SIEMENS

Prf-Nr./Q-Nr.:

Cetificate No.:
Dienststelle:

1722b
I BT LV GC R&D TG WeiSS

Depaftment:
Ort: Place: Anlagen: Enclosures.

Amberg Test Summary

rag: 2010-04-09
Date:

Prtifuescheinigung I
Ezeugnis

Tes-t -

mte
Hersteller: SIEMENS
Manufacturer:

tProduct:

switch disconnector Fuse (sDF)

Tech.

lY:o:",

3K161 30

specirication:

Daten: Ue=690 V AG 50/60 Hz leAc23B=630A/6g0v Ue=440 V DG le DC22A=6304/400V

Labot I

LTD., INDIA

Art der Prfung I Type of

Prfer

test:

Type Test

Tested

by:

SeVefal

Laboratory:

ALPHA registered

Testing Laboratory D 006 Siemens AG, Amberg

Angewandte Prfbestimmungen / Iesf specifications applied:

IEC 60947-3: (08/2008) / IEC 60947-1 (06/2007) DIN EN 60947-3: (02120101/ DN EN 60947-l: (0a/2008) I

Durchgefhrte Prfungen

Tests conducted:

Test Sequences IEC 60947-3 l, ll, lV, V / IEC 60947-1 (8.2.1.1.11

Prfergebnis

/ Iesf

resu/fs:

All requirements of the test specification are met.

Bemerkungen

Remarks:

lSSUed: 2001-0,|.-11

This test certificate is valid for all variations of type 3KL6l 30 lndex a: Standards updated, plastic material requirements are met

Unterschrift

/ Signature

Gegengezeichnel

Released by:

SIEMENS AG
Siemens Aktiengesellschaft: Chairman of the Supervisory Board: Gerhard Cromme Managing Board: Peter Loescher, Chairman, Presdent and Chief Executive Ofcer; Wolfgang Dehen, Heinrich Hiesinger, Joe Kaeser, Barbara Kux, Hermann Requardt, Siegfried Russwurm, Peter Y. Solmssen Registered offices: Berlin and Munich; Commercal registries: Berlin Charlottenburg, HRB 12300, Munich, HRB 6684 WEEE-Reg.-No. DE 23691 322

Industry Sector

Formular: Jan.2009

SIEMENS
Test summarv
Manufacturer: Test device:
Type:

Pagel l2

Certificate no.:1722b
Siemens LTD. INDIA

Switch disconnector Fuse (SDF)

3KL61

Test specification:

tEc 60947-3 (08-2008) / tEC 60947-1 (06/2007)

wsGRtTT/2010/3KL61 630A
Test

Test report No.:

Test-sequence and sub-clause

Device

lEc 60947-3
Test-sequence
8.3.3.1
I

8.3.3.2 8.3.3.3 8.3.3.4 8.3.3.5 8.3.3.6 8.3.3.7 Test-sequence ll

8.3.4.1

Temperature-rise on Samples A & F Dielectric properties on Samples A &

see test report:

F

wscFvfi/2o10/3K161

6304

Making and breaking capacities AC23B Dielectric verification Leakage current Temperatu re-rise verification Strength of actuator mechanism

8.3.4.2 8.3.4.3 8.3.4.4 Test-sequence lV 8.3.6.2.1a) 8.3.6.2.1b) 8.3.6.3 8.3.6.4 8.3.6.5

Operational performance test Dielectric verification Leakage current Tem perature-rise verification

see test report: wscFvfi/2o 1 0/3K161 _630A

Fuse protected short-circuit withstand Fuse protected short-circu it makino Dielectric verification Leakage current Temperature-rise verification

see test report:

WSGFYTT/2o10/3K161

630A

Test-sequence V
8.3.7.1

8.3.7.2 8.3.7.3 8.3.7.4

Overload test Dielectric verification Leakage current Temperature-rise verification

see test report:

WSGFYTT/2o10/3K161

6304

tEc 60947-l
8.2.1.1.1

Glow Wire test

see test report: 1722b-01

The tests were carried out on devices, representative for the whole series.

SIEMENS
The tests were carried out in the

Page2l2
KALWA WORKS, WSGR R&D

Thane-400 601, Maharashra, lndia

Test Lab, lndia.

Test Lab Sremens AG, I BT LV GC R&D MA L, Werner von Siemensstr. 48, 92220 Amberg, Germany

ERDA, Vadodara, Gujarat, lndia. Ma4arpura lndustrial Estate, Vadodara-39) 010, lndia
CPRI, Bhopal, Madhya Pradesh, India. Govindpura, Bhopal-462 023, lndia

Amberg, 2010-04-09
Location. Date