232" socket.
3.2.4 I/O connections (I/O block) for testing line components

Each test electronics unit features 4 IN/OUT blocks on the rear panel as standard. The
first block at the top left (Interface 0) is always used as a so-called system port. The
three other blocks may be used as sorting port, combined port and parameter port. The
individual logical ports to which a function or function group is assigned (see Fig. 2) are
assigned to the physical connections, i.e. the I/O blocks, by software during the
installation procedure. In the standard sequence, the combination port is assigned to
Interface 1, the sorting port is assigned to Interface 2 and the parameter port is
assigned to Interface 3. However, the assignment may also be changed by the user.
The number of inputs and outputs for each block is fixed.
For information on the electrical characteristics of the I/O connections, see
Section 6.7.1.
3.2.4.1 Functions of the logical ports

The functions of the logical ports are assigned as follows:
• System port: this is always present and contains all signals relating to line transport
• Rotation port: this is only necessary on C’FLUX sensor systems
• Sorting port: this is used for sorting and/or cutting operation; besides several input
signals, it also makes available output signals for three-way sorting
• Combination port: signals for the test operating mode, for fault handling and three
outputs for marking
• Marking expansion port: this provides a further 8 marking outputs per port.
• Parameter port: this has 4 event inputs which can be used for evaluation and 4
outputs for the output of a parameter value.
6.430/2.815/6.440 3-5
The individual signals of the ports are summarised in Fig. 2.
System Rotation Sorting Combinati Marking Parameter

Signal port port port on port expansion port
port
1 Tls1 Ren Sreq Mstop M4/12 F0
bit 0 Light barrier Rotation Sorting Marking Marking Ext. event 0
1 enable recall stop output 4
2 Tls2 Rstop Scut Gerr M5/13 F1
bit 1 Light barrier Rotation Cutting Fault Marking Ext. event 1
2 stop magnetisati output 5
on
3 Tstep Rerr Sakn Ctest M6/14 F2
bit 2 External Fault motor Test piece Line ready Marking Ext. event 2
motion controller confirmation for testing output 6
clock
4 Tstop Ftemp Copt Cerrq M7/15 F3
bit 3 Roller (C'FLUX) Option Fault Marking Ext. event 3
conveyor command acknow- output 7
stop ledgement
5 Crdy1 (Res) S0 M1 M8/16 P0
bit 4 Test Sorting Marking Marking Parameter
electronics output 0 output 1 output 8 value bit 0
ready
6 Crdy2 (Res) S1 M2 M9/17 P1
bit 5 Operator- Sorting Marking Marking Parameter
control output 1 output 2 output 9 value bit 1
computer
ready
7 Tlift Res) S2 M3 M10/18 P2
bit 6 (C'FLUX) Sorting Marking Marking Parameter
output 2 output 3 output 10 value bit 2
8 (Res) F24k Cend Cerr M11/19 P3
bit 7 (C'FLUX) Piece Fault Marking Parameter
evaluation output 11 value bit 3
ready
A n.c. F6k n.c. n.c. n.c. A1
Parameter
(C'FLUX) value
analog
Digital IN Digital OUT Analog Out
Fig. 2 Table: Signal port assignment
3-6 6.430/2.815/6.440
3.2.4.2 Detailed description of the I/O signals
Tls1
• When determining the test speed by run time measurement of the test piece
between two light barriers (parameter Speed.Clock [Line; Deb] = measured):
light barrier 1 must be connected to this input and mounted 100mm...1000mm in
front of light barrier 2. The distance must be entered in the parameter
Measure.Distance [Line; Con].
• If the external motion clock at input Tstep, e.g. from a timing wheel (parameter
Speed.Clock [Line; Deb] = external), is used:
If input Tls1 is activated, the internal pulse generator is used as the motion clock
source. In this case, the test speed corresponds to the last measured value of the
external source (timing wheel). When Tis1 is deactivated, the system switches back
to the external source.
This function is suitable for applications in which for a short time no external clock is
available owing to the gaps between test pieces.
The polarity of Tls1 can be selected with bit 0 of the parameter
Interface.System.Polarity [IO; Con].
Tls2
Light barrier connection for the signal gate function. This allows entry and exit signals of
the test piece to be suppressed. In addition, Tls2 is used in conjunction with Tls1 for
speed measurement (see above).
Two operating modes of the signal gate can be selected with the parameter
Signal.Gate.Control [Sys; Con]:
• direct: the input signal controls the signal gate directly without delay.
• delayed: the input signal is delayed individually for each sensor system and serves
as the signal gate. The light barrier can be mounted at a distance ranging from 4 to
10000 mm in front of the first sensor system (see parameter LS2.Distance mm
[Sys; Con]). The length of the untested sections at the leading edge and trailing
edge of the test piece can also be set independently for each sensor system
(parameters Untested.Front [Sys; Sta], Untested.Tail [Sys; Sta]).
The polarity of Tls2 can be selected with bit 1 of the parameter
This input features a bounce suppression circuit with a time constant of 100 ms:
therefore, the interval between two consecutive pieces must be at least 100 ms.
6.430/2.815/6.440 3-7
Tstep
Input for an external pulse generator e.g. timing wheel (parameter Speed.Clock
[Line; Deb] = external)
Signal frequency: ≤ 10kHz (min. pulse width 50µs)
Signal resolution: 0,1...10 pulses/mm
Maximum speed: 50 m/s
Set parameter Clock.Multiplier [Line; Con] (= M) in accordance with the external clock
rate Ce so that this results in an internal clock rate Ci of 10 pulses/mm:
Ci = Ce * M = 10 pulses/mm
Example:
An external clock with 1 pulse / 2.5 mm requires M = 25:
M = 2.5 mm / 0.1 mm = 25
Note: If the external clock corresponds to a transport speed that is higher than
parameter Max.Speed, an error message will be generated and the clock rate will be
divided by 100 internally to avoid an overload of the Test Electronics. As soon as the
external clock rate is below this limit, the clock signal will be used directly again.
Tstop
If the input is activated, the motion clock is deactivated internally regardless of the
mode of clock generation (internal, external or measured). The signal corresponds to
the status: Roller conveyor stop or reverse.
In the stop condition, the evaluation of the piece remains at the current test position, all
tracking systems are frozen and monitoring for the speed clock is deactivated. Light
barrier signals are not evaluated.
Tstop is not operative in the case of deactivated test mode operation
(Test.Mode.Manual [Eval; Sta] = off) and internal clock generation.
The polarity of Tstop can be selected with bit 3 of the parameter
Monitoring of the external motion clock
The external motion clock is only monitored if material is to be found under the light
barrier.
If Tstop is active, the external motion clock is no longer monitored.
Crdy1
The output signals test standby of the test electronics, i.e. internal test mode = on and
no fault has occurred.
The polarity of the signal Crdy1 can be selected with bit 4 of the parameter
Crdy2
The output signals test standby of the operator-control computer, i.e. ready to read and
save the test results.
The output is rendered inactive when the operator-control computer is switched off, the
cable connection is interrupted or the operating software is not running.
3-8 6.430/2.815/6.440
The polarity of the signal Crdy2 can be selected with bit 5 of the parameter
Sreq
When a test piece arrives at the sorting bench, the sorting result is requested via this
input. Subsequently, the sorting outputs are updated; only required if
Sorting.Control [Sort; Con] = on request.
The sorting request may be issued at the earliest when evaluation for this piece has
been completed (output Cend indicates this status); the activation must be complete
before the Cend signal of the next piece.
Minimum pulse width of Sreq is 10 ms. The polarity of the signal Sreq can be selected
with bit 0 of the parameter InterfaceX.Polarity [IO; Con] (X: 1...4 depending on
interface used).
Scut
Only for testing with subsequent cutting
(parameter Test.Procedure [Line; Con] = with cutting).
The input signal Scut provides information on a cutting operation at the position defined
in the parameter Cut.Position mm [Eval; Con].
Each signal change from OFF to ON generates a new piece in the test result report.
Minimum pulse width of Scut is 10 ms. The polarity of the signal Scut can be selected
with bit 1 of the parameter InterfaceX.Polarity [IO; Con] (X: 1...4 depending on
interface).
Sakn
This input signal serves in the case of testing with subsequent cutting to suppress all
cropped pieces which undershoot a minimum length and which are no longer supplied
to the downstream transport path (e.g. casement hinge cut-off in drawing processes;
parameters Test.Procedure [Line; Con] = with cutting and
Piece.Confirmation [Line; Con] = on). The distance from the sensor for the Sakn
signal to the cutting position corresponds to the minimum piece length.
Minimum pulse width of Sakn is 10 ms.
The polarity of the signal Sakn can be selected with bit 2 of the parameter
InterfaceX.Polarity [IO; Con] (X: 1...4 depending on interface used).
Copt
This input allows you to trigger a predefined command or a list of commands. The
command(s) can be set with the parameter Option.Command.Event1 [PE; Ser] for the
rising edge and with the parameter Option.Command.Event2 [PE; Ser] for the trailing
edge.
Minimum pulse width of Copt is 10 ms.
The polarity of the signal Copt can be selected with bit 2 of the parameter
6.430/2.815/6.440 3-9
S0, S1, S2
These 3 outputs supply the sorting information for each piece dependent on the
evaluation settings.
With event evaluation (Statistics [Eval; Con] = count), a 1-out-of-N coding is used,
activating one of the signals S2-S1-S0 in each case.
With statistical evaluation (Statistics [Eval; Con] = density), a binary coding is used
for the quality levels 1..8, extending from OFF-OFF-OFF to ON-ON-ON.
The polarity of the 3 signals S0, S1, S2 can be selected with bits 4, 5, 6 of the
parameter InterfaceX.Polarity [IO; Con] (X: 1...4 dependent on the interface used).
The parameter Sort.Pulse [Sort; Con] allows you to define the duration of signal
activation.
A value of 0 signifies static evaluation, i.e. the status of the outputs remains constant
until the output for the next piece.
Cend
This output indicates that the evaluation for the piece currently under test is fully
complete. The signal is activated at the instant at which the end of the test piece has
exceeded the evaluation position.
If Sorting.Control [Sort; Con] = at piece end, one of the sorting outputs S0, S1, S2 is
also activated simultaneously. The signal is deactivated again when the leading edge of
the next test piece has reached the evaluation position. This edge is recommended for
transmission of the piece identification if a material tracking system is to designate each
piece individually.
The polarity of the signal Cend can be selected with bit 7 of the parameter
Mstop
As long as Mstop is active, all marking outputs are deactivated. This input allows
marking of a flaw to be interrupted as long as line transport is stopped. When Mstop is
reset, the marking outputs are re-enabled immediately .
The polarity of the signal Mstop can be selected with bit 0 of the parameter
Gerr
In the standard configuration, this input is used to detect a fault on the magnetising unit.
In the case of applications without magnetisation, this input can also be used to handle
other faults.
The minimum pulse width of Gerr is 10 ms. The polarity of the signal Gerr can be
selected with bit 1 of the parameter InterfaceX.Polarity [IO; Con] (X: 1...4 depending
on interface used).
Ctest
The input signal Ctest is used to activate and deactivate the test mode via an external
signal. The signal is linked with the test mode defined by the user (parameter
Test.Mode.Manual [Eval; Sta] by a logical AND operation.
The test signals are only evaluated if the operating mode TEST or REF has been
selected and Ctest is activated.
3-10 6.430/2.815/6.440
The polarity of the signal Ctest can be selected with bit 2 of the parameter
Cerrq
Input signal Cerrq serves to confirm a fault signal. If Cerrq is activated, the fault signal
Cerr is cancelled and the message window of the dialog software closes.
This confirmation is independent of the solution of the problem which has triggered the
fault. It simply means that note has been taken of the fault signal.
Minimum pulse width of signal Cerrq is 10 ms. The polarity of the signal Cerrq can be
selected with bit 3 of the parameter InterfaceX [IO; Deb] (X: 1...4 depending on
interface used).
M1...M19
The output signals M1...M19 are direct control signals for the marking guns in order
either to mark the position of the flaws or to perform marking at the trailing end of the
piece in accordance with sorting class. In general, a longitudinal section which always
covers the flaw (including all system tolerances) is marked for each flaw.
The parameter Min.Marking.Duration [Mark; Con] can be used to select a minimum
time in order to ensure marking even for very short flaws.
The parameter Response.Time [Mark; Con] allows the delays of the marking guns to
be compensated by means of software (they are triggered earlier by an amount equal
to this time).
All marking outputs M1...M19 can be configured independently of one another. This
means that certain outputs can be used for flaw marking directly after the sensor
system, and other marking outputs can activate the marking guns further away (see
parameter Marking.Distance.GateX [Mark; Con]).
The polarity of the signals M1, M2, M3 can be selected with bits 4, 5 and 6 of the
parameter InterfaceX.Polarity [IO; Con] (X: 1...4 dependent on the interface used).
The polarity of the signals M4...M11 (or M12...M19) can be selected with bits 0 ... 7 of
the parameter InterfaceX.Polarity [IO; Con] (X: 1...4 depending on interface used).
6.430/2.815/6.440 3-11
Cerr
The output signal Cerr indicates a fault which has occurred somewhere in the test
electronics or the operator-control unit.
The signal remains active until it is either cancelled by a pulse at signal input Cerrq or
cancelled by a confirmation on the operator-control computer. If the fault persists, signal
Cerr is reactivated within a few seconds (≤ 2 s).
The polarity of the signal Cerr can be selected with bit 7 of the parameter
F0...F3
The input signals F0...F3 allow you to provide the instrument with additional test
information (e.g. the signals "too large" or "too small" from a circumference gauging
device).
A pulse at F0 indicates a flaw of flaw class 0; a pulse at F3 indicates a flaw of flaw class
3. The flaws are assigned to the test piece at a configurable line position, with an
assignment accuracy of 5 ms.
These flaws are handled in the same way as flaws originating from eddy current
evaluation. They lie on an event line of their own and can thus be distinguished in
respect of result display or marking from eddy-current testing.
Minimum pulse width and pulse pause are 10 ms in each case. The polarity of the
signals F0...F3 can be selected with bits 0...3 of the parameter
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3.2.5 Configuring I/O connections for line operation

The I/O connections are configured with the aid of the IO Control window:
Fig. 3 IO Control window
Within the IO Control window you assign ports to the interface modules (blocks). A port
is the combination of 8 thematically related connections.
You assign to the "IN" and "OUT" connections of a block the current polarity of these
connections with the help of the buttons Active = Current and Active = No Current.
Block 0
The system port is permanently assigned to block "0" by default.
You set the polarity for the "IN" and "OUT" connections in the area Polarity.
With the help of the button Refresh you can display the current values for Clockrate,
Gate and Tstop for all connections.
Block 1 ff.
"IN" connections
For the "IN" connections, you can determine the current signal level with the help of the
button Refresh.
You set the desired polarity in the area Polarity.
"OUT" connections
For the "OUT" connections, you can change the current signal level in the area
Test Level with the help of the buttons HIGH and LOW.
You set the desired polarity in the area Polarity.
Analog connection
For the analog connection, you can set the level in the field Analog Value (not shown
in the illustration). You can enter values between 0 and 255 in the field New Value,
whereby 0 corresponds to a voltage of 0 V and 255 to a voltage of 10 V.
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Note: A change of the port assignment to blocks will be valid after the next startup of
the Test Electronics.
3.2.5.1 Defined ports

The following ports are defined:
Port "IN" "OUT" Analog

connections connections connections
System Port (permanently 4 4 -
assigned to block "0")
Sorting Port 4 4 -
Combi Port 4 4 -
Marking Port M4...M11 - 8 -
Marking Port M12...M19 - 8 -
Param Port 1 to 4 4 4 1
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3.3 Installing/updating the software, customising the language

3.3.1 Installing/updating the software
Note: The original CD is housed in a pocket behind the PC cover plate.
The setup programme allows:

• the new installation of the DEFECTOTEST DS2000 software
• the updating of already installed DEFECTOTEST DS2000 software
• the deinstallation of installed DEFECTOTEST DS2000 software
Preconditions
New installation
Operating system Windows NT.
No DEFECTOTEST DS2000 software is installed.
There are no data that can be overwritten in the installation directory.
Update
DEFECTOTEST DS2000 software Version 1.02 or later is installed (older
versions must be deinstalled).
Related testing electronics is accessible (connected and activated).
Deinstallation
DEFECTOTEST DS2000 software is installed.
During the installation process, you are asked by the setup programme which of the
above-mentioned options you wish to carry out.
You can choose between the language versions German and English during the setup.
Furthermore, you can install an "Auto Logon", which automatically performs the logon
while the operating system is powered up.
Basic procedure:
Save of the databases before updating.
This is recommended especially, if the library has important settings stored or the
stored test results are of importance. Copy out of the directory Dtest\Te\Data the files
Setting.db, Msgsvr.db and Result.db to any other directory. If the automatic import of
the database entries doesn't succeed during the update, the datasets of the saved files
can be imported manually. Contact the IFR remote service in such a case.
Insert the DEFECTOTEST DS2000 CD in the CD-ROM drive.
Run the programme "Setup.exe" on the DEFECTOTEST DS2000 CD.
Follow the instructions of the installation programme.
In the case of new installation and update, a message indicating the successful
installation of the DEFECTOTEST DS2000 software is displayed at the end of the
installation process.
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3.3.2 Deactivating Auto Logon

You can deactivate the "Auto Logon", which you have installed during the software
installation, in a simple manner.
"Auto Logon" is active.
If you only wish to deactivate the "Auto Logon" temporarily, press the "shift" key during the
start of Windows.
If you wish to deactivate the "Auto Logon" permanently, start the programme
"Autologon.exe" from the Start menu of the DEFECTOTEST DS2000 software or from the
Windows Desktop.
3.3.3 Starting the DEFECTOTEST DS2000 software

Select the command DTest in the programme group DS2000.
− or −
Click the button DTest on the Desktop.
The DEFECTOTEST DS2000 software is started. The graphical user interface of the
software appears.
3.3.4 Setting the language of the software

During the setup, you can choose between the language versions German and English.
You can set other language versions at a later stage through the import of a translation
table. The translation table is provided as a Microsoft Access file "Translation.mdb".
This file can be found on the DEFECTOTEST DS2000 CD in the language-specific
folder (e.g. the folder "German" or "French").
Import of a current translation table

If you wish to import a translation table of the current software version, perform the
following steps:
DEFECTOTEST DS2000 software is running.
Copy file Translation.mdb from the CD into the directory
"Ds2000\Dtest\Doc".
Select menu command Configuration>Import Translation.
The Translation window opens.
Confirm with OK.
The automatic language import is started. − The language import can take several
minutes.
End the DEFECTOTEST DS2000 software.
Restart the DEFECTOTEST DS2000 software.
The terms of the software are displayed in the language imported.
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Import of an older translation table

New terms (e.g. menu commands) may be added as a result of a software update. If
you wish to use a translation table from an older software version for the language
import, proceed as follows:
Perform the steps under Import of a current translation table.
During the import procedure, the software recognises newly-added terms that do not exist in
the old translation table. The new terms are inserted into the translation table in the original
language.
Add the translations of the new terms in the translation table.
Look in the readme-file for parameters that have changed in their values in respect to former
versions, to correct the translation in such cases.
Repeat the import of the translation table.
3.3.5 Adjustments after a software update

In the event of a software update, the results database, the settings and the current
configuration are automatically adopted into the new software version. Nevertheless, a
number of different parameters must be set manually. The parameters that must be set
for the current software version are to be found in the Readme file.
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DEFECTOTEST DS2000 User Manual Operation
This chapter familiarises you with the basic functions and the operator-control structure
of the DEFECTOTEST DS graphical user interface.
You will learn how to set up the testing instrument for the test material and will get to
know the evaluation operating modes.
A major part of this chapter is concerned with the adjustment of the software to the
testing environment.
At the end of the chapter, you will find two checklists relating to the size change for a
CIRCOGRAPH and a DEFECTOMAT sensor system.
4 Operation
4.1 Basic functions of the GUI

4.1.1 Start procedure
Both the test electronics and the operator-control computer are switched on at the
mains switch. The test electronics operates in real time and is responsible, amongst
other things, for excitation of the sensors and conditioning the signals as well as for
evaluation of the incoming test results and controlling the testing line. When the test
electronics is switched on, a self-test of all modules is conducted and the software
modules are initialised. The test electronics is then immediately ready for testing with
the setting which obtained before it was switched off the last time.
Note: The test electronics operates independently of the operator-control computer.
This means that it tests even if the operator-control program in the start phase is not yet
started or is switched off during Test operating mode.
The operator-control computer forms the interface to the test instrument. Besides
display of the test results, it also provides help functions for instrument setting and
options for archiving and logging. The operator-control computer can be connected at
any time to test electronics during operation without disturbing testing.
When the operator-control computer is switched on, the start window of the
DEFECTOTEST DS2000 software is opened at the centre of the screen, and you can
track whether the start procedure is running correctly in the line at the bottom.
Fig. 4 Start window of the DEFECTOTEST DS2000 software
This is supplemented by the display in the Windows task bar. When Startup is
displayed, the connections to the message servers, result servers and setting servers
are established consecutively. Should an error occur during the start phase, this is
displayed in plain text.
After the start procedure is complete, you will see the graphical user interface described
in Section 4.1.3.
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Operation DEFECTOTEST DS2000 User Manual
4.1.2 Ending the DEFECTOTEST DS2000 software

You end the DEFECTOTEST DS2000 software with the menu command File>Exit or
with the toolbar button Setting-Exit. Switch off the operator-control computer with the
power switch only when the software has powered down completely (no entries in the
task bar at the bottom of the screen).
The File command File>Close Dialog only closes the GUI of the
DEFECTOTEST DS2000 software. The server processes to save the test results
continue to run in this case. The same applies if the X-button in the title bar of the
DEFECTOTEST-software is used. To stop the server processes start again the
DEFECTOTEST-software and use now the command EXIT.
Note: In case of option Foerster-Net a secondary dialog (in opposite to the primary
dialog) cannot close the server processes. Only the command >Close Dialog is offered
and the toolbar button EXIT just closes the GUI, because the primary dialog is
responsible for the servers.
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4.1.3 Elements of the graphical user interface
4.1.3.1 GUI of DEFECTOTEST DS2000

When the instrument is switched on and the system has booted up, you will see the
DEFECTOTESTDS2000 user interface which displays all information. This interface
is essentially subdivided into four sub-areas.
Fig. 5 DEFECTOTESTDS 2000 GUI
At the top, you will find the menu bar familiar from other Windows applications.
Beneath this is the status bar which supplies current information on the status of the
testing line and the status of the individual sensor systems. Clicking on the
corresponding icons opens additional windows which, for example, allow you to change
the operating modes of individual line units or to display the incoming signals of the
sensor systems. On the right-hand side of the status bar, you can display your own
customised logo (see Section 4.4.14).
The central area of the GUI is the Result field, which displays the test information
tailored to meet your own needs with the aid of so-called layouts.
The toolbar is located at the right-hand side. You can use the toolbar to start all
standard functions, such as printing out reports, and also to call procedures and
windows for setting the test instrument to a new material. In a similar manner to the
pop-up menus of the Windows menu bar, one or more windows which allow a
differentiated selection of commands is or are opened when you choose one of the
tools.
4.1.3.2 Windows menu bar

The Windows menu bar contains six pop-up menus with the following contents:
• File: Calling up print commands, quitting the programme, closing the
DEFECTOTEST DS2000 GUI
• Setup: Setting the test instrument, editing test reports and calling up adjustment
procedures
• View: Selection of the possible Result windows and calling up further screen
contents
• Window: Selection of how the Result windows are arranged
• Configuration: Customising the language of the software
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• ?: Online Help, subdivided on the basis of topics and key words
Tip: The underlined letter in the menu names signifies that you can open the menu not
only with the mouse, but also with the key combination [Alt]+ [underlined letter]. If you
keep the key [Alt] pressed after opening the menu, you can call up a command in the
menu with the key [underlined letter in the command].
4.1.3.3 Status bar

The statuses of the testing line units (line speed, light barrier signals, marking signals,
sorting signals...) and sensor systems (Clear-for-Test signals...) are displayed in the
status bar. A change of status in a testing line unit is indicated by a change in the
assigned icon. The individual icons are used to call up further windows in which
corresponding parameters can be set: such a window is opened up by clicking once on
the icon.
The structure of the status bar, i.e. the number of icons, depends on the configuration
setting. If for instance marking equipment is configured as 'none', the MARKING icon
will disappear.
Every time the configuration was being changed with influences on the status bar, the
dialog must be closed and opened again, to get a complete rebuild of the status bar.
Designation of the icon areas

Individual areas can be distinguished within the icons. In this chapter, the major areas
of the icons are designated as follows:
Fig. 6 Designation of the icon areas
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SETUP, REF, TEST (icon for test status)
The first icon in the status bar to the right of the Foerster logo displays the current test
status. The operating mode (SETUP, REF or TEST) is displayed as text in the title bar.
The line status is indicated by the colour and the symbol in the line bar.
The number after K in the foot bar shows the current key level.
Operating modes
SETUP:
Setup operation mode. No evaluation of the test results.
REF:
Trial operation mode with reference (standard) piece. Evaluation of the test results
without logging.
TEST:
Normal test operation. Evaluation of the test results with logging.
Line status
The grey line bar means that there is a part in the light barrier. If there is no part in the
light barrier, the line bar is black. The arrow in the line bar indicates that the testing has
been released by the line.
An icon with stop sign indicates that the test line is not ready for operation (see input
signal "Ctest", Section 3.2.4.2).
Following a click on the test status icon, a window opens in which the operating mode
(SETUP, REF or TEST) can be selected manually.
LINE CLOCK
This icon indicates the current speed of the testing line. In the illustrated example, the
speed is 2 m/s. The line bar is grey if the current speed lies within the tolerance limits
which are defined by the parameters Min.Speed [Line; Sta] and Max.Speed
[Line; Sta]. Otherwise, the line bar is black.
When you click on the LINE CLOCK button, a window opens allowing you to enter a
value for the internal speed.
SENSOR SYSTEMS
For every sensor system there is an own status field; e.g. the CIRCOGRAPH DS 6.430
with DEFECTOMAT channel has a status field CGRAPH and a status field DMAT.
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This icon indicates that the sensor system is a DEFECTOMAT. The name in the title
bar is set to D'MAT by default, but can be renamed as required (parameter
System.Name [Sys; Con]).
A small square in the head line indicates the status of the absolute channel (if equiped):
bright green means ON, black means OFF.
This icon indicates that the sensor system is a CIRCOGRAPH. The name in the title bar
is set to C'GRAPH by default, but can be renamed as required (parameter
System.Name [Sys; Con]).
A small square in the head line indicates the status of the clearance channel: bright
green means ON, black means OFF.
In case of CIRCOGRAPH the current rotation speed of the testing head is displayed in
the foot bar. In the current example, this is 9000 r.p.m.. The line bar is grey if the
current rotational speed lies in the tolerance range around the scheduled rotational
speed. Otherwise, it is coloured black.
The green title bar indicates that the sensor system is switched on. An inactive sensor
system has a grey title bar.
Each of these icons can be used to open a window allowing you to activate and
deactivate the sensor system and allowing you to control the system monitoring (noise
monitoring).
CHANNELS
The bright green squares in the title bar indicate active channels - black squares mean
inactive channels. In this example the third of four channels is switched off. White
squares mean active channels but with noise monitoring switched off.
A signal icon with grey line bar indicates that the signal gate is enabled. – The part in
the sensor system is undergoing active testing.
A signal icon with black line bar indicates the signal gate has currently not been
enabled. This means, for example, that no material or untested ends are currently
moving through the sensor system.
The letter F and number in the foot bar indicates that a flaw has been detected on the
test piece. The flaw class ("1", "2" or "3") is displayed by the number. For example, F1
means flaw class "1".
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Clicking on the signal icon assigned to the sensor system opens an oscilloscope for the
corresponding sensor system, which displays the filtered test signals directly.
MARKING
A MARKING icon with green title bar indicates that marking is not active.
A MARKING with letter M and number in the foot bar indicates that marking is currently
active. The marking class is displayed by the number. In the current example, this is the
marking class M2.
SORTING
A SORTING icon with green title bar indicates that the sorting operation is activated.
A SORTING icon with letter S and number in the foot bar indicates that the sorting gate
Sx is currently active, with x being the number of the sorting class. At the same time
one of the three arrows is highlighted (to right in case of S0, upwards in case of S1,
downwards in case of S2).
If the size of the sorting FIFO is greater 1 (see parameter Sorting.FIFO.Length) the
whole contents of the FIFO-memory is displayed in the foot bar instead of the current
sorting gate. (If there is not enough space in the foot bar, the sequence of sorting
informations will continue in a head line just below the titel bar.)
With a click on the SORTING icon a window opens that enables to set the contents of
the sorting FIFO. You can erase sorting informations out of the FIFO step by step and
insert new sorting informations.
Note: If a piece is being taken away physically from the line just between the sensor
system and the sorting gate, it is mandatory to adapt the contents of the sorting FIFO.
Unless the sorting sequence will be wrong from now on.
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MESSAGE, WARNING, ERROR
The MESSAGE icon indicates that the test sequence is currently running free of errors.
This icon brings your attention to warning information by changing the title bar from
MESSAGE to WARNING. The type of warning is already indicated in the icon.
This icon brings your attention to a system error by changing the title bar from
MESSAGE to ERROR. The type of error is already indicated in the icon. Error
messages are distinguished from other messages by virtue of their red colour.
Clicking on the message opens the Result Display window. In addition to the category
of the message, this displays the time the message occurred, the name of the
message, other texts for the error diagnosis and possible remedial action.
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4.1.3.4 Result field

The Result field displays the results of the conducted test. The contents of the
selectable Result windows have a hierarchical structure.
Fig. 7 Hierarchical structure of the Result window contents
Starting from a list of test requests, it is possible to separate the test results down to a
single flaw. There is always a reference between all open windows. This means that if a
new test report is selected, the first test piece is displayed automatically. Conversely, if
a test piece is selected, the corresponding test report and the first flaw of the test piece
are displayed.
If you double-click on the window Test Result, a pop-up window opens which classifies
the checksums according to evaluation tracks (channels) instead of sorting classes.
A double-click on the window Piece Image opens a pop-up window that lists all detailed
data of the current defect. These are as follows:
• Maximum amplitude
• Phase angle
• Position measured from the test piece's head
• Length, i.e. extend of the flaw in transport direction
• Flaw class
• Event line (evaluation track resp. channel)
• Valuation, i.e. sorting class bec.of this defect
After the DEFECTOTEST installation there is no request defined and the result
windows are all empty. In this case select in the toolbar Setting – Request. Put in a
name for the request and select 'Start Now'. The first entry will be made into the result
database and the result windows will start activation.
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4.1.3.5 Toolbar
The bar at the right-hand side of the GUI is used to call frequently used commands.
When a button is selected, a floating button bar is opened, offering a differentiated
selection of actions. The buttons of the toolbar are adapted during installation,
depending on the existing instruments and the required application. The buttons are so
designed to be also suitable for a touch screen.
Fig. 8 Floating button bars (left) of the toolbar (right)
4.1.4 Options (additional software functions)

Your DEFECTOTEST DS2000 software may contain additional functions (options) in
addition to the basic functions. You can order options with the initial delivery of your
instrument or purchase them at a later date. In the case of a subsequent purchase, the
options are enabled within the already installed software.
In your DEFECTOTEST DS2000 software, buttons that belong to disabled options
are shown in grey.
The following options are available:
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4.1.4.1 Result Investigation

• Graphical research mode on the basis of the stored results with a display of every
part and all flaws
• Printout of the stored results at all levels of detail
• Copying of individual test requests into a Microsoft Access or Sybase database
for storage or subsequent evaluation
• Possible from every PC in the network through the FoersterNet option
4.1.4.2 Tail Marking

• Activation of max. 3 marking guns to mark the test piece ends depending on the
sorting result, independent of and additional to the standard local flaw marking
• Selectable marking lengths and position measured from the trailing end of the test
piece
• Compensation of the response delay
• Possible through the same marking guns in combination with the flaw marking
4.1.4.3 Circumferential Marking

• Distinguishing of the flaw position on the circumference of the part
• Up to 4500 r.p.m. 8 circumferential segments
• Up to 9000 r.p.m. 4 circumferential segments
• Segments are distinguished and displayed in the flaw evaluation, and can be
individually marked (marking classification dependent on segment and flaw type).
• Including 8 additional marking connections with screw-type terminals for 24 VDC
power supply on the rear panel of the test electronics, floating
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4.1.4.4 Test Report Design

• The layout of the test protocol can be designed according to your own conceptions.
• All test results, setup data and invariable texts can be used.
• Font size and format can be freely selected
• Report templates can be saved and direct a report printout at any point in time.
4.1.4.5 Foerster Net

• 5 software licences for the parallel operation of the test electronics at several
operating sites (PCs) via an Ethernet connection
• Configuration and operation of each site with full functional access, independent of
the other operating sites
• Setup operation can be delegated to any PC in the network
• A connection to every TCP/IP-capable network (e.g. the Internet) can be established
via Gateway.
4.1.4.6 Software Interface

• Calling up of operating functions through other programmes via TCP telegrams
• All setup parameters can be read individually or in groups and can be individually
written.
• Addressing of the internal setting library through remote call-ups
• Information of new test results in the results database to synchronise the adoption of
results
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4.1.5 Selection and arrangement of Result windows in the Result field

(layout)
4.1.5.1 Creating a layout

If Result windows are already present, these can be closed by choosing Window in the
top menu bar and then clicking on Close All.
You can configure the assignment of the Result field as you wish by calling menu item
View once or several times and selecting one of the Result windows below.
Test Report List

This displays all stored test requests. Other data can be displayed, besides a name
(Identification) and the date of the request.
Test Parameter
The configurable parameter list of the test setting is specified, corresponding to the
selected test request. The file name of the test setting is displayed under Setup Name.
Test Result
Overall result list of the test request. The flaw totals are specified, overall and ordered
by sorting classes; the latter also in the form of a pie chart.
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Position Totals
Histogram of the location-dependent flaw distribution of all test pieces referred to the
leading edge of the test piece. You can determine here whether flaw accumulations
occur for specific positions on the test pieces. This is a possibility of monitoring
production conditions.
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Piece Sequence
Test result display of each individual test piece by sorting classes (colour assignment
and height of the bar) in the form of a bar chart.
Piece Results
Position display of the flaws on each individual test piece with additional specification of
the sorting class (schematic representation of the test pieces) and length of the tested
parts. If warning signs appear right to the sorting symbol, there was an instrument
failure during the test of this piece, so the test results are uncertain.
Piece Image
Display of the current signal amplitudes for all sensors or segments of the selected
sensor system and the true-to-length position display of the flaws for the piece currently
undergoing testing in the so-called evaluation tracks.
Defect Impedance
Display of the characteristics of one or more selected flaws in the impedance plane in
relation to the selected thresholds – as a vector, Y-component or sector. The peak
values and phases of the flaws are displayed.
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You can obtain a list of all Result windows mapped on the Result field under Window
by clicking on Window List.
Menu item Window provides you with the following arrangement options, allowing you
to arrange the Result windows in line with your own requirements:
• Cascade
• Tile Horizontal
• Tile Vertical
• Minimise All
In addition, the windows can be moved as required with the mouse by dragging the title
bar and resized as required with the mouse by dragging the borders.
The selection of Result windows together with the selected arrangement is referred to
as layout and can be saved as described below.
4.1.5.2 Saving a layout

In order to save a layout which has been adapted to the testing task, choose command
Save Layouts in menu item Window and stipulate under which of the four definable
layouts the current arrangement is to be saved.
4.1.5.3 Retrieving a layout

There are two ways of retrieving a saved layout:
First, you can do this using menu item View and command Select Layout. This lists all
archived layouts in a further sub-menu; you can choose one of these, which is then
displayed in the Result field.
Secondly, and more simply, you can retrieve a layout using the toolbar at the right. After
you click on the button Result, a transverse window is opened that also lists all saved
layouts. When you click on the corresponding button, the layout is displayed in the
Result field.
4.1.5.4 Structure of the Result window Piece Image

The complete information regarding the flaw distribution on a test piece or a section
(defined by Section.Length [Eval; Con]) is conveyed by the Result window Piece
Image. The term section is understood to be the length of a section of the entire test
piece, which is subjected to an evaluation in its own right.
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The Result window Piece Image essentially comprises two parts. The current signal
amplitude characteristics of the test channels are displayed in the top half whilst the so-
called evaluation tracks are displayed in the bottom half. In contrast to the signal
amplitude characteristics, only the flaw events are displayed on the latter, i.e.
evaluation on the basis of the selected evaluation mode has already been performed in
this case. Flaw events are distinguished by corresponding shading or colouring on the
basis of flaw classes F1, F2 and F3. The names are displayed to the right next to the
signal characteristics or evaluation tracks. These refer, for instance, to a channel or
segment number and the relevant flaw sector.
4.1.5.5 Numerical Display of the Test Results

When clicking on a result window that has already the focus a result window with
numerical data opens, that is applied to the base result window.
Numeric result windows are Test Result Event Types, Piece numeric and Defect
numeric.
The numeric windows show the currently selected datasets of the result database. It is
the same information that is used for building the grafic result display.
These windows are of temporary kind just for looking at the detailed informations of a
test result. The numeric result windows always lie in front of the normal result windows.
They do not belong to the saved layouts. If a new layout is selected, all numeric result
windows close automatically.
The numeric result windows can remain open during active testing and during
navigations, and they will display the data to the current selection of results.
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4.1.6 Offline mode of the result windows (only with option Result-
Investigation)
4.1.6.1 Activating the Offline mode

Normally the result windows show the current testing, i.e. the currently tested piece
resp. the pieces just before. With option Result-Investigation the former results of the
past can be viewed.
By use of the button Result it is possible to switch to offline mode (button right of
Layout 4):
The result windows will not update to new test pieces; but now every piece in the result
database can be selected.
The fact that there is no display of the current testing is marked by the additional term
'OFFLINE' in the titel bars of all result windows.
Note: The storing of results into the result database goes on, i.e. the offline mode can
be used during an active testing without disturbing the result storage.
To switch back to the display of the current testing use again the button Result –
Offline.
4.1.6.2 Navigating step by step

In the offline mode the navigation box appears always on top of all result windows:
By use of the navigation box it is possible to find result informations step by step or by
selection.
The left arrow button steps back to older test results, the right arrow button to newer
test results.
The kind of step depends on the result window that has currently the focus.
If one of the windows Test Report List, Test Result or Position Totals was clicked, the
arrows of the navigation box step backwards resp. forwards by one test request.
If the last click was in a window that shows single test pieces (Piece Sequence, Piece
Results), the navigation box steps backwards resp. forwards by one test piece.
If window Piece Image or Defect Impedance has the focus, the navigation box steps
backwards resp. forwards by one defect.
Independent of the kind of step all result windows are related to each other. A selected
defect is on the currently selected piece, and this piece belongs to the selected test
request. The selection is highlighted in every result window with yellow color.
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If you step from one piece to the next, and this piece belongs to the following test
request, the windows Test Report List, Test Result and Position Totals change their
display automatically to the new request. In the windows Piece Image and Defect
Impedance the selection jumps to the first defect of the newly selected piece.
For finding a certain test information following operation sequence is recommended:
Focus on window Test Report List
With the navigation box step to the desired test request – the summarized result is
given in the window Test Result and the first piece of this request is selected
Focus on window Piece Results
With the navigation box step to the piece of interest – the sorting result is displayed in
window Piece Results and the first defect of this piece is selected
Focus on window Piece Image
With the navigation box select every defect watching the position on the piece and the
position in the impedance plane.
4.1.6.3 Navigating by Selection

When using the button Select on the navigation box the window Navigate Selection
opens:
In this window you can directly input the test request and test piece of interest. The
piece can be identified either by the piece ident or by the testing time.
Note: The piece ident can be defined during the test individually for every piece; use
menue function File – New Piece Ident. As long as no setting occurs an upcounting
identification is applied automatically.
When setting a testing time, the piece that is nearest to this testing time will be
selected.
Instead of direct input, that is searched in the database when leaving the text box, it is
also possible to use button Change. It opens a list box with all test requests resp. with
all test pieces resp. a calendar. These list boxes are an alternative to the direct input.
When leaving the window Navigate Selection with OK, the result windows take the new
selection. When leaving with Cancel, the selection of the result windows remains as
being before opening Navigate Selection.
6.430/2.815/6.440 4-19
4.1.6.4 Interpretation of the result window displays

Relations of the selections
The current selection is marked with yellow color in every result window. The selections
of all result windows are related to each other according to following scheme:
selected defect lies on the selected piece belongs to the selected test request
selected test request contains the selected piece has the selected defect
Navigating defective pieces
If the focus is on window Piece Image or Defect Impedance, the navigation box arrows
step backwards and forwards by one defect. In this case you will jump over pieces
without defects, i.e. only defective pieces will be selected.
Navigating all pieces
If the focus is on window Piece Results or Piece Sequence, the navigation box arrows
step backwards and forwards by one piece. In this case all pieces including the
defectless will be displayed. If a piece has no defects, there will be no selection in the
windows Piece Image and Defect Impedance.
Navigating on pieces that were tested long ago
If pieces are selected with testing times long ago, it may happen, that the signal
amplitudes or even the defects for that piece are missing. The result windows show the
remark 'Data erased!' in such cases.
The reason is that the maximum number of entries in every table of the result database
is monitored. This avoids unlimited increasing of the result database. When a table has
reached its limit, every new entry will overwrite the oldest entry of the table. As the table
with the signal amplitudes grows most quickly, old data of this table will be overwritten
first. Depending on the number of defects the defect table will overwrite sooner or later
its oldest entries. The piece table and the test request table, that contain the most
important test information, grows very slowly, so these tables cover the longest period
of time in the past.
Note: If you want to avoid any loss of result information, it is necessary to make saves
of the result database in certain time periods - use program Save Result DS for this job.
Navigating onto test requests or pieces with a lot of defects
If there are may defects in a test request or on a single piece (> 10000), the database
access and the display will take much time. In these cases the DEFECTOTEST
software changes to statistical mode automatically and displays a respresentative sub
quantity of about 10000 defects in the windows Positon Totals and Defect Impedance.
In the result windows you will find the mark 'statistical', which means that there are
more defects than displayed and not every single defect was taken for the display.
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4.1.7 Key levels (access control)

The DEFECTOTEST DS2000 software gives you the facility to exclude certain
functions for different user groups. Unavailable functions (buttons) are shown in grey by
the software.
The access to software functions is regulated by means of the Key window.
Key window
To open the Key window:
(i) Menu command Setup>Key
− or −
(ii) Key combination
The Key window contains the following areas:
Operator Name
A freely-chosen name, which is saved along with the instrument setting, is entered
here.
Key Level
The key levels are set here and passwords for the key levels can be changed.
On delivery of the instrument or after a new installation of the DEFECTOTEST
DS2000 software, the password for the key level Service is "IFR". No passwords have
been allocated for the remaining levels.
6.430/2.815/6.440 4-21
Should you forget your password for the key level 5 (Service), contact the INSTITUT
DR. FOERSTER Servicing Department.
Functions of the key levels

According to the specific key level, you have access to various functions for different
purposes:
Key level Functional scope/application Typical operator

Locked No intervention in the test Unsupervised instrument
(Level 0) sequence
Test Conducting of test sequence Production staff
(Level 1)
Reduced Test operation according to preset Tester with limited setting
(Level 2) parameters facility
Base Preparatory settings, administration Quality control lab
(Level 3) of the settings library
Config Initial commissioning in the line Trained operator
(Level 4) INSTITUT DR. FOERSTER
Servicing Dept.
Service Full functions for error diagnosis INSTITUT DR. FOERSTER
(Level 5) and hardware modification staff
The current key level is displayed in the status bar below on the icon for Operating
mode and Test status (SETUP, REF or TEST) (number after K).
Note: You can only open the Parameter List window with key level ≥ 3. However, you
can configure any selection of parameters in the Quick window, which are then still
accessible from key level 2 (see Section 4.1.7.1).
Setting the key level

Click on the desired key level.
If a password has been allocated for the desired key level, you are asked to enter the
password.
Enter password.
Confirm with OK.
The key level is set.
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Changing the password (old password is known)

Click on the desired key level.
If necessary, enter current password.
Click on Change Passwd.
You are asked to enter and confirm a new password.
Enter new password twice.
Confirm with OK.
Changing the password (old password has been forgotten)

If you have forgotten a password for a specific level, you can change this password
from a higher key level. If you have forgotten your password for the highest key level 5
(Service), contact the INSTITUT DR. FOERSTER Servicing Department.
Set a higher key level.
Click on the lower key level desired. There is no password required for decreasing the key
level.
Click on Change Passwd.
You are asked to enter and confirm a new password.
Enter new password twice.
Confirm with OK.
Note
To enter a key level the password of the desired key level and the passwords of all
higher key levels will be accepted. This allows for several operators to have different
passwords without knowing the password of the colleagues.
DlgMode
The Dialog mode is required in the case of several operating stations.
Your instrument cannot be operated from several operating stations simultaneously.
In the Dialog mode, you set whether your computer is the operator-control computer
(Primary) or not (Secondary). If your computer is not the operator-control computer,
the setting parameters of the test instrument are not changable. Other functions are
also possible under Secondary.
If an operator-control computer "A" is already connected with the test electronics, the
attempt of another computer "B" to switch to Primary is rejected with a reference to the
primary computer "A". A change of computer "B" to Primary is possible after the
computer "A" has been switched to Secondary.
The selected key level is valid for the Primary computer only and passes to another
computer, when die Primary rights are passed. In dialog mode Secondary a fixed key
level applies, that can be changed individually on every computer in the file Dialog.ini
(section [system] 'SecondaryKeyLevel').
6.430/2.815/6.440 4-23
4.1.8 Setting the test instrument
4.1.8.1 Quick window

An operating window can be opened either using the Windows menu bar or using the
toolbar in order to change the test instrument parameters. In the first case, choose
command Quick in menu item Setup. In the second case, click on the following button
combination.
In both cases, a window opens: it does not have to look exactly like the following
illustration, but may be configured by the user to meet his own requirements.
Fig. 9 Input window for the instrument parameters
In order to keep the number of parameters manageable, only the parameters used
frequently are offered. The Quick window can be configured, i.e. the parameters
displayed can be selected, using the parameter list (see Section 4.1.7.2).
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Note: Always give preference to using the Quick window rather than the parameter list
if you are carrying out routine changes to a few parameters. The parameter list supplies
the entire set of all parameters which can be set and is thus less easy to use.
All windows mentioned are closed either with OK or Cancel. In the first case, the new
settings are accepted and, in the second case, the new settings are rejected
immediately.
If you click on the Help button, a Help window is opened, providing assistance and
background information on the current window.
6.430/2.815/6.440 4-25
4.1.8.2 Parameter list

The number of parameters which are displayed in the Quick window and which can be
changed there should be restricted to the parameters required frequently (whereby you
can omit any number of parameters). This ensures clarity of the parameters relevant to
normal Test operating mode.
However, there are certain situations in which it is practical to edit the entire set of
parameters.
• Adding or removing parameters in the Quick window for a newly required application
• Installing a new test instrument or changing installation of a test instrument in a
testing line
• Fault-finding by the Servicing Department
You can access all parameters by opening Setup in the Windows menu bar and
choosing menu item Parameter List. The window Parameter List is then displayed as
in Fig. 11. You can also open the parameter list window by means of the key
combination:
Fig. 10 Parameter List window
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Display of the parameters

As in the Quick window, the individual parameters and their current values are
displayed on the right-hand side of the window. The parameters are sorted thematically
by default. If you click on the header Parameter, the parameters are displayed in
alphabetical order.
Structure of the parameter list

There is a directory structure under which the parameters are arranged on the left-hand
side. There are three levels. At the first level, the parameters are arranged by function
units (e.g. testing line, sensor system, marking, sorting etc.). The second level exists
only for the sensor systems. Here, a further distinction is made on the basis of general
system settings, settings for the individual channels and setting of the evaluation
parameters. The parameters for the individual channels are then saved at the third and
lowest level.
Designation of the parameters in the text
In order to facilitate the finding of the parameters in the parameter list, the directory in
which the parameter is to be found is also given within square brackets in the text.
Text example:
The minimum defect distance is determined by the parameter

Min.Defect.Distance [Eval; Con].
They only take effect if the operating mode Filter [DifGen; Sta] = Test is
activated.
The first, boldly highlighted term within the brackets designates the directory in which
the parameter is to be found. The subsequent abbreviation designates the so-called
parameter class. – The parameters are divided into 4 classes:
• Standard (Sta)
• Configuration (Con)
• Service (Ser)
• Debug (Deb)
Parameters of the class Standard are always displayed. Parameters of the other
classes are only displayed if they are added in the configuration window
Parameter List Configuration of the Parameter List window (see Sections
"Parameters for changing the default instrument behaviour" and "Parameters for
servicing purposes and for troubleshooting" in this sub-chapter).
The structure of the parameter list (within a sensor system) is essentially dependent on
the physical configuration of the sensor system. On the other hand, the parameters
No.Sectors [Sys; Sta] (number of sectors to be evaluated) and
Channel.Mode [Sys; Con] influence the appearance of the parameter list.
Each sensor system always contains the directories Sys, DifGen, DifSpec and
Analyses.
The DEFECTOMAT sensor system can also contain the directory Abs (depends on the
instrument equipment).
6.430/2.815/6.440 4-27
The CIRCOGRAPH sensor system also contains the directory Clr.

• Sys:
Parameters which apply generally to the sensor system and which relate to general
function. This directory is always present only once for the corresponding sensor
system.
• DifGen:
Parameters which relate to the test setting of one or more channels or segments
(e.g. frequency). The number of subdirectories depends solely on parameter
Channel.Mode [Sys; Con]. In the case of the setting independent, the number of
subdirectories results from the number of channels. Otherwise, only one directory
is present.
Note: The setting independent is usual in the case of test channels (unlike
circumferential segments).
• DifSpec:
Parameters which always refer to individual channels (switching on and off,
corrections to the gain and phase)
• Analyses:
Parameters which relate to the evaluation of the signal (e.g. flaw thresholds). The
number of subdirectories depends on the parameters Channel.Mode [Sys; Con]
and No.Sectors [Sys; Sta]. In the case of setting independent, the number of
subdirectories results from the number of channels multiplied by the number of
sectors. Otherwise, there are only as many subdirectories as there are sectors
defined. In the case of a DEFECTOMAT sensor system, a further subdirectory Abs
can exist.
Only DEFECTOMAT sensor system
• Abs:
Parameters relating to the setting of the absolute channel (e.g. zero compensation,
gain). It is always present once if an absolute channel exists.
Only CIRCOGRAPH sensor system
• Clr:
Parameters relating to the setting of the clearance channel (e.g. switching on and
off, zero compensation).
The operator can influence the structure of the parameter list only by the number of
sectors (No.Sectors [Sys; Sta]. This relates merely to the number of subdirectories in
directory Analyses. This is where the relevant flaw thresholds (FX.Threshold %
[Analyse; Sta]), evaluation lengths (SFS.Length.FX [Analyse; Sta]) etc. can be set
for each defined sector. The sector names are issued by the parameter
Sector.Names [Sys; Sta]. If there is more than one sector name, these are to be
separated by commas.
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Setting parameters
Choosing the Change... button in the Parameter List window opens a further window
which allows you to make additional settings for the selected parameter, besides
entering a value directly.
In order to do this, click on the Advanced button, after which a tabs page (Fig. 12)
opens. Only the Flags tab is important for the operator and, within this tab, only Quick,
Lib/Directory and Result/ParDoc.
• The Quick flag is set in order to include the corresponding parameter in the Quick
window.
• The Lib/Directory flag can then be marked if the entries of the corresponding
parameter are to be displayed in the overview of the setting library.
• The Result/ParDoc flag is marked in order to display the current value of the
parameter in the Test Parameter Result window.
Fig. 11 Tabs page with parameter properties (here: Flags tab)
The buttons in the window of the parameter list are identical to those of the Quick list.
The procedures described in Section 4.1.7.1 are therefore identical.
Parameters for changing the default instrument behaviour

Other parameters which generally need to be called only once are required for
installation of the test instrument in a testing line. These can be accessed via the
Parameter List Configuration window. The Parameter List Configuration window is
opened via the Configuration button (triangular icon in the right-hand corner of the
Parameter List window).
Note: You can only open the Parameter List Configuration window with key level 4 or
higher. In this key level, additional configuration parameters can be accessed. All
available parameters can only be accessed in key level 5.
6.430/2.815/6.440 4-29
Fig. 12 Parameter List Configuration window (view in key level 5)
Clicking on the Config button and quitting the window with OK supplements the
existing parameters by the parameters typical for the test instrument installation. In the
parameter list, these can be distinguished from the others by the addition of a hand
symbol.
In this documentation, all the parameters that can only be set after Config has been
activated are marked with the abbreviation "Con".
Example:
Speed.Clock.Test [Line; Con]
Parameters for servicing purposes and troubleshooting

Note: The parameters for servicing purposes and troubleshooting can only be
accessed in key level 5.
Using the Configuration window in Fig. 13, two further types of parameters (Service
and Debug) can be activated. If Service is activated, additional parameters for
servicing work to modify instrument behaviour are displayed. The activation of Debug
provides additional information for troubleshooting purposes for
INSTITUT DR. FOERSTER staff.
In this documentation, all parameters that can only be set after Service or Debug have
been activated are marked by the abbreviations "Ser" (= Service) and "Deb" (= Debug).
Examples:
Rot.Operation [Sys; Ser]
Filter.Step [Clr; Deb]
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4.1.8.3 Saving and retrieving a test instrument setting

If you wish to reactivate a test instrument setting which has already been saved, you
can call up the setting library with the command Library in menu item Setup from the
Windowsmenu bar. Alternatively, you can also open the library by clicking on
Besides selecting and loading (Load) instrument settings, it is also possible to manage
the setting library here (delete or save current settings).
Fig. 13 Setting Lib window
Displaying additional setting parameters

In addition to the two parameters Name and Date, you can display further parameters
(of the parameter list) in the Setting Lib window. A parameter that is to be displayed in
the Setting Lib window must be marked in the tab Flags of the Parameter List
Configuration window (see Section 4.1.7.2).
Searching in the library list

Using the Find Setting... button, you can filter the settings containing specific
parameter values, e.g. a specific diameter range or a specific test frequency. In this
way, you can determine saved settings whose names you do not know or you can find
settings for materials which are at least similar to a new material to be tested.
When either corresponding parameter values or parameter value ranges are entered,
the list of displayed settings is reduced to those containing appropriate entries.
Viewing the parameter list and description

Note:
• The button Lookup Descr... is only displayed if Use Setting Description is marked
in the Configuration window.
6.430/2.815/6.440 4-31
• A descriptive text is only displayed if it has been entered on saving the instrument
setting (see "Saving a library entry" further below).
As soon as a setting is marked, you can view the description of this setting and a
parameter list with the button Lookup Descr... without having to load it. The parameter
list contains those parameters for which the flag indicator "Ergebnis/ParDok" is set.
The description contains important information on the setting for the operator.
Viewing a checklist
Note:
• The button Lookup Checkl... is only displayed if Use Setting Checklist is marked
in the Configuration window.
• A checklist is only displayed if it has been entered on saving the instrument setting
(see "Saving a library entry" further below).
If a setting is marked, the checklist can be viewed with the button Lookup Checkl....
The checklist contains information to be heeded by the operator when loading the
setting.
Loading a library entry

Clicking on the Load button loads the marked setting, thus causing it to take effect
immediately. Each library entry covers all sensor systems and line controllers of the test
instrument.
Saving a library entry

The setting currently effective is saved in the library with Save. The operator is
requested in a dialog box to enter a name for this setting. This is followed by two dialog
boxes Edit Setting Description and Edit Setting Checklist. The related operator
entries assist in subsequently identifying and using the library entries. The entries in the
dialog box can be called up later in the windows Setting Lib and Test Request.
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Entries in the dialog box "Edit Setting Description"

Enter important information on the setting in the dialog box Edit Setting Description.
Examples:
• Test according to "SEP 1925"
• Reference run according to "50 tubes"
Entries in the dialog box "Edit Setting Checklist"

In the dialog box Edit Setting Checklist, enter what the operator should bear in mind
when loading the setting.
Examples:
• Coil with which the setting is to be run
• Protective nozzles with which the setting is to be run
• Line settings that cannot be controlled through the instrument
Deleting a library entry

The Delete button removes the marked entry from the library.
6.430/2.815/6.440 4-33
4.1.9 Operating the oscilloscope

A separate oscilloscope window can be opened for each sensor system using the
status bar. In order to do this, click on the Channel status field which is located to right
next to the relevant sensor system's status field.
You can then view the signals of all test channels in different formats.
The difference channel (DIFx) to be displayed is determined in the left list field on top.
In a DEFECTOMAT sensor system an absolute channel Absolute can be present
additionally. In a CIRCOGRAPH sensor system an absolute channel Clearance can be
selected additionally.
Various displays of the recorded signals are possible, depending on the defined
channel:
• The formats Vector V, Y-component Y or impedance plane Y/X can be set for a
difference channel
• Only the display of the signal Amplitude is possible for an absolute channel or for all
CIRCOGRAPH-channels together.
• The formats Round or Straight can be set for a clearance channel
The possible formats can be changed in every scope mode with running or frozen
display without losing the sampled signals.
In the configuration window format Y/X can be set to accumulate the signals in the
background. All displayed signals remain in the picture in a light grey color, until button
Erase or a change of the format clears the display.
4.1.9.1 Scope modes for DEFECTOMAT
Scope Window for DEFECTOMAT in mode CONT
The button CONT-TRIG-REP toggles betwenn the DEFECTOMAT scope modes in a

cyclic manner.
The typical mode during setup with a reference piece that is moved manually back and
forth is CONT. The new signal samples are inserted on the right side and the signal
display moves to left according to the movement of the piece. The display can be
stopped by button STOP at any time. As long as being stopped no new signals are
inserted.
If an internal speed clock is used, the movement of the picture is constant equal to the
setting of the internal speed and independent of the actual piece movement. In this
case the parameter value of the internal speed should not differ too much from the
actual speed because of the filters. If an external speed clock is used and the line
stops, the scope display stops, too.
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Note: If the input signal Tstop is used to freeze all evaluation activities independent of
the actual clock, the scope will continue sampling signals based on the current clock
signal. This feature can be used to investigate a section on the test piece by moving
back and forth the test piece without disturbing the evaluation.
The selectable scale in the middle of the window bottom corresponds to the display's
width and determines how much the signal display is being compressed or spread. The
scale can be changed at any time with running or frozen display without losing the
sampled signals. Internally the signals are always stored at full resolution independent
of the current scale.
Mode CONT is limited to line speeds of maximum 0.5 .. 1.0m/s, depending on the load
of the evaluation unit. At higher line speeds the signal curve will miss and a signal level
is displayed instead (dashed line). As soon as the speed becomes slow enough the
normal signal display resumes automatically.
Modes TRIG and REP enable signal displays at higher speeds. In TRIG the click on
button CAPT.DEF captures the next signal curve with the selected scale width that
exceeds the threshold. Which kind of threshold Fx is crucial for the capturing, can be
configured in the configuration window.
As long as the threshold is not reached a level display (dashed line) enables to watch
the current signal height. To abort waiting for a trigger, press the button again
(CAPT.NOW).
In mode REP signal curves of the selected scale width are captured and displayed in a
repetitive way. So there is a living display without operator actions. But be aware that
only short signal sections are displayed and no continuous signal curve.
4.1.9.2 Scope modes for CIRCOGRAPH
Scope Window for CIRCOGRAPH in mode REP
The button REP-COMP-TRIG toggles between the CIRCOGRAPH-modes in a cyclic

manner.
The typical mode during setup with a reference defect positioned under the rotating
head's probes is REP. In mode REP signal curves of rotational cycles will be displayed
repetitively. The signal shots are synchronized with the rotating head, so that they make
the impression of a standing picture. With the scale control in the middle of the window
buttom parts of the cycle can be displayed. With every change of the scale the highest
signal will be positioned into the center of the window. If this part of the cycle doesn't
show the signal of interest, the test piece can be turned to show another part of the
cycle.
The mode COMP enables an overview of a test piece, e.g. if the number or the location
of the reference defects are unknown. The signals will be compressed by taking the
6.430/2.815/6.440 4-35
maximum amplitude of every cycle. In this mode it is possible to select all channels: In
every cycle the maximum amplitude of all equipped CIRCOGRAPH-channels will be
determined. The new signal samples are inserted on the right side and the signal
display moves to left steadyly. The display can be stopped by button STOP at any time.
As long as being stopped no new signals are inserted.
The selectable scale corresponds to the display's width and determines how much the
signal display is being compressed or spread. The scale can be changed at any time
with running or frozen display without losing the sampled signals. Internally the signals
are always stored at a resolution of single cycles independent of the current scale.
Note: The display movement is controlled by the rotational speed of the head. If the
actual rot speed doesn't match the parameter's value, the display movement will not fit
to the selected scale. If the rotating head stands, the signal display stops, too.
In mode TRIG single cycles can be captured. When pressing button CAPT.DEF the
next rotational cycle with a signal exceeding the threshold will be captured. Which kind
of threshold Fx is crucial for the capturing, can be configured in the configuration
window. The scale for the captured cycle can be changed with the same zooming as in
mode REP.
As long as the threshold is not reached a level display (dashed line) enables to watch
the current signal height. To abort waiting for a trigger, press the button again
(CAPT.NOW).
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4.1.10 Adjusting the test instrument

In various test operation situations, it is necessary to adjust the test instrument, for
instance when
• enhancing or checking the correctness of a test setting after loading it from the
setting library
• performing regular inspection of the setting during ongoing operation (required by
standards)
• replacing the probes
A distinction must be made between different adjustment procedures, depending on the
type of sensor system. These procedures require a test standard with at least one
known flaw. It will be of advantage if there is a separate test standard available for each
material and each diameter.
4.1.10.1 Calling up adjustment procedures using the toolbar

Adjustment procedures which are required frequently can be saved with their own
button in the toolbar at the right during configuration.
When you select the adjacent button, a floating button bar is opened, containing an icon
for each adjustment procedure and each sensor system.
If you click on the corresponding icon, the assigned adjustment procedure is called up.
The different adjustment procedures are identified by letters:
M: Adjustment to reference defect in motion
C: Adjustment to reference defect stationary
K: Adjustment of probes
4.1.10.2 DEFECTOMAT-adjustment to reference defect in motion (adjust procedure

M)
In order to perform an adjustment of a DEFECTOMAT sensor system, the adjustment
procedure D'MAT to Reference Defect in motion can be called up from the Adjust
sub-menu in item Setup on the Windows menu bar (the test standard must be run
through the sensor system). First, a check is conducted in order to establish whether
channels are activated. If they are not, this is offered to the operator. The following
window is then opened:
6.430/2.815/6.440 4-37
Fig. 14 Adjustment window for a DEFECTOMAT sensor system
If there is an absolute channel and it is activated, the operator is prompted to insert a

flawless section of the test standard into the coil. When the operator acknowledges this,
the zero compensation of the absolute channel is then performed. In the configuration
window (triangular button at the top right) the handling of the absolute channel can be
switched off in total or only regarding the zero compensation.
The operator is now requested with the message waiting for reference piece to move
the test standard in a so-called reference run over its entire length through the coil.
Should the sensitivity setting be entirely inappropriate after one pass, you can change
this setting in approximate steps (-6 dB or +6 dB) with the arrow keys next to the Gain
Adjustment [dB] field. The test standard must then be moved once again through the
coil after clicking on Repeat.
A flaw can be selected by use of the arrow buttons right to the list and is highlighted in
colour in all display modes.
Clicking on the Adjust button adjusts the sensitivity of the test channel in that way that
the selected flaw is as high as the reference threshold. In the configuration window it
can be selected which threshold F1, F2, F3 works as reference. Furthermore a
tolerance can be selected, so that the reference defect will be a given amount higher
than the threshold. When using the adjust, the phase setting of the test channel can be
left unchanged or can be adapted in that way, that the selected flaw will have a 90 deg
direction (selectable in the configuration window).
In the case of a multi-channel DEFECTOMAT sensor system, the operator must select
consecutively every channel by use of the channel selector. In every channel the
correct flaw must be selected and the Adjust button pressed. In this case, the absolute
channel is also considered as a separate channel. Since it supplies only unidimensional
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signals however, there is no display of the impedance plane and no display of any
phase angles.
If you quit the adjustment procedure with Cancel, the original values of sensitivity and
phase are restored. If you quit with OK, the values are saved. If you quit the Adjust
window with OK without clicking on the Adjust button on all channels, you must answer
a safety prompt (can be switched off by configuration).
Important: As long as the Adjust window is open, all pieces passing through are
handled as test standards! This means, above all, that they are not included in the test
report!
4.1.10.3 CIRCOGRAPH-adjustment to reference defect stationary (adjust procedure

C)
Note: If the CIRCOGRAPH has no clearance channel, the adjust must be done in the
same way as for the DEFECTOMAT, i.e. adjustment on reference defect in motion
(adjust procedure M).
In order to perform adjustment of a CIRCOGRAPH with clearance compensation, you
can call up the adjustment to Reference Defect stationary in the menu bar under item
Setup and sub-menu Adjust (adjust procedure C). For this procedure a reference
flaw must be positioned beneath the probes.
6.430/2.815/6.440 4-39
Fig. 15 Adjustment window for clearance compensation
Adjustment of clearance compensation is based on a semi-automatic principle. The

inspector is prompted, step-by-step, through the adjustment procedure. Each point
must be acknowledged by the operator with OK.
We can distinguish between two cases:
• Base:
Initial adjustment of a combination of test material, sensors and test frequency. For
this purpose, a basic adjustment must be performed, requiring a part with reference
flaw.
• Dim:
Adjustment of a combination of test material, sensors and test frequency with which
testing has already been conducted but with a different material diameter. A size
(dimensional) adjustment can then be carried out. You can use a flawless production
piece for this purpose.
Base (Base Adjust)

In order to perform an adjustment for a new material, choose the Base button from the
item Setting. You are now prompted to perform various actions and to acknowledge
these on completion.
Two positions of the reference flaw are scanned in this case for computing the
clearance compensation. First, the flaw must have a minimum clearance with respect to
the probes (6 o'clock position). Then, the test piece must be rotated through 180° so
that the flaw has maximum clearance from the probes (12 o'clock position). The
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compensation characteristic is determined from the two measured points. This means
that a separate compensation curve applies to each material, which fits best with the
current situation.
Dim (Dimensional Adjust)
This adjustment is appropriate if consecutive test requests with the same material and
the same test frequency, yet with different size, are to be run. For this adjustment, only
a flawless section is required.
Choose the Dim button under item Setting. Here as well, you are prompted to perform
various actions which you must acknowledge. Unlike Base Adjust, only one
measurement point is recorded in this case and no reference defect is needed.
Configuration window
If you click on the triangular icon in the upper right-hand corner of the Setting window
for the clearance compensation, the Configuration window opens. In the
Configuration window, you can set the following parameters:
Parameter Explanation
Factor Signallevel/Noiselevel in % The flaw signal must be larger than the
average signal level by the given factor.
Otherwise, the adjustment is aborted,
since the signal appears to be too
unreliable.
Inc/Deb step in dB Increment with which the gain can be

changed
Display Steps Through an increase in the display steps,
the bar diagram of the positioning help is
divided into several bars with tracking
characteristic.
Cancel with question If you click on the button Cancel after an

adjustment, a prompt appears asking
whether the changes should really be
rejected.
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4.1.10.4 CIRCOGRAPH-adjustment of the probes (adjust procedure K)

After a probe change, you must harmonise the sensitivity and phase angle of the
probes of your CIRCOGRAPH sensor system with one another again. After the
adjustment, all probes must have the same sensitivity and phase angle.
The adjust procedure K enables to adjust the probes by means of an automatic or a
manual calibration. The objective of the calibration is to get the same measure values
for all probes.
Fig. 16 Adjust K in mode automatic calibration
In the upper area there is an impedance plance displayed for every probe with the
current signal (thick black lines), the reference threshold (thin grey cycle), the gain
correction and the phase correction. The signals of the probes are constantly refreshed.
There are two sampling modes, that can be selected in the configuraton window:
In sampling mode life every new value is displayed. The reference defect must be
positioned beneath the probes in that way, that all probes detect the defect completely. The
reference piece should not be moved afterwards.
In sampling mode capture a newer value is only displayed, if this value is larger than the
value currently displayed. The reference piece should be moved slowly through the rotating
head, so all probes detect the defect at least in one rotating cycle completely. The adjust will
be done based on the captured signals. If the reference piece should be passed again
through the rotating head, the displayed signals can be reset with butten Repeat.
Auto Calibration
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After sampling the probe signals in a proper way just press the button 'Auto.Calibrate'.
As a result of this action all probe signals must show the same position and size.
The auto calibration can be selected to use the reference data (selection in the
configuration window). I.e. all channels will be adjusted in that way that the signals' size
is equal to Ref.Threshold + Ref.Tolerance and – if selected – the signals' phase angle
is 90 deg. The auto calibration can also be selected to be referenced to a probe. I.e. all
other channels will be adjusted in that way that their signal match the signal of the
reference channel. To select a channel as reference simply click in the channel's
impedance plane.
If you have selected equalisation in the configuration window, the correction values will
be minimized (the average of all channels will be zero) and the base sensitivity of the
sensor system will be changed accordingly. This avoids that the correction values
increase more and more by consecuting calibrations. The disadvantage of the
equalisation is, that the change of the base sensitivity will be lost when loading a setting
that was stored earlier and the sensitivity must be adapted again for instance by use of
the Adjust C.
Manual Calibration
When pressing the button 'Manual Calibrate', new buttons will become visible, that
offer to change the sensitivity correction and the phase correction. Select every channel
consecutively by a click on the impedance plane and set the probe signals to equal
position and size. After adjusting all channels click again the button 'Manual Calibrate'
to finish the calibration.
Fig. 17 Adjust K in mode manual calibration
Configuration window
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You open the Configuration window by clicking on the triangular icon in the upper
right-hand corner.
You can set the following parameters:
Parameter Explanation
Signal refresh [ms] Time interval for the refresh of the probe signals
Sensitivity step [±dB] Increment with which the gain of the channels can
be changed
Minimize correction When equalisation is selected, the average of all
values channels' correction values will be zero and the
base sensitivity will be adapted accordingly.
Sampling mode life
Uses the current sensor signals. During the
calibration, the reference piece with its flaw must
remain positioned under all probes.
capture
Collects the largest signals in each case for every
sensor. The calibration can be performed after the
reference piece with its flaw has been slowly pulled
through the testing head.
Auto Calibrate to ... If Reference Data is selected, use the parameters
in the following section to define the signals position
and size.
If Selected Probe should be used, the following
section doesn't care.
Reference Data Definition of the type of threshold, the tolerance gap
and the phase for the auto calibrated probe signals.
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4.1.11 Logging test requests
4.1.11.1 Preparing the test report

If a new test request is to be started, a new test report must also be created. The
entries can be made in preparation for this, i.e. even during the previous test request.
There are two ways to call up a new test report.
Firstly, you can do so via the Windows menu bar in menu item Setup with the
command Next Request. A test form is opened when you run this command.
Fig. 18 Test Report form
Secondly, you can call up a new test report using the toolbar on the right. Click on
and an identical test form is opened.

You can now make the entries in the new form.
These include, for instance:
• Name: designation of the test request
• Customer: this is where you can enter the customer name
• Tester: name of the responsible inspector
• Shift: name of the responsible shift
• Remark: additional remarks describing the test request in greater detail
Note: You can configure the input fields via the parameter RemarkX.Name
[Request; Con] (X = 0...20) (rename existing ones, add new ones, delete existing
ones). Exception: the field Name cannot be configured.
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All entries can also be left blank, apart from Name.

A test setting applicable to the test request is entered under Setting Name. If the name
is not known, you can switch to the Setting Library with Setting Lib... and search for an
appropriate setting.
When a test setting has been selected, you can view and check the description of this
instrument setting with Lookup Descr.... However, this prerequires that the Description
window has been set up during the configuration and, in addition, that an entry exists.
Using the Lookup Checkl... function, the operator can retrieve information important,
for instance, for manual conversion of the sensor system when using the selected test
setting. The precondition here too is that the checklist has been created when the
instrument setting was saved.
The entries are saved with the button Start later so that they are available again the
next time the window is opened.
Note: The entries have not yet taken effect!
The operator entries are rejected with the button Cancel. All fields are then reset to the
values they had when the window was opened.
Clicking on the Start now button makes the entries definitively take effect! The selected
test setting is loaded. The next piece which enters the testing line is tested with the new
setting and is also entered as the first piece in a new test report.
4.1.11.2 Printing out test results

Reports for completed test requests can be printed by clicking in the Windows menu
bar on File - Print. The submenue offers the different print types.
A more elegant option to print out the Result field contents and reports is to use the
buttons in the tool bar on the right.
When you click on the adjacent icon in the toolbar, you will see a floating button bar
containing further icons corresponding to one of the types of printout.
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Printout of the active result window (result window with the last click –> blue title bar).
This is magnified so that it fits on one DIN A4 page.
See also Section "Printout from screen".
Printout of the entire screen with all open windows (screenshot).

See also Section "Printout from screen".
Printout of the Piece Image of all sensor systems. This is magnified so that it fits on one
DIN A4 page. See also Section "Printout of the Test piece display" .
Printout of a test report, as specified beforehand by a form, with the current setting and
result data. See also Section "Printout of test reports".
There are as may buttons as forms are available in the directory PrnRpt - with the same
name as the file name of the form.
During setup different forms are loaded. If some of these forms should not be used,
delete or move the corresponding files with the extension .rpt out of the directory
Dtest\Te\PrnRpt.
With the programme "Crystal-Report-Designer" you can also design your own layouts.
The programme is part of the software option Test Report Design, which is delivered
with an own manual. The form files .rpt that are created by use of "Crystal-Report-
Designer" must simply be copied into the directory Dtest\Te\PrnRpt to enable printouts
based on that form.
4.1.11.3 Printout of the Test piece display

If you click on the button Image, the following window opens:
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Fig. 19 Print report – [pieceimage] window
The window contains the following areas:

Print mode
Selection of the print mode.
manual:
All results in the results database up to now can be printed. The selection of the test
pieces for which the results are to be printed is made in the area Pieces.
triggered
Printout of all results accumulating after OK has been clicked on. If you wish to stop the
printing again, you must reopen the Print report – [pieceimage] window, select
manual and click on OK again.
Area to select the test request
Selection of the test request from which you wish to print results.
Valuation from
Selection of the lowest sorting class for printout. Only pieces with sorting class equal or
higher than selected will be printed, pieces with smaller sorting class will not be printed.
Example:
'0' means all pieces will be printed regardless of the sorting class,
'2' means only pieces with sorting class S2 will be printed.
Pieces
Selection of the test pieces for which the results are to be printed.
Buttons
Help:
Calls up the online help.
OK:
Closes the window. Adopts the settings in the window. If you have selected triggered,
results accumulating from now on are printed.
Cancel:
Closes the window. Rejects the settings in the window.
Preview:
Only active if manual is selected.
Displays a print preview in the white field on the right-hand side of the window.
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Print:
Prints the selected results.
4.1.11.4 Printout from screen

If you click on the button Screen resp. MDI-Window, the following window opens:
Fig. 20 Print window [screenshot] window
The window displays a print preview.

The window contains the following buttons:
Cancel:
Closes the print preview. No printout.
Print:
Prints the entire screen (displayed in the print preview).
4.1.11.5 Printout of test reports

When you click on the button of a test report, the following window opens:
Fig. 21 Print Report – [einzelteil.rpt] window
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The window contains the following areas:

Print mode
Selection of the print mode.
manual:
All results in the results database up to now can be printed. The selection of the test
pieces for which the results are to be printed is made in the area Pieces. If you wish to
print results, you must first call up the print preview with the button Preview.
triggered:
Printout of all results accumulating after OK has been clicked on. If you wish to stop the
printing again, you must reopen the Print report – [einzelteil.rpt] window, select
manual and click on OK again.
Area to select the test request
Selection of the test request from which you wish to print results.
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Valuation from
Selection of the lowest sorting class for printout. Only pieces with sorting class equal or
higher than selected will be printed, pieces with smaller sorting class will not be printed.
Example:
'0' means all pieces will be printed regardless of the sorting class,
'2' means only pieces with sorting class S2 will be printed.
Pieces
Selection of the test pieces for which the results are to be printed.
Button bar
Help:
Calls up the online help.
OK:
Closes the window. Adopts the settings in the window. If you have selected triggered,
results accumulating from now on are printed.
Cancel:
Closes the window. Rejects the settings in the window.
Preview:
Opens a separate window containing a print preview:
Fig. 22 Print preview for the printout of a test report
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The print preview contains the following control elements:
Element Function
Closes the print preview.
Jumps to the first page of the report.
Jumps one page earlier in the report.
Jumps one page later in the report.
Jumps to the last page of the report.
Aborts a process that is running.
Possible application: a database access is
unsuccessful.
Opens the printer dialog box of the standard

printer.
Opens the window for printer configuration.

Refreshes the test report.
Exports a report to a file or an e-mail.
Only possible if the computer is correspondingly
configured.
Zoom function.
Search function for the report drawn up.
The search term is written in the field to the left of
the binoculars.
4.1.11.6 Setup of the printouts

With the menue function File – Setup printouts a window with the same name opens.
This window has three sheets for the different types of printouts.
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You can select for each printout type, whether a preview on the screen should be used
before the printout. The preview window has buttons to start the actual printing or to
cancel the printing. If preview is not selected, the printout will be transfered directly to
the printer without a preview window.
For the printouts from the screen and for the printouts of the test piece display a head
and foot line can be configured. Input any text into the text boxes, e.g. your company
name. It is also possible to insert automatic text fields by clicking on the blue arrow right
to the text field of the head resp. foot text box. This opens a list box with numerous text
fields, which enable, for example, to place the current printing time or the testing time of
the selected piece in the head/foot lines.
For the printout of test reports it is not possible to configure head or foot lines here,
because the test reports offer to define head and foot zones by themselves.
4.1.11.7 Setup of the printer

The DEFECTOTEST software generally uses the standard printer und the standard
document setting, that is configured at the operating system. If you want to change
the printer type or the paper format, use the WINDOWS-function Start -> Settings ->
Printers.
If multiple printers are configured at the Operation Unit, click with the right mouse
button on the printer that should be used for the DEFECTOTEST printouts and select
'Set as default'.
If the paper format should be changed, click with the right mouse button on the printer
and select 'Document defaults'. All settings that are made here will be used with the
DEFECTOTEST printouts.
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4.1.12 Error messages and displays

One important system function of the DEFECTOTEST DS is monitoring of important
statuses and sequences in the test electronics. This includes, for instance, the function
of the probes including the probe cable and the analog electronics, rotation of the
rotating sensor, feed of the test material (motion clock), the test electronics temperature
etc. The tolerance limits outside of which a message is issued can be defined by
configuring parameters (min./max. values). At the same time, delay times can be
defined which, if they expire, trigger the message. This is required, inter alia, in order to
achieve specific operating conditions (e.g. rotational speed setpoint on motor start).
The MESSAGE button in the status bar provides a list of all messages occurring in the
order in which they occurred. Each of these messages can be assigned to one of four
categories which is displayed in the icon title.
• Error: failures which influence test operating mode in an inadmissible way
• Warning: changes or incidents of which the operator should take note
• Remark: information which may be of assistance for subsequent diagnosis
• Service: information which provides pure fault-finding information for appropriately
trained personnel
The gravity of the message and the associated consequences decrease from top to
bottom.
Fig. 23 Structure of the Message window
When opening the message list all messages of today are displayed – the most recent
message on top. For messages of the former days open the configuration window (click
right on top) and select another date.
When you click on the message, further information is provided in the bottom area of
the window. A more precise description and appropriate remedial action are displayed
beneath the title of the message. The date and time of the message, the category of the
message and the message source are displayed as additional information.
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The message category icons are initially displayed in colour. When the Message
window is acknowledged (button QUIT), the messages accumulated up to that point are
highlighted in grey, so that they can be distinguished from newly generated messages.
Note: The acknowledgement of an error message doesn't mean the solution of the
problem but only the notice of the error message. If the problem is still present when
pressing the QUIT button, the error message will appear again. You must solve the
problem first and then quit the message to get a clear message field.
If a permanent error condition cannot be solved, but the testing has to go on – for
example: a CIRCOGRAPH probe is damaged and testing should be done with the
remaining probes – the test channel of that probe must be switched off. When switching
off a channel the monitoring of the channel is also off, and after the next quit the error
message will not reappear.
By opening the Configuration window, you can define which categories of message
over what period of time are to be displayed in the list. However, all messages are
saved internally so that they are available for subsequent troubleshooting or fault
handling! It is advisable to display messages up to the category Warning.
Furtheron the printout of the message list can be configured.
Note: The system can be configured in that way, that instrument failures will be
recorded together with the test results and that the pieces that are being tested during
the failure will be sorted in a special way automatically (see parameters
Sorting.Clas.CatX).
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4.1.13 Starting Test operating mode
4.1.13.1 Basic information on the Test operating mode

The Test operating mode is started under two conditions. Firstly, the testing line must
have signalled that it is ready. Secondly, the operator must actively enable testing. This
is performed with the test mode button in the status bar: if you click on the button for
test mode, the Status Test Mode window opens. Here, you must select the operating
mode TEST.
SETUP means: setup mode, no evaluation of the test results.

REF means: trial operation mode with reference piece, evaluation of the test results
without logging.
The operator can make changes at any time to the test parameters during an ongoing
Test operating mode. Since this may result in dead times for test evaluation in the
region of a few seconds, a configurable prompt is displayed at this point which the
operator must acknowledge. In general, a change in parameters should be performed
in the SETUP setting.
In order to check the instrument setting, it is necessary to move a reference piece
through during a long test request. For this purpose, as described in Section 4.1.9, call
up the corresponding adjustment procedure. You can initially ascertain whether there
has been a change in the test behaviour since the last setup. Should this be the case,
you can perform an adjustment. The pieces tested in the reference run are entered in
the database but are logged separately depending on the configuration. Marking,
sorting and speed detection for the reference run can also be configured.
4.1.13.2 Preparations
Convert the sensor system and, if necessary, activate magnetisation and set the transport
mechanism to the new test material.
Load the instrument setting from the setting library or set it up again in accordance with
Section 4.2.
Note: Do not load a new instrument setting whilst test pieces are passing through!
During the loading operation, the instrument may not detect a trailing end of a piece
running through and this would cause incorrect timing of the sorting control!
Perform a reference run.
Create or load the test report:
Open the Report window with the toolbar using the button Setting and by clicking on
Request. Enter the required data in the individual sections. You must enter at least the
Name of the new test request. The name of the current test instrument setting is displayed
under Setting. By clicking on Start now, you can immediately start the new test request. If
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you wish to start testing later, save the form with Start later. The report last saved is
displayed when you call up the test report again.
Start the test request:
In the status bar, click on the test status icon and select the operating mode TEST.
Activate material allocation.
Testing commences!
4.1.13.3 Monitoring Test operating mode

The testing instrument requires no special operation on the part of the operator during
ongoing Test operating mode. It merely requires monitoring.
Monitor the following aspects:
• Allocation and throughput of the test material
• Flaw displays: Are flaws being correctly marked? Are flawed parts being correctly
sorted?
Event messages (Messages): If a malfunction occurs, you can take appropriate
counter-measures after calling up the Message window.
4.1.13.4 Inserting a reference run in test operating mode

It is possible to interrupt an ongoing test request for a reference run and then continue
the test request. The counters of the test report are not changed by the interruption.
Proceed as follows:
Deactivate material allocation and wait until the last test piece has passed the sensor
system.
Perform the reference run (see Section 4.1.9).
It may be necessary to set a better sensitivity using the corresponding adjustment
procedure.
Reactivate material allocation.
Testing resumes!
4.1.13.5 End of test

Deactivate material allocation and wait until the last test piece has passed through, has been
marked and has been sorted.
Deactivate the roller conveyor drive.
Select the Print button in the tool bar.
Select the Protocol button in the button bar.
The test request just completed is documented.
For further details, see Section 4.1.10.2.
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4.1.14 Instrument monitoring (noise monitoring)

The signals of all probes are monitored continuously in that way, that the noise level is
inside a predefined range. If the noise level goes down compared to the usual level, it
can be seen as a note for a probable instrument failure, e.g. break of probe wire, break
of cable or failure in the test channel electronics. If the noise level increases over the
usual level, it can also be caused by an instrument failure, e.g. break of probe core or
missing compensation of the clearance channel. A higher noise level can also be
caused by vibrations in the line or by a higher surface roughness of the test material.
Therefore the upper noise limit must be set up carefully to avoid wrong alarms.
4.1.14.1 System Window

With a click on the sensor system status field the system window opens:
System window for a CIRCOGRAPH with 4 probes
In the system window the noise level of every probe is displayed. With a
CIRCOGRAPH there are as many bars as probes are present displayed in the right
probe arrangement on the test heads. The set up of all probes is unique – therefore the
Noise.Channel.Select is fixed to 'All'. With a standard DEFECTOMAT there is only one
bar; a two frequency DEFECTOMAT has two bars. In this case the set up is individually
for each probe and can be changed with Noise.Channel.Select. There is no noise
monitoring for the absolute channel.
For every probe a dark blue line indicates the current noise level and a bright blue area
indicates the range of the noise level in the past time. With the button 'Erase' this range
can be reset at any time. The sampling of the noise level range starts again und runs
on even with closed system window.
When switching on the noise monitoring (button Noise.Channel.Monitor ON), the
limits are displayed as black lines and can be set by the controls Noise.Lower.Limit
and Noise.Upper.Limit. When the noise falls below the limit, an error message will
appear in the message field, when the noise exceeds the upper limit, a warning
appears. Furthermore the color of the noise area in the system window changes from
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blue to red, so the probe will be found easily. The category of the messages can be
changed by parameters Noise.Lower.Limit.Message and
Noise.Upper.Limit.Message.
4.1.14.2 Setup of the noise monitoring

To find a proper setting of the noise monitor proceed as follows:
Switch off the noise monitor and reset the noise level range with Erase. Run the test of
some pieces and open again the system window.
Switch on the noise monitor and set the Noise.Lower.Limit one step below the blue
noise level range. If the noise level is so low, that the limit must be selected at zero,
there is no noise monitoring possible on the lower limit. Select the Noise.Upper.Limit
higher than the noise level range with rather a big gap between, because material with
rough surface or with a lot of defects will increase the noise level. Go on with testing
material with this setting.
If messages arise because of noise level exceeds and there is obviously no instrument
failure, either the noise limits can be opened or the sections for the noise calculation
can be enlarged. By use of the parameters Noise.Lower.Average.Length resp.
Noise.Upper.Average.Length the length of material is selected, over which the noise is
calculated as the average value of the test signal. A longer section for this average
calculation means that short signal changes will be more suppressed but the instrument
will detect a permanent change later. Because defect signals will increase the noise
level, use a longer average length for the upper limit that for the lower limit. As long as
you have no own experiences, we recommend to use a quader or half of a piece length
for the Noise.Lower.Average.Length and two or three times of the piece length for the
Noise.Upper.Average.Length.
4.1.15 Typical system configurations

By way of example, two different system configurations for the DEFECTOMAT and
CIRCOGRAPH sensor systems are outlined. Besides the setting of the most
important parameters, the derived parameter list and the corresponding Result windows
Piece Image and Defect Impedance are also shown.
4.1.15.1 DEFECTOMAT sensor system
DEFECTOMAT sensor system with two identical segment coils

For the purposes of this example, it is assumed that two segment coils with identical
test instrument settings are to be operated. This is expressed by the parameter
Channel.Mode [Sys; Con], which must be set to common operation. The parameter
Trace.Assignment [Sys; Con] = Channels indicates that the evaluation tracks are
assigned to channels. In the example, only one sector is evaluated:
No.Sectors [Sys; Sta] = 1.
These settings result in the following structure for the parameter directory of the
DEFECTOMAT sensor system.
Channel.Mode common operation
[Sys; Con]
Trace.Assignment Channels
[Sys; Con]
No.Sectors 1
[Sys; Sta]
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The names 'Coil1‘ and 'Coil2' express the assignment to the individual segment coils.
The names can be entered in the relevant directory DifSpec in the parameter
DifSpec.Name [DifSpec; Con].
The following configuration is obtained for the Piece Image window: a separate signal
trace is displayed for each segment coil and the absolute channel. Since only one
sector is evaluated, only one evaluation track is assigned to each channel. It must be
noted that the same settings for location and width of the sector apply to both segment
coils. The name 'Risse' (Cracks) for the evaluation tracks can be issued using
parameter Sector.Names [Sys; Sta].
DEFECTOMAT sensor system single-channel with two sectors and with

absolute channel
For the purposes of this example, a single-channel DEFECTOMAT sensor system is
assumed. As opposed to the previous example, two sectors (No.Sectors [Sys; Sta] =
2), i.e. two flaw types, are to be evaluated. Since the evaluation parameters can always
be set separately for each sector, two subdirectories are created in the directory
Analyses. Names can be assigned to the sectors with parameter Sector.Names
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[Sys; Sta] in the directory Sys. If more than one name is assigned, these names must
be separated by commas → (in the example: Beule, Riß (Dent, Crack)). The derived
structure is as follows:
The following configuration results for Piece Image window. A separate signal trace is
displayed for the test channel and for the absolute channel. Since two sectors are
evaluated (see Defect Impedance window), two evaluation tracks are assigned to the
test channel. The absolute channel supplies one evaluation track. The signal trace of
the differential channel indicates no thresholds. This is related to the fact that different
thresholds can be defined for the individual sectors, but the signal traces of the two
sectors are combined to form one
4.1.15.2 CIRCOGRAPH sensor system
CIRCOGRAPH sensor system with two sectors

For the purposes of this example, a standard-version CIRCOGRAPH sensor system is
assumed. The parameter Channel.Mode [Sys; Con] = common flaw display defines
that only one test instrument setting applies to all channels, i.e. there is only one
DifGen directory. Consequently, defining two sectors ensures that a separate
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subdirectory is created for each sector in the directory Analyses. Instead of naming the
sectors 'Sect1' and 'Sect2', the name of the flaw type can also be specified directly.
Channel.Mode common flaw display

[Sys; Con]
Trace.Assignment Segments
[Sys; Con]
No.Sectors 2
[Sys; Sta]
The following configuration is obtained for the Piece Image window. One single signal
trace and a separate evaluation track for each sector are displayed. The two sectors
can be seen in the Defect Impedance window.
The signal trace indicates no thresholds. This is related to the fact that different
thresholds can be defined for the individual sectors, but the signal traces of the two
sectors are combined to form one.
Note: In this case, the number of circumferential segments is unimportant for display
and logging.
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CIRCOGRAPH sensor system with segment evaluation

In contrast to the previous example, the four individual segments are evaluated
separately. For this purpose, the parameter Channel.Mode [Sys; Con] is set to
common event display. This is of no significance as regards the structure of the
parameter list, but does have a clear effect in the Piece Image window. Only one
sector is defined in the example.
Channel.Mode common event display

[Sys; Con]
Trace.Assignment Segments
[Sys; Con]
No.Sectors 1
[Sys; Sta]
The following configuration is obtained for the Piece Image window. One common signal
trace is displayed for all segments.
As opposed to the previous example, however, the setting Channel.Mode [Sys; Con]
= common event display means that a separate evaluation track is displayed for each
segment – i.e. a total of four tracks. If two sectors are to be evaluated instead of one
sector, two evaluation tracks are assigned to each segment, i.e. a total of eight tracks
are displayed and are also ultimately saved as the test result.
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4.1.16 Supplementary programme Save Result DS

The supplementary programme Save Result DS is part of the option 'Result
Investigation'.
With the programme Save Result DS, you can save result data records of the
DEFECTOTEST DS2000 application (Result.db) in an external database. Possible
databases are "Microsoft Access" and "Sybase". The saved structure (tables,
directly and indirectly referenced data records) is adopted from the
DEFECTOTEST DS2000 application.
Save Result DS gives you the opportunity to exclude certain tables (detailed data) from
the saving procedure.
You can save one or more test requests in a database file.
In the result database of the DEFECTOTEST DS2000 application, individual detailed
data can be missing (cause: FIFO principle). The test requests to be saved are checked
by Save Result DS for their completeness.
In a Log Window, you can check which test requests have already been saved.
4.1.16.1 Main window Save Result DS
Fig. 24 Main window Save Result DS
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4.1.16.2 Menus
In the menu bar, you can open the following pull-down menus:
Menu "File"
Commands in the File menu:
Command Description
Save Request Opens the Save Request window.
Here, you save marked test requests in a database file.
Show Log Opens the Show Log window.
Here, test requests already saved are listed.
Exit Ends the software Save Result DS.
Menu "Config"
Commands in the Config menu:
Command Description
Config Display Opens the Config Display window.
Here, you select which columns are displayed in the test
request list of the main window.
Config Save Opens the Config Save window.
Here, you select:
• which tables (detailed data) are saved
• from what point a test request is designated as incomplete
• the type of database
Menu "?"
Commands in the ? menu:
Command Description
? Opens the About window.
Here, the version number of the software Save Result DS is
displayed.
4.1.16.3 Button bar

The button bar contains the following buttons:
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Button Description
Save Request Opens the Save Request window.
Here, you save marked test requests in a database file.
Show Log Opens the Show Log window.
Here, test requests already saved are listed.
Exit Ends the software Save Result DS.
4.1.16.4 Display Requests area

The Display Requests area shows within which time period test requests are
displayed in the Request List.
When you click once in the Display Requests area, the Display Requests window
opens. You set the time period in this window. This function is useful if you wish to
make a selection from a large number of requests.
Display Requests window

The Display Requests window is opened by clicking once in the area Display
Requests within the main window.
Fig. 25 Display Requests window
In the Display Requests window you set which time period is displayed in the Request
List. The Display Requests window contains the following elements:
Select period for requests
Under Start and End you set the start and end date for the display period. If you click
on one of the arrow keys, a calendar opens in which you can specify the date in a
convenient manner.
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Buttons
Ok:
Closes the Display Requests window and adopts the dates selected.
Cancel:
Closes the Display Request window. All test requests that exist in the
DEFECTOTEST DS2000 application are displayed in the Request List.
4.1.16.5 Request List

In the Request List, all or part (limited under Display Requests) of the result data
records contained in the DEFECTOTEST DS2000 result database are displayed.
The Request List always contains the following entries:
Entry Description
Save Data records already saved are marked with
a tick.
RequestName Name of the test request
RequestStart Start time of the test request
RequestEnd End time of the test request
In the Config Display window, you can select further entries to be displayed in the
Request List. See Section 4.1.14.9.
Data records which you wish to save in a database must be marked in the Request List.
You can mark data records with the mouse or keyboard. Marked data records are
highlighted in blue.
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4.1.16.6 Save Request window

The Save Request window is opened with the menu command File>Save Request or
with the button Save Request.
Fig. 26 Save Request window
In the Save Request window, you save request data sets that you have marked in the
Request List in a database.
The Save Request window contains the following elements:
Display field
• Name of the selected test requests
• Results of the data completeness test
• Messages from the saving procedure (e.g. save-to directory, end of the saving
procedure)
List fields to select a folder

Here, you can select a folder in which to save the database file.
Database name without extension

Here, you enter the file name (without extension) for the database file. Only use letters,
numbers and the special character "_" (underline).
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Buttons
Create Database:
Starts the saving procedure.
The saving procedure can take several minutes. The end of the procedure is confirmed
in the Display field with the message Save Request finished.
Close:
Closes the Save Request window, without performing any action.
Log file
During the saving procedure, a log file is created in the same directory as the database
file. The name of the log file contains the suffix "_SYB" (Sybase) or "_ACC"
(Microsoft Access) to identify the database.
The log file essentially contains the content of the Display field in the Save Request
window.
4.1.16.7 Show Log window

The Show Log window is opened with the menu command File>Show Log or with the
button Show Log.
Fig. 27 Show Log window
In the Show Log window, requests that have already been saved are displayed in a
list. The list contains the following entries:
Entry Description
SaveDate Date saved
RequestName Name of the request
StartDate Start time of the test request
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EndDate End time of the test request

DbPath Directory and file saved to
Piece Result of the completeness check
Filled circle: piece data complete
Semi-filled circle: piece data incomplete
Dash: piece data not saved
DefSec; Flaw; Saved tables (detailed data)
Doc; Sta; Dyn
Filled circle: detailed data completely saved
Semi-filled circle: detailed data incompletely saved
Dash: detailed data not saved
4.1.16.8 Config Display window

The Config Display window is opened with the menu command
Config>Config Display.
Fig. 28 Config Display window
In the Config Display window, you select which columns in the Request List of the
main window are displayed. You select a column by clicking in the square to the left of
the column name. Selected columns are marked with a tick.
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The Config Display window contains the following elements:
Selected Columns
Here, you select the columns that are displayed in the Request List of the main
window.
Buttons
Ok:
Closes the Config Display window and adopts the settings.
Cancel:
Closes the Config Display window and rejects the settings.
4.1.16.9 Config Save window

The Config Save window is opened with the menu command
Config>Config Save.
Fig. 29 Config Save window
In the Config Save window, you select:

• which tables (detailed data) are saved
• from what point a signal sequence is designated as incomplete
• the database type
The Config Save window contains the following elements:
Selected tables to save

Here, you select which tables (detailed data) are saved. You select a table by clicking in
the square to the left of the table designation. Selected tables are marked with a tick.
Note: The tables ParSta and ParDyn are necessary, if the saved database should be
viewed with the DEFECTOTEST-software in the result investigation mode.
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Flaw Table Tolerance [%]

Here, you determine from what point a signal sequence is designated as incomplete.
In the result database of the DEFECTOTEST DS2000 application, individual detailed
data can be missing (cause: FIFO principle). If more detailed data is missing within a
table than have been selected in the area Flaw Table Tolerance, a signal sequence is
designated as incomplete by the completeness check.
Select Database
Here, you select the database format in which test requests are saved by the
Save Result DS software.
Possible database types are "MicrosoftAccess" and "Sybase".
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Buttons
Ok:
Closes the Config Save windowand adopts the settings.
Cancel:
Closes the Config Save window and rejects the settings.
4.1.16.10 Error messages, Fatal Error

Error messages are displayed in special windows of the Save Result DS software or
with the help of system information from the operating system.
Fatal Error
A system-relevant error (Fatal Error) is displayed in the SR Dialog Fatal Error
window.
Fig. 30 SR Dialog Fatal Error window
In the event of a system-relevant error, do not click on the button Shut Down. Inform
those responsible for the system.
The system administrator ends the Save Result DS software with the button Shut
Down after scrutinising the contents of the SR Dialog Fatal Error window.
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4.1.16.11 Typical operating sequences

Note: Save Result DS is a separate software programme and cannot be started
directly from the user interface of the DEFECTOTEST DS2000 software.
1. Starting the software

DEFECTOTEST DS2000 software is running.
In the Windows start menu, click on the icon Save Result DS in the programme group
DS2000.
The Save Result DS software is started. The main window of the software is opened.
2. Configuring the display (optional)

Select the menu command Config>Config Display.
The Config Display window is opened.
Select which entries are to be displayed in the Request List of the main window.
Confirm with OK.
3. Configuring the saving procedure

Select the menu command Config>Config Save.
The Config Save window is opened.
Select
• which tables (detailed data) are saved,
• from what point a signal sequence is designated as incomplete,
• in which database format requests are saved.
Confirm with OK.
4. Setting the display area (optional)

In the main window, click in the area Display Requests.
The Display Requests window is opened.
Select the start and end date of the period that is to be displayed in the Request List of the
main window.
Confirm with OK.
5. Saving test requests

In the Request List of the main window, mark the requests that are to be saved.
In the main window, click on the button Save Request.
The Save Request window is opened.
Select the target directory.
Enter the name of the save file (without extension).
Click on the button Create Database.
The saving procedure is started.
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Note: The saving procedure can take several minutes. The end of the procedure is
confirmed in the Display field by the message Save Request finished.
Close the Save Request window with Close.
6. Examining which requests have been saved (optional)

In the main window, click on the button Show Log.
The Show Log window is opened.
After examination, close the Show Log window again with Close.
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4.2 Setting the test instrument to the test material

4.2.1 Basic information on the setup
The test instrument basically distinguishes between two operating states: Setup and
Test. Setup mode means that counting and logging of the test results and marking of
the parts passing through are suppressed. All monitoring functions are deactivated and
the signal gate is permanently activated. An independent preselect can be made for
motion clock generation.
Test mode is further subdivided into two operating modes. Test operating mode as
such and operation during a reference run (Ref). For the latter, it is also possible to
preselect a separate motion clock and to activate and deactivate marking and sorting.
Material and diameter of the test material and the test speed and type of sensor system
used determine the attributes of the eddy currents in the test material and, thus, the
signals supplied by the sensor. Consequently, the optimum setting of the absolute and
differential channels must be determined for each material-diameter combination. When
the instrument setting has been optimised, it can be saved in the setting library, as
described in Section 4.1.7.3 and can be reloaded for testing under the same conditions.
A comparison piece is required for the setting.
A comparison piece is a section of material of the same diameter and same material as
the test material in which one or more artificial comparison flaws of defined depth, width
and length have been incorporated.
Lengthwise saw cuts whose depth and width correspond to the natural flaws to be
detected or are specified in a corresponding test standard in particular are suitable for
use as comparison flaws. Bores are also used frequently to verify the detectability of
short flaws. The instrument must be set so that the comparison flaws are displayed on
the screen with optimum signal-to-noise ratio and with appropriate amplitude.
Note: This is the only method of guaranteeing a correct setting with verifiable
flaw detectability!
This setting method is described in detail in the sections which follow.
If a comparison piece with artificial flaws is not available (e.g. because the natural flaws
to be detected can be simulated only with great difficulty), the test channel can be set
alternatively on the basis of a typical, natural flaw.
Once a suitable test setting has been established and saved for a specific combination
of probes, material and material diameter, it is very much easier to set the instrument
again the next time it is necessary to test with the same conditions. Apart from
downloading the corresponding instrument setting, all that needs to be done is to run a
few adjustment procedures (see Section 4.2.3) in which the operator is 'prompted'.
Only CIRCOGRAPH sensor system
For the CIRCOGRAPH sensor system, there is also an adjustment allowing automatic
setting of the instrument for differing material diameters with the same material and the
same probes (see Section 4.2.3.2).
4.2.2 Initial setting

The precondition is a comparison piece containing various, appropriate comparison
flaws. It should contain flaws with which the differential channel can be set (e.g. several
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flaws of differing depths) on the one hand and also flaws with which the absolute
channel can be set (e.g. slot).
Preparations
In the status bar, select the operating mode SETUP after clicking on the test status icon.
Set the sensor system to the test piece diameter. Follow the instructions given in the User
Manual for DEFECTOMAT coils in respect of coil diameter selection.
Check and correct the settings of the sensor system (to be found in the parameter list under
D‘MAT\Sys), in this case primarily the effective probe width Nominal.Probe.Width [Sys; Sta]
(see Section 6.8.2).
In the status bar, set the parameter of the motion clock Speed.Clock.Set [Line; Con] under
LINE CLOCK to the required clock mode and, in the case of an internal clock source, enter
the anticipated speed (Internal.Speed [Line; Sta]).
Note: The anticipated speed cannot be greater than the given maximum speed.
This means: Internal.Speed [Line; Sta] ≤ Max.Speed [Line; Sta].
In the status bar, set the parameter of the signal gate Signal.Gate.Set [Sys; Con] to
automatic release (auto) or permanent release (on) under D'MAT and activate the sensor
system (on) with parameter Operation [Sys; Sta].
Setting up the differential channel

Since the differential channel responds only to changes in the signal, the comparison
flaw must be transported repeatedly through the sensor system is order to optimise the
setting. In Manual mode, the comparison piece is moved to and fro in the test coil and
the signal display must be observed simultaneously. If a parameter is changed, the
effect on the signal can be observed immediately.
If the reference piece in the line cannot be used in Manual mode, the reference piece
must be moved through the coil after each new parameter change and the result in
comparison with the last must be assessed.
Note: In general, the speed when setting may differ from the speed during Test
operating mode. However, it must always be determined precisely so that automatic
setting of the high-pass filter operates correctly. Since this is difficult if the reference
piece is moved by hand, parameter Filter [DifGen; Sta] should be set to demo. The
comparison piece should nevertheless be moved as uniformly as possible in this
operating mode. Please refer to Section 4.4.4.3 for further details (e.g. if using a timing
wheel).
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Activating the differential channel:

Set parameter Channel [DifSpec; Sta] = on.
Tip: In many cases, it is favourable to include this parameter in the Quick window.
Set the frequency parameter Frequency kHz [DifGen; Sta]. The settings 3 kHz, 6 kHz,
10 kHz, 12 kHz, 15 kHz, 30 kHz, 60 kHz and 100 kHz are available. The selection of the test
frequency depends on:
• the test material (in this case, particularly the electrical resistivity ρ and the magnetic
permeability µ)
• the geometry of the test material (diameter, wall thickness in the case of tubes)
• the flaws to be detected (internal flaws, external flaws etc.)
Note 1: If neither experience from previous applications nor guidelines from relevant
test standards are available, please be guided by the recommendations in
Section 4.4.4.2. applicable to through-type coils. However, please note that these
recommendations can only be considered as general guidelines owing to the complex
physical relationships involved.
Note 2: The filters which correspond to this frequency and to other instrument settings
are set automatically.
Set the following parameters approximately:
Parameter Description Setting value

Filter.Corr. [DifGen; Sta] High-pass filter -2
correction
Gain dB [DifGen; Sta] Gain approx. 30 dB
F1.Threshold % [Analyse; Sta] Flaw threshold F1 Setting according
F2.Threshold % [Analyse; Sta] Flaw threshold F2 to the given values
F3.Threshold % [Analyse; Sta] Flaw threshold F3 of the relevant test
norm or values
from experience
Eval.Mode [Sys; Sta] Evaluation mode vector
Note: In the case of ferro-magnetic test material and with magnetising yoke, set the
magnetising current to maximum.
Open the scope by clicking on the SIGNAL button in the status bar in order to visualise
passage through the coil and choose a differential channel in the centre evaluation window
and display mode Y/X in the right evaluation window.
Move the comparison piece through the coil. Move the comparison piece at the set internal
speed or switch the filter off (Filter [DifGen; Sta] = demo). You can anticipate a signal with a
certain noise level from which the flaw signal can be differentiated more or less clearly.
The comparison piece must be moved in the coil for the following optimisation steps.
Set the gain so that the flaw signal reaches approx. 50% amplitude.
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Optimise the frequency, if necessary, as follows:

• to maximum signal amplitude if the noise level is low
• to optimum signal-to-noise ratio if the noise level is higher
• to maximum phase separation between flaw and noise signals if the noise level is
high
Correct the gain if necessary.
If you are working with magnetisation, adapt the magnetising current:
Slowly reduce the magnetising current until the noise level increases.
Then increase the current again until the noise level no longer drops appreciably.
Note the differing behaviour of the signals of bores and slots as a function of
magnetisation. The signals of slots increase with increasing magnetisation whilst bores
supply a better signal-to-noise ratio at moderate field strengths. Always choose a
working range in which the signal-to-noise ratio changes only slightly in the case of
slight magnetisation variations. Pay particular attention to ensuring that you remain far
enough above the fluctuations typical of bores.
Note on the testing on welding lines with LSM 180:

Increase the magnetisation only to such an extent that swarf in the tube is not attracted.
Precisely set of the filters.

Note: This optimisation is required only in exceptional cases if you have been unable to
achieve an adequate signal-to-noise ratio with the preceding steps.
The parameter Filter.Corr [DifGen; Sta] can be optimised only if the test instrument is
precisely aware of the test speed at all times (see Section 4.4.4.4). In operating mode
Filter [DifGen; Sta] = demo, a change is not practical since the parameter is rendered
inoperable (high-pass filter is fully open) and changes initially show no effect. They
have an effect only when operating mode Filter [DifGen; Sta] = Test is activated.
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Further changes in the parameter with respect to the basic setting are practical only if
the test instrument is familiar with the current speed of the test material, i.e.
• in the case of parameter setting Speed.Clock.Test [Line; Con] = external using a
timing wheel
• in the case of parameter setting Speed.Clock.Test [Line; Con] = measured and at
constant speed
• in the case of parameter setting Speed.Clock.Test [Line; Con] = internal and if the
set speed is precisely observed.
The speed when optimising the parameter may differ unrestrictedly from the
subsequent speed during Test operating mode provided all signals to be allowed for
(bores, external flaws and internal flaws, dents and disturbance signals) are present at
the higher speeds in precisely the same way as at this (in general far lower) speed.
Unfortunately, this precondition does not always apply. Many disturbance sources
(vibration, shock and influences of cutters) occur only under the conditions of Test
operating mode. In this case, you would be well-advised to initially retain the neutral
setting and to optimise the setting if necessary on the basis of practical experience
during Test operating mode.
If you have adapted the parameter to the conditions of your testing line during
commissioning or after a certain trial period, you will generally not have to change it
later.
Define the evaluation mode: Selection of the evaluation mode (parameter Eval.Mode [Sys;
Sta]) depends on the flaw signals to be detected and the noise signals to be suppressed:
Amplitude evaluation (vector)
• different flaw types with different phase angles are to be detected and/or
• the noise level is low
Y-component evaluation (Y)
• you intend to optimise for a specific flaw type (same phase angle as the comparison
flaw) and/or
• suppression of a higher noise level, which, however, differs clearly as regards phase
angle from the flaw signals
The phase Phase deg [DifGen; Sta] is set so that the noise signal is suppressed as far
as possible. To this end, the phase must be varied so that the noise signal points in the
X direction.
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Sector evaluation (sector)

• Several flaw types are to be evaluated differently.
Example: Flaw type 1 (cracks) is assigned to sector 1 and flaw type 2 (dents) is
assigned to sector 2.
• Suppression of major noise signals whose phase angle differs only inadequately
from the flaw signals. This must be applied if reliable separation by Y-component
evaluation is not possible.
Note: In the case of sector evaluation, the position (Sector.Position deg
[Analyse; Sta]) and the opening angle (Sector.Width [Analyse; Sta]) of the sectors
must be selected in such a way that the flaw signals lie centrally in the sectors whilst
the noise signals fall reliably in the area outside the sectors.
Setting flaw thresholds:
If neither the targets of a test standard nor empirical values are available (cf. Approximate
setting of various parameters), it is advisable to use three comparison flaws of different
depths and to set the instrument so that their relevant signals exceed the flaw thresholds F1,
F2 and F3 (defined by FX.Threshold % [Analyse; Sta] X=1...3) Correct the sensitivity again if
necessary.
Setting the absolute channel

The absolute channel must be set after the settings for the differential channel have
been made, in particular after optimising the test frequency.
Activating the absolute channel:
Set parameter Channel [Abs; Sta] = on.
Tip: In many cases, it is advisable to include this parameter in the Quick window.
Open the scope (SIGNAL button in the status bar). In the windows at the upper edge of the
Scope window, set the settings normal, Absolute and Amplitude in the order specified. You
can initially anticipate a uniformly high signal trace on the absolute channel.
Perform compensation:
Position a flawless section of the comparison piece in the test coil and trigger parameter
Abs.Compensate [Abs; Sta] by clicking on the + or - button. The absolute display of the
signal returns to the zero line.
Tip: In many cases, it is advisable to include this parameter in the Quick window.
Set the gain:
Position a flaw (e.g. a welding flaw) in the coil and set parameter Abs.Gain [Abs; Sta] so that
the flaw amplitude is approx. 50%.
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Note: Many physical properties of the test material influence the distribution and
magnitude of the eddy currents. In addition to material discontinuities (flaws), this
relates, in particular, to the type of alloy, electrical conductivity, permeability,
temperature and material volume (diameter and, in the case of tubes, also the wall
thickness). The gain is the only parameter with which different influences can be
differentiated on the absolute channel, i.e. the gain must be set so that the influences to
be detected as flaws exceed the thresholds whilst the other influences lie just below the
lower threshold. In practice, it is generally necessary to determine a practical
compromise which can frequently be done only the basis of a certain practical trial.
Setting flaw thresholds:
If neither the targets of a test standard nor empirical values are available, set the flaw
threshold F1 (F1.Threshold % [Analyses.Abs; Sta]) in the parameter list directory so that the
signal amplitude exceeds this threshold. In principle, two other thresholds can be set
(analogously to the differential channel). However, this is practical only in extremely rare
cases. Consequently, thresholds F2 and F3 should each be set to 100%.
Note: Long-term effects, such as temperature variations, may lead to a situation in
which the signal of the flawless test material drifts slowly away from the zero point.
Tracking compensates for such effects by reducing the absolute signal at regular
intervals and in small steps towards zero.
If tracking is to be activated:
Set parameter Auto.Track [Abs; Sta] to on.
The tracking speed Track.Speed [Abs; Sta] must be set on the basis of empirical values. The
higher the value, the shorter will be the time intervals in which the signal reduction is
triggered.
Note: If you wish to record long-term variations in the test material, e.g. continuous
variations in the diameter or wall thickness, you must deactivate tracking. If you are
using the absolute channel to detect long flaws (e.g. as an unwelded tube monitor) and
wish to work with tracking, tracking should be performed only at large intervals in
relation to the anticipated flaw length, since otherwise a long flaw would be
compensated away step-by-step.
Consequence: Select a low tracking speed!
Defining and saving the reference flaws

After a suitable setting has been found for the selected test material, it is advisable to
store this setting in the setting library. In this case, it is possible, for testing sections on
which the comparison piece is transported mechanically through the coil, to store also
the amplitude and phase of the comparison flaws used together with their position. This
allows you to perform simple adjustment later (see Section 4.2.2.1).
In the status bar, after clicking on the test status icon, select the operating mode SETUP.
The Adjustment window can be called by clicking on the Adjust button in the button bar and
then clicking on D'MAT.
Note: Zero compensation of the absolute channel can be performed again, which can
be triggered with OK.
The message waiting for reference piece now prompts you to move the comparison
piece over its entire length through the coil. After passage of the comparison piece, the
flaw with the highest amplitude is marked in yellow.
All flaws detected are specified in the flaw list, together with the position, the gain and
the phase for instance. This flaw list is assigned on the basis of the amplitude of the
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flaws. For each channel, it is possible to save the first three flaws of the flaw list as
reference flaws together with the test instrument setting established.
For this purpose, you must set the top left-hand list box to the corresponding channel
and trigger storage of the reference flaws with Save Ref. The reference flaw data are
thus a part of the instrument setting and is also saved when the instrument setting is
archived.
Note: For a comparison piece on which more than three flaws have been incorporated
(e.g. three flaws of differing depth for setting the differential channel and a slit for setting
the absolute channel), it may occur, under certain circumstances, that a specific flaw
cannot be saved as the reference flaw for a channel because there are three other
flaws with a higher amplitude. For the relevant channel, it is then possible to define an
area in which the flaws relevant to this channel are positioned. The related parameters
Ref.Zone.Start [DifGen; Con] and Ref.Zone.End [DifGen; Con] can be selected in
the Configuration window. Moreover, this window also provides parameters which can
be used to set the motion clock and preselection of the marking and sorting during a
reference run.

The first time the CIRCOGRAPH sensor system is set to a new material, it is necessary
to adapt the test channels and the clearance channel besides setting the rotating head
mechanism which is generally also required. A suitable test setting can then be stored
and retrieved for subsequent tests using the same material. Generally, it is then only
necessary to make slight modifications to the setting.
In the next section, we shall initially consider only the case in which vector evaluation is
to be performed. Since the phase of all test channels must be adjusted besides the
amplitude for Y and sector evaluation, please refer to the section "Setting the
differential channel with phase evaluation". Test channel 1 (Dif 1) must generally be
selected for the following settings since subsequent calibration of the probes in
particular always refers to this channel.
Note: After a probe change, the sensitivity and phase position of the probes of your
CIRCOGRAPH sensor system must be readjusted in relation one another (see Section
4.1.9.3).
Preparations
In the status bar, after clicking on the test status icon, set the operating mode SETUP.
Set the rotating head mechanism to the test piece diameter. Please follow the instructions in
the User Manual for the relevant rotating head.
6.430/2.815/6.440 4-83
Check and correct the settings of the sensor system, in this case primarily:
• diameter Material.Diameter [Line; Sta] of the test piece
• clearance between the probes and the material Clearance mm [Sys, Con]
determined by the larger diameter of the rotating test heads compared to the
material diameter
• rotational speed Rot.Speed rpm [Sys; Sta]
• rotational speed tolerance Rot.Speed.Tolerance % [Sys; Con]
In the status bar under LINECLOCK, set the parameter of the motion clock Speed.Clock.Set
[Line; Con] to the required clock mode and, in the case of an internal clock source, enter the
anticipated speed (Internal.Speed [Line; Sta]).
In the status bar under C’GRAPH, set the parameter of the signal gate
Signal.Gate.Set [Sys; Con] to automatic enable (auto) or permanent enable (on) and activate
the sensor system (on) with parameter Operation [Sys; Sta].
Setting the differential channel

Switch on the rotating head drive.
Deactivate clearance compensation:
Parameter Channel [Clr; Sta] = off.
Activate differential channel 1:
Set parameter Channel [DifSpec\Dif1; Sta] = on in the parameter list directory.
Set the frequency parameter Frequency kHz [DifGen; Sta]. The following table must be
considered only as a guideline. Settings 30 kHz, 100 kHz, 300 kHz, 1000 kHz and 3000 kHz
are available.
Material Test frequency

Austenitic steel, titanium 1-3 MHz
Ferritic steel, bronze 300 kHz – 1 MHz
Copper, aluminium 100-300 kHz
Note: The filters corresponding to this frequency and other instrument settings are set
automatically.
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Make approximate settings for the following parameters:

correction
Filter.Bandwidth [DifGen; Sta] Filter bandwidth 4
In order to visualise the test signals, open the scope of the CIRCOGRAPH sensor system by
clicking on the SIGNAL button in the status bar and choose differential channel 1 (Dif 1) in
the centre list box and display mode Vector V in the right-hand list box.
Place the comparison piece into the transport mechanism and move it slowly into the
rotating head until the signal of the comparison flaw is displayed on the scope. Position the
comparison piece so that this signal reaches its maximum and switch transport off.
You can anticipate a signal similar to the signal shown in the adjacent illustration with a
certain noise level from which the flaw signal is distinguished more or less clearly.
Set the sensitivity Gain so that the wanted signal (comparison flaw signal) reaches approx.
50% amplitude height.
Optimise the frequency if necessary by
• setting to maximum signal amplitude if there is a low noise level
• setting to optimum signal-to-noise ratio if there is a higher noise level
Perform the precise setting of the filters.
Check how the changes of the parameters Filter.Corr. [DifGen; Sta] and
Filter.Bandwidth [DifGen; Sta] affect the signal-to-noise ratio. Set the parameters so that the
noise signals are clipped as much as possible and so that the wanted signals are clipped as
little as possible.
Set the flaw thresholds:
Choose the flaw thresholds F1.Threshold % [Analyse; Sta], F2.Threshold % [Analyse; Sta]
and F3.Threshold % [Analyse; Sta] in practical steps (e.g. 20%, 50% and 100%), depending
on what flaw depths you wish to distinguish. If no empirical values or targets are available, it
is admissible to use three comparison flaws of differing depth and to set the instrument so
that their relevant signals exceed the amplitude thresholds for F1, F2 and F3. Correct the
sensitivity again if necessary.
Setting the differential channel with phase evaluation

For the CIRCOGRAPH sensor system, it is necessary in many cases to use evaluation
other than vector evaluation. This will be the case if the noise level is excessive and if,
as may be the case, even the phase angle of the wanted signal can hardly be
distinguished from that of the noise signal.
For the following settings, you should generally choose test channel 1 (Dif 1), since
subsequent calibration of the probes in particular always refers to this channel.
6.430/2.815/6.440 4-85
Switch on the rotating head drive.

Deactivate clearance compensation:
Parameter Channel [Clr; Sta] = off.
Activate differential channel 1:
Set parameter Channel [DifSpec\Channel1; Sta] = on.
Set the frequency parameter Frequency kHz [DifGen; Sta]. The following table can be
considered only as a guideline. The settings 30 kHz, 100 kHz, 300 kHz, 1000 kHz and
3000 kHz are available.

Note: The filters corresponding to this frequency and other instrument settings are set
automatically.
Make approximate settings for the following parameters:

correction
Filter.Bandwidth [DifGen; Sta] Filter bandwidth 4
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For visualisation of the test signals, open the scope of the CIRCOGRAPH sensor system by
clicking on the SIGNAL button in the status bar and choose differential channel 1 (Dif 1) in
the centre list box and display mode Vector V in the right-hand list box.
Place the comparison piece into the transport device and move it slowly into the rotating
head until the signal of the comparison flaw is displayed on the oscilloscope. Position the
comparison piece so that this signal reaches its maximum and switch off the transport
device.
You can anticipate a signal similar to that shown in the adjacent illustration with a
certain noise level from which the flaw signal can be distinguished more or less clearly.
Set the sensitivity Gain so that the wanted signal (comparison flaw signal) reaches approx.
50% amplitude height.
Switch to display mode Y/X and optimise the frequency if necessary by
• setting to maximum signal amplitude if the noise level is low
• setting to optimum signal-to-noise ratio if the noise level is higher
• setting to maximum phase separation between flaw and noise signals if the noise
level is high
Note: If display mode Y/X is not available owing to a large material diameter, you can
call a Zoom function with the Detail button, and this always provides Y/X.
Perform precision setting of the filters.
Check how the variations in the parameters Filter.Corr. [DifGen; Sta] and
Filter.Bandwidth [DifGen; Sta] affect the signal-to-noise ratio. Set the parameters so that the
noise signals are clipped as much as possible and so that the wanted signals are clipped as
little as possible.
Set the flaw thresholds:
Choose the flaw thresholds F1.Threshold % [Analyse; Sta], F2.Threshold % [Analyse; Sta]
and F3.Threshold % [Analyse; Sta] in practical steps (e.g. 20%, 50% and 100%) depending
on what flaw depths you wish to distinguish. If no empirical values or targets are available, it
is advisable to use three comparison flaws of differing depths and to set the instrument so
that their relevant signals exceed the amplitude thresholds for F1, F2 and F3. Correct the
gain again if necessary.
Select the evaluation mode:
Selection of the evaluation mode (parameter Eval.Mode [Sys; Sta]) depends on the flaw
signals to be detected and the noise signals to be suppressed.
6.430/2.815/6.440 4-87
Y-component evaluation (Y)

• for optimising for a specific flaw type (identical phase angle as the comparison flaw)
− and/or −
• suppression of an excessive noise level which, however, differs clearly as regards
phase angle from the flaw signals.
The phase Phase deg [DifGen; Sta] is set so that the noise signal is suppressed as
much as possible. Vary the phase so that the noise signal points in the X direction.
Sector evaluation (sector)
• Several flaw types are to be evaluated in different ways.
Example: Flaw type 1 (cracks) is assigned to sector 1, flaw type 2 (dents) is
assigned to sector 2.
• Suppression of high noise levels whose phase angle differs only inadequately from
the flaw signals. This must be applied if reliable separation by Y component
evaluation is not possible. In the case of sector evaluation, the position
(Sector.Position deg [Analyse; Sta]) and the opening angle (Sector.Width
[Analyse; Sta]) of the sectors must be selected so that the flaw signals lie centrally
in the sectors whilst the noise signals fall reliably in the area outside of the sectors.
• Adjustment of the signal phases: Unlike vector evaluation, it is necessary, in the
case of Y and sector evaluation, to adjust also the phase angle of all test channels
besides the amplitude.
See Section 4.1.9.3.
Enter the reference flaw manually.
Performing basic adjustment

When you call up the adjustment procedure C'GRAPH to reference defect stationary,
you can adjust clearance compensation simultaneously with calibration of the test
channel amplitudes. Two methods are possible in this procedure. Firstly, a basic
adjustment which is advisable if a new material is to be tested. Secondly, there is a
simplified adjustment which can be used if a setting already exists for the material used
and if a basic adjustment has been performed, but a different diameter is to be tested
(see Section 4.2.3.2).
A reference piece with test flaw is required for the basic adjustment. In order to start
adjustment, click on button Adjust and then click on C'GRAPH. A Setting window
opens, and you must then press the Base button.
Zero adjustment:
Remove the test material from the rotating head and confirm the highlighted field with OK.
The test instrument automatically sets the clearance voltage to zero.
Position the test piece beneath the rotating probes so that the flaw is as close as possible to
the probes. In order to do this, place the test piece onto the protective guides and turn it so
that the flaw points downwards. For optimum position of the flaw, observe the blue bar
display (maximum possible amplitude). It may be necessary to set the sensitivity with the
arrow keys. Then acknowledge the first measuring point by clicking on OK.
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Position the test piece beneath the rotating probes so that the flaw is as far as possible from
the probes. In order to do this place the test piece onto the protective guides and turn it so
that the flaw points upwards. For optimum positioning of the flaw, observe the blue bar
display (minimum possible amplitude). Then confirm this second measuring point by clicking
on OK. Clearance compensation is now activated.
In order to check the adjustment, you can now turn and raise the test piece at will. The
amplitude of the bar display should now fluctuate only within 10%. Correct operation of the
clearance channel can also be checked with the scope. If the setting is accepted, confirm it
with Accept. Otherwise, you are prompted to repeat the adjustment by clicking on Repeat.
When you click on OK, the current setting is accepted. If you click on Cancel, all adjustment
settings made are rejected.
4.2.3 Implementing adjustment procedures

It is generally the case on a testing line that only one specific selection of materials and
material dimensions etc. is to be tested. In this case, a setting can be determined for
each combination and saved together with the amplitudes and phase angles of the
reference flaws (see Section 4.2.2.1).
After calling the corresponding setting, it is not guaranteed that the comparison flaws of
the corresponding comparison piece will once again have the same phase angle and
the same amplitude after a reference run (drift).
In this case however, it is not necessary to repeat the setting procedure specified in the
preceding section but you can perform a far simpler adjustment procedure for the
differential and absolute channel. In addition, this process automatically triggers a zero
compensation of the absolute channel.
Preparations
In the status bar, after clicking on the test status icon, select the operating mode REF.
Load the setting relating to the comparison piece from the
setting library.
Set the sensor system to the test piece diameter. Follow the instructions in the User Manual
for DEFECTOMAT coils in relation to coil diameter selection.
Check and correct the settings of the sensor system (which can found in the parameter list
under D'MAT\Sys), in this case primarily effective probe width
Nominal.Probe.Width mm [Sys; Sta]
(see Section 6.8.2).
In the status bar under LINECLOCK, set the motion clock parameter
Speed.Clock.Ref [Line; Con] to the required clock mode and, in the case of an internal clock
source, enter the anticipated speed (Internal.Speed [Line; Sta]).
6.430/2.815/6.440 4-89
Adjusting the differential and absolute channel

Call up the Adjustment window:
Click on the Adjust button and then clicking on D’MAT. A check is conducted in order to
establish whether the differential and absolute channels are activated. Otherwise, you are
prompted for each channel to specify whether the channel is to be activated.
Perform zero compensation of the absolute channel:
If an absolute channel is present and activated, you are prompted to insert a flawless test
section of the reference piece into the test coil. Zero compensation is triggered when you
confirm with OK.
Perform reference run:
The message waiting for reference piece now prompts you to move the comparison piece
over its entire length through the coil. After the comparison piece has passed through, the
flaw with the highest amplitude is marked in yellow. However, you may select any other flaw
as you wish.
Adjust:
Vary the sensitivity and phase of the marked flaw with the Adjust button so that the flaw
coincides with the reference flaw indicated at this point – as stored in the test setting. This
step must be performed separately for the differential channel and the absolute channel. A
different set of flaws is saved for each channel. The list box at the top left allows you to skip
to and fro between the individual channels.
Quit adjustment:
Adjustment is activated only when you click on OK. By contrast, if you choose Cancel, the
previous values of gain and phase are retained. If you have left one or more channels
without clicking on the Adjust button with OK, you must confirm that you wish to do this.
Note: For as long as the Adjustment window is open, all parts passing through are
treated as reference parts! This means, above all, that they are not counted in the test
report!

In a testing line, it is generally the case that only a specific selection of material and
material sizes etc. are to be tested. In this case, a setting can be determined for each
combination and saved together with the amplitudes and phase angles of the reference
flaws.
After calling the corresponding setting, it is not guaranteed that the comparison flaws of
the corresponding reference piece once again have the phase angle and the same
amplitude after a reference run (drift).
In this case however, the setting procedure in accordance with the preceding section no
longer needs to be repeated; rather, you can perform a far simpler adjustment
procedure for the test channels.
Preparations
Load the setting relating to the comparison piece from the
setting library.
Set the sensor system to the test piece diameter. Follow the instructions in this User Manual
for the CIRCOGRAPH sensor system.
Check and correct the settings of the sensor system (which can be found in the parameter
list under C’GRAPH\Sys), in this case primarily:
• diameter Material.Diameter [Line; Sta] of the test piece
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• clearance between probes and material Clearance mm [Sys; Con], determined by

the larger diameter setting of the test heads compared to the material diameter
• rotational speed Rot.Speed rpm [Sys; Sta]
• rotational speed tolerance Rot.Speed.Tolerance % [Sys; Con]
In the status bar under LINECLOCK, set the parameter of the motion clock
Speed.Clock.Ref [Line; Con] to the required clock mode and, in the case of an internal clock
source, enter the anticipated speed (Internal.Speed [Line; Sta]).
Triggering drift compensation

High temperature variations or soiling of the test heads may cause drift of the zero point
of clearance compensation (i.e. the signal of the clearance channel without material in
the rotating head) over the course of time. This drift may be compensated for without
having to perform the entire adjustment procedure once again from the start.
This compensation of drifts is also recommended ...
... after loading a new setting from the library;
... after switching on the instrument. Best is to wait about 2 minutes after powering on
the system until the probes reached their operation temperature, and then trigger the
compensation function.
Procedure in Setup mode

Remove the comparison piece from the rotating head.
Choose parameter Compensate [Clr; Sta] and trigger with + or -.
This completes the zero adjustment procedure again.
Procedure in Test or Reference mode

Wait until there is currently no test piece in the rotating head.
Choose parameter Compensate [Clr; Sta] and trigger with + or -.
This completes the zero adjustment procedure again.
6.430/2.815/6.440 4-91
Performing size adjustment

This performs adjustment in the case of change to a new test piece diameter. The
precondition for this short-form adjustment procedure is that a test setting has already
been determined for the same probe type, the same material and the same frequency
and that a basic adjustment procedure has been performed. A production piece without
test flaws can be used for dimension adjustment. In order to start adjustment, click on
the Adjust button and then click on C’GRAPH. A Setting window opens, and you must
click on the Dim button.
Zero adjustment:
Remove the test material from the rotating head and confirm the highlighted field with OK.
The test instrument automatically sets the clearance voltage to zero.
Insert the test piece into the rotating head, place the test piece onto the protective guides
and acknowledge by clicking on OK. Clearance compensation is now activated.
When you click on OK, the current setting is adapted. If you click on Cancel, all adjustment
settings made are rejected.
After you have set up the test channels, readjusted the amplitude and performed
clearance compensation, the corresponding test setting should be saved for
subsequent tests.
Save test setting for subsequent tests.
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4.3 Evaluation operating modes

In this section, the basic procedures of the different evaluation processes will be
introduced. Although this section appears very theoretical, it is very helpful for a deeper
understanding of the methods underlying the testing in order to decide which evaluation
mode is best suited for the intended application.
4.3.1 Sequence of the evaluation process

The evaluation process is divided into the following steps:
1. Scanning the evaluation tracks

2. Evaluation option:
Short flaw suppression
− or −
Evaluation in accordance with EN1971
− or –
Minimum Defect Distance
3. Recording the flaw ranks:
A) Determining the number of flaws
− or −
B) Determining the flaw length
− or −
C) Determining the flaw density
4. Classification, grading:
Sorting of the test pieces by flaw count limits (in case A)
− or −
Sorting of the test pieces by flaw length limits (in case B)
− or −
Grading of the test pieces by quality numbers (in case C)
The individual steps are elucidated in the following sections.
6.430/2.815/6.440 4-93
4.3.2 Scanning the evaluation tracks
Evaluation of the recorded signals is performed in various steps. Before the actual
evaluation, the test electronics determines, for each system clock unit in each
evaluation track, whether a flaw threshold F1, F2 or F3 has been exceeded and, if so,
which threshold. A section from such a track with system clock increments could be
imagined as follows:
F1 F1 F1 F2 F2 F1 F1 F1
Fig. 31 Section from a recorded evaluation track
4.3.3 Evaluation options

Before the actual flaw evaluation the following evaluation procedures can be optionally
applied:
• Short flaw suppression (SFS) - only alternatively to EN1971
• Evaluation according to EN1971 - only alternatively to SFS
• Minimum defect distance
4.3.3.1 Short flaw suppression

An evaluation option which suppresses punctiform flaws can now be applied to these
incremented tracks before the application of further evaluation procedures.
This evaluation option is generally referred to as short flaw suppression. A short flaw
suppression is usually only used for the CIRCOGRAPH sensor system.
The short flaw suppression can generally precede all further evaluation procedures as
an option. It is possible for all three flaw classes F1, F2 and F3.
Basic principle
The short flaw suppression ensures that only flaws after a certain length (in mm) are
counted as such. If, for instance, a flaw of class F1 is to be evaluated as a flaw only
after a length corresponding to 3 system clock cycles, we obtain the following instead of
the original track trace as shown in Fig. 36 (see Section 4.3.2):
F1 F1 F1 F2 F2
The system clock cycles with flaws F1 that are smaller than the minimum flaw length
are assessed as flawless.
With application to short flaw suppression for flaw class F3: if the length of the flaw F3
is smaller than the minimum flaw length, the flaw is downgraded one flaw class. That
means a flaw F3 becomes a flaw F2.
Analogously with short flaw suppression for flaw class 2: if the length of the flaw F2 is
smaller than the minimum flaw length, the flaw is downgraded one flaw class. That
means a flaw F2 becomes a flaw F1.
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If a short flaw suppression check is carried out for several flaw classes, the test begins
with the highest flaw class.
Short flaw suppression can be performed for each flaw class but it is conventional
always to allow for flaws of the highest flaw class irrespective of their length. The
minimum flaw length with which a flaw is included in evaluation is determined by
parameter SFS.Length.FX [Analyse; Sta] (X=1...3) in units of mm.
Parameters
If you want to perform a short flaw suppression, set the following parameters:
Parameter Setting value; explanation

Eval.Option [Analyse; Con] Short flaw suppression
SFS.Length.F1 [Analyse; Sta] Desired borderline flaw length for flaw
class F1
class F2
class F3
4.3.3.2 Flaw evaluation in accordance with EN1971
Application
The flaw evaluation according to EN1971 is intended primarily for through-type coils in
order to overcome the disadvantage of encircling differential coils when detecting long
cracks. In principle, it is also possible for CIRCOGRAPH applications.
The flaw evaluation according to EN1971 is preferably implemented for the testing of
copper tubes. It is normally only applied for "pieces" and "cropping/coil to coil".
Search path algorithm – only DEFECTOMAT sensor system

Prior to evaluation according to EN1971, the search path algorithm is executed for
DEFECTOMAT sensor systems. It means that starting with an exceed of a threshold
the typical length of a flaw signal will be analysed as one defect.
As search path, a multiple of the nominal effective width of the sensor system is
designated.
The following applies:
Search path = Nominal.Probe.Width [Sys; Sta] * Search.Factor [Eval; Ser]
Basic principle of the evaluation according to EN1971

For encircling coil systems in particular, Standard EN1971 defines evaluation criteria
which describe a specific mode of counting for transgressions of the flaw threshold FX
(X =1,2,3).
Smaller flaws are only considered as critical when an accumulation of flaws (non-local
inhomogeneity) occurs within an observation window to be defined. If a preselected
flaw count is detected (flaw cluster) within this window which moves continuously over
6.430/2.815/6.440 4-95
the test piece, the tube length observed over the entire window area is evaluated as
flawed (see the following Example 1).
In principle, the evaluation according to EN1971 can be carried out for all flaw classes
(F1, F2 and F3). In general, however, only flaw class 1 is used to evaluate non-local
inhomogeneities. In this case, the system clock units are individually assessed for the
higher flaw classes (F2, F3). If a flaw F2 or F3 is detected, the assessment of flaw class
1 is interrupted and reset (see the following Example 2). If the system clock units of flaw
classes F2 and F3 are to be assessed individually, you must select the length of the
evaluation window to correspond with a system clock unit and select the minimum flaw
number = 1 (see parameters).
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Example 1
• Evaluation according to EN1971 for flaw class F1
• Length of the evaluation window: 4 system units
• Minimum flaw number for assessment as local inhomogeneity: 3
This means: all evaluation windows that contain at least 3 flaws of flaw class 1 are
evaluated as flawed.
System unit No. 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1
Evaluation track F1 F1 F1 F1 F1 F1 F1 F1 F1 F1 F1
Evaluation in
accordance with
EN1971 F1 F1 F1
F1 F1 F1
F1 F1
F1 F1 F1
F1 F1 F1
F1 F1 F1
F1 F1 F1
F1 F1
F1 F1
F1
F1 F1
F1 F1 F1
F1 F1
F1 F1
Result F1 F1 F1 F1 F1 F1 F1 F1 F1 F1 F1 F1 F1 F1
Fig. 32 Evaluation according to EN1971 for flaw class F1, no flaws F2 and F3
Result: In total, two non-local inhomogeneities of flaw class 1 were detected over the
displayed area of the evaluation track.
6.430/2.815/6.440 4-97
Example 2
As in Example 1, but with a flaw of flaw class F2 in system unit 7
System unit No. 20 29 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1
Evaluation track F1 F1 F1 F1 F1 F1 F1 F2 F1 F1 F1
Evaluation in
accordance with
EN1971 F2 F1 F1
F1 F2 F1
F1 F2
F1 F1 F2
F1 F1 F1
F1 F1 F1
F1 F1 F1
F1 F1
F1 F1
F1
F1 F1
F1 F1 F1
F1 F1
F1 F1
Result F1 F1 F1 F1 F1 F1 F1 F1 F1 F1 F2
Fig. 33 Evaluation according to EN1971 for flaw class F1, one flaw F2, no flaw F3
The uppermost evaluation window is not tested for flaw clustering. The second and
fourth evaluation windows (from above) are reset (system unit 4, 5 and 6).
Result: 2 non-local inhomogeneities of flaw class F1 and a single flaw of flaw class F2
were detected.
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Parameters
If you wish to carry out an evaluation according to EN1971 for flaw class F1, set the
following parameters:

Eval.Option [Analyse; Con] EN1971
Eval.Length.F1 [Analyse; Sta] Desired length of the evaluation
window for flaw class F1
Min.Defect.Counts.F1 [Eval; Deb] Desired minimum number of flaws
in the given evaluation window for
flaw class 1
Eval.Length.F2 [Analyse; Sta] Length in mm, which corresponds to
a system unit
Min.Defect.Counts.F2 [Eval; Deb] 1
Eval.Length.F3 [Analyse; Sta] Length in mm, which corresponds to
a system unit
Min.Defect.Counts.F3 [Eval; Deb] 1
4.3.3.3 Minimum defect distance

(Combination of neighbouring flaws)
In particular, if a large number of flaws occur close together, it is favourable to combine
these to form a few flaws. This is achieved by defining a so-called minimum defect
distance. Two flaws are considered as separate only if their spacing exceeds a certain
distance.
Example: If the entered minimum defect distance corresponds to 3 system clock
cycles, we obtain the following configuration instead of the original evaluation track as
shown in Fig. 36 (see Section 4.3.2).
F1 F1 F1 F2 F2 F2 F2 F1 F1 F1 F1
The gaps are filled with flaws of the highest neighbouring flaw class (in this case: F2 in
the left-hand gap or F1 in the right-hand gap).
The minimum defect distance is determined by the parameter
Min.Defect.Distance [Eval; Con]. With the value 0 the algorithm is switched off.
The minimum defect distance algorithm has different effect on the piece evaluation.
When using the flaw count the piece will tend to a better result because of the smaller
number of flaws. When using the flaw length or flaw densitiy the piece will tend to a
worse result because of the filled gaps.
6.430/2.815/6.440 4-99
4.3.4 Recording the flaw ranks

In the further evaluation, different types of flaw information can be taken into account:
• flaw number
• flaw length
• flaw density
There are special evaluation procedures for all three cases. The evaluation procedures
are described in greater detail in what follows.
4.3.4.1 Determining the number of flaws (flaw count)
Flaw type unification (Unification algorithm)

Before determining the number of flaws per flaw class, a "flaw type unification" is
carried out. For this purpose, neighbouring flaw grids in a track are combined to form
one flaw. The flaw class corresponds to the highest flaw grid. We then obtain the
following configuration for the example shown in Fig. 36 (see Section 4.3.2):
F1 F2 F1
Counting the flaws

Following the evaluation algorithms described above, the flaws of the individual classes
are counted. One distinguishes between two counting methods:
1. Normal (Count.Mode [Eval; Con] = with lower classes)
A flaw of a certain flaw class is also counted as a flaw of the lower flaw classes.
Example: A flaw F2 is counted as flaw F2 and as flaw F1. In the evaluation track
above, one obtains three flaws F1 and one flaw F2.
2. Substract (Count.Mode [Eval; Con] = single class)
A flaw of a certain flaw class is only counted as a flaw of this class and not of the lower
flaw classes. Example: A flaw F2 is only counted as flaw F2 and not as flaw F1. In the
evaluation track above, one obtains two flaws F1 and one flaw F2.
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Parameters
If you wish to determine the flaw count, set the following parameters:

Statistics [Eval; Con] Count
Count.Dimension [Eval; Con] Defects
4.3.4.2 Determining the flaw length

Determination of the flaw length is, analogously to determining the number of flaws, an
event evaluation (Statistics [Eval; Con] = count). However, now it is the system clock
cycles which are counted, regardless of their distribution and the gaps, so as to obtain
an overall length for the threshold transgressions. This total flaw length is formed
separately for each flaw class.
Parameters
The following parameters must be set in order to determine the flaw length:

Statistics [Eval; Con] Count
Count.Dimension [Eval; Con] Length
4.3.4.3 Determining the flaw density

In order to calculate the flaw density, all system clock units marked with a flaw F1, F2
and F3 and each evaluation track are added over the selectable selection length and
converted to the relevant flaw density D1, D2 and D3. The flaw density D is defined as
the quotient of the number of flawed system units and the total number of system units
per section.
Example: There are 5 system units with flaw F2 on a section with 500 system clocks.
In this case the flaw density D2 = 0.01.
In the determination of the flaw density, there is no combination of flaws from the
different flaw classes.
For each section, the highest density from all evaluation tracks applies in each flaw
class, i.e. the section is assessed with 3 numbers D1max, D2max and D3max.
Unlike determination of the flaw quantity, if a flaw class Fm is exceeded, all subordinate
flaw classes Fn (n<m) are also counted. This corresponds to the Normal method and is
achieved by setting parameter Count.Mode [Eval; Con] to with lower classes.
Parameters
The following parameters must be set in order to determine the flaw density:
6.430/2.815/6.440 4-101
Statistics [Eval; Con] Density

Section.Length m [Eval; Con] To be entered in m
4.3.5 Assessment, classification

(sorting and quality classes)
Depending on the type of flaw information determined (flaw number, flaw length, ...), the
test results are compared with flaw limits which act as a sorting criterion, or evaluation
numbers (so-called quality numbers) are formed.
4.3.5.1 Sorting by flaw count limits

After the number of flaws has been determined, a comparison is conducted with flaw
count limits. This comparison of the total number of flaws (sum over all evaluation
tracks) is performed for each flaw class F1, F2 and F3 separately. The assigned
parameters used as limit values are S1.Limits.FX [Sort; Con] and
S2.Limits.FX [Sort; Con] (X = 1...3). After transgression of the relevant limit value,
ejection of the test piece into the relevant sorting trough is triggered. The number of
parameters to be preset depends on the number of sorting troughs present.
4.3.5.2 Sorting by flaw length limits

After determining the flaw length, a comparison with flaw length limit values is
performed. This comparison of the total flaw length (sum over all evaluation tracks) is
performed for each flaw class F1, F2 and F3 separately. The assigned parameters are
as with the flaw count limits: S1.Limits.FX [Sort; Con] and S2.Limits.FX [Sort; Con]
(X = 1...3). However, these limit values must now be entered in units of mm. After the
relevant limit value is exceeded, ejection of the test piece in the relevant sorting trough
is triggered. The number of parameters to be preset depends on the number of sorting
troughs present.
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4.3.5.3 Generation of quality numbers

After determining the flaw density, no comparison is performed with a limit value but,
initially, a quality number is computed for each section on the basis of the evaluation
algorithm Quality number over weighted densities (see Section 4.4.7.5) and the
arithmetic mean is then formed for all sections. The result of this calculation leads to
subdivision of the test material into quality classes QX (X = 1...9).
To determine the quality number, the quality coefficients A0, A1, A2 and A3 must be
laid down and entered as corresponding parameters Quality.Coefficient.AX
[Eval; Con] (X = 0...3). The quality coefficients weight the flaw densities of the different
flaw classes. The quality coefficients must not be confused with the quality
number.
For details on determining the parameters Quality.Coefficient.AX [Eval; Con]
(X = 1...3), see Section 4.4.7.5.
4.3.6 Line positions for the evaluation

To clarify the parameters that describe the lengths within the testing line, the positions
of relevant testing line components are schematically represented in the following
diagram. The picture shows only 1 marking gun, but there are several marking guns
possible at different distances. The requirements following apply to all of them.
Fig. 34 Evaluation positions
Mounting position of the sensor systems

In case of several sensor systems, e.g. C'GRAPH rotating head and D'MAT coil, the
sequence in line is selectable. The system that is counted as no.1 by the software can
be mounted at the second position, too.
The distance betwenn the sensor systems should be as small as possible.
Light barrier for signal gating

In front of the foremost sensor system a light barrier for the signal gating (LS2) must be
mounted and must be connected to Tls2. The distance to the foremost sensor system
should be as small as possible and must meet two requirements:
6.430/2.815/6.440 4-103
The distance from the light barrier to the first sensor system in line must be as large as the
maximum untested end on the test pieces.
The distance from the light barrier to the last sensorsystem in line must be smaller than the
shortest test piece sequence (shortest piece + shortest gap between pieces).
The light barrier LS2 is the central zero point for all measurements of line positions
behind.
In testing lines with endless material the light barrier LS2 can be omitted. In this case a
position in front of the foremost sensor system should be marked as zero point. All
measurements of line positions have to start at this mark.
The distance of the middle of the coil resp. the middle of the test head to the light
barrier LS2 must be input at parameter LS2.Distance [Sys; Con] for every sensor
system individually.
Light barrier for speed measuring

In case of speed measuring by transition time a further light barrier LS1 must be
mounted in front of LS2. It must be connected to Tls1. The distance between the two
light barriers must be input at parameter Measure.Distance [Lin, Con],
Definition of the Result-Position

100mm behind the last sensor system the signals of all sensor systems are analysed. If
optional evaluations like Short-Flaw-Suppression or Flaw Evaluation acc. EN1971 or
Minimum-Defect-Distance should be used, an additional length in line must be reserved
by parameter Max.Eval.Length [Eval, Con].
At the end of this evaluation length is the so called Result.Position, where the marking
and sorting informations are available. Therefore use small values for Max.Eval.Length,
if the marking or sorting must take place short behind the last sensor system. If marking
and sorting positions are not predefined, give enough space for the optional
evaluations.
The Result.Position is also the starting point for the result display in the window Piece
Image.
Sorting Position
In Test.Procedure 'without cutting' the sorting information is available when the piece
end reaches the Result-Position, which is indicated by signal Cend.
With Sorting.Control 'on request' the requesting signal Sreq can occur from this
moment on. It must occur before the next piece end reaching the Result.Position. With
Sorting.Control 'at piece end' the sorting signals will be activated together with Cend.
In Test.Procedure 'with cutting' the sorting information is available just after the cutting
signal Scut and applies to the piece behind the cutting station.
Marking Positions
The marking guns must be mounted behind the Result.Position but with enough gap for
the response time. The minimum distance from the Result.Position can be calculated
by response time of the gun * maximum line speed.
Every marking gun can be located at a different position, but the distance should be as
small as possible to keep a high marking precision. The distance of the marking gun to
light barrier LS2 must be input at parameter Marking.Distance.Gate.X, with X number of
the marking gun.
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In case of tail marking of the pieces depending on the sorting results and cutting
operation the marking guns must be located behind the cutting station (parameter
Cut.Position) with enough gap for the response time (see above).
4.3.7 Application examples

In the following examples, parameter presets for different applications are listed.
Deviations from these recommendations are certainly compatible with existing
standards or own evaluation preferences.
4.3.7.1 Piece testing

For this application, it is conventional to perform event weighting, i.e. to determine
either the number or length of flaws. Besides the parameters which must be set for
these cases, other parameters must also be set:

Statistics [Eval; Con] count
Count.Dimension [Eval; Con] defects
SX.Limits.FX [Sort; Con] Entry of the flaw count limit for each flaw
class FX (X=1...3)
Count.Mode [Eval; Con] single class
Eval.Option [Analyse; Con] 1 (off, normal operation), 2 (short flaw
suppression)
SFS.Length.FX Must be changed only if testing with
[Analyse; Sta] CIRCOGRAPH/ short flaw suppression see
Section 4.4.7.6
(to be entered in mm)
Test.Procedure [Line; Con] w.o. cutting
Measure.Distance [Line; Con] To be set for speed measurement with light
barriers
Untested.Front [Sys; Sta] Entry of the untested leading section in mm
Untested.Tail [Sys; Sta] Entry of the untested trailing section in mm
Piece.Length.Evaluation on if length of the material represents a
[Eval; Sta] sorting criterion
off if no length evaluation is required
Piece.Length.Min m Entry of the minimum piece length if length
[Eval; Sta] evaluation is required
Piece.Length.Max m Entry of the maximum piece length, also
[Eval; Sta] acts as a scale length in the result windows
Cropping.Suppression [Eval; Con] off
Virtual.Piece.Length m 0
[Line; Con]
6.430/2.815/6.440 4-105
As an alternative to determining the flaw count, it is also possible to determine the total
flaw length in each flaw class. In this case, parameter Count.Dimension [Eval; Con]
must be set to length. The flaw limits SX.Limits.FX [Sort; Con] must now be entered
as flaw length limits, which can be set in units of mm.
4.3.7.2 Cropping/Coil to coil

As with piece testing, for this application it is also conventional to perform event
weighting, i.e. to determine either the number or the length of flaws. Besides the
parameters which must be set for these cases, other parameters must also be set:

Statistics [Eval; Con] count
Count.Dimension [Eval; Con] Defects
SX.Limits.FX [Sort; Con] Entry of the flaw count limit for each flaw
class FX (X=1...3)
Count.Mode [Eval; Con] single class
suppression),
3 (EN1971)
SFS.Length.FX [Analyse; Sta] Must be changed only if testing with
CIRCOGRAPH sensor system/short flaw
suppression Section 4.4.7.6.
Length entered in mm.
Test.Procedure [Line; Con] with cutting
Cut.Position [Eval; Con] Distance between light barrier 2 and the

cutting station (see Section 4.3.6)
Cutting.Tolerance [Line; Con] Entry of the tolerance for cropping
Piece.Confirmation [Line; Con] Off
Piece.Length.Evaluation on if the length of the material represents
[Eval; Sta] a sorting criterion
off if no length evaluation is required
Piece.Length.Min m Entry of the minimum piece length if
[Eval; Sta] length evaluation is required
Piece.Length.Max m Entry of the maximum piece length, also
[Eval; Sta] acts as scale length in the result windows
Cropping.Suppression [Eval; Con] Off
[Line; Con]
As an alternative to determining the flaw count, it is also possible to determine the total
flaw length in each flaw class. In this case, parameter Count.Dimension [Eval; Con]
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must be set to length. The flaw limits SX.Limits.FX [Sort; Con] must now be entered
as flaw length limits, which can be set in units of mm.
4.3.7.3 Continuous
For this application, it is conventional to perform a statistical weighting, i.e. to determine
the density of the flaws. Besides the parameters which must be set for this case, other
parameters must also be set:

Section.Length m [Eval; Con] Length of a section of the entire test piece
which is given an its own assessment
Quality.Coefficient.AX [Eval; Con] Entry of the quality coefficients for
computation of quality numbers
(see Section 4.4.7.5)
Count.Mode [Eval; Con] with lower classes
suppression),
3 (EN1971)
Virtual.Piece.Length m Entry of a length that appears favourable
[Line; Con] for the display in the result windows.
When this length is attained, the display
jumps to the next line – analogous to
virtual cutting of the test material.
Cropping.Suppression [Eval; Con] Off
6.430/2.815/6.440 4-107
4.3.7.4 Wire
For this application, it is conventional to form a statistical weighting, i.e. to determine
the density of the flaws. Besides the parameters which must be set in this case, other

which is given an its own assessment
suppression)
[Line; Con]
In the case of copper wire testing in particular, it is practical to perform an event

weighting in place of statistical weighting. In this case, parameters
Statistics [Eval; Con], Count.Dimension [Eval; Con] resp. Count.Mode [Eval; Con]
must be set in accordance with the information provided in Section Piece testing.
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4.3.7.5 Hot wire

For this application, it is conventional to perform statistical weighting, i.e. to determine
the density of the flaws. Besides the parameters which must be set for this case, other

which is given an its own assessment.
Eval.Option [Analyse; Con] 1 (off, normal operation)
Cropping.Suppression [Eval; Con] on if cropping length suppression is
required, otherwise off
Cropping.Section.Begin Entry of the start cropping length in m if
[Eval; Con] cropping length suppression is activated
Cropping.Section.End Entry of the end cropping length in m if
[Eval; Con] cropping length suppression is activated
[Line; Con]
6.430/2.815/6.440 4-109
4.4 Configuration/adjusting the software to the testing

environment
4.4.1 Basic information
Configuration means adapting the software to the mechanical and electrical
characteristics of the testing environment. Most of the settings relate only to parameters
which generally need be set only once when the test instrument is commissioned. All
parameters required for installation can be found in parameter list (Section 4.1.7.2).
Besides the pure configuration parameters, the parameter list also contains all
operator-control parameters for the test instrument. These depend on the technical
testing task and also on the products to be tested and the specific test requests. The
Quick window of the DEFECTOTEST DS GUI can be adapted optimally in
accordance with Section 4.1.7.1.
The following sections describe the individual parameters in a specific context resp.
functional interrelationship (e.g. marking, sorting etc). It is stated, in each case, in which
directory these parameters can be found.
Various parameters are visible only if specific preconditions are met. Thus, the marking
parameters are displayed only if the corresponding marking ports also exist.
Designation of parameters
In this chapter, the directory (module) and the key level of the parameter, which is
described in a sub-chapter, is specified separately at the beginning of the sub-chapter.
Example:
4.4.7.8 Leading end length (Cropping.Section.Begin m)
Directory: Eval Level: Con

This parameter defines the length of the leading end in m.
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4.4.2 Settings of the sensor system

This essentially means the settings for the characteristics of the sensors (e.g. effective
width). Initially, the parameters for all sensor systems are presented and then the
parameters reserved for the rotating systems.
4.4.2.1 Activating and deactivating the sensor system (Operation)

Directory: Sys Level: Sta
This parameter activates the sensor system (on) and deactivates it (off).
You can switch the system on and off in a simple manner with the button D'MAT in the
status bar. The parameter Operation is adapted to the current setting.
You can switch the system on and off in a simple manner with the button C'GRAPH in
the status bar. The parameter Operation is adapted to the current setting.
The setting of the parameter can be seen from the colour in which the name of the
sensor system is highlighted. If it is highlighted in green, the sensor system is
activated; otherwise, the name is highlighted in grey.
4.4.2.2 Effective probe width (Nominal.Probe.Width)

This parameter is required in order to be able to perform automatic setting of the low-
pass and high-pass filters.
Definition of effective probe width:
The extent of the effective coil field in the track direction of the probe. It determines the
signal characteristic when the probe passes over a flaw.
Parameter Nominal.Probe.Width must always be changed if a sensor with a different
effective probe width is used.
The corresponding table value in accordance with Section 6.8 must be entered for this
parameter. The existing sensor type can be identified from the part number of the
sensor system on the delivery note and on the sensor system itself.
Tip: If you work with a large number of different sensor types or in various diameter
ranges, it is advisable to include this parameter in the Quick window.
6.430/2.815/6.440 4-111
4.4.2.3 HF preamplifier (HF.Preamplifier)

Directory: Sys Level: Con
This parameter indicates, for the relevant sensor system, whether preamplifiers are
connected in series with the test probes.
For a DEFECTOMAT sensor system, no amplifiers are scheduled by default (0).
Otherwise, value 1 must be entered for the parameter. If there are several probes, the
values must be listed accordingly and separated by a comma, e.g. 1,1,0,0.
For a CIRCOGRAPH sensor system, preamplifiers for all probes are integrated in the
rotating head electronics (value in the case of two probes: 1,1; value in the case of four
probes: 1,1,1,1).
4.4.2.4 Track assignment (Trace.Assignment)

Parameter Trace.Assignment decides whether the evaluation tracks are to be
assigned to individual instrument channels or individual circumferential segments of the
test material.
The following assignment applies:
• DEFECTOMAT: Channels
The number of channels which can be evaluated on the DEFECTOMAT sensor system
results from the physical number of test channels fitted and the absolute channel.
The following assignment applies:
• CIRCOGRAPH: Segments
The number of circumferential segments which can be evaluated on the CIRCOGRAPH
sensor system is limited, the lower limit being set by the number of existing test heads
and the upper limit being set by the rotational speed. Possible values are 1,2,4,8 and
16 (see next section). Of course, a greater number of segments to be evaluated also
necessitates a correspondingly higher computing power.
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4.4.2.5 Combination of channels (Channel.Mode)

Parameter Channel.Mode defines how the channels of a sensor system will be
combined. The combination applies on one hand to the setting and on the other hand to
the test results.
Channel. Setting of the Recording of the flaw Recording of the

Mode parameters signal defect events
Independent individual for each individual for each individual for each
channel channel channel
Common all channels unique individual for each individual for each
operation channel channel
Common all channels unique combined flaw signal individual for each
flaw display (largest amplitude of channel
all channels)
Common all channels unique combined flaw signal combined defect
event display (largest amplitude of events
all channels) (1 event line)
The selection of individual or unique setting changes the structure of the parameter list.
With individual setting there are as many parameter groups DifGen as channels are
present; with unique setting there is only one parameter group DifGen in the sensor
system.
Note: The special parameters (DifSpec), e.g. the sensitivity correction, are always
channel dependent.
The selection of individual or combined flaw and event recordings changes the marking
assignment and the result window piece.image.
Note: If multiple sectors are used in the impedance plane (parameter No.Sectors > 1) ,
the number of event lines as determined by the channel mode will be multiplied by the
number of sectors.

At a CIRCOGRAPH without option Circumferential Marking there is only selection
Channel.Mode = 'common event display' possible. Only the setting of the probes in a
unique way makes sens and has to be done only once by the operator. The signal flaw
and the defect events do not distinguish between the probes.
At a CIRCOGRAPH with option Circumferential Marking the selection Channel.Mode =
'common flaw display' is possible. The setting of all probes is unique again. The
probe signals will be assigned to the circumferential segment, in which the probe stays
as the signal is being recorded (Trace.Assignment = 'segments'). The signal analysis
will be done in each segment independently – including SFS. Afterwards the signal
flaws will be combined to 1 flaw line in the result window. But the defect events stay
individual for each segment, i.e. as much event lines as circumferential segments. The
segment information is stored in the result database and can be used for the marking
assignment (parameter Mark.Assignment.Fx).
6.430/2.815/6.440 4-113

At the DEFECTOMAT there are no circumferential segments, but instead the channel
information will be recorded (Trace.Assignment = 'channels'). The channel mode
doesn't matter at the one channel DEFECTOMAT. For a multi channel DEFECTOMAT
the best setting depends on the type of sensor system:
A two frequency system must be set to Channel.Mode = 'independent', to allow
different settings in the two channels. The results will always be treated
independently in this case.
A sensor system of multiple segment coils will typically be set unique in all channels.
If the signals of every coil should be displayed independently, Channel.Mode =
'common operation' must be selected. If you would like to have not as much
information in the result windows, select 'common flaw display' or 'common event
display' to get a more compressed result window.
It is important to know that not only the result display is being combined, but also the
entries in the result database. With selection 'common event display' even the
marking assignment cannot be done in dependance of the channels.
4.4.2.6 Limitation of the frequency range (Frequency.Max, Frequency.Min)

The selectable frequency range can be limited with these two parameters. The
parameters disable the testing with frequencies that do not provide usable signals with
the given sensor system.
Note: The parameter Frequency can be set only to such values that are in the list of
generable frequencies depending on the test channel. All of these frequencies that are
smaller than Frequency.Min or that are larger than Frequency.Max will be eliminated
from the list of selectable frequencies.
4.4.2.7 Further parameters for CIRCOGRAPH or CIRCOSCAN sensor systems
Probe track width (Rot.Trace.Width mm)

This parameter is required for monitoring for testing without omission.
Definition of probe track width:
Extent of the effective coil field transverse to the track direction, i.e. in throughput
direction of the test material. Together with the number of test heads and the number of
probes per test head, it determines the permitted feedrate of the test material.
Parameter Rot.Trace.Width mm must always be changed if a sensor with a different
effective probe width is used.
parameter. The existing sensor type can be identified from the part number of the
sensor system on the delivery note and on the sensor system itself.
Coil clearance correction (Winding.Dist.Corr mm)

The measuring probes are located further back than the test head surface owing to a
protective cover. Parameter Winding.Dist.Corr mm allows for this fact and performs a
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correction of the true distance between the probe and test material surface. The
corresponding table value in accordance with Section 6.8 must be entered for this
parameter.
Number of sensor elements per test head (Sensor.Per.Head)

This parameter defines number of sensor elements present in the individual test heads.
parameter. Amongst other things, it determines the maximum permitted feedrate of the
test material.
Number of test heads (No.Heads)

This parameter defines the number of test heads connected and installed in the test
instrument. Amongst other things, it determines the maximum permitted feedrate of the
test material.
Clearance between probes and material (Clearance mm)

This parameter defines the clearance between the probes and the material surface. It
must be calculated as:
(Diameter setting at the rotating head – material diameter) / 2.
In most cases the clearance will be kept constant, as the diameter setting at the rotating
head will be selected a fixed value larger than the material diameter. In such cases the
parameter Clearance can stay always at the same value.
The parameter Clearance influences, amongst other things, automatic setting of the
filters. For this reason, the setting should be made with care.
Direction of rotation (Rot.Direction)

This parameter defines the direction of rotation of the test heads referred to the
throughput direction.
• cw: Clockwise direction of rotation
• ccw: Direction of rotation counter-clockwise
The default setting is cw.
6.430/2.815/6.440 4-115
Rotational speed (Rot.Speed rpm)

This parameter defines the rotational speed of the test head mechanism.
If the motor control contains only two rotational speeds, this value generally needs to be
set only during commissioning.
If the motor control allows variable rotational speeds, the values must be entered before
defining a new test instrument setting.
Parameter Rot.Speed rpm determines, amongst other things, the maximum permitted
feedrate of the test material and is required for automatic filter setting.
Rotational speed tolerance (Rot.Speed.Tolerance %)

Parameter Rot.Speed.Tolerance % defines in what range the speed may deviate from
the set value Rot.Speed rpm [Sys; Sta] (see previous section). Amongst other things,
it determines the maximum permitted feedrate of the test material and is required for
automatic filter setting. In addition, it serves to monitor the actual rotational speed. If the
rotational speed moves out of the preset range, a warning message is issued. The
tolerance band can be selected within 10% of the preset rotational speed setpoint.
Synchronisation point of rotation (Rot.Sync.Pos deg)

This parameter defines the sensor position with respect to which synchronisation is
performed and to which all signals refer spatially. The zero point 0° is, by definition,
located at the right-hand side centre (3 o'clock position) in relation to the throughput
direction. The sensor position depends on the rotating head type.
Rotation control (Rot.Gate.Control)

This parameter defines whether the signal gate is enabled by the rotation control
permanently (off) or dependent on the position of the rotating head (on).
Note: This parameter must be set to off, i.e. the signal gate is always enabled by the
rotation control.
Rotation plane (Rot.Plane, Rot.Head.Diameter)

This parameter determines the rotation plane of the rotating system. In one case the
probes rotate vertical with respect to the test material (setting vertical); this applies to
all CIRCOGRAPH rotating heads. In the other case the probes rotate parallel to the test
material surface (setting parallel); this applies to all CIRCOSCAN rotating discs.
In setting parallel the parameter Rot.Head.Diameter appers, which must be set to the
diameter of the rotating disc. This value is used for calculation of the probes' speed
over the material and the proper filter setting. In setting vertical parameter
Rot.Head.Diameter will disappear, and the software uses parameter Material.Diameter
for the filter calculation.
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Rotation range (Rot.Range)

This parameter defines the rotational speed range of the rotating system.
Note: This parameter must be set to high.
4.4.3 Setting the display and evaluation depth

This section deals with the parameters which decide to what extent the incoming
signals are differentiated or are combined before and after evaluation. This means the
signals displayed in the Result window Piece Image. The amplitude traces of the
recorded signals are displayed in the upper section whilst the result after evaluation is
displayed in the lower section in the form of so-called evaluation tracks.
The number of signal amplitude displays and the number of related evaluation tracks
depend on the relevant instrument configuration and the required information depth.
4.4.3.1 Number of segments (Segments.Per.Revolution)

This parameter defines how many segments are to be evaluated per circumference.
Values 1, 2, 4, 8 and 16 are possible in general, but the effective range is limited by the
parameter Rot.Speed to a maximum value and parameter No.Heads as a minimum
value.
Individual evaluation of the segments is performed only with the CIRCOGRAPH-option
'Circumferential Marking' and parameter Channel.Mode = 'common flaw display'. With
Channel.Mode = 'common event display' the data of of segments are combined to one
evaluation track.
4.4.3.2 Number of sectors (No.Sectors)

Sector evaluation allows known disturbance sources which assume specific phase
angles in the impedance plane to be excluded from further evaluation. For this purpose,
evaluation sectors (see Sections 4.4.8.6 and 4.4.8.7) which do not contain these flaw
signals are set in the impedance plane. It is possible to define up to 4 such sectors. In
principle, this allows up to 4 flaw types (crack, scab, dent etc.) to be distinguished on
the basis of their phase angle.
The number of defined sectors multiplicatively increases the number of evaluation
tracks displayed. Please refer to Section 4.4.2.5 for further details.
6.430/2.815/6.440 4-117
4.4.3.3 Sector names (Sector.Names)

These parameters allow you to assign a name to each sector for sector evaluation.
Maximum five letters can be used for the names. If more than one sector has been
defined, the names must be entered one after the other and separated by commas.
You should use 'revealing' names wherever possible.
Tip: Since each sector can be assigned to a specific flaw, it is practical to name the
individual sectors after the corresponding flaws.
4.4.4 Setting the differential channel
4.4.4.1 Activating and deactivating the differential channel (Channel)

Directory: DifSpec Level: Sta
This parameter activates (on) and deactivates (off) the differential channel.
In state wo.excit. the test channel switches off not just the receiver but also the
transmitter. This can be helpful to avoid mutual influences of the probes.
Note: In multi probe systems the impedance of the probes changes when the excitation
of one probe is being switched off. This causes a change in sensitivity at the other
probes by 1 to 2 dB.
In state resid.volt. the test channel provides the residual voltage remaining after the
demodulation instead of the normal test signals. In the scope the residual voltage can
be checked. This state is not allowed in testing mode, but only in setup mode.
Note: the states wo.excit. and resid.volt. are only supported by test channels of newer
version (order no. ???). With older test channels these states have no function.
4.4.4.2 Frequency (Frequency kHz)

Directory: DifGen Level: Sta
This parameter defines the test frequency, i.e. the frequency of the alternating current
with which the coil is excited. The frequency determines the magnitude and penetration
depth of the eddy currents in the test material and is thus of crucial significance as
regards flaw detectability. The frequency imposes an upper limit on the setting range of
the low-pass filter.
Tip: Include the parameter in the Quick window if you have to test different materials or
parts with greatly differing geometry.
Selection of the test frequency - DEFECTOMAT sensor system

The following recommendations apply to through-type coils. It must be noted that these
recommendations can only be considered as general guidelines owing to the complex
interrelationships.
• Minimum frequency:
The required minimum frequency depends on the test speed.
Guideline value: 1 kHz per 1 m/s
The instrument issues a message if the frequency is too low resp. the maximum
speed is too high.
• Maximum permitted frequency:
Generally for HD and HMD through-type coils: f ≤ 1 MHz
Generally for LMD through-type coils: f ≤ 100 kHz
4-118 6.430/2.815/6.440
Specific frequency ranges are specified for standard LMD coils, depending on
diameter range:
Nominal diameter ∅1.2..68 mm → max. test frequency fmax = 100 kHz
Nominal diameter ∅ > 68 mm → max. test frequency fmax = 30 kHz
• Testing tubes for internal and external flaws:
The following rule of thumb can be specified for this application for the test frequency
f in [kHz]:
At a frequency in accordance with this formula, the penetration depth of the eddy
currents approximately corresponds to the wall thickness of the tube so that even
internal flaws can be detected. Experience has shown that there is a phase difference
of approx. 90° between external and internal flaws.
You should choose a higher frequency for small diameters and a low frequency for
large diameters, i.e. on the basis of the above formula:
− with ∅ > 40 mm: next available frequency down,
− with ∅ ≤ 40 mm: next available frequency up.
Pure surface testing of tubes and solid stock:
In this case, the following rule of thumb applies to the test frequency f in [kHz]:
At this frequency, the eddy currents achieve a penetration depth of approx. 1 mm. If
internal flaws are to be suppressed on tubes, a higher frequency will be required.
Allow for the test material diameter as with internal-external flaw testing.
6.430/2.815/6.440 4-119
• Testing hot wire:

The same values as for cold stock apply to hot copper.
Guideline values for ferrous material above the Curie point:

− with ∅ ≤ 30 mm: test frequency f = 100 kHz
− with ∅ > 30 mm: test frequency f = 30 kHz
Selection of the test frequency - CIRCOGRAPH sensor system

The following table contains guideline values for entering the test frequency. It is
essentially oriented around the conductivity of the material to be tested.

4.4.4.3 Filter setting in normal and manual mode (Filter)

This parameter defines the filter operating mode for normal Test operating mode and
when working in manual mode.
In the first case, the parameter is set to active. The high-pass filter is then set
automatically.
In the second case, the parameter must be set to demo or manual.
The demo operating mode opens the filters as far as possible. This mode should be
used, when the test piece is moved to and fro manually in the sensor system. This
means that the preset internal speed (Internal.Speed [Line; Sta]) can be complied with
only approximately. In normal operation with automatically set high-pass filter, this
leads to a situation in which the amplitude and the phase angle of the signals vary
greatly with fluctuating speed. Parameter setting demo opens the high-pass filter and
thus simplifies setting.
If, by contrast, the reference piece is coupled to a timing wheel when being manually
moved to and fro in the sensor system and the motion clock parameter
Speed.Clock.Set [Line; Con] is set to external, you can leave Filter set to active.
Setting demo is very suitable for a fast function test. You can easily determine whether
a signal is present at all.
The manual operating mode means that the operator has full control about the filter
setting by himself. When selecting this mode the parameters HP.Filter.Man and
LP.Filter.Man will appear in the parameter list. By use of these parameters every filter
setting is possible. The only restriction is that HP.Filter.Man must be smaller or equal
to LP.Filter.Man, and the maximum for LP.Filter.Man depends on the test frequency.
Now the operator has to care for an appropriate filter setting. The automatic adaptations
depending on the speed do not work.
Manual mode is not possible, if automatic filters are equipped.
4-120 6.430/2.815/6.440
4.4.4.4 High pass filter correction (Filter.Corr)

Only for CIRCOGRAPH sensor system
The parameter Filter.Corr acts as a filter sharpness correction for the high-pass filter
(HP filter). This serves to suppress low-frequency noise signals. The value range for
setting is between –4 and 4. The increment is 1.
• 0: No correction of the filter sharpness (neutral setting). The high-pass filter is set
automatically on the basis of the effective probe width and the current speed.
• -4...-1: Lower filter sharpness. The high-pass filter is always set one, two, three or
four steps lower than the neutral setting. The edge is further away from the typical
wanted signals. Signals with lower frequency (e.g. signals of internal flaws and
dents) are suppressed to a lesser extent in the filter.
• +1...+4: Higher filter sharpness. The high-pass filter is always set one, two, three or
four steps higher than the neutral setting. The edge lies closer in the case of the
typical wanted signals; noise signals just below the frequency of the wanted signals
(e.g. noise level resulting from vibrations) are suppressed better. However, if the
filtration is too sharp, this does entail the risk of also attenuating wanted signals in
the filter.
Setting 0 is selected such that typical wanted signals are also already slightly
attenuated in the interests of effective noise suppression. If no high noise signals are
present, select settings with negative sign.
4.4.4.5 Filter bandwidth (Filter.Bandwidth)

Only for CIRCOGRAPH sensor system
The filter bandwidth (parameter Filter.Bandwidth) influences the setting of the low-
pass filter. This suppresses high-frequency noise signals. Its setting range and, thus,
automatically the filter bandwidth is limited upwards by parameter
LP.Frequency.Limit % [DifGen; Ser]. The lower limit of the setting range is limited by
a number of other parameters.
The setting of the bandwidth and, thus, the setting of the low-pass filter are generally
non-critical since the typical high-frequency noise lies well above the frequency of the
wanted signals. Generally, different settings within the limits set automatically by the
above-mentioned parameters supply a similarly good signal-to-noise ratio so that you
can frequently dispense with optimisation. Manual readjustment is practical only if the
same test speed occurs when setting as occurs subsequently in Test operating mode. It
is required only if an instrument setting is to be optimised for a specific flaw type or if
noise signals whose frequency lies just above the wanted signals are to be masked.
4.4.4.6 Gain (Gain dB)

Parameter Gain dB determines the amplitude of the analog output signals and is
crucial as regards correct classification of the flaw signals with the aid of the trigger
thresholds. The gain must be adapted each time the test material is changed. This can
be done by direct setting or by selecting the appropriate instrument setting. Moreover
adjustment procedures to simplify setting are available (see Section 4.1.9).
6.430/2.815/6.440 4-121
4.4.4.7 Gain readjustment range (Readjust.Range)

Directory: DifGen Level: Con
At key level 2 (reduced) or lower, the parameter Readjust.Range dB defines the
adjustment range within which the parameter Gain dB [DifGen; Sta] (see previous
section) can be increased or decreased. The value 0 dB disables readjustment, the
value 71.9 dB fully enables setting of the gain.
At key level 3 (normal) or higher, the parameter Gain dB [DifGen; Sta] defines the
middle of the setting range.
Tip: Use the function only when necessary. Choose a readjustment range which is as
narrow as possible and only as broad as necessary to compensate for the influences
occurring in your system. Conventional values lie at approx. 3 dB.
4.4.4.8 Y gain (Y.Gain dB)

Parameter Y.Gain dB results in a purely optical elongation of the signal in the Y
direction in the case of values ≠ 0.
4.4.4.9 Phase angle (Phase deg)

This parameter allows you to rotate the phase angle of the signals in the impedance
plane in any direction. The values apply in the mathematically positive direction, i.e.
counter-clockwise.
In the case of amplitude evaluation, the phase angle of the signals is of no importance
as regards the weighting. By contrast, in the case of Y-component evaluation resp.
sector evaluation, it is the most important parameter, after the gain, since, together with
the gain and the trigger thresholds, it determines the signal weighting.
The parameter Phase deg [DifGen; Sta] can be adapted to the relevant test material
either directly or by selection of a suitable instrument settings. Moreover, adjustment
procedures to simplify setting are available (see Section 4.1.9).
4-122 6.430/2.815/6.440
4.4.5 Setting the absolute channel

The precondition for display of these parameters is installation of an absolute channel.
4.4.5.1 Switching the absolute channel on and off (Channel)

Directory: Abs Level: Sta
This parameter activates (on) and deactivates (off) the absolute channel
Tip: If you work with the absolute channel, it is advisable to include this parameter in
the Quick window.
4.4.5.2 Gain of the absolute channel (Abs.Gain dB)

This parameter determines the amplitude of the analog output signal in dB and is
crucial for correct flaw detection with the aid of the trigger thresholds.
Tip: If you work with the absolute channel, it is advisable to include this parameter in
the Quick window.
4.4.5.3 Zero compensation of the absolute channel (Abs.Compensate)

The flawless test material generates a DC voltage component on the absolute channel.
The trigger parameter Abs.Compensate compensates for this component so that, as
on the differential channel, only the deviations of interest supply a visible signal. This
compensation must always be performed when setting the absolute channel.
The parameter is triggered by clicking on the parameter in the parameter list and
choosing the + or – button.
Tip: If you work with the absolute channel it is advisable to include this parameter in the
Quick window.
The parameter can be triggered only if the absolute channel is activate and the signal
gate has been enabled.
4.4.5.4 Automatic zero tracking (Auto.Track)

Long-term effects, such as temperature variations, may lead to a situation in which the
signal of the flawless test material drifts slowly away from the zero point. Automatic
tracking compensates for such effects by moving the output signal at regular intervals
and in small steps towards zero.
Parameter Auto.Track activates (on) or deactivates (off) this automatic function.
Tracking is discontinued temporarily for as long as testing is disabled (i.e. in the gap
between two test pieces passing through) or if the testing line is stopped (provided a
timing wheel is used or the control signal 'Roller conveyor off" (Tstop, see Section
3.2.4.2) is connected).
4.4.5.5 Tracking speed (Track.Speed)

Directory: Abs Level: Con
Parameter Track.Speed determines the time interval (in relative values) in which the
tracking steps follow each other in succession with tracking activated. The higher the
6.430/2.815/6.440 4-123
setting, the higher the clock rate, i.e. the faster the output signal is set to zero. The
increment for the tracking speed depends on parameter Abs.Gain dB [Abs; Sta]:
The higher the gain, the greater the increment and the faster a drift of the absolute
signal is reset to zero.
Note: The parameter must be set on the basis of empirical values. It must be noted that
use of automatic tracking prerequires a low flaw density on the material under test.
Otherwise, the system, in all probability, will track on a flawed area of the material, i.e.
the setting of the absolute channel moves ever further away from the actual zero point.
In this case, it is preferable to deactivate tracking.
4.4.6 Setting the clearance channel

The precondition for display of these parameters is installation of a clearance channel.
4.4.6.1 Activating and deactivating the clearance channel (Channel)

Directory: Clr Level: Sta
This parameter activates (on) and deactivates (off) the clearance channel.
Tip: If you work with the clearance channel, it is advisable to include this parameter in
the Quick window.
4.4.6.2 Zero compensation of the clearance channel (Compensation)

Directory: Clr Level: Sta
Under certain circumstances, the zero point of clearance compensation (i.e. the signal
without material beneath the probes) may drift over the course of time as the result of
major temperature variations or soiling of the test heads. This drift can be compensated
for without having to perform the entire adjustment procedure in accordance with
Section 4.1.9. Compensation should be carried out if the clearance signal has clearly
shifted in the direction of the upper or lower control limit by comparison with the original
setting. In order to do this, open the scope of the sensor system and set display mode
normal in the first window and the clearance channel clearance in the second window.
The display of the compensation curve under round and straight contains the same
information.
Zero compensation is triggered after removal of the material from the rotating head by
clicking on the parameter in the parameter list and choosing the + or - button.
Tip: If you work with the clearance channel, it is advisable to include this parameter in
the Quick window.
4-124 6.430/2.815/6.440
4.4.7 Setting the evaluation parameters

A separate set of parameters must be set, depending on the type of test material. A
distinction can essentially be made between pieces, cropping/coil to coil, continuous
and wire.
4.4.7.1 Counting units (Count.Dimension)

Depending on the particular application, it may be practical to count the individual flaws
or to count the length of these flaws. Setting defects must be selected for counting
individual flaws whilst setting length must be selected for accumulating the flaw
lengths. Parameter Count.Dimension, together with parameter Statistics [Eval; Con]
(see next section) is of central importance as regards the type of evaluation.
4.4.7.2 Statistics (Statistics)

The setting of this parameter, together with the setting of
Count.Dimension [Eval; Con] (see previous section) defines how evaluation of the
flaws is to be performed in respect of a test piece or a section. A distinction can be
made between determining the number of flaws, the accumulated flaw length or the
accumulated flaw length per section (flaw density). The table below shows the related
settings of the parameters Count.Dimension [Eval; Con] and Statistics.
Type of evaluation Count.Dimension Statistics

Flaw count Defects count
Flaw length Length count
Flaw density Length density
The numerical values resulting from the flaw evaluations are compared with set flaw
limits when determining the flaw count resp. flaw length (see Section 4.4.10.6), whilst a
quality number corresponding to the quality of the test material is calculated when
determining the flaw density (see Section 4.4.7.5). The flaw limits for the flaw count
resp. flaw length at the same time form the sorting criteria for the individual test pieces
and are thus discussed only in Section Sorting.
4.4.7.3 Count mode (Count.Mode)

The parameter Count.Mode defines whether flaw length counting for a flaw class is to
be interrupted or not by the occurrence of flaws of a higher class. In the case of setting
single class, only the highest flaw category is counted further in the case of higher
threshold value transgressions. In the case of setting with lower classes, all lower flaw
classes are also counted, besides the highest flaw category, in the case of higher
threshold value transgressions.
6.430/2.815/6.440 4-125
The following settings are the conventional defaults.

• Event evaluation: single class
• Statistical evaluation: with lower classes
4.4.7.4 Section length (Section.Length m)

This parameter determines over what part length (section) of the test material section-
related evaluation is performed when determining the flaw length density (Statistics
[Eval; Con] = density, Count.Dimension [Eval; Con] = length). The entry must be
made in units of m.
The value range of the parameter is subject to a lower limit resulting from the maximum
line speed.
4.4.7.5 Quality coefficients (Quality.Coefficient.AX)

When testing with parameter Statistics [Eval; Con] = density (statistical evaluation), it
is conventional to assign the entire wire a quality number Q between 1 and 9. In this
case, each section defined by parameter Section.Length [Eval; Con] (see previous
section) is initially evaluated singly. This means that, even during ongoing Test
operating mode but also subsequently with the aid of the report sheet, it is possible to
make detailed statements on flaw accumulations (clusters). These quality numbers
QSection, determined section-by-section, are determined with the aid of the evaluation
algorithm Quality number over weighted densities. It is expressed by the following
equation:
The mean flaw density for each flaw class is determined during material testing. The
quality coefficients A0, A1, A2 and A3 must be defined and entered as corresponding
parameters Quality.Coefficient.AX (X=0..3) for determining the quality number. By its
very nature, the flaw density F3 has a higher weighting than flaw density F2 and this, in
turn, has a higher weighting than flaw density F1. The value range for the coefficients
lies between 1 and 1000 for A0 and between 0 and 1000 for A1, A2 and A3. If the
calculated quality number QSection exceeds a value of 9, it is automatically limited to 9.
4-126 6.430/2.815/6.440
Finally, the quality class Q which also forms the basis for the end marking of the wire is
determined from the arithmetic mean of the quality numbers QSection i. Only integers
between 0 and 9 are formed for the quality classes Q.
Example: Let us assume that a wire of length 1 km has been tested, whereby a length
of 100 m is to be stipulated for each section. We thus obtain a split into 10 sections.
The quality coefficients shown in the table below have been selected and the
corresponding mean flaw densities have been determined for the first section.
Selected quality coefficients A0 A1 A2 A3
1 5 20 100
Determined mean flaw densities of the F1 F2 F3

first section
0.865 0.025 0.001
After we apply the formula, we obtain the quality number QSection 1 = 6 for the first
section.
With this selection of the coefficients, the quality number QSection = 1 would be assigned
to a flawless section of the wire whilst this quality number increases by 1 in each case:
• with a 20% increase in the F1 flaws
• with a 5% increase in the F2 flaws
• with a 1% increase in the F3 flaws.
Let us assume that the quality numbers QSection 1 = 6, QSection 2 = 4, QSection 3 = 3,
QSection 4 = 3, QSection 5 = 2, QSection 6 = 2, QSection 7 = 2, QSection 8 = 3, QSection 9 = 2 and
QSection 10 = 3 have been determined in this way. This results in a quality number Q = 3
for the entire wire. One could deduce from the trend in the quality numbers that there is
an accumulation of flaws in particular at the leading edge of the wire.
6.430/2.815/6.440 4-127
4.4.7.6 Additional evaluation options (Eval.Option)

Directory: Analyse Level: Con
Generally, any threshold transgression with the resolvable length preset by the system
clock will be recognised as a flaw. Parameter Eval.Option is set to value off in this
case.
However, there are two methods with which threshold transgressions are not evaluated
under certain circumstances. These two methods are known under the terms short
flaw suppression and evaluation acc. to EN1971.
Short flaw suppression

This evaluation option allows you to exclude short flaws up to an upper limit length
('short flaw length') from all display and evaluation operations. Flaws which exceed the
length limit are recorded over their entire length and supplied to further evaluation. The
short flaw lengths can be set separately for flaw classes F1 to F3.
In order to activate short flaw suppression:
Set parameter Eval.Option [Analyse; Con] to SFS (Short Flaw Suppression).
Set the parameters SFS.Length.FX [Analyse; Sta] (X=1...3) to the required flaw length limit.
Evaluation in accordance with EN1971

This evaluation which exclusively applies to testing of copper is normally scheduled
only for pieces and cropping/coil to coil.
For encircling coil systems in particular, Standard EN1971 defines evaluation criteria
which describe a specific mode of counting for transgressions of the flaw thresholds FX
(generally only X =1). In this case, smaller flaws are not considered as critical unless an
accumulation of flaws occurs within an observation window to be defined. If a
preselected flaw count is detected (flaw cluster) within this window which moves
continuously over the test piece, the entire tube length observed is evaluated as F1
flawed.
In order to activate evaluation in accordance with EN1971:
Set parameter Eval.Option [Analyse; Con] to EN1971.
Set parameter Eval.Length.F1 [Analyse; Sta] to the required length of the evaluation window.
Set parameter Min.Defect.Counts.F1 [Eval; Deb] to the required minimum quantity of flaws in
the specified evaluation window.
This evaluation option is also possible, in principle, for CIRCOGRAPH applications, but
is intended primarily for through-type coils in order to overcome the disadvantage of
encircling differential coils when detecting long cracks.
4-128 6.430/2.815/6.440
4.4.7.7 Cropping length suppression (Cropping.Suppression)

By setting this parameter, it is possible to exclude the leading and trailing ends of a wire
from statistical evaluation. This function is required typically for hot-wire testing. It
causes a delay in flaw counting.
Cropping length suppression is activated by setting Cropping.Suppression = on.
Operating mode off must be set for testing pieces, continuous material and material to
be cropped.
4.4.7.8 Leading end length (Cropping.Section.Begin m)

This parameter defines the length of the leading end in m.
4.4.7.9 Trailing end length (Cropping.Section.End m)

This parameter defines the length of the trailing end in m.
4.4.7.10 Piece length evaluation (Piece.Length.Evaluation)

Directory: Eval Level: Sta
With the aid of this parameter, it is possible to evaluate and sort the tested pieces with
respect to their length, regardless of eddy current testing. In setting on, the function is
deactivated, With settings as S1 and as S2, you can define to what sorting trough S1 or
S2 a test piece of the wrong length is to be sorted.
4.4.7.11 Maximum piece length (Piece.Length.Max m)

This parameter performs two functions. Firstly, it defines the maximum length which is
still evaluated as good for activated part length evaluation. Otherwise, sorting is
performed on the basis of the setting made. On the other hand, Piece.Length.Max
serves to scale the displays in the Result windows.
4.4.7.12 Minimum piece length (Piece.Length.Min m)

This parameter defines the minimum length which is still evaluated as good for
activated piece length evaluation. Otherwise, sorting is performed on the basis of the
setting made.
4.4.7.13 Maximum evaluation length (Max.Eval.Length)

Max.Eval.Length defines the space in line available for the optional evaluations short
flaw suppression, evaluation acc. to EN1971 and minimum defect distance. If none of
these algorithms should be used, set to the minimum value of 100mm.
To find a proper value determine the maximum length that will be used as short flaw (if
short flaw suppression will not be used, take 0) resp. the maximum length that will be
used for EN1971 (if evaluation acc.to EN1971 will not be used, take 0). Add the
6.430/2.815/6.440 4-129
maximum value for the minimum defect distance (if minimum defect distance algorithm
will not be used, take 0). Add this result to the minimum value of 100mm.
Note: Max.Eval.Length restricts the parameters SFS.Length.Fx, Eval.Length.Fx and
Min.Defect.Distance – so do not select too small values to enable these algorithms. On
the other hand the Max.Eval.Length restricts the earliest point for marking and sorting
output – so do not select too high values to avoid problems with the position of marking
or sorting equipments.
4.4.7.14 Minimum defect distance (Min.Defect.Distance)

Min.Defect.Distance is the gap between two defects required, so that they will not be
concatenated to one large defect event that covers both defect positions.
The length is defined in mm. A value of 0 means no concatenation of defects.
4-130 6.430/2.815/6.440
4.4.8 Setting the analysis parameters
4.4.8.1 Evaluation mode (Eval.Mode)

The parameter Eval.Mode determines the type of flaw thresholds.
• vector:
In this mode, the signals are evaluated on the basis of their amplitude. They are
classified as flaws FX (X=1..3) if their amplitude exceeds the corresponding all-round
threshold whose magnitude is defined by FX.Threshold % [Analyse; Sta].
• Y:
In this mode, only the Y-component of the signals is evaluated. They are classified
as flaws FX (X=1..3) if either their positive or their negative Y-component exceeds
the corresponding horizontal threshold whose magnitude is defined by
FX.Threshold % [Analyse; Sta].
• sector:
In this mode, signals are evaluated on the basis of their amplitude but only within
defined areas (sectors see Sections 4.4.8.6 and 4.4.8.7). Signals are classified as
flaws FX (X=1..3) if their amplitude exceeds the corresponding all-round threshold
whose magnitude is defined by FX.Threshold % [Analyse; Sta] within one of these
sectors.
Selection of the evaluation mode depends on how greatly phase angles and amplitudes
of flaw signals to be detected differ from those of noise signals to be suppressed.
Amplitude evaluation
• Different flaw types with different phase angles are to be detected
− and/or −
• the noise level is low.
Y-component evaluation
• The system is to be optimised for a specific flaw type (same phase angle as the
comparison flaw)
− and/or −
• masking of an increased noise level whose phase angle clearly differs from that of
the flaw signals.
Sector evaluation
• Several flaw types are to be evaluated differently
Example: Flaw type 1 (cracks) is to be assigned to sector 1, flaw type 2 (dents) is to
be assigned to sector 2.
• Masking of more major noise signals whose phase angle differs only inadequately
from that of the flaw signals. This must be used if reliable separation by Y-
component evaluation is not possible.
6.430/2.815/6.440 4-131
4.4.8.2 EN1971 evaluation lengths (Eval.Length.FX mm)

Directory: Analyse Level: Sta
Parameter for the evaluation according to EN1971. For information on setting the
parameter Eval.Length.FX mm, (X=1...3) see Section 4.4.7.6 (EN1971).
4.4.8.3 SFS evaluation lengths (SFS.Length.FX mm)

Parameter for the short flaw suppression (SFS) evaluation option. For information on
setting the parameter SFS.Length.FX mm, (X=1...3) see Section 4.4.7.6 (short flaw
suppression).
4.4.8.4 Flaw thresholds (FX.Threshold %)

The flaw thresholds FX.Threshold % (X=1...3) serve to classify the analog output
signals. Signals which exceed flaw threshold F2 but do not exceed flaw threshold F3 for
instance are handled as F2 flaws.
The thresholds act on the amplitude or on the Y-component of the signal, depending
upon selection of the evaluation mode, which is defined by parameter Eval.Mode
[Sys; Sta], Accordingly, they are displayed as circles (all-round thresholds) in the case
of vector evaluation in the impedance plane whilst they are displayed as pairs of
horizontal thresholds symmetrical to the X-axis in the case of evaluation of the Y-
component.
In the case of sector evaluation, all-round thresholds also apply. However, they act only
in the defined sectors.
Selection of the trigger thresholds depends on whether you work in accordance with
specific standards. These test standards generally contain fixed presets.
The condition F1.Threshold % ≤ F2.Threshold % ≤ F3.Threshold %, required for
practical signal evaluation, is ensured automatically.
4.4.8.5 Flaw count limits (Min.Defect.Counts.FX)

Corresponding limits for the minimum flaw count must be defined for specific evaluation
methods (see Section 4.4.7.6, as required by Standard EN1971). Please refer to
Section 4.4.7.6 (EN1971). for what parameters Min.Defect.Counts.FX need to be set
in specific cases.
4.4.8.6 Sector position (Sector.Position.deg)

The parameter Sector.Position deg defines the position of the sector centre in units of
°.
4-132 6.430/2.815/6.440
4.4.8.7 Sector width (Sectors.Width.deg)

Parameter Sector.Width deg defines the total opening angle of the sector to be
defined. It is specified in units of °.
4.4.8.8 Defect extend (Defect.Extend mm)

Extension for defect signals: every F1..F3-event will set all consecutive system units
within the length of Defect.Extend. If new events will occur within the Defect.Extend, the
event of the highest amplitude is used.
Defect.Extend=0 means, the length will be set automatically ...
... with CGRAPH acc.to the gaps between the probes' traces in order to fill these gaps;
... with DMAT acc.to Nominal.Probe.Width * Search.Factor, in order to reduce all
threshold exceeds of a single defect's signal to the threshold exceed of the maximum
point of the signal.
4.4.9 Setting the marking parameters

The parameters for marking are set via the parameter list in directory Mark. This
directory is displayed only if a combination port resp. one or two marking expansion
ports are present.
4.4.9.1 Number of marking guns (Marking.Equipment)

Directory: Mark Level: Con
Parameter Marking.Equipment is used to specify whether and how many marking
guns are connected. Basically, settings can be made ranging from none to 19 channels
(19 marking guns). The actual value range does, however, depend on the number of
fitted marking expansion ports (see IO interface). If no marking guns are to be
connected, this completes the settings under Mark.
4.4.9.2 Clearance LS2 – marking gun (Marking.Distance.Gate.X)

The individual distances Marking.Distance.GateX (X=1..19) of the marking guns from
light barrier 2 (LS2) must be entered depending on the number of marking guns. The
entry must be made in length unit millimetres (mm). The entered value must lie
between 10 mm and 30,000 mm.
See also Section 4.3.6 Evaluation positions.
4.4.9.3 Response time of the marking guns (Response.Time ms)

The response time (Response.Time ms) of the marking guns is the time between
activation of the gun and the instant at which the paint strikes the test piece surface.
The value to be entered corresponds precisely to this value and ensures that the guns
are activated earlier accordingly. The marking activation ensures, that the defective
material zone is always inside the marked zone at every line speed between 0 and
Max.Speed.
6.430/2.815/6.440 4-133
The response time depends on the type of construction of the gun and its distance from
the test piece. The guideline value is approx. 50 ms. However, the approximate value
should be taken from the corresponding manufacturer's equipment sheet and
determined precisely by means of advance trials with a reference piece. Values
between 0 ms and 1,000 ms can be entered for this parameter. Proceed as follows:
Activate the differential channel.
Enter the distances between marking gun and light barrier 2
(Marking.Distance.Gate.X [Mark; Con]), unless you have already done this.
Enter an approximate value for the response time (Response.Time).
Set the speed:
In the case of internal clock: Set the display Internal.Speed under the LINE CLOCK button to
the maximum speed of the testing line.
Move the reference piece at different speeds.
Check the marking result.
Correct the response time:
Marking too early: reduce the response time.
Marking too late: increase the response time.
4.4.9.4 Minimum marking duration (Min.Marking.Duration)

The minimum marking duration Min.Marking.Duration parameter sets the minimum
activation time specified for the marking guns. The minimum marking duration prolongs
the marking track into tail direction, if Min.Marking.Duration * Max.Speed gives a
greater length than the defective zone plus the response-time-prolongation. This
ensures that in case of short defects and high line speeds the activation is not shorter
than necessary for the marking gun.
A value range of 0 ms to 1,000 ms is available.
4.4.9.5 Activating marking (Marking.Output)

Directory: Mark Level: Sta
This parameter switches marking on (on) or off (off). However, it is set using the status
bar (MARKING button).
4-134 6.430/2.815/6.440
4.4.9.6 Coding of the flaw information (Marking.Assignment.FX)

The Marking.Assignments.FX (X=1..3) parameters assign a coding to the flaw
classes F1-F3 with the aid of up to 4 marking guns in each case. For this purpose, the
numbers of the corresponding marking guns are coded as two-digit hexadecimal
numbers. An maximum eight-digit number is then generated on the basis of this. Thus,
entry 010A12 means that marking guns 1,10 and 18 are activated in the case of the
corresponding flaw class. In this case, only 3 guns are activated. The seventh and
eighth digit of the numerical combination is missing or set to zero.
Several evaluation tracks

If you only enter one number for the parameter Marking.Assignment.FX, this number
applies for all evaluation tracks. This means that flaws are marked in all evaluation
tracks by the same marking gun(s).
In the case of several evaluation tracks, it is possible to select other marking gun(s) for
every evaluation track: with N evaluation tracks, you must in this case enter N
hexadecimal numbers separated by commas for the parameter
Marking.Assignment.FX. The N numbers relate in order to the N evaluation tracks.
Example:
The parameter value 01,02 means:
• Flaws in the first evaluation track are marked by the marking gun 1.
• Flaws in the second evaluation track are marked by the marking gun 2.
The total number of evaluation tracks is built up by concatenating the evaluation tracks
of all sensor systems. For the number of evaluation tracks of each sensor system
(event lines) see parameter Channel.Mode.
Direct control
Normally, the control instants are adapted to the marking gun behaviour (e.g. to
compensate for response delay). If you do not want this to occur (e.g. since the signals
are not being used for marking guns but for a control unit), you must add the value 80
to the original parameter value(s).
Example:
81 instead of 01
81,83 instead of 01,03
4.4.9.7 End marking (Tail.Marking)

Parameter Tail.Marking activates marking of the trailing ends of the test piece in order
to provide additional information on the test specimens. This operating mode can be
activated with on and deactivated again with off.
4.4.9.8 Start of end marking (Tail.Marking.Begin mm)

The parameter Tail.Marking.Begin mm is required in order to define the position of the
end marking on the test piece. Tail.Marking.Begin mm indicates the start of marking
6.430/2.815/6.440 4-135
and is calculated forwards from the trailing end. A negative value means activation
behind the piece tail.
4.4.9.9 End of end marking (Tail.Marking.End mm)

This parameter defines the end of the end marking. The entered value must be less
than the value for Tail.Marking.Begin [Mark; Con] (see previous section). A negative
value means activation behind the piece tail.
4.4.9.10 Coding of the end marking information (Tail.Marking.Assignment.SX/QX)

These parameters allow you to select what marking gun combinations are to be
assigned to the sorting class SX (X=0..2) resp. quality class QX (X=1..9). For this
purpose, up to 4 marking guns can be assigned to each parameter. Consequently, the
numbers of the corresponding marking guns are coded as two-digit hexadecimal
numbers.
An eight-digit number is then generated from this. Thus, entry 010A1200 means that
marking guns 1,10 and 18 are activated in the case of a corresponding sorting signal. In
this case, only 3 guns are activated. The seventh and eighth digit of the numerical
combination are thus both set to zero.
In the case of the quality classes, the corresponding class QX is determined from the
arithmetic mean of the quality coefficients determined section-by-section.
4.4.9.11 Marking in reference mode (Marking.Input.Ref)

The parameter controls whether marking information is created in the operating mode
REF or not.
4.4.10 Setting the sorting parameters

The parameters for sorting are set using the parameter list in directory Sort. This
directory is displayed only if a sorting port is present.
4.4.10.1 Number of sorting gates (Sorting.Equipment)

Directory: Sort Level: Con
Parameter Sorting.Equipment is used to enter whether no sorting gates, one sorting
gate or two sorting gates is or are connected. If no sorting gate is connected, this
completes the settings under Sort.
4.4.10.2 Sorting monitoring (Sorting.Control, Sorting.FIFO.Length)

The setting of this parameter ensures that either the sorting signal is issued
immediately (immediate), or after each test piece (at piece end), or that the sorting
information waits for an external call-up signal (Input SortingPort = Sreq) (on request).
In case of selection on request the parameter Sorting.FIFO.Length is important. It
defines how large the sorting FIFO memory is (first-in-first-out) and so how much
sorting information can be generated before the first call-up signal occurs. By use of
4-136 6.430/2.815/6.440
this parameter it is possible to have up to 20 pieces between the result position and the
sorting gate.
If the sorting FIFO is full and there no call-up with Sreq before the next sorting
information is generated, an error message occurs:
Error: in sorting sequence (BGR)
If an Sreq is sent to the DS without a sorting information in the sorting FIFO, an error
message occurs:
Error: in sorting sequence (BGR)
Setting immediate cannot be used for sorting in the actual sense of the word. After a
flaw occurs that reaches the relevant sorting limit, the flaw signal is output immediately,
and this can be used as a line stop signal for instance.
6.430/2.815/6.440 4-137
4.4.10.3 Sorting pulse length (Sorting.Pulse ms)

Parameter Sorting.Pulse ms determines the length of the output pulse issued as
sorting information. If the value 0 is assigned to the parameter, the sorting command is
applied to the output until the sorting information for the next test piece is retrieved
(static operation).
4.4.10.4 Sorting information for Test operating mode (Sorting.Mode.Test)

This parameter selects how sorting is performed during Test operating mode. Either
automatic sorting on the basis of the applied sorting information (auto) or sorting into
one trough (S0,S1,S2,S3) are possible, regardless of the test result. The parameter
must generally be set to auto for Test operating mode.
4.4.10.5 Sorting information for reference mode (Sorting.Mode.Ref)

This parameter allows you to preselect a sorting trough (S0,S1,S2,S3) into which a
reference piece is to move during installation or during a reference run. In principle,
automatic sorting (auto) on the basis of test result is possible for reference pieces as
well.
4.4.10.6 Sorting limits (S1.Limits.FX, S2.Limits.FX)

There are six parameters S1.Limits.FX, S2.Limits.FX (X=1..3) for which limits can be
defined mutually independently, as of which the correspondingly flawed test piece
should be supplied to the sorting troughs S1 or S2 (see table) for comparison with the
determined total flaw counts in each flaw class.
Flaw class Sorting class S1 Sorting class S2

F1 S1.Limits.F1 S2.Limits.F1
The limit values apply to the entire flaw count or to the cumulative flaw length. In
addition, you can specify whether the limit values are to apply to flaw class FX alone or
to the sum of F1, F2 and F3.
4.4.10.7 Sorting clas in case of evaluation disturbances (Sorting.Clas.CatX)

If instrument failures occur during test, so that the test result is uncertain, the affected
test pieces can be sorted out automatically independent of the test result.
The evaluation disturbances are divided into three categories:
Category 3: Break of sensors (testing probe, clearance probe)
4-138 6.430/2.815/6.440
Category 2: Disturbances at the rotation drive, at the line transport or the

magnetization, including too high deviation of the rotational speed or the transport
speed.
Category 1: HF-overload of a test- or clearance channel, overrun of a signal tracking
system or alarms of the noise monitoring.
For each of these categories the piece sorting can be selected individually for S1 or S2
with the parameters Sorting.Clas.Cat1, Sorting.Clas.Cat2, Sorting.Clas.Cat3. The
'off' value means the sorting depends only on the test results and doesn't take into
account the evaluation disturbances.
4.4.11 Settings for the automatic test sequence

These settings cover parameters relating to control of the signal gate and length
specifications required for correct flaw assignment.
The signal gate opens and closes the input of the differential channel and, if present,
the absolute channel. If the channels are enabled, all functions of signal processing,
display and evaluation operate on the basis of the targets and settings applicable to the
current operating state.
4.4.11.1 Signal gate (Signal.Gate.Control)

Entry and exit of the test material generate noise signals which cannot be distinguished
from the actual flaw signals. In order to suppress these pseudo signals, testing may not
be activated until after the test piece has entered and must be deactivated before the
test piece exits.
For this reason, the signal gate is always operated automatically in Test operating
mode and reference mode. The instrument requires an external control signal for this
purpose. Parameter Signal.Gate.Control defines how the instrument is to respond to
this control signal.
• In operating mode direct, the signal gate is enabled and disabled with no delay by
the edge change of the external signal. Parameters LS2.Distance mm [Sys; Con],
Untested.Front mm [Sys; Sta] and Untested.Tail mm [Sys; Sta] have no effect in
this case. In this mode, the signal gate can be controlled by a higher-level PLC for
instance.
• In operating mode delayed (Signal.Gate.Control = delayed), the switching edges
of a test piece sensor (light barrier 2) installed upstream of the relevant sensor
system signal the test piece entry resp. exit. The signal gate is enabled with the aid
of the motion clock delayed by the length
LS2.Distance mm [Sys; Con] + Untested.Front mm [Sys; Sta]
and is disabled earlier by an amount equal to length
LS2.Distance mm [Sys; Con] – Untested.Tail mm [Sys; Sta]
This operating mode is conventional for testing pieces and individual coils.
One exception occurs if there is already a test piece on the line when testing is
commenced. Parameter Signal.Gate.Init [Line; Con] (see next section) defines how
this is handled.
If no external control signal is connected, this corresponds to continuous state
Signal.Gate.Control = on.
4.4.11.2 Initialisation of the signal gate (Signal.Gate.Init)

Directory: Line Level: Con
6.430/2.815/6.440 4-139
This parameter defines how a test piece already on the testing line is handled.
Depending on selection, the signal gate is enabled immediately (with piece presence)
or when the next test piece enters the line (with next piece entry).
4-140 6.430/2.815/6.440
4.4.11.3 Signal gate in Setup mode (Signal.Gate.Set)

This parameter defines how the signal gate is to operated in the event of Setup mode.
• on:
The signal gate is permanently on
• auto:
Automatic signal gate as in Test operating mode and reference mode with the
corresponding setting of parameter Signal.Gate.Control [Sys; Con].
4.4.11.4 Activation of the cutter (Test.Procedure)

Parameter Test.Procedure allows you to preselect whether cropping of the tested
material is to occur on the testing line. Setting with cutting generates signals for the
cutter. Setting w.o.cutting does not.
4.4.11.5 Distance between light barrier 2 and sensor system (LS2.Distance mm)
This parameter refers to the distance between the test piece sensor and the centre of
the sensor and must be entered in units of mm. The test piece sensor should be slightly
inclined in order to avoid incorrect control responses as the result of reflections at bright
test piece surfaces. The crucial point is the point of intersection of the light beam with
the test axis.
Note: Since the light beam is interrupted by the edge and not by the axis of the test
material, the inclination may lead to an inaccuracy of a few millimetres in the case of
large diameters. You should compensate for this effect if necessary by selecting the
two parameters Untested.Front mm [Sys; Sta] and Untested.Tail mm [Sys; Sta]
somewhat higher.
Parameter LS2.Distance mm limits parameter
Untested.Tail mm [Sys; Sta].
4.4.11.6 Untested leading edge (Untested.Front mm)

This parameter is active only in the case of Signal.Gate.Control [Sys; Con] =
delayed. It defines the length of the untested leading edge of the test piece in mm.
6.430/2.815/6.440 4-141
4.4.11.7 Untested trailing edge (Untested.Tail mm)

This parameter is active only in the case of Signal.Gate.Control [Sys; Con] =
delayed. It defines the length of the untested trailing edge of the test piece in mm. The
value range is limited by LS2.Distance mm [Sys; Con].
Notes:
DEFECTOMAT and CIRCOGRAPH sensor system:
DIN 54141, Part 2, describes how to determine the minimum untested leading and
trailing edge by means of a check unit.
Only DEFECTOMAT sensor system:
In the case of a DEFECTOMAT sensor system, you should initially try out the following
minimum values and increase the setting if pseudo signals come through:
• If testing in the coil holder:
Minimum value = half overall length of test coil
• If testing in the magnetising yoke:
Minimum value = half overall length of test coil
+ 2 x tube wall thickness resp.
+1 x wire or bar diameter
As the throughput speed increases, physical reasons dictate that there are higher
values for the untested leading edge owing to the delayed field build-up for
homogenising material permeability. The field build-up depends on the throughput
speed, the material cross-section and the material permeability (steel quality).
4.4.11.8 Distance LS2 to cutting position (Cut.Position mm)

In the case of Test.Procedure [Line; Con] = with cutting, the parameter Cut.Position
defines at which position the test material is cropped. The entry is made in units of mm.
In the case of continuous testing followed by cutting, the instrument requires an
external control signal from a transmitter which detects the cutting point. This requires
the distance between light barrier LS2 and the cutting position. The flaw events are
shifted with the aid of the motion clock through a corresponding distance and, only
then, are they summed for evaluation of the cropped sections. The accuracy of the
function depends on the speed determination and how synchronously the saw carriage
is currently running at the instant it contacts the test material.
4-142 6.430/2.815/6.440
4.4.11.9 Cutting tolerance (Cutting.Tolerance mm)

This parameter is active only in the case of Test.Procedure [Line; Con] = with
cutting, i.e. if cropping of the test material occurs. The entry is made in units of mm.
Flaws in the cut-off areas at the leading and trailing end of a test piece whose length is
defined by parameter Cutting.Tolerance mm are assigned to both pieces. This
prevents a flawed piece being evaluated and sorted as flawless if there is uncertainty
as regards the precise position of the cutting point. This method has the disadvantage
that the flaws are counted twice in the specified areas in the report and a flawless piece
may be evaluated as flawed.
The necessity for this parameter results from the inaccuracy of synchronism between
test material and saw carriage.
Tip: Set the value as low as possible and only adequately high as required for reasons
relating to quality assurance.
4.4.11.10 Virtual cutting (Virtual.Piece.Length m)

The parameter Virtual.Piece.Length needs to be set only if testing continuous
material. It ensures that test results such as the quality numbers can be generated at all
for this operating mode. The tested material is subdivided into virtual length sections
which are each evaluated individually. Their length must be entered in units of metres.
Virtual cutting is deactivated if value 0 is entered.
4.4.11.11 Test piece confirmation (Piece.Confirmation)

This parameter is active only in the case of Test.Procedure [Line; Con] = with
cutting, i.e. if cropping of the test material occurs, and has nothing directly to do with
flaw testing.
On drawing lines in particular, it may occur that short leading and trailing sections may
be cut off and removed as scrap even before the sorting bench. Consequently, they
should not occur in the sorting information or the test report at all. This requirement can
be met by setting parameter Piece.Confirmation to on. Test piece confirmation is
inactive in setting off.
A further light barrier which must be mounted an adequate distance downstream of the
cutter is required for the test piece confirmation function. The distance from the cutting
point must be greater than the length of the cropped sections and smaller than the
minimum production length. The test result for the cropped sections is generated as
soon as the cutting signal appears. The sorting information is enabled and the counter
incremented only when the signal of the test piece confirmation (Sakn, see Section
3.2.4.2) appears. A short piece which does not reach the minimum length does not
generate a result and is omitted.
6.430/2.815/6.440 4-143
4.4.11.12 Signal gate in reference mode (Signal.Gate.Ref)

This parameter defines how the signal gate should work in reference operation mode.
The standard is auto (as in Test operation).
4.4.11.13 Material diameter (Material.Diameter mm)

Directory: Line Level: Sta
This parameter defines the diameter of the test pieces in units of mm.
4.4.12 Settings for speed determination

The instrument requires a speed-proportional motion clock in order to control all
functions which must run synchronously with the passage of the test material through
the testing line (e.g. signal gate, marking and motion-synchronous signal display).
Moreover, the signals on the differential channel are dependent on the throughput
speed so that the filters and various internal functions must be set to the anticipated
range of the test speed.
4.4.12.1 Speed unit (Speed.Unit)

This parameter allows you to preselect the unit of the speed in which all other speed
entries are made. You must choose between m/s and m/min.
4.4.12.2 Minimum speed (Min.Speed m/s; m/min)

This parameter defines the lower limit of the anticipated range of the test speed in the
relevant instrument setting. It is required for internal settings.
The parameter Min.Speed m/s; m/min influences the filter setting.
4.4.12.3 Maximum speed (Max.Speed m/s; m/min)

This parameter defines the upper limit of the anticipated range of the test speed in the
related instrument setting. It influences a lot of internal settings – especially the
resolution of the evaluation in transport direction. Consequently, it should not be
selected higher than the actual maximum anticipated speed.
The current speed is monitored constantly to avoid an overload of the evaluation unit. If
the maximum speed is exceeded, the instrument issues a message. With Speed.Clock
= 'measured', the internal clock will be limited at the maximum speed; with
Speed.Clock = 'external' the provided clock will be divided by 100 as long as the
original clock rate is too high.
The parameter Min.Speed influences the filter setting.
4-144 6.430/2.815/6.440
4.4.12.4 Speed measurement with light barriers (Measure.Distance mm)

This parameter is active only if one of the motion clock signals (Set, Ref, Test) is set to
speed measurement with light barriers → measured. The entry must be made in units
of mm.
Parameter Measure.Distance mm is required for generating the motion clock from the
run time between two light barriers LS1 and LS2. Measure the distance between the
light barriers and enter the value determined.
4.4.12.5 Speed measurement with external pulse generator (Clock.Multiplier)

This parameter is active only if one of the motion clock signals (Set, Ref, Test) is set to
speed measurement with an external pulse generator (e.g. timing wheel)
→ external.
The parameter Clock.Multiplier is calculated from the external clock pulse rate:
Clock.Multiplier corresponds to the path per pulse in multiples of 0.1 mm.
Example:
An external clock with 1 pulse/2.5 mm leads to Clock.Multiplier = 25
(= 2.5 mm/0.1 mm).
4.4.12.6 Internal speed (Internal.Speed m/s; m/min)

This parameter is active only if one of the motion clock signals (Set, Test, Ref) is set to
internal speed preset → internal. The entry must be made in the unit selected under
Speed.Unit [Line; Con].
The value range is subject to an upper limit defined by parameter
Max.Speed. m/s [Line; Sta] in the corresponding unit.
Note: Always enter the current speed as accurately as possible! The accuracy of all
processes which must run synchronously with passage of the test material depends on
the accuracy of this entry!
4.4.12.7 Motion clock for setup mode (Speed.Clock.Set)

This parameter defines how the speed-proportional motion clock is determined in Setup
mode. It can be set as follows:
• internal:
Internally generated clock on the basis of the entry under parameter Internal.Speed
[Line; Sta] in the corresponding unit. This method of speed determination is suitable
for systems with precisely known, constant test speed. No external sensors are
required.
6.430/2.815/6.440 4-145
• external:
External clock, generated by a pulse generator incorporated in the roller conveyor or
by the roller conveyor control. This method of speed determination is suitable for
systems with fluctuating test speed. The speed can be determined most accurately
with a timing wheel running on the test material.
• measured:
Method which is suitable for testing pieces and wire. The instrument determines the
motion clock from the run time of the test pieces between two light barriers LS1 and
LS2. This necessitates entry of the distance between these light
barriers (Measure.Distance mm [Line; Con]).
The front of the test piece is crucial to the run time measurement. The instrument
retains the motion clock determined from the run time until the next piece has
passed through the measurement section. If its speed differs from the preceding
speed, the clock changes abruptly and then remains constant again until the next
piece. The instrument uses the set internal speed until the first piece passes
through.
Note: If you are working with setting internal or measured and if it may occur that the
roller conveyor stops during passage of a test piece, it is advisable to use control signal
'Roller conveyor stop' (Tstop, see Fig. 2). The following functions are discontinued
when this signal is enabled:
• Length determination for the piece in the sensor system
• Tracking on the absolute channel if activated
• Motion-synchronous signal display
4.4.12.8 Motion clock for test operating mode (Speed.Clock.Test)

This parameter defines how the speed-proportional motion clock is determined in Test
operating mode. This is subject to the same information as described in Section
4.4.12.7.
4.4.12.9 Motion clock for reference mode (Speed.Clock.Ref)

This parameter defines how the speed-proportional motion clock is determined in
Reference mode. This is subject to the same information as described in Section
4.4.12.7.
4-146 6.430/2.815/6.440
4.4.12.10 Freezing the clock (Freeze.Mode)

Directory: Line Level: Ser
The setting of this parameter determines how the current clock is frozen:
Off: no freezing
On: always frozen
Via Tls1: with input signal Tls1 = freezing active
Via Tstop: with input signal Tstop = freezing active
The freezing functions are valid for all operating modes of the "Motion clock for setup
mode". See Section 4.4.12.7.
4.4.13 Setting of the instrument monitoring
4.4.13.1 Activation of the noise monitoring (Noise.Channel.Monitor)

Directory: DigGen Level: Sta
The Parameter enables to switch off or on the monitoring. Switching off may be
necessary, if it is not possible to set the monitoring in a way that avoids pseudo error
messages.
Dependent on the Channel.Mode [Sys, Con] the activation is common for all sensors
of the sensor system or it is individual for each sensor. All channels with switched off
monitoring are indicated by white squares in the status bar.
Note: If a system or channel is switched off for testing operation, the monitoring will be
deactivated automatically.
4.4.13.2 Noise monitoring limits (Noise.Upper.Limit, Noise.Lower.Limit)

Directory: DigGen Level: Sta
The parameters define the levels that cause messages by the monitoring function. The
values for the limits should be determined by watching the noise level range of
production pieces over a period and setting the limits with tolerance around this range.
Note: The zero value for the lower limit means a deactivation of this limit.
Dependent on the Channel.Mode [Sys, Con] the limits are common for all sensors of
the sensor system or individual for each sensor.
4.4.13.3 Categrories of messages (Noise.Lower.Limit.Message,

Noise.Upper.Limit.Message)
These parameters determine, whether the exceed of the lower resp. upper noise limit
causes an error, a warning or no message at all. The selection can be made for the
lower and upper limit and for every sensor system different.
4.4.13.4 Generation of the noise values (Noise.Lower.Average.Length,

Noise.Upper.Average.Length)
The noise values for every sensor will be calculated as the average of the signal
samples over a defined section. For the comparison with the lower resp. upper limit two
6.430/2.815/6.440 4-147
individual average values will be calculated, so it it possible to have a longer average

interval for the upper limit compared to the lower limit. The parameters
Noise.Lower.Average.Length resp. Noise.Upper.Average.Length define the length of
material that is used for one average value. A short section means a fast reaction of the
monitoring system in case of an instrument failure. A long section avoids pseudo error
messages in case of short signal deviations. It is necessary to find a compromise
between these requirements.
Note: With a CIRCOGRAPH rotating over standing material there will be no new noise
value because of the missing transport. When continuing the transport the next noise
value will be available and it can have a high level, if during the transport stop a
material defect was sampled very often.
As long as the signal gate is off the current average calculation for the noise values
stops.
4.4.14 Configuring the result display
4.4.14.1 Activation and configuration of the scroll mode

(PclmgScroll; PclmgScale)
The parameters PclmgScroll and PclmgScale can only be set in the file dialog.ini.
The parameters are to be found in the section [Result].
The parameters PclmgScroll and PclmgScale determine the display of the test results
in the Piece Image window.
Parameter Function Setting values

PclmgScroll Activates the scroll mode: 0 (function off)
1 (function on)
If the displayed length is exceeded, the
new information is displayed in scroll
mode on the left side of the screen.
PclmgScale Determines the area in m that is displayed 1 to 1000
in the Piece Image window. (in metres, only
whole numbers)
4.4.15 Integrating a customised logo

The outermost field in the right of the status bar can be filled with a customer-specific
logo. This requires a bitmap file (with the extension .bmp), which you can create, for
example, with the Windows programme Paint. The bitmap file must be named
"Customer.bmp" and be located in the directory "Dtest\Te".
The size of the bitmap graphic is automatically adjusted by the
DEFECTOTEST DS2000 software. Nevertheless, the bitmap file should not be too
large, since a large file noticeably increases the time required to launch the
DEFECTOTEST DS2000 software.
4-148 6.430/2.815/6.440
4.5 CHECKLIST
Size change for CIRCOGRAPH sensor system
This checklist is intended as a memory aid for the routine operation of the test
instrument. Familiarity with the operating structure of the user interface as well as with
the relevant window is assumed. The user should also have a sure command of the
use of the rotating head.
This checklist also presupposes that appropriate test instrument settings have already
been determined for the material to be tested. Generally, only an adjustment of the size
(dimension) of the particular test material remains to be conducted. This adjustment
consists of a few steps:
• Loading the instrument setting from the setting library
• Setting up the testing line
• Performing the size adjustment
• Creating the test log
• Starting the test request
The individual steps are detailed in what follows.
1. Loading the instrument setting from the setting library

Press the Setting button and select the Library field there.
Mark the desired instrument setting with the mouse and confirm with the Load button.
Note 1: With the button Find Setting..., you can find an appropriate instrument setting
by searching for suitable parameter values.
Note 2: With the buttons Lookup Descr... and Lookup Checkl..., you can gain access
to information that relates to the instrument setting and the test before the setting is
loaded.
2. Setting up the testing line
Warning!
6.430/2.815/6.440 4-149
Danger of serious injury from rotating components!

Replacing the protective guides and changing the rotating head diameter is only to be
performed when the motor is not running.
Set the rotating head diameter according to the diameter of the material to be tested. The
corresponding values are to be taken from the documentation of the relevant rotating head.
Insert the protective guides that correspond to the diameter of the material to be tested. The
corresponding values are to be taken from the documentation of the relevant rotating head.
Caution!
Danger of mechanical damage to the rotating head!
Check that the probes are covered by the protective guides.
Warning!
Danger of serious injury from rotating components!
Check that all doors and covers of the rotating head are closed and locked.
Set the transport mechanics to the new material.

Finally, start the motor of the rotating head.
Tip: Further specific information pertaining to the setup process should be added to this
checklist.
4-150 6.430/2.815/6.440
3. Performing the size adjustment

In order to call up the adjustment procedure, click on the button Adjust and then on the
button C'GRAPH (with the character C to the upper right).
The setting window for the clearance compensation is now opened.
Fig. 35 Setting window for the clearance compensation
If you are performing an adjustment during a size change, click on Dim in the adjustment
window.
Follow the individual steps taking you through the adjustment.

Each step to be carried out is highlighted in colour.
At the end of the procedure, either click on OK to activate the adjustment or reject it with
Cancel.
- or -
4. Creating the test log
6.430/2.815/6.440 4-151
Click on the Setting button and then select the Request field.
Fill in the preconfigured fields (the field Name to identify the test request – typically a request
number – must be filled in).
Click on the Start now button.
The entries become effective. The next piece that runs into the test line is entered as
the first piece in a new test log.
Note: Alternatively, a test log can be prepared in advance during an ongoing test
request. The entries are saved with Start later, so that they are available again when
the window is opened the next time.
5. Starting the test request

The signal gate is allocated. Testing begins.
4-152 6.430/2.815/6.440
4.6 CHECKLIST
Size change for DEFECTOMAT sensor system
This checklist is intended as a memory aid for the routine operation of the test
instrument. Familiarity with the operating structure of the user interface as well as with
the relevant window is assumed. The user should also have a sure command of the
use of the rotating head.
This checklist also presupposes that appropriate test instrument settings have already
been determined for the material to be tested and stored in the library. Generally, only
an adjustment of the size (dimension) of the particular test material remains to be
conducted. This adjustment consists of a few steps:
• Loading the instrument setting from the setting library
• Setting up the testing line
• Performing a reference run
• Creating the test log
• Starting the test request
The individual steps are briefly elucidated in what follows.
1. Loading the instrument setting from the setting library

Press the Setting button and select the Library field there.
Mark the desired instrument setting with the mouse and confirm with the Load button.
Note 1: With the button Find Setting..., you can find an appropriate instrument setting
by searching for suitable parameter values.
Note 2: With the buttons Lookup Descr... and Lookup Checkl..., you can gain access
to information that relates to the instrument setting and the test before the setting is
loaded.
2. Setting up the testing line

Convert the sensor system: insert coil and corresponding protective guides.
If appropriate, centre the sensor system.
If appropriate, set magnetisation.
6.430/2.815/6.440 4-153
Set the transport mechanics to the new material.

Tip: Further specific information pertaining to the setup process should be added to this
checklist.
3. Performing a reference run

In order to call up the adjustment procedure, click on the button Adjust and then on the
button D'MAT with the character M to the upper right.
Follow the individual steps taking you through the adjustment.

At the end of the procedure, either click on OK to activate the adjustment or reject it with
Cancel.
- or -
Attention: As long as the adjustment window is open, all pieces running through are
handled as reference pieces, i.e. not logged!
4. Creating the test log

Click on the Setting button and then select the Request field.
Fill in the preconfigured fields (the field Name to identify the test request – typically a
request number – must be filled in).
Click on the Start now button.
The entries become effective. The next piece that runs into the test line is entered as
the first piece in a new test log.
4-154 6.430/2.815/6.440
Note: Alternatively, a test log can be prepared in advance during an ongoing test
request. The entries are saved with Start later, so that they are available again when
the window is opened the next time.
5. Starting the test request

The signal gate is allocated. Testing begins.
6.430/2.815/6.440 4-155
DEFECTOTEST DS2000 User Manual Maintenance and servicing
5 Maintenance and servicing
5.1 Cleaning
Only clean the varnished parts and the touchscreen with universal plastic cleanser or
commercial cleaning agents.
Do not use petroleum products, alcohol or cold cleansers!
Inspect the filter mats at the ventilator on the rear side of the device at regular intervals.
Replace the filter mats if they are strongly soiled.
5.2 Calibration
The instrument has been calibrated prior to delivery according to the stipulations of the
ISO Standard 9001. In the case of normal working conditions, we recommend a
calibration interval of one year for instruments and of two years for calibration
standards. The calibration can be performed by INSTITUT DR. FOERSTER or by one
of our authorised service points.
5.3 Remote Service

In the event of problems with your DEFECTOMAT or CIRCOGRAPH,
INSTITUT DR. FOERSTER offers a Remote Service via modem connection.
If you wish to take advantage of the Remote Service, proceed as follows:
Connect the instrument with the telephone line through the modem integrated within the
operator-control computer.
Take up verbal contact with INSTITUT DR. FOERSTER over the telephone number +49
(0)7121 140-276.
6.430/2.815/6.440 5-1
DEFECTOTEST DS2000 User Manual Technical data
6 Technical data
6.1 General
The following applies to all information in this chapter:
Only values with tolerances or limit values are guaranteed data. Values without
tolerances are only for information purposes.
6.2 Function
The test performance is dependent on the connected sensor systems (rotating heads,
through-type coils etc.) Refer to these documents.
To achieve maximum test performance, the test electronics must be adapted to the
connected sensor systems (number of channels).
6.3 Dimensions
Cabinet housing (37 HE): W: 600 mm; D: 800 mm; H: 1959 mm
Compact housing (12 HE): W: 555 mm; D: 700 mm; H: 595 mm
6.4 Weight
Approx. 80 kg, depending on the equipment (number of channels)
6.5 Power supply

Operating voltage: 200 V to 240 V
Frequency: 50 Hz to 60 Hz
6.6 Ambient conditions
Operation
Ambient temperature: +5 °C to +40 °C
(extendable with air-conditioning appliance)
Relative humidity: Max. 85%, non-condensing
Protective cover (according to EN 60 529)

Protective cover of the
electronics: IP 54
DEFECTOTEST DS2000; Institut Dr.Foerster Technical data • 6-1

Technical data DEFECTOTEST DS2000 User Manual
Storage
Storage location: In the unopened original packaging, in closed
rooms
Ambient temperature: -20 °C to +70 °C
Relative humidity: Max. 95%, non-condensing
Maximum storage duration: 12 months (extension possible after intermediate
inspection by INSTITUT DR. FOERSTER
personnel)
Transport
Storage, transport and transhipment must only take place in the original packaging,
whereby the containers are to be protected against moisture. Instructions on the
packaging are to be heeded (e.g. fragile, store in a dry place, this side up).
Marked load-bearing points – if they exist – are to be heeded!
The authorised means of transport are rail, plane, ship and truck (on cemented roads).
6-2 6.430/2.815/6.440
6.7 Interfaces
6.7.1 I/O connections
Each I/O block is assigned 8 optocoupler-decoupled, digital signals (connection
terminals A,B) and 1 analog signal (connection terminals C,D). In addition, each
terminal strip is provided with a pair of screw-type terminals for 24 V power supply and
two pairs with 0 V. Please refer to Fig. 41 for the specifications of the corresponding
inputs and outputs etc. The entire screw-type terminal row of each block can be
removed without having to disconnect the individual cables.
The I/O connections make the connection to the testing line. This includes the motor
control, the marking system, the sorting unit and the roller conveyor. The connections
can be connected directly to a PLC (24 V DC).
Fig. 36 Digital inputs/outputs and analog output
The digital outputs feature a semiconductor relay. They are short-circuit proof,
overtemperature-resistant, protected against overvoltage and incorrect polarity and
allow bounce-free switching. The relevant status of the output is indicated by two LEDs
(yellow and green) (see Fig. 41). Each output can drive one marking gun. The COM
terminal is common to all outputs of an I/O block.
The digital inputs operate in a voltage range of 10..30 V DC with debounce. Each
individual terminal is electrically isolated and floating.

Special outputs are designed for analog control signals e.g. for C’FLUX-specific
expansion options.
The terminals '24V' and '0V' provide an auxiliary power supply of 24V DC at every
block. Actually there is one power supply that can be accessed at every block. The
maximum load is 2A.
The auxiliary power supply is not connected to any input or output signal internally.
Therefore the connection from '24V' to output terminal 'B' and from '0V' to output
terminal 'COM' must be done externally.
6.7.2 PC interfaces
• One parallel interface (25 pin)
• Two serial interfaces (9 pin)
• External monitor connection (VGA)
• Modem connection (analog or ISDN)
• Mouse connection (PS2)
• Keyboard socket (DIN)
6-4 6.430/2.815/6.440
6.8 Characteristic parameters for FOERSTER standard sensor

systems
6.8.1 CIRCOGRAPH rotating probes
C’GRAPH Nominal.Probe. Rot.Trace.Width Winding.Dist.Cor Sensors.Per.Hea No.Heads

Width mm mm r mm d
RO20
Test head N 0.9 1.5 0.2 1 2
6.460.01-2015
Test head N 1.2 2.5 0.2 1 2
6.460.01-2025
Test head N 1.2 5.0 0.2 1 2
6.460.01-2050
Test head DF 0.9 1.5 0.2 1 2
6.460.03-2015
Test head DF 1.2 2.5 0.2 1 2
6.460.03-2025
Test head DF 1.2 5.0 0.2 1 2
6.460.03-2050
Fig. 37 Table for RO20 rotating systems

Width mm mm r mm d
RO35 P
Test head N 0.9 1.5 0.2 1 2/4
6.461.01-2015
Test head N 1.2 2.5 0.2 1 2/4
6.461.01-2025
Test head N 1.2 5.0 0.2 1 2/4
6.461.01-2050
Test head DF 0.9 1.5 0.2 1 2/4
6.461.03-2015
Test head DF 1.2 2.5 0.2 1 2/4
6.461.03-2025
Test head DF 1.2 5.0 0.2 1 2/4
6.461.03-2050

Width mm mm r mm d
RO35 L
Test head 1.2 2.5 0.4 1 2/4
6.461.21-2025
Test head 1.2 5.0 0.4 1 2/4
6.461.21-2050
Fig. 38 Table for RO35P/L rotating systems

C’GRAPH Nominal.Probe Rot.Trace.Width Winding.Dist.Cor Sensors.Per.Hea No.Heads

.Width mm mm r mm d
RO65
Test head N 1.2 2.5 0.4 2 2/4
6.452.01-2311
Test head N 2.2 5.0 0.4 2 2/4
6.452.01-2321
Test head N 2.2 10.0 0.4 2 2/4
6.452.01-2331
Test head DF 1.2 2.5 0.4 2 2/4
6.452.02-2311
Test head DF 2.2 5.0 0.4 2 2/4
6.452.02-2321
Test head DF 2.2 10.0 0.4 2 2/4
6.452.02-2331

Width mm mm r mm d
RO130
Test head N 1.2 2.5 0.4 2 2/4
6.453.01-2311
Test head N 2.2 5.0 0.4 2 2/4
6.453.01-2321
Test head N 2.2 10.0 0.4 2 2/4
6.453.01-2331
Test head DF 1.2 2.5 0.4 2 2/4
6.453.02-2311
Test head DF 2.2 5.0 0.4 2 2/4
6.453.02-2321
Test head DF 2.2 10.0 0.4 2 2/4
6.453.02-2331
6-6 6.430/2.815/6.440
6.8.2 DEFECTOMAT coils
Sensor type Type No. Nominal Nominal.Probe.Widt Remarks

diameter mm h mm
LMD/HMD/HD coil 2.891 <= 44 4.5 Sizes I and II

LMD segment coil 2.893
" 47..100 5.5
" > 100 7.0
Weld seam probe 2.895.01-0602 11.0

2.895.01-0611
2.895.01-0606 7.0
2.895.01-0612
Hand-held probe 2.895.01-1301 1/2" 6.5
2.895.01-0501 1" 9.0
Fine-wire coil 2.864 3.0
LMD Therm coil 2.892 9..15 4.5 Sizes I and II
" 17..44 5.5
" 47..68 7.0
D segment coil 2.893.01-9902 3.5

(probe comb assembly)
L coil system 2.893.01-9904 5.0

(probe comb assembly) 2.893.01-9905
Fig. 41 Table for DEFECTOMAT COILS

DEFECTOTEST DS2000 User Manual Imprint
7 Imprint
7.1 How to contact us
Institut Dr. Foerster GmbH & Co. KG

Postfach 1564
D-72705 Reutlingen
In Laisen 70
D-72766 Reutlingen
Telephone +49 (0)7121 140-0
Telefax +49 (0)7121 140-488
E-mail: ts@foerstergroup.de
Internet: http://www.foerstergroup.de
Remote Service IFR:
Telephone +49 (0)7121 140-276
Service department IFR:
Telephone +49 (0)7121 140-300
6.430 UA06/DE
Order no. 166 594 4
Edition: 01/04
Author: Forster/Halter
Information and illustrations subject to alteration
DEFECTOTEST DS2000; Institut Dr.Foerster Imprint • 7-1

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User Manual DEFECTOTEST DS2000 Foreword

Trademarks and Other Property Rights

1.1 Use as intended .........................................................................................................................1-1

1.2 Safety class and enclosure ......................................................................................................1-1

1.3 Dangers and safety information...............................................................................................1-1

2.1 DEFECTOMAT DS 2.815............................................................................................................2-1

2.1.1 Application and performance features .........................................................................2-1

2.2 CIRCOGRAPH DS 6.430 ............................................................................................................2-2

2.2.1 Application and performance features .........................................................................2-2

2.3 STATOGRAPH DS 6.440............................................................................................................2-3

2.3.1 Application and performance features .........................................................................2-3

2.4 Instrument-specific sections of the User Manual ..................................................................2-3

3.1 Installing the instrument on the testing line ...........................................................................3-1

3.1.1 Before starting operation for the first time ....................................................................3-1

3.2.1 Back view of the test electronics ..................................................................................3-4

3.2.4.1 Functions of the logical ports ..................................................................................................... 3-5

3.3.1 Installing/updating the software ................................................................................. 3-15

4 OPERATION ......................................................................................................................................... 4-1

4.1 Basic functions of the GUI ....................................................................................................... 4-1

4.1.1 Start procedure ............................................................................................................ 4-1

4.1.11.1 Preparing the test report.......................................................................................................... 4-45

4.2.1 Basic information on the setup...................................................................................4-76

4.3.1 Sequence of the evaluation process ..........................................................................4-93

4.3.7 Application examples ............................................................................................... 4-105

4.4.1 Basic information ..................................................................................................... 4-110

4.4.8.7 Sector width (Sectors.Width.deg) .......................................................................................... 4-133

4.5 CHECKLIST Size change for CIRCOGRAPH sensor system ...........................................4-149

4.6 CHECKLIST Size change for DEFECTOMAT sensor system ...........................................4-153

5 MAINTENANCE AND SERVICING.......................................................................................................5-1

5.1 Cleaning ..................................................................................................................................... 5-1

5.2 Calibration.................................................................................................................................. 5-1

5.3 Remote Service ......................................................................................................................... 5-1

6 TECHNICAL DATA............................................................................................................................... 6-1

6.1 General ....................................................................................................................................... 6-1

6.2 Function ..................................................................................................................................... 6-1

6.3 Dimensions ................................................................................................................................ 6-1

6.4 Weight......................................................................................................................................... 6-1

6.5 Power supply ............................................................................................................................. 6-1

6.6 Ambient conditions................................................................................................................... 6-1

6.7 Interfaces ................................................................................................................................... 6-3

6.7.1 I/O connections ............................................................................................................ 6-3

6.8 Characteristic parameters for FOERSTER standard sensor systems................................. 6-5

6.8.1 CIRCOGRAPH rotating probes ................................................................................... 6-5

7 IMPRINT ................................................................................................................................................ 7-1

7.1 How to contact us ..................................................................................................................... 7-1

1.1 Use as intended

1.2 Safety class and enclosure

1.3 Dangers and safety information

1.3.2 Safety measures

1.3.2.1 Prior to commissioning

Call the Servicing Department!

1.3.2.2 Handling the instrument

1.3.2.3 In the event of malfunctions

Call the Servicing Department!

1.3.2.4 Repairs and modifications

1.3.2.5 Additional cooling device on the rear panel door

M 22* coil entry

M 40* coil yoke coil entry

1.3.2.7 Field effects on magnetic data medium and mechanical watches

1.3.2.8 Protection against burns

1.4 CE Declaration of Conformity

• European Directive 73/23/EEC: Safety of electrical apparatus