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All tests are performed at 25oC, unless otherwise specified. The nominal varistor voltage should be tested against the
The test circuits and methods given herein are intended as minimum limits for the model using the method described in
a general guide. Since the tests frequently entail high the Nominal Varistor Voltage VN section. If the varistor is
voltages and currents, the user must exercise appropriate open, short, or more than 10% outside either limit, it should
safety precautions. be replaced. The DC standby current may also be measured.
the voltage shift typically is less than 1%. This voltage shift is
V (T)
5V/DIV of little consequence for most measurement purposes but
might be noticeable when viewing a DVM as in the test
method of Figure 1. The visual DVM observation should be
250V made shortly after power is applied, with measurement to
not more than three significant figures.
240V
Third, it is normal for the varistor voltage-current
0.1ms/DIV characteristic to become slightly asymmetrical in polarity
1ms/DIV under application of DC electrical stress over time. The
230V 10ms/DIV
100ms/DIV varistor voltage will increase in the same direction as the
1000ms/DIV
polarity of stress, while it will be constant or will decrease in
T the opposite polarity. This effect will be most noticeable for a
varistor that has been subjected to unipolar pulse stresses
FIGURE 2. VOLTAGE-TIME V(T) CHARACTERISTICS OF A or accelerated DC life tests. Therefore, to obtain consistent
LITTELFUSE VARISTOR (V130LA10A) results during unipolar pulse or operating life tests, it is
OPERATING AT A CONSTANT DC CURRENT OF essential to provide a polarity identification for the test
specimens. However, for initial readout purposes, this effect
For varistor models that are commonly used on 60Hz power usually is insignificant.
lines, the VN limits may be specified for a 1.0mA peak AC
current applied. If an AC test is preferred by the user, a Maximum Clamping Voltage, VC
schematic approach similar to that shown in Figure 1 is used, Two typical current impulses that may be used to define the
except an AC VARIAC™ is substituted for the DC power supply, varistor clamping voltage are the 8/20µs and the 10/1000µs
and an oscilloscope is substituted for the voltmeter. This circuit pulses. Figure 5 shows typical varistor test waveforms for
is equivalent to that of a typical curve tracer instrument. these two impulses.
To avoid unnecessary concern over minor measurement The clamping voltage of a given model varistor at a defined
anomalies, three behavioral phenomena of metal-oxide current is related by a factor of the varistor voltage.
varistors should be noted. First, it is normal for the peak Therefore, a test of the nominal varistor voltage against
varistor voltage measured with AC current to be about 2% to specifications may be sufficient to provide reasonable
5% higher than the DC value, as illustrated by Figure 3. This assurance that the maximum clamping voltage specification
“AC-DC difference” is to be expected, since the one-quarter is also satisfied. When it is necessary to perform the VC test,
cycle period of a 60Hz wave is much less than the 20ms special surge generators are required. For shorter impulses
minimum settling time required for DC readout. than 8/20µs, precautions must be observed to avoid an
erroneous “overshoot” in the measurement of the clamping
Second, it is normal for the varistor voltage to increase
voltage. The Equipment for Varistor Electrical Testing section
slightly when first subjected to electrical current, as shown in
gives general information on surge generators; a brief
Figure 4. This might be considered a “break-in” stabilization
description of the “overshoot” effect follows.
of the varistor characteristics. During normal measurement
V(T)
5V/DIV
DC AC 60Hz
100
VOLTAGE (V)
130VRMS RATED
PRODUCT
MEDIUM VOLTAGE
MATERIAL
10
10-7 10-6 10-5 10-4 10-3 10-2 10-1
I, CURRENT (A) T, 50ms/DIV
FIGURE 3. AC AND DC CHARACTERISTIC CURVES FIGURE 4. V130LA10A) VARISTOR VOLTAGE FOR THE
INITIAL CYCLES OF 60Hz OPERATION AT A
PEAK CURRENT OF 1.0mA
10A/DIV 10A/DIV
100V/DIV 100V/DIV
0 0
10µs/DIV 1ms/DIV
FIGURE 5A. 8/20µs, WAVE IP = 50A, VP = 315V FIGURE 5B. 10/1000µs, WAVE IP = 50A, VC = 315V
FIGURE 5. TYPICAL CLAMPING VOLTAGE TEST WAVEFORMS (LITTELFUSE
FIGURE 6. VARISTOR TYPE V130LA10A)
VOLTAGE PROBE
AREA ≈
VOLTAGE PROBE
22cm2
SURROUNDING
COPPER TUBE
CURRENT
PATH VARISTOR
VARISTOR
FIGURE 7A. MINIMAL LOOP AREA FIGURE 7B. EXCESSIVE LOOP AREA TYPICAL
“OVERSHOOT” OF LEAD-MOUNTED VARISTOR
WITH STEEP CURRENT IMPULSES
FIGURE 7C. CURRENT RISE OF 8µs FIGURE 7D. CURRENT RISE OF 0.5µs
FIGURE 7. EFFECT OF LEAD LENGTH ON “OVERSHOOT”
10-143
Application Note 9773
The Littelfuse Varistor specification sheets show the VI Hence, when making measurements as well as when
characteristic of the devices on the basis of maximum voltage designing a circuit for a protection scheme, it is essential to
appearing across the device during a current pulse of 8/20µs. If be alert to the effects of lead length (or more accurately of
current impulses of equal magnitude but faster rise are applied loop area) for connecting the varistors. This is especially
to the varistor, higher voltages will appear across the device. important when the currents are in excess of a few amperes
These higher voltages, described as “overshoot,” are partially with rise times of less than 1µs.
the result of an intrinsic increase in the varistor voltage, but
With reasonable care in maintaining short leads, as shown in
mostly of the inductive effect of the unavoidable lead length.
Figure 6A, it is possible to describe the “overshoot” effect as an
Therefore, as some applications may require current impulses
increase in clamping voltage relative to the value observed with
of shorter rise time than the conventional 8µs, careful attention
a 8/20µs impulse. Figure 7 shows a family of curves indicating
is required to recognize the contribution of the voltage
the effect between 8µs and 0.5µs rise times, at current peaks
associated with lead inductance [1].
ranging from 20A to 2000A. Any increase in the lead length, or
The varistor voltage, because of its nonlinearity, increases only area enclosed by the leads, would produce an increase in the
slightly as the current amplitude of the impulse increases. The voltage appearing across the varistor terminals - that is, the
voltage from the lead inductance is strictly linear and therefore voltage applied to the protected load.
becomes large as high current amplitudes with steep fronts are
DC Standby Current, ID
applied. For that reason, it is impractical to specify clamping
voltages achieved by lead-mounted devices with current This current is measured with a voltage equal to the rated
impulses having rise times shorter than 0.5µs, unless circuit continuous DC voltage, VM(DC), applied across the varistor.
geometry is very accurately controlled and described. The circuit of Figure 1 is applicable where current sensing
resistor R2 has a value of 1000Ω. The test method is to set
To illustrate the effect of lead length on the “overshoot,” two the voltage supply, E1, to the specified value with switch S1
measurement arrangements were used. As shown in Figures closed and S2 in the V position. Then S2 is placed in position
6A and 6B, respectively, 0.5cm2 and 22cm2 of area were I and S3 in position, ID. S1 is then opened, the test device is
enclosed by the leads of the varistor and of the voltage probe. inserted in the test socket, and S1 is closed. The DVM
The corresponding voltage measurements are shown in the reading must be converted into current. For example, if a
oscillograms of Figures 6C and 6D. With a slow current front maximum standby current of 200µA is specified, the
of 8µs, there is little difference in the voltages occurring with maximum acceptable DVM reading would be 0.200V.
a small or large loop area, even with a peak current of 2.7kA. The measurement of DC standby current can be sensitive to
With the steep front of 0.5µs, the peak voltage recorded with the device behavioral phenomena of “break-in” stabilization
the large loop is nearly twice the voltage of the small loop. and polarization of the VI characteristics, as described in the
(Note on Figure 6D that at the current peak, L di/dt = 0, and Nominal Varistor Voltage VN section. If the device under test
the two voltage readings are equal; before the peak, L di/dt has prior unipolar electrical history, polarity indicators should
is positive, and after, it is negative.) be observed and test values interpreted accordingly.
80
1000
WAVESHAPE 60
800
CLAMPING VOLTAGE (V)
0.5/1.5µs 50
600 1/3µs
40
8/20µs
400 30
20
200
C
125 oC
C
C
C
100 o
50 o
25 o
75 o
SPECIMEN: V130LA10A
10 10
20 40 60 80100 200 400 600 800 1000 2000 10-9 10-8 10-7 10-6
10-5 10-4 10-3 10-2
PEAK CURRENT (A) VARISTOR CURRENT (ADC)
10-144
Application Note 9773
1400 0.12
xx
0.10 x x
DISSIPATION FACTOR, D
1200 x
CAPACITANCE (pF)
XX x xx
X 0.08 x
X
X x
1000 XX 0.06 x
XXX
XX x
X
X XX X xx
0.04 x
800 x
x
x
0.02
600 0
10 102 103 10 4 10 5 106 107 108 10 102 103 10 4 10 5 106 107 108
FREQUENCY (Hz) FREQUENCY (Hz)
FIGURE 10. CAPACITANCE VARIATION WITH FREQUENCY FIGURE 11. DISSIPATION FACTOR VARIATION WITH
FREQUENCY
The value of DC standby current also can be sensitive to may be obtained by measurement methods similar to those
ambient temperature. This is unlike varistor characteristics already given for nominal varistor voltage and maximum
measured at currents of 1mA or greater, which are relatively clamping voltage. These miscellaneous characteristics may
insensitive to ambient temperatures. With VM(DC) around be useful in some cases to enable comparison of Littelfuse
85% of VN, Figure 8 shows the typical DC standby current of Varistors with other types of nonlinear devices, such as those
a model V130LA10A varistor in the order of 10µA or 20µA at based on silicon carbide, selenium rectifier or zener diode
room temperature. ID increases to about 80µA at 85oC, the technologies.
maximum operating temperature without derating.
Varistor Rating Assurance Tests
Capacitance
Since the bulk region of a Littelfuse Varistor acts as a Continuous Rated RMS and DC Voltage [VM(AC)
dielectric, the device has a capacitance that depends and VM(DC)]
directly on its area and varies inversely with its thickness. These are established on the basis of operating life tests
Therefore, the capacitance of a Littelfuse Varistor is a conducted at the maximum rated voltage for the product
function of its voltage and energy ratings. The voltage model. These tests usually are conducted at the maximum
rating is determined by device thickness, and the energy rated ambient operating temperature, or higher, so as to
rating is directly proportional to volume. accelerate device aging. Unless otherwise specified,
end-of-lifetime is defined as a degradation failure equivalent
Littelfuse Varistor capacitance can be measured through use
to a VN shift in excess of ±10% of the initial value. At this
of a conventional capacitance bridge and is found to vary
point the device is still continuing to function. However, the
with frequency, as shown in Figure 9. Typically, capacitance
varistor will no longer meet the original specifications.
measurements are made at 1MHz. Dissipation factor also is
frequency-dependent, as shown in Figure 10. A typical operating life test circuit is shown in Figure 11. If
the varistor is intended principally for a DC voltage
When measured with a DC bias, the capacitance and
application, then the AC power source should be changed to
dissipation factor show little change until the bias approaches
DC. It is desirable to fuse the varistors individually so testing
or exceeds the VN value. Furthermore, the capacitance change
is not interrupted on other devices if a fuse should blow. The
caused by an applied voltage (either DC or AC) may persist
voltage sources should be regulated to an accuracy of ±2%
when the voltage is removed, with the capacitance gradually
and the test chamber temperature should be regulated to
returning to the prebias value. Because of this phenomenon, it
within ±3oC. The chamber should contain an air circulation
is important that the electrical history of a Littelfuse Varistor be
fan to assure a uniform temperature throughout its interior.
known when measuring capacitance.
The varistors should receive an initial readout of
Miscellaneous Characteristics characteristics at room ambient temperature i.e., 25 ±3oC.
A number of characteristic measurements can be derived They should then be removed from the chamber for
from the basic measurements already described, including subsequent readout at 168,500, and 1000 hours. A minimum
the nonlinear exponent (alpha), static resistance, dynamic of 20 minutes should be allowed before readout to ensure
impedance, and voltage clamping ratio. The data, however, that the devices have cooled off to the room ambient
temperature.
10-145
Application Note 9773
TEST CHAMBER
1V 100mV 1ms
FIGURE 12. SIMPLIFIED OPERATING LIFE TEST CIRCUIT
10A/DIV
Transient Peak Current, Energy, Pulse Rating, and
Power Dissipation Ratings
Special surge generator equipment is required for testing.
100V/DIV
Since high energy must be stored at high voltages to
perform these tests, especially on larger sizes of Littelfuse
Varistors, the equipment must be operated using adequate
safety precautions. 0
The peak current rating, ITM of Littelfuse Varistors is based
on an 8/20µs test impulse waveshape. The specifications
1ms/DIV
include a maximum single value in the ratings table. A pulse 10/1000µs WAVEFORM
rating graph defines the peak current rating for longer
impulse duration as well, such as for a 10/1000µs wave. A FIGURE 13. SURGE TEST WAVEFORMS
family of curves defines the rated number of impulses with a
given impulse duration and peak current. Table 1 outlines a suggested program of testing to verify
varistor transient and pulse ratings with a minimum of
Energy rating, WTM, is defined for a 10/1000µs current impulse
expensive, time-consuming testing. New specimens should
test wave. This waveshape has been chosen as being the best
be used for each test level and failure judged according to
standard wave for tests where impulse energy, rather than peak
the specification criteria.
current, is of application concern. A direct determination of
energy dissipated requires that the user integrate over time the TABLE 1. TESTING OF TRANSIENT CURRENT, ENERGY,
product of instantaneous voltage and current. PULSE RATING, AND POWER DISSIPATION
RATINGS
Peak voltage and current are readily measured with
NO. PULSES AT
available equipment. Therefore, the energy rating can be
RATED MINIMUM
tested indirectly by applying the rated peak impulse current CURRENT TEST PULSE
of a 10/1000µs waveshape to the test specimen. Then, the TEST (ALTERNATING WAVESHAPE PERIOD
energy dissipated in the varistor can be estimated from the PARAMETER POLARITY) (µs) (s)
known pulse waveshape. For a 10/1000µs waveshape the Maximum Peak 1 (Same Polarity 8/20 NA
approximate energy is given by the expression E = 1.4VC Iτ. Current as Readout)
For example, a model V130LA10A varistor has a single pulse Pulse/Energy 2 10/1000 or 50
rating for a 10/1000µs impulse waveshape of about 75A peak, Rating, Power 2ms Square
Dissipation Wave
and a maximum clamping voltage at 75A of about 360V. Thus,
the computation of estimated energy dissipation is 38J. Pulse Rating 10 8/20 25
The transient power dissipation rating, PTAM , is defined as the Pulse Rating 100 8/20 12
maximum average power of test impulses occurring at a
specified periodic rate. It is computed as the estimated energy Continuous Power Dissipation
dissipation divided by the test pulse period. Therefore, varistors Since Littelfuse Varistors are used primarily for transient
can be tested against this rating by applying two or more suppression purposes, their power dissipation rating has
impulses at rated current with a specified period between been defined and tested under transient impulse conditions.
pulses. For example, a model V130LA10A varistor has a pulse If the devices are to be applied as threshold sensors or
rating of two 10/1000µs test impulses with a peak current of coarse voltage regulators in low power circuits, then a
about 65A. The estimated energy dissipation per pulse dissipation test under continuous power is more appropriate.
computed as per the preceding example is about 30J. If a This continuous power test will aid the user in determining if
period of 50s is allowed after the first test pulse, the estimated the device is suitable for his specific application.
10-146
Application Note 9773
A circuit for continuous power dissipation testing is shown Equipment for Varistor Electrical Testing
in Figure 13. The DC power supply voltage should be set to
a value of approximately twice the nominal varistor voltage Impulse Generators
of the product model under test. In that case, nearly A convenient method of generating current or voltage surges
constant power dissipation is maintained in the varistor. consists of slowly storing energy in a capacitor network and
Since the circuit transfers nearly equal power to the series abruptly discharging it into the test varistor. Possible energy
resistor and varistor-under-test, the series resistor value is storage elements that can be used for this purpose include
simply chosen to achieve the test design value of power lines (lumped or distributed) and simple capacitors,
dissipation. In Figure 13 a nearly constant power depending on the waveshape desired for the test. Figure 14
dissipation of about 0.6W is obtained. shows a simplified schematic for the basic elements of an
impulse generator.
S1 S2 L R2
68kΩ
1W OSCILLOSCOPE
5%
400VDC
±2%
VARISTOR V
V130LA10A R1 UNDER
E1 C TEST COM
I
TEST CHAMBER
R3
10-147
Application Note 9773
1. The Surge Withstand Capability (SWC) standard [1] Fisher, F.A., “Overshoot - A Lead Effect in Varistor
specified a 150Ω source. Characteristics,” Report 78CRD, General Electric,
2. The Ground Fault (UL-GFCI) standard is 50Ω source [8]. Schenectady, N.Y., 1978.
3. The Transient Control Level (TCL) proposals of Martzloff [2] Heller, B. and A. Veverka, “Surge Phenomena in
et. al. [7] include a 50Ω resistor in parallel with a 50µH Electrical Machine”, ILIFFE Books Ltd., London, 1968.
inductor. [3] Greenwood, Allen, “Electrical Transients in Power
4. The installation category concept of ANSI/IEEE Standard Systems”, Wiley Interscience, New York, 1971.
C62.41-1980 implies a range of impedances from 1Ω to [4] Craggs, J.D. and J.M. Meek, “High Voltage Laboratory
50Ω as the location goes from outside to inside. Techniques”, Buttersworth Scientific Publications,
5. The FCC regulation for line-connected telecommunication London, 1954.
equipment implies a 2.5Ω source impedance [9]. However,
[5] Martzloff, F.D., “Transient Control Level Test
the requirement of the FCC is aimed at ensuring a
Generators”, Report 77CRD241, General Electric,
permanent “burning” of a dielectric puncture and does not
Schenectady, N.Y., 1977.
necessarily imply that the actual source impedance in the
real circuits is 2.5Ω. [6] “Test Specifications for Varistor Surge-Protective
Devices”, ANSI/IEEE Std. C62.33, 1982.
6. Reported measurements [10] indicate the preponderance
of the inductance in branch circuits. Typical values are µH [7] Martzloff, F.D., and F.A. Fisher, “Transient Control Level
per meter of conductors. Philosophy and Implementation - The Reasoning
7. There is no agreement among the above proposals on a Behind the Philosophy,” 77CH1224-5EMC,
specific source impedance. Examining the numbers “Proceedings of the 2nd Symposium on EMC”,
closer, one can observe that there is a variance between Montreux, June 1977.
2.5Ω to about 50Ω. Going back to ANSI/IEEE Standard [8] “Standard for Safety: Ground Fault Circuit Interrupters,”
C62.41-1980 by using the Open Circuit voltage (OCV) UL943, Underwriters Laboratories, May 12,1976.
and SCI (short circuit current) for the different location
categories, one can calculate a source impedance. [9] “Longitudinal Voltage Surge Test #3,” Code of Federal
Regulations, Section 68.302(e), Title 47,
Any practical power circuit will always have some finite Telecommunications.
impedance due to the resistance and inductance of the
power line and distribution transformer. Table 2 shows [10] F.D. Martzloff, “The Propagation and Attenuation of
Surge Voltages and Surge Currents in Low-Voltage AC
representations of the surge source impedance implied in
Circuits,” IEEE Transactions on Power Apparatus and
the environment description of ANSI/IEEE C62.41-1980.
Systems, PAS-102, pp. 1163-1170, May 1983.
10-148