The Rise Of VNAs

How vector network analyzers help shape today’s microwave/RF designs

By Bob Buxton, Anritsu Company

The vector network analyzer (VNA) has been around for many years. For much of that time, it
has been considered complicated and expensive. However, with today’s high-frequency
complex designs, the microwave VNA may be perhaps the single most important measurement
tool in the RF/microwave industry.

Why? Because a microwave VNA is a precise, multichannel measurement system capable of

measuring minute differences of amplitude and phase over multi-octave frequency ranges. That
is the reason VNAs are used to verify so many designs, from Bluetooth devices, cellular
telephones, and wireless local area networks (WLANs) to high-speed serial interconnects,
military electronic warfare (EW), electronic countermeasures (ECM), and radar systems. This
introductory article will be followed by others that will cover various aspects of VNAs in more
detail.

Today’s VNAs are high-performance measurement systems that can be specified for frequency
coverage from RF through millimeter-wave frequencies, with impressive measurement
resolution and dynamic range. To obtain the ultimate accuracy, they should be calibrated on a
daily basis using a set of calibration standards approved by the VNA manufacturer. Attention
should be paid to the quality of accessories like adapters and test cables, and even to the
condition of test-port connectors.

As seen in the 3/8/11 edition of the RF Globalnet (www.rfglobalnet.com) newsletter.

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VNA Measurements
In most instances, VNAs have become the instrument of choice and have all but replaced scalar
analyzers in many applications. That’s because VNAs do everything that scalar analyzers do,
plus they add the ability to measure the phase characteristics of microwave networks and
components such as amplifiers, cables, and antennas over a greater dynamic range and with
more accuracy.

In essence, VNAs measure how a device under test (DUT) transforms the magnitude and phase
of signals to which it is subjected. These devices can range from a simple two-port DUT, such as
a filter, to a sophisticated network where knowledge of both intentional transmission paths and
crosstalk is required. As shown in Figures 1 and 2, VNAs are able to measure both transmission
and reflection characteristics of DUTs.

Figure 1: The VNA can make a wide range of transmission measurements.

Figure 2: The VNA can make five different reflection measurements.

As seen in the 3/8/11 edition of the RF Globalnet (www.rfglobalnet.com) newsletter.

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Phase data acquired by a VNA provides the potential for many complex measurement features,
including S-parameters, which are a shorthand method for identifying forward and reverse
transmission and reflection characteristics, as well as time-domain gating and group delay.
Figure 3 shows four S-parameters — S11 (forward reflection), S21 (forward transmission), S22
(reverse reflection), and S12 (reverse transmission) — that can be measured with a VNA. Phase
information also allows greater accuracy through vector-error correction of the measured
signal.

Figure 3: Four S-parameters that can be measured with a VNA

While there are different ways to perform S-parameter measurements, the method employed
by the Anritsu VectorStar® MS4640A series of VNAs is to down-convert the signal to a lower
intermediate frequency (IF) via a process called harmonic sampling. The IF signal is then
digitized for processing. This heterodyne approach gives the system greater dynamic range due
to its variable IF-filter-bandwidth control. The system is also much less sensitive to interfering
signals, including harmonics.

Summary
The VNA is a powerful instrument with the ability to measure phase, as well as amplitude.
Measuring phase introduces the ability to add vector-error correction to the measurement
trace. With vector-error correction, errors introduced by the measurement system are
accounted for and measurement uncertainty is minimized. Phase measurements also add the
capability for measuring group delay, which is the rate of phase change versus frequency.
Overall, using a VNA provides for a more complete analysis of any test device.

As seen in the 3/8/11 edition of the RF Globalnet (www.rfglobalnet.com) newsletter.

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Stay tuned for future columns on VNAs. We’ll discuss VNA fundamentals, calibration, and
applications. In the interim, please visit www.anritsu.com,
http://www.facebook.com/AnritsuCompany, or http://twitter.com/Anritsu to learn more about
VNAs.

About The Author

Bob Buxton received an M.Sc. in microwaves and modern optics from University College
London and an MBA from George Fox University (Newberg, OR). His experience includes R&D,
product definition, and marketing in connection with microwave components, operational
equipment, and test equipment in the fields of radar, communications, and video. Prior roles
have been in the United Kingdom, Germany, and the United States. Since April 2010, he has
been leading Anritsu's general-purpose microwave bench instrument product marketing team.

As seen in the 3/8/11 edition of the RF Globalnet (www.rfglobalnet.com) newsletter.