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International Journal of Computational Intelligence and Information Security, November 2011 Vol. 2, No.

11


32

ESTIMATION OF RELIABILITY PARAMETERS FOR
TELE-COMMUNICATION SYSTEM

Pankaj Singh
Assistant Professor, Department of Electronics Communication Engineering,
S.R.M. University, NCR Campus, Modinagar, U.P.-201204, India
Email: singhpankaj76@rediffmail.com

Shamimul Qamar
Professor, Institute of Science & Technology Klawad, Yamuna Nagar, Haryana, India
Email: jsqamar@gmail.com

K. P. Yadav
Professor, Saraswati Institute of Engineering and Technology, Ghaziabad (U.P.)
Email: karunesh732@gmail.com


Abstract

In this paper, the author has considered a problem related to telecommunication system for
estimation of its reliability parameters. There are four main components in this system, namely
telephone instrument, sub exchanges, main exchange and radar. These all are connected in series and in
this model are designated as I, S, M and R respectively. Supplementary variables technique and
Laplace transform have been used to formulate and solve the model, respectively. Laplace transforms
of various state probabilities, steady-state behavior of the system and a particular case have been
obtained to connect the model with physical situations. Reliability and M.T.T.F. for the considered
system have been computed at the end. One numerical example with graphical illustration has given at
last to highlight the important results of this study.

KEY WORDS: Parallel redundancy, Markovian process, Supplementary Variables, Laplace
transforms, exponential time distribution etc.



1. Introduction:

As the field of reliability engineering is becoming a recognized discipline in
engineering, so is the awareness of its specialized topics which were generally
overlooked in the past. For example, in recent years environmental failure and human
error have received a widespread attention in reliability analysis of complex systems
because the assumption of statistically independent failure of units, is easily violated
in practice.
The local calls are either transferred in the same sub exchange or transferred into the
other through main exchange. The S.T.D. and I.S.D. calls are distributed by the
function of main exchange and radar. On failure of radar, the system works in
degraded state. The whole system can fail completely due to failure of subsystems I,
S, M, and due to environmental reasons. All the failures follow exponential time
distribution whereas all the repairs follow general time distribution. System
configuration has been shown through fig-1(a) while transition of states through fig-
1(b).

The following assumptions have been used throughout this study:

(i) Initially, all the system is good and operable.
International Journal of Computational Intelligence and Information Security, November 2011 Vol. 2, No. 11


33

(ii) All failures follow exponential time distribution and are S-independent.
(iii) All the repairs follow general time distribution and are perfect, i.e., after repair
system works like new.
(iv) The whole system works in reduced efficiency state on failure of radar.
(v) The whole system can fail due to failure of subsystem M, S, I and
environmental reasons.
(vi) Repair facilities are always available to repair a failed subsystem / component.



Fig-1(a): System configuration






International Journal of Computational Intelligence and Information Security, November 2011 Vol. 2, No. 11


34


Fig-1(b): State-transition diagram


The following notations have been used throughout this study:

m n / : Number of units working in subsystem I/S.
/ : Failure rate of any one unit of subsystem I/S.
/ : Failure rate of subsystem M/R.
2 1
, e e
: Failure rate of the system due to environmental reasons.
) ( j
i

: First order probability that i
th
failure can be repaired in the time
interval ( ) + j j, conditioned that it was not repaired upto the
time j.
) (
0
t P
: Pr{at time t, the whole system is operable}.
) , ( t j P
i

: Pr {at time t, the system is in failed condition due to failure of i
th

subsystem}. Elapsed repair time lies in the interval ( ) + j j, .
) , ( t r P
R

: Pr {at time t, the system is in degraded state due to failure of
radar}. Elapsed repair time lies in the time interval ( ) + r r, .
) , ( t j P
Ri

: Pr {at time t, the system is failed due to failure of the i
th

International Journal of Computational Intelligence and Information Security, November 2011 Vol. 2, No. 11


35

subsystem while radar has already failed}. Elapsed repair time for
i
th
subsystem lies in the interval ( ) + j j, .
) , ( t u P
E

: Pr {at time t, the system is failed due to environmental reasons}.
Elapsed repair time lies in the time interval ( ) + u u, .
) ( j S
i

:
( ) ( ) j and i dj j j
i i


, } { exp
) ( j D
i

:
( ) j and i j j Si , / 1
. . . . F T T M : Mean time to failure.

2. Literature Review:
In this section, the author has done analysis for mathematical formulation of the
model, its solution, a particular case and various results related to reliability
estimation.

2.1 Formulation of mathematical model
Using elementary probability considerations and limiting procedure [1]-[3], we obtain
the following set of difference-differential equations, which is continuous in time,
discrete in space and governing the behavior of considered system:
( ) ( ) dy y t y P dx x t x P t P e m n
dt
d
S S I I


+ =
(

+ + + + +
0 0
0 1
) ( , ) ( , ) (
( ) ( ) dr r t r P dz z t z P
R R M M


+ +
0 0
) ( , ) ( ,
( ) du u t u P
E E

+
0
) ( ,




(1)
( ) ( ) 0 , =
(

t x P x
t x
I I
(2)
( ) ( ) 0 , =
(

t y P y
t y
S S
(3)
( ) ( ) 0 , =
(

t z P z
t z
M M
(4)
( ) 0 , ) (
2
=
(

+ + + + +

t r P r e m n
t r
R R
(5)
( ) ( ) 0 , =
(

t x P x
t x
RI I
(6)
( ) ( ) 0 , =
(

t y P y
t y
RS S
(7)
( ) ( ) 0 , =
(

t z P z
t z
RM M
(8)
( ) ( ) 0 , =
(

t u P u
t u
E E
(9)

Boundary conditions are
( ) ) ( , 0
0
t P n t P
I
= (10)
International Journal of Computational Intelligence and Information Security, November 2011 Vol. 2, No. 11


36

( ) ) ( , 0
0
t P m t P
S
= (11)
( ) ) ( , 0
0
t P t P
M
= (12)
( )


+ + =
0 0
0
) ( ) , ( ) ( ) , ( ) ( , 0 dy y t y P dx x t x P t P t P
S RS I RI R

+
0
) ( ) , ( dz z t z P
M RM



(13)
( ) ) ( , 0 t P n t P
R RI
= (14)
( ) ) ( , 0 t P m t P
R RS
= (15)
( ) ) ( , 0 t P t P
R RM
= (16)
( ) ) ( ) ( , 0
2 0 1
t P e t P e t P
R E
+ = (17)
Initial conditions are:
( ) 1 0
0
= P , otherwise all state probabilities are zero at 0 = t (18)

2.2 Solution of the model
Taking Laplace transforms of equation (1) through (17) by the use of initial
conditions (18), and on solving them [4] one by one, we obtain the following L.T. of
transition state probabilities depicted in fig-1(b), we obtain:

( )
( ) s C
s P
1
0 =

(19)
( )
( ) s C
s D n
s P
I
I
) (
=
(20)
( )
( ) s C
s D m
s P
S
S
) (
=
(21)
( )
( ) s C
s D
s P
M
M
) (
=
(22)
( )
( ) s C
s B
s PR
) (
=
(23)
( )
( ) s C
s D s B n
s P
I
RI
) ( ) (
=
(24)
( )
( ) s C
s D s B
s P
M
RM
) ( ) (
=
(25)
( )
( ) s C
s D s B m
s P
S
RS
) ( ) (
=
(26)
and ( )
( )
| | ) ( ) (
1
2 1
s D s B e e
s C
s P
E
E + =
(27)
where,
2
e m n s A + + + + = (28)

{ } ) ( ) ( ) ( ) ( 1
) (
) (
A D s S s S m s S n
A D
s B
R
M S I
R


+ +
=
(29)
and ) ( ) ( ) ( ) (
1
s S s S m s S n e m n s s C M S I + + + + + =
| | ) ( ) (
2 1
s S s B e e E +



International Journal of Computational Intelligence and Information Security, November 2011 Vol. 2, No. 11


37

{ } | | ) ( ) ( ) ( ) ( ) ( A S s S s S m s S n s B R M S I + + +
(30)

Verification

It is worth noticing that
s
s P s P s P s P s P s P s P s P s P E RM RS RI R M S I
1
) ( ) ( ) ( ) ( ) ( ) ( ) ( ) ( ) ( 0 = + + + + + + + +
Taking inverse Laplace Transform, we get
1 ) ( ) ( ) ( ) ( ) ( ) ( ) ( ) ( ) (
0
= + + + + + + + + t P t P t P t P t P t P t P t P t P
E RM RS RI R M S I
(31)
This shows that our modeling, mathematical formulation and its solution is correct.

2.3 Steady-state behavior of the system
Using final value theorem of L.T., viz; ( ) ), ( ) ( P
0
say P s P s Lim t Lim
s t
= =

provided the
limit on right side exists, in equation (19) through (27), we get the following steady-
state behavior [5] of the system:
( )

0
1
0
C
P

=
(32)
( )

0 C
M n
P
I
I

=


(33)
( )

0 C
M m
P
S
S

=


(34)
( )

0 C
M
P
M
M

=


(35)
( )

0
) 0 (
C
B
P
R

=
(36)
( )

0
) 0 (
C
M B n
P
I
RI

=


(37)
( )

0
) 0 (
C
M B
P
M
RM

=


(38)
( )

0
) 0 (
C
M B m
P
S
RS

=


(39)
and
( )
| | M ) 0 (
0
1
E 2 1
B e e
C
P
E
+

=
(40)
Where, = = ) 0 ( i
i
S M Mean time to repair i
th
failure

| | ) ( 1
) (
) 0 (
s A D m n
s A D
B
R
R
+ +

=




and
0
) ( ) 0 (
=
(

=
s
s C
ds
d
C


2.4 Particular case
When repairs follow exponential time distribution
International Journal of Computational Intelligence and Information Security, November 2011 Vol. 2, No. 11


38

In this case, setting ( )
( )
j , and i
j
j S
i
i
i
+
=

in equations (19) through (27), we may


obtain the following transition states (of fig-1(b)) probabilities:
( )

1
) ( 0
s F
s P =
(41)

) )( (
) (
I
I
s s F
n
s P

+
=
(42)

) )( (
) (
S
S
s s F
m
s P

+
=
(43)

) )( (
) (
M
M
s s F
s P

+
=
(44)

) (
) (
) (
s F
s E
s PR =
(45)

) )( (
) (
) (
I
RI
s s F
s E n
s P

+
=
(46)

) )( (
) (
) (
M
RM
s s F
s E
s P

+
=
(47)

) )( (
) (
) (
S
RS
s s F
s E m
s P

+
=
(48)
and
( )
| |

) (
) ( 1
) (
2 1
E
E
s
s E e e
s F
s P
+
+
=
(49)

Where,
( )
(

+
+
+
+
+
+
=
M
M
S
S
I
I
R
s s
m
s
n
A
s E

) (

and
M
M
S
S
I
I
s s
m
s
n
e m n s s F

+
+ + + + + =
1
) (
| |
E
E
s
s E e e

+
+ ) (
2 1


R
R
M
M
S
S
I
I
A s s
m
s
n
s E

+
(

)
`

+
+
+
+
+
+ ) (


2.5 Reliability and M.T.T.F. evaluation
From equation (19), we get
( )
1
1
e m n s
s R
+ + + + +
=


Taking inverse Laplace Transform, we have
( ) ( ) { } t exp
1
e m n t R + + + + = (50)
Also, M.T.T.F.

=
0
) ( dt t R
International Journal of Computational Intelligence and Information Security, November 2011 Vol. 2, No. 11


39


1
1
e m n + + + +
=

(51)
2.6 Numerical computation
For a numerical illustration, let us consider the values , 6 , 002 . 0 , 50 = = = m n
3 . 0 03 . 0 , 06 . 0 , 01 . 0
1
= = = = e and .
We may take t = 0,1,2,----10 by putting these values in equations (50) and (51) we
observe the changes in the values of reliability function R(t) and M.T.T.F.,
respectively. Their graphical representation have been shown in fig-2 and 3,
respectively.


Fig-2: The way reliability of considered system decreases with the increase in time.

Fig-3: The way MTTF of considered system decreases with the increase in
environmental failure rate.
3. Results and discussion:

In this paper, author has done reliability analysis for tele-communication system.
Possible state transition of considered system has been drawn (fig-1(b)) and an
equation obtained corresponding to each state by using supplementary variables
technique. Laplace transform has been used to solve mathematical equations.
Reliability and M.T.T.F. have been computed for considered system.
International Journal of Computational Intelligence and Information Security, November 2011 Vol. 2, No. 11


40

In earlier research, no care was given to system failure due to environmental reasons.
Without this, one cannot access the actual reliability of the system. Therefore, the
author has paid due attention to failures due to environmental reasons and obtained
better results for considered tele-communication system.
A numerical example appended at last to highlight important results of this study. Its
graphical illustration has been shown through fig-2 to 3. These figures show the
variation of reliability and M.T.T.F for the considered example assured tele-
communication system.

REFERENCES
[1] Cluzeau, T.; Keller, J.; Schneeweiss, W. (2008): An Efficient Algorithm for Computing the
Reliability of Consecutive-k-Out-Of-n:F Systems, IEEE TR. on Reliability, Vol.57 (1), 84-
87.
[2] Gupta P.P., Agarwal S.C. (1983): A Boolean Algebra Method for Reliability Calculations,
Microelectron. Reliability, Vol.23, 863-865.
[3] Lai C.D., Xie M., Murthy D.N.P. (2005): On Some Recent Modifications of Weibull
Distribution, IEEE TR. on Reliability, Vol.54 (4), 563-569.
[4] Tian, Z.; Yam, R. C. M.; Zuo, M. J.; Huang, H.Z.(2008): Reliability Bounds for Multi-State
k-out-of- n Systems, IEEE TR. on Reliability, Vol.57 (1), 53-58.
[5] Zhimin He., Han T.L., Eng H.O. (2005): A Probabilistic Approach to Evaluate the Reliability
of Piezoelectric Micro-Actuators, IEEE TR. on Reliability, Vol.54 (1), 44-49.

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