NodeB LMT User Guide

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14

Testing the RF Performance of the NodeB

About This Chapter

This describes how to test the NodeB RF performance. The RF performance test is also referred to as the 141 test. The 141 test consists of the UL 141 test and DL 141 test. Before the test, you need to set the parameters for the cell to be tested. 14.1 Introduction to RF Performance Test The RF performance test is also referred to as the 141 test. It is based on TS25.141 in the 3GPP protocols, which aims at testing the NodeB RF performance. 14.2 Setting the Parameters of a Cell Under Test This describes how to set the parameters of a cell under test. Before a 141 test, select the cell to be tested and then set the test parameters. 14.3 Testing the UL RF Performance This describes how to test the UL RF performance. The UL 141 test refers to the RF performance test on the NodeB RX channels. The test is of the following types: the UL E-DCH test, UL DPCH test, UL RACH test, and UL HS-DPCCH test. 14.4 Testing the DL RF Performance This describes how to test the DL RF performance. The DL 141 test is to test the RF performance on the NodeB TX channels.

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14.1 Introduction to RF Performance Test

The RF performance test is also referred to as the 141 test. It is based on TS25.141 in the 3GPP protocols, which aims at testing the NodeB RF performance. The 141 test mainly depends on the self-test of the equipment. This means that the function test and index test of the equipment are completed by the built-in testing modules such as the software module and hardware module. The 141 test needs external devices to set up a testing environment before the NodeB carries services. The 141 test applies to preliminary RF performance acceptance in the initial phase of site construction. The 141 test on the NodeB consists of two parts: UL 141 test and DL 141 test. Read the following precautions before performing a 141 test:
l

External devices are required for the test because the test cannot be performed through the testing modules only.
NOTE

For details about setting up compatible testing environment and performing the test on related devices, refer to the RF testing guides.
l

The NodeB must be disconnected from the RNC before a 141 test. In that case, the NodeB cannot carry services. Do not test on a running NodeB. To ensure normal NodeB services, reset the NodeB after the 141 test. For details, refer to 9.3.3 Resetting the NodeB.

You can obtain the 141 testing results shown in the 141 Test pane.

14.2 Setting the Parameters of a Cell Under Test

This describes how to set the parameters of a cell under test. Before a 141 test, select the cell to be tested and then set the test parameters.

Prerequisite
You are logged in to the NodeB LMT.

Procedure
Step 1 Click the Maintenance tab in the navigation pane. Step 2 Double-click 141 Test in the navigation pane. Step 3 Click OK. The 141 Test pane is displayed. Step 4 Right-click 141 Test in the 141 Test pane. Choose Create Cell on the shortcut menu. The parameter area is displayed in the right part of the window, as shown in Figure 14-1.
NOTE

For different models of NodeBs, the cell parameter settings for a 141 test are different. The following figure takes the BTS3812E as an example. For detailed parameter settings, refer to Table 14-1.

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Figure 14-1 Setting cell parameters

Table 14-1 describes the elements in the area for setting the parameters. Table 14-1 Elements in the area for setting the parameters Element NodeB Demodulating Mode Description Value range: DEM_2_CHAN, DEM_4_CHAN, DEM_ECON_4_CHAN Because this is a static parameter, the new configuration takes effect after the NodeB is reset. Local Cell ID Diversity State ID of the local cell State of TX diversity. Value range: Non Diversity, Diversity

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Element Band Range UL Frequency (MHz) DL Frequency (MHz) RRU Connect Flag

Description Value range: Band I to Band IX To dynamically select a frequency within the band range. Unit: MHz. To dynamically select a frequency within the band range. Unit: MHz. Cell parameter of the macro NodeB Whether the RRU is connected or not Select Connected with RRU when an MRRU is configured. Select Connected with TRU when an MTRU is configured.

Fiber Delay between RRUBBU

Parameter of the distributed NodeB Delay caused by optical cables between the RRU and the BBU when the RRU and BBU are connected through optical cables Parameter of the macro NodeB Delay caused by optical cables between the RRU and the BBI. When the distance between the RRU and the BBI is greater than three meters, connect them through optical cables. When you select RRU Connect Flag > Connected with RRU, the parameter values range from 0 to 65535. When you select RRU Connect Flag > Connected with TRU, the parameter cannot be set.

Fiber Delay between RRUBBI

Cell Radius (Chip) Primary Scrambling Code T Cell Max Transmit Power (0.1dbm) Main TRU Slot

Value range: 2 to 2304. Unit: Chip. Value range: 0 to 511. Default value: 0. Unit: chip. Value range: 0 to 9. Default value: 0. Unit: 256 chips. Maximum transmit power of the cell Value range: 0 to 500. Precision: 0.1 dBm. Parameter of the macro NodeB TX main channel for the cell

Main MTRU Power Capability

Parameter of the macro NodeB Power transmitted from the antenna connector and corresponding to the main MTRU The value must be consistent with the MTRU type. Parameter of the macro NodeB Power transmitted from the antenna connector and corresponding to the diversity MTRU. The value must be consistent with the MTRU type. Subrack number of the main RRU

Diversity MTRU Power Capability

Main MRRU Frame

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Element Main MRRU Power Capability Diversity MRRU Power Capability Connection at CPRI Ports

Description Power amplifier specification required by the main MRRU. The value must be consistent with the MTRU type. Power amplifier specification required by the diversity MRRU. The value must be consistent with the MTRU type. Parameter of the macro NodeB Connection between the MTRU/MRRU and HBBI/HBOI

Optical Port

Macro NodeB: number of the HBOI optical port connected to the RRU Distributed NodeB: number of the BBU optical port connected to the RRU

DLP Slot Encoding DSP ID BBU Frame No.

Slot number of the board containing encoding DSPs Number of the encoding DSP Parameter of the distributed NodeB Subrack number of the BBU

RHUB RRU Connect Mode

Macro NodeB: through an optical cable Distributed NodeB: through an optical or an Ethernet cable

RHUB Frame No

This parameter must be set when RHUB RRU Connect Mode is GE. This parameter is 20 by default when RHUB RRU Connect Mode is Optical. This parameter must be set when RHUB RRU Connect Mode is GE. This parameter is 0 by default when RHUB RRU Connect Mode is Optical.

Ge Port

Step 5 Set the parameters of the cell under test. Step 6 Choose Start. The Input dialog box is displayed, as shown in Figure 14-2. Figure 14-2 Input dialog box

Step 7 Enter the cell name. Step 8 Click OK. A cell under test is created. ----End
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14.3 Testing the UL RF Performance

This describes how to test the UL RF performance. The UL 141 test refers to the RF performance test on the NodeB RX channels. The test is of the following types: the UL E-DCH test, UL DPCH test, UL RACH test, and UL HS-DPCCH test. 14.3.1 Introduction to Uplink RF Performance Test The UL 141 test is to test the RF performance on the NodeB RX channels. During the test, the NodeB sets up UL channels based on different test types. 14.3.2 Testing the UL E-DCH This describes how to test the UL E-DCH. The E-DCH stands for the enhanced dedicated channel. Each E-DCH is dedicated to one UE. It can offer high speed data transferring. This test checks whether the technical specifications for the UL E-DCH meet the requirements in TS25.141 of the 3GPP protocols. 14.3.3 Testing the UL DPCH This describes how to test the UL DPCH. The UL DPCH stands for the UL dedicated physical channel. This test checks whether the technical specifications for the UL DPCH meet the requirements in TS25.141 of the 3GPP protocols. 14.3.4 Testing the UL RACH This describes how to test the UL RACH. The UL RACH stands for the UL random access channel, which is used to transmit relatively small amounts of data. This test checks whether the technical specifications for the UL RACH meet the requirements in TS25.141 of the 3GPP protocols. 14.3.5 Testing the UL HS-DPCCH This describes how to test the UL HS-DPCCH. The UL HS-DPCCH stands for the high speed dedicated physical control channel, which carries UL feedback signaling related to DL HSDSCH transmission. This test checks whether the technical specifications for the UL HSDPCCH meet the requirements in TS25.141 of the 3GPP protocols.

14.3.1 Introduction to Uplink RF Performance Test

The UL 141 test is to test the RF performance on the NodeB RX channels. During the test, the NodeB sets up UL channels based on different test types. According to different UL channels, the UL 141 test is categorized into the following types:
l l l l

E-DCH test DPCH test RACH test HS-DPCCH test

The general procedure for performing the 141 test is as follows: Transmit signals with a signal generator. For any type of the 141 test, the NodeB only receives and displays the content on the LMT interface. Adjust the signals until the content meets the RF performance requirements. Record the testing result. Then you can verify the result by comparing it with the technical specifications in TS25.141 of the 3GPP protocols. The commonly-used UL 141 test covers the following items:
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Reference receive sensitivity level Dynamic range Adjacent channel selectivity Blocking characteristics Intermodulation characteristics Spurious emissions Verification of the internal BER calculation

During the test, select different test items for different NodeB RF performance. For details, refer to TS25.141 in the 3GPP protocols.

14.3.2 Testing the UL E-DCH

This describes how to test the UL E-DCH. The E-DCH stands for the enhanced dedicated channel. Each E-DCH is dedicated to one UE. It can offer high speed data transferring. This test checks whether the technical specifications for the UL E-DCH meet the requirements in TS25.141 of the 3GPP protocols.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test.

Context
When the E-DCH test is started, the NodeB shuts down the channels that need no test and sets up channels on the UL processing units according to preset parameters to test the technical specifications required in TS25.141 of the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane and choose UL Test > E-DCH Test. The parameter area is displayed in the right part of the window, as shown in Figure 14-3.

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Figure 14-3 Setting parameters of the E-DCH test

Table 14-2 describes the elements in the area for setting the E-DCH test parameters. Table 14-2 Elements in the area for setting the E-DCH test parameters Element UL Scrambling Code ULP Slot Description Value range: 0 to 16777215 Macro NodeB: value range: 0 to 7, 15 Distributed NodeB: default value: 0 Demodulating DSP ID Macro NodeB: value range: NDD0, NDD1 Distributed NodeB: default value: NDD0 DL Scrambling Code DL E-HICH OVSF Code DL E-HICH SIGNATURE Code E-HICH Power(0.1dB) DL DSP CCTrCHID Value range: 0 to 511 Value range: 5 to 127 Value range: 0 to 39 Value range: -350 to +150 Value range: 9 to 136

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Element DLP Slot

Description Macro NodeB: value range: 0, 1, 8, 9, 15 Distributed NodeB: default value: 0

Reporting Period(s)

Interval between two test data reports Macro NodeB: value range: 1 to 255 Distributed NodeB: value range: 0 to 255, indicating the BBU

Propagation Delay Frame Offset Code Offset Test Type Business Type Receive Diversity State SD608 ID1 SD608 ID2 Step 2 Set the parameters.

Value range: 0 to 255 Value range: 0 to 255 Value range: 0 to 149 Value range: EDPDCH demodulation capability test, EDPCCH detection capability test Value range: FRC4, FRC5, FRC7 Value range: Non Diversity, Diversity Value range: 0 to 3 Default value: 0

Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-4. Figure 14-4 Input dialog box

Step 4 Enter the test item name. Step 5 Click OK. The testing flow is created. Step 6 Adjust the signals with reference to the BLER values displayed in the window. Then record the results when the BLER values meet the RF specifications. ----End

14.3.3 Testing the UL DPCH

This describes how to test the UL DPCH. The UL DPCH stands for the UL dedicated physical channel. This test checks whether the technical specifications for the UL DPCH meet the requirements in TS25.141 of the 3GPP protocols.
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Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test.

Context
When the UL DPCH test is started, the NodeB shuts down the channels that need no test and sets up channels on the UL processing units according to preset parameters to test the technical specifications required in TS25.141 of the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose UL Test > DPCH Test. The parameter area is displayed in the right part of the window, as shown in Figure 14-5. Figure 14-5 Setting parameters of the DPCH test

Table 14-3 describes the elements in the area for setting the DPCH test parameters. Table 14-3 Elements in the area for setting the DPCH test parameters Element Main-Diversity Test Connection Rate FP ID
14-10

Description Value range: Main-Diversity Test, Main Test, Diversity Test Service bit rate of the channel. Value range: 12.2, 64, 144, 384 Value range: 0 to 499
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Element Scramble Scramble Type Frame Offset Code Offset Reporting Period(s)

Description Value range: 0 to 16777215 Long Scramble Value range: 0 to 255 Value range: 0 to 38399 Interval between two test data reports Value range: 1 to 255

Propagation Delay RRU Interconnection Mode

Value range: 0 to 255 Connection mode of the RRUs Value range: Non-interconnection Mode, Interconnection Mode Slot number of the board containing demodulating DSPs Value range: NDD0, NDD1 Default value: 1.

ULP Slot Demodulating DSP ID SD608 ID Step 2 Set the parameters.

Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-6. Figure 14-6 Input dialog box

Step 4 Enter the test item name. Step 5 Click OK. The testing flow is created. Step 6 Adjust the signals with reference to the BER/BLER values displayed in the window. Then record the results when the BER/BLER values meet the radio frequency specifications. ----End

14.3.4 Testing the UL RACH

This describes how to test the UL RACH. The UL RACH stands for the UL random access channel, which is used to transmit relatively small amounts of data. This test checks whether the technical specifications for the UL RACH meet the requirements in TS25.141 of the 3GPP protocols.

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Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test.

Context
When the UL RACH test is started, the NodeB sets up channels on the UL processing units according to preset parameters to test the technical specifications required in TS25.141 of the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose UL Test > RACH Test. The parameter area is displayed on the right part of the window, as shown in Figure 14-7. Figure 14-7 Setting parameters of the RACH test

Table 14-4 describes the elements in the area for setting the RACH test parameters. Table 14-4 Elements in the area for setting the RACH test parameters Element ULP Slot Description Slot number of the board containing demodulating DSPs

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Element Test Type

Description Value range: Preamble Detection Performance, Message Demodulation Performance

l

Preamble Detection Performance test: measures the capture performance of RACH preamble, including the false alarm rate and detection rate. Message Demodulation Performance test: measures the RACH message demodulation performance. The demodulation performance refer to the demodulation performance on messages after the system detects the access of a subscriber.

Scramble Frame Sync(ms) Reporting Period(s)

Value range: 0 to 8191. Intervals of frame synchronization signals output by the NMPT/ BBU. Value range: 20 ms, 40 ms, 80 ms. Reporting period of the testing result Value range: 1 to 255.

RRU Interconnection Mode

Connection mode of the RRUs Value range: Non-interconnections Mode, Interconnection Mode If the RRU is not connected, use the default value.

Preamble Signature Preamble Threshold Sub Channel:0/Slot:1

Value range: 0 to 15 Value range: 27 to 35 Value range: Sub Channel, Slot

l

If you select Sub Channel, then the test must be conducted in the sub-channel mode. The testing device has to support the access initiation in this mode. If you select Slot, then the test must be conducted in the slot mode. The testing device has to support the access initiation in this mode.

Sub Channel/Slot Value Step 2 Set the parameters.

Value range: 0 to 15.

Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-8. Figure 14-8 Input dialog box

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Step 4 Enter the test item name. Step 5 Click OK. The testing flow is created. Step 6 Adjust the signals with reference to the test values displayed in the window. Then record the results when the test values meet the radio frequency specifications. ----End

14.3.5 Testing the UL HS-DPCCH

This describes how to test the UL HS-DPCCH. The UL HS-DPCCH stands for the high speed dedicated physical control channel, which carries UL feedback signaling related to DL HSDSCH transmission. This test checks whether the technical specifications for the UL HSDPCCH meet the requirements in TS25.141 of the 3GPP protocols.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test.

Context
When the UL HS-DPCCH test is started, the NodeB sets up channels on the UL processing units according to preset parameters to test the technical specifications required in TS25.141 of the 3GPP protocols.
NOTE

The UL HS-DPCCH test can be performed only on the HSDPA-supported NodeBs.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose UL Test > HS-DPCCH Test. The parameter area is displayed in the right part of the window, as shown in Figure 14-9.

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Figure 14-9 Setting parameters of the HS-DPCCH test

Table 14-5 describes the elements in the area for setting the HS-DPCCH test parameters. Table 14-5 Elements in the area for setting the HS-DPCCH test parameters Element Scramble Scramble Type Frame Offset Code Offset Reporting Period(s) Description Value range: 0 to 16777215 Long Scramble Value range: 0 to 255 Value range: 0 to 38399 Interval between two test data reports Value range: 1 to 255 Propagation Delay RRU Interconnection Mode Value range: 0 to 255 Connection mode of the RRUs Value range: Non-interconnection Mode, Interconnection Mode If the RRU is not connected, use the default value. ULP Slot Demodulating DSP ID SD608 ID Step 2 Set the parameters.
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Slot number of the board containing demodulating DSPs Value range: NDD0, NDD1 Default value: 1.

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Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-10. Figure 14-10 Input dialog box

Step 4 Enter the test item name. Step 5 Click OK. The testing flow is created. Step 6 Adjust the signals with reference to the BER/BLER values displayed in the window. Then record the results when the BER/BLER values meet the radio frequency specifications. ----End

14.4 Testing the DL RF Performance

This describes how to test the DL RF performance. The DL 141 test is to test the RF performance on the NodeB TX channels. 14.4.1 Introduction to Downlink RF Performance Test During the DL 141 test, the DL processing module establishes radio channels with specified parameters according to different test modes. 14.4.2 Testing the Maximum Transmit Power This describes how to test the maximum transmit power. The NodeB maximum transmit power is the average power of each carrier at the antenna connector under reference conditions. The maximum transmit power test is to test the difference between the maximum transmit power and the rated transmit power of the NodeB within the entire frequency bands under test. 14.4.3 Testing the Power Accuracy on the CPICH This describes how to test the power accuracy on the Common Pilot Channel (CPICH). The CPICH power accuracy refers to the deviation between the ordered channel power and the pilot channel power measured at the antenna interface. The CPICH power is a reference parameter for cell planning. This reference parameter is broadcasted to each UE through the DL BCH channel. The CPICH power accuracy test is to verify the deviation between the ordered channel power and the pilot channel power measured at the antenna interface. 14.4.4 Testing the Frequency Error This describes how to test the frequency error. Frequency error is the measure of the difference between the assigned frequency and the actual NodeB transmit frequency. The frequency of the tester should be consistent with that of the NodeB. The frequency error test is to test the accuracy of the NodeB transmit frequency. 14.4.5 Testing the Transmit Intermodulation This describes how to test the transmit intermodulation. Transmit intermodulation performance is a measure of the capability of the transmitter to inhibit the generation of signals in its nonlinear elements caused by presence of the wanted signal and an interference signal reaching the
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transmitter through the antenna. The test verifies the ability of the NodeB transmitter to inhibit the generation of intermodulation products in its non-linear elements caused by presence of the wanted signal and an interference signal reaching the transmitter through the antenna to below specified levels. 14.4.6 Testing the IPDL Time Mask This describes how to test the IPDL time mask. The IPDL refers to the idle period of DL signal. The IPDL time mask test checks whether the power ratio of active state to idle state of NodeB DL signals meets requirements during the test time specified by IPDL. 14.4.7 Testing the Step of Power Control This describes how to test the power control step. The power control step test checks that the DL power control step and response meet relevant requirements. The power control step is the required step change in the DL transmitter output power of a code channel in response to the corresponding Transmit Power Control (TPC) command. 14.4.8 Testing the Step Size or Dynamic Range of Power Control This describes how to test the step size or dynamic range of power control. The power control dynamic range is the difference between the maximum and the minimum code domain powers of a code channel under specified conditions. The test checks whether the power control dynamic range of the code channel meets the requirements. 14.4.9 Testing the Dynamic Range of Total Transmit Power This describes how to test the dynamic range of total transmit power. Dynamic range of the total power control is the difference between the maximum and the minimum transmit power of a code channel for a specified reference condition. The code domain errors of the maximum and minimum transmit powers should meet the requirement. 14.4.10 Testing the Occupied Bandwidth This describes how to test the occupied bandwidth. The test verifies whether the occupied bandwidth of a channel meets the requirement. 14.4.11 Testing Spurious Emissions This describes how to test spurious emissions. The test checks whether special frequency bands meet relevant standards. It is applied to multi-carrier cases and specified frequency ranges, which are beyond 12.5 MHz from the carrier frequency. The test is conducted in the true RMS level mode or in the true average level mode. 14.4.12 Testing the Spectrum Emission Mask This describes how to test the spectrum emission mask. The test verifies the out-of-band spectrum leakage of the NodeB. 14.4.13 Testing the ACLR This describes how to test the Adjacent Channel Leakage Power Ratio (ACLR). The test checks whether the ACLR meets the requirements for adjacent channel interference. 14.4.14 Testing the Accuracy of Transmit Modulation This describes how to test the accuracy of transmit modulation. The Error Vector Magnitude (EVM) shows the difference between the reference waveform and the measured waveform. In this guide, EVM refers to the accuracy of transmit modulation. 14.4.15 Testing the Peak Code Domain Error This describes how to test the Peak Code Domain Error (PCDE). The test discovers and limits inter-code cross-talk. 14.4.16 Testing the HSDPA

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This describes how to test the HSDPA. The test verifies the Error Vector Magnitude (modulation accuracy) when the QAM mode is one of the modulation modes for the NodeB DL signals. The test also verifies the NodeB DL frequency.

14.4.1 Introduction to Downlink RF Performance Test

During the DL 141 test, the DL processing module establishes radio channels with specified parameters according to different test modes. Table 14-6 lists the relation between test items and test modes of the DL 141 test. Table 14-6 Relation between test items and test modes of the DL 141 test Test Type Maximum transmit power CPICH power accuracy Frequency error Transmit intermodulation IPDL time mask Power control steps Power control step or dynamic range Total dynamic range Occupied bandwidth Spurious emission Spectrum emission mask Adjacent channel leakage power ratio Transmit modulation accuracy Peak code domain error HSDPA Test Mode Test mode 1 Test mode 2 Test mode 4 Test mode 1 Test mode 1 Test mode 2 Test mode 2 Test mode 4 Test mode 1 Test mode 1 Test mode 1 Test mode 1 Test mode 4 Test mode 3 Test mode 5

Different test modes correspond to different channels. The system automatically establishes a channel for each test item based on the test mode. For the descriptions of test modes, refer to TS25.141 in the 3GPP protocols.

14.4.2 Testing the Maximum Transmit Power

This describes how to test the maximum transmit power. The NodeB maximum transmit power is the average power of each carrier at the antenna connector under reference conditions. The maximum transmit power test is to test the difference between the maximum transmit power and the rated transmit power of the NodeB within the entire frequency bands under test.

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Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: a power meter.

Context
Under a normal testing environment, the NodeB maximum transmit power is within 2 dB of the NodeB rated transmit power. For details, refer to TS25.141 in the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > Maximum Transmit Power. The Input dialog box is displayed, as shown in Figure 14-11. Figure 14-11 Input dialog box

Step 2 Enter the test item name. Step 3 Click OK. The testing flow is created. Step 4 Record the testing results from the power meter. ----End

14.4.3 Testing the Power Accuracy on the CPICH

This describes how to test the power accuracy on the Common Pilot Channel (CPICH). The CPICH power accuracy refers to the deviation between the ordered channel power and the pilot channel power measured at the antenna interface. The CPICH power is a reference parameter for cell planning. This reference parameter is broadcasted to each UE through the DL BCH channel. The CPICH power accuracy test is to verify the deviation between the ordered channel power and the pilot channel power measured at the antenna interface.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: an RF signal tester.
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Context
Under a normal testing environment, the measured CPICH power is within 2.1 dB of the ordered absolute value. For details, refer to TS25.141 in the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > CPICH Power Accuracy. The Input dialog box is displayed, as shown in Figure 14-12. Figure 14-12 Input dialog box

Step 2 Enter the test item name. Step 3 Click OK. The testing flow is created. Step 4 Record the testing results from the signal tester. ----End

14.4.4 Testing the Frequency Error

This describes how to test the frequency error. Frequency error is the measure of the difference between the assigned frequency and the actual NodeB transmit frequency. The frequency of the tester should be consistent with that of the NodeB. The frequency error test is to test the accuracy of the NodeB transmit frequency.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test.

Context
Under a normal testing environment, the difference between measured transmit frequency and actual transmit frequency is within 0.05 ppm. For details, refer to TS25.141 in the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > Frequency Error. The parameter area is displayed on the right part of the window, as shown in Figure 14-13.
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Figure 14-13 Setting parameters of the frequency error test

Table 14-7 describes the elements in the area for setting the frequency error test parameters. Table 14-7 Elements in the area for setting the DPCH test parameters Element PCCPCH Power(dB) PCPICH Test Option Step 2 Set the parameters. Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-14. Figure 14-14 Input dialog box Description Deviation from the maximum cell transmit power. Value range: 3 dB to 44 dB. Default value: 18 dB. Value range: PCCPCH+SCH, PCCPCH+SCH+PCPICH.

Step 4 Enter the test item name.

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Step 5 Click OK. The testing flow is created. Step 6 Record the testing results from the signal tester. ----End

14.4.5 Testing the Transmit Intermodulation

This describes how to test the transmit intermodulation. Transmit intermodulation performance is a measure of the capability of the transmitter to inhibit the generation of signals in its nonlinear elements caused by presence of the wanted signal and an interference signal reaching the transmitter through the antenna. The test verifies the ability of the NodeB transmitter to inhibit the generation of intermodulation products in its non-linear elements caused by presence of the wanted signal and an interference signal reaching the transmitter through the antenna to below specified levels.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: an RF signal tester.

Context
You can create one more test signal in another cell, and inject the signal into the cell under test as interference signal through external testing devices. The power of the interference WCDMA signal should be 30 dB lower than that of the carrier signal. The frequencies of the interference WCDMA signal should be beyond 5 MHz, 10 MHz, and 15 MHz for the carrier frequency. Under a normal testing environment, the spectrum emission mask, ACLR and spurious emissions should meet the requirements in TS25.141 of the 3GPP protocols in case of inverse intermodulation interference.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > Transmit Intermodulation. The Input dialog box is displayed, as shown in Figure 14-15. Figure 14-15 Input dialog box

Step 2 Enter the test item name.

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Step 3 Click OK. The testing flow is created. Step 4 Record the testing results from the signal tester. ----End

14.4.6 Testing the IPDL Time Mask

This describes how to test the IPDL time mask. The IPDL refers to the idle period of DL signal. The IPDL time mask test checks whether the power ratio of active state to idle state of NodeB DL signals meets requirements during the test time specified by IPDL.

Prerequisite
l l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: a tester.

Context
During IPDL, the NodeB shuts down all the DL channels temporarily to minimize interference to the UE during measuring DL signals in different cells. Therefore, the accuracy of measurement for DL signals in neighboring NodeBs is improved. There are two specifications for the IPDL time mask test: idle time and power ratio of active state to idle state. Under a normal testing environment, these specifications should meet the requirements in TS25.141 of the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > IPDL Time Mask. The Input dialog box is displayed, as shown in Figure 14-16. Figure 14-16 Input dialog box

Step 2 Enter the test item name. Step 3 Click OK. The testing flow is created. Step 4 Record the testing results from the signal tester. ----End

14.4.7 Testing the Step of Power Control

This describes how to test the power control step. The power control step test checks that the DL power control step and response meet relevant requirements. The power control step is the
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required step change in the DL transmitter output power of a code channel in response to the corresponding Transmit Power Control (TPC) command.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: an RF signal tester.

Context
The Up/Down tests are to be performed on the basis of different power control steps.
l l

The power changes by 1 dB after one power control with the power step of 1 dB. The power changes by 10 dB after 10 power controls with the power step of 1 dB.

The same is similar for the other power step sizes. Under a normal testing environment, the power control step size or dynamic range meets the requirements in TS25.141 of the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > Power Control Steps. The parameter area is displayed on the right part of the window, as shown in Figure 14-17. Figure 14-17 Setting parameters of the power control steps test

Table 14-8 describes the elements in the area for setting the power control step test parameters.
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Table 14-8 Elements in the area for setting the power control steps test parameters Element Power Control Steps (dB) Init Power of Physical Channel 3 (dB) Scramble Scramble Type Frame Offset Code Offset Propagation Delay RRU Interconnection Mode ULP Slot Description Value range: 0.5, 1, 1.5, 2. Value range: -3 to -45 Value range: 0 to 16777215 Long Scramble Value range: 0 to 255 Not editable. Default value: 512. Value range: 1 to 255 Value range: Non-interconnection Mode, Interconnection Mode Slot number of the board containing demodulating DSPs. For example, the HULP, HBBI, and HBOI. Value range: 0 to 7, 15 The values 0 and 1 indicate the HBBI. The values 2 to 7 indicate the HULP. The value 15 indicates the HBOI. Demodulating DSP ID SD608 ID Step 2 Set the parameters. Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-18. Figure 14-18 Input dialog box Value range: NDD0, NDD1 Default value: 1.

Step 4 Enter the test item name. Step 5 Click OK. The testing flow is created. Step 6 Record the testing results from the signal tester. ----End

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Postrequisite

14.4.8 Testing the Step Size or Dynamic Range of Power Control

This describes how to test the step size or dynamic range of power control. The power control dynamic range is the difference between the maximum and the minimum code domain powers of a code channel under specified conditions. The test checks whether the power control dynamic range of the code channel meets the requirements.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: an RF signal tester.

Context
Under a normal testing environment, the power control step size or dynamic range meets the following requirements:
l

The maximum code domain power is equal to or greater than the NodeB maximum output power minus 3 dB. The minimum code domain power is equal or less than the NodeB maximum output power minus 28 dB.

For details, refer to TS25.141 in the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane, and then choose DL Test > Power Control Steps or Dyn Range on the shortcut menu. The parameter area is displayed on the right part of the window, as shown in Figure 14-19.

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Figure 14-19 Setting parameters of the power control steps or dynamic range test

Table 14-9 describes the elements in the area for setting the power control steps or dynamic range test parameters. Table 14-9 Elements in the area for setting the test parameters Element Scramble Scramble Type Init Power of Physical Channel 3 (dB) Step 2 Set the parameters. Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-20. Figure 14-20 Input dialog box Description Value range: 0 to 16777215 Value range: Long Scramble, Short Scramble Value range: -3 to -45

Step 4 Enter the test item name.

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Step 5 Click OK. The testing flow is created. Step 6 Record the testing results from the signal tester as result 1. Step 7 In the 141 Test pane, select the test node and then change the value in Init Power of Physical Channel 3 to a lower value if the initial value is 3 dB or to a higher value if the initial value is 45 dB. Step 8 Click Modify. Step 9 Record the testing result from the tester as result 2. Step 10 Repeat Step 7 through Step 8. Record the results one by one. ----End

14.4.9 Testing the Dynamic Range of Total Transmit Power

This describes how to test the dynamic range of total transmit power. Dynamic range of the total power control is the difference between the maximum and the minimum transmit power of a code channel for a specified reference condition. The code domain errors of the maximum and minimum transmit powers should meet the requirement.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: a signal generator.

Context
This specification ensures that when the NodeB has a DL code channel, it can reduce the TX power to its minimum to reduce the adjacent channel interference to the minimum. Under a normal testing environment, the dynamic range of total DL power, which is equal to the maximum transmit power minus minimum transmit power, is no smaller than 18 dB. For details, refer to TS25.141 in the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > Total Dynamic Range. The parameter area is displayed on the right part of the window, as shown in Figure 14-21.

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Figure 14-21 Setting parameters of the total dynamic range test

Table 14-10 describes the elements in the area for setting the total dynamic range test parameters. Table 14-10 Elements in the area for setting the total dynamic range test parameters Element PCCPCH Power(dB) PCPICH Test Option Step 2 Set the parameters. Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-22. Figure 14-22 Input dialog box Description Deviation from the maximum cell transmit power. Value range: 3 dB to 44 dB. Default value: 18 dB. Value range: PCCPCH+SCH, PCCPCH+SCH+PCPICH.

Step 4 Enter the test item name.

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Step 5 Click OK. The testing flow is created. Step 6 Record the testing results from the signal tester. ----End

14.4.10 Testing the Occupied Bandwidth

This describes how to test the occupied bandwidth. The test verifies whether the occupied bandwidth of a channel meets the requirement.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: an RF signal tester.

Context
The occupied bandwidth is the width of a frequency band. The transmit power below the lower and above the upper frequency limits of the width of the frequency band needs to be less than 0.5% of the total transmit power. Therefore, the total power in the occupied bandwidth should be no less than 99% of the total transmit power. Under a normal testing environment, the occupied bandwidth with chip rate at 3.84 Mbit/s is less than 5 MHz. For details, refer to TS25.141 in the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > RF Spectrum Emission. The parameter area is displayed on the right part of the window. Step 2 Select Occupied Bandwidth from the Param Value drop-down list. Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-23. Figure 14-23 Input dialog box

Step 4 Enter the test item name. Step 5 Click OK. The testing flow is created. Step 6 Record the testing results from the signal tester. ----End
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14.4.11 Testing Spurious Emissions

This describes how to test spurious emissions. The test checks whether special frequency bands meet relevant standards. It is applied to multi-carrier cases and specified frequency ranges, which are beyond 12.5 MHz from the carrier frequency. The test is conducted in the true RMS level mode or in the true average level mode.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: a signal generator.

Context
Spurious emissions include harmonic emission, parasitic emission, intermodulation products and frequency conversion products produced by undesirable transmitter effects. These emissions interfere with the devices in other frequency bands. The categories of spurious emission test are category A, category B, and protection of special frequency band. The settings of RF signal tester vary with the test categories. Under a normal testing environment, the testing result should meet the requirements in TS25.141 of the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > RF Spectrum Emissions. The parameter is displayed on the right part of the window. Step 2 Select Spurious Emission from the Param Value drop-down list. Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-24. Figure 14-24 Input dialog box

Step 4 Enter the test item name. Step 5 Click OK. The testing flow is created. Step 6 Record the testing results from the signal tester. ----End
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14.4.12 Testing the Spectrum Emission Mask

This describes how to test the spectrum emission mask. The test verifies the out-of-band spectrum leakage of the NodeB.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: a signal generator.

Context
In the frequency range from f=2.5 MHz to f_offsetmax from the carrier frequency, emissions should not exceed the maximum level for the appropriate NodeB maximum output power. These level requirements form a spectrum emission mask. Under a normal testing environment, the testing result should meet the requirements in TS25.141 of the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > RF Spectrum Emissions. The parameter is displayed on the right part of the window. Step 2 Select Spectrum Emission Mask from the Param Value drop-down list. Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-25. Figure 14-25 Input dialog box

Step 4 Enter the test item name. Step 5 Click OK. The testing flow is created. Step 6 Record the testing results from the signal tester. ----End

14.4.13 Testing the ACLR

This describes how to test the Adjacent Channel Leakage Power Ratio (ACLR). The test checks whether the ACLR meets the requirements for adjacent channel interference.
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Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: a signal generator.

Context
The ACLR is the ratio of the transmitted power within the specified carrier frequency band to the mean power leaking into the adjacent carrier band. Under a normal testing environment, the testing result should meet the requirements in TS25.141 of the 3GPP protocols.
NOTE

Matched filter uses the filter (root raised cosine and roll-off 0.22) with a noise power bandwidth equal to the chip rate. The test is conducted either in the true RMS level mode or in the true average level mode. Measure the ACLR at 5 MHz and 10 MHz offsets from both sides of the channel frequency.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > RF Spectrum Emissions. The parameter is displayed on the right part of the window. Step 2 Select Adjacent Channel Leakage Power Ratio from the Param Value drop-down list. Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-26. Figure 14-26 Input dialog box

Step 4 Enter the test item name. Step 5 Click OK. The testing flow is created. Step 6 Record the testing results from the signal tester. ----End

14.4.14 Testing the Accuracy of Transmit Modulation

This describes how to test the accuracy of transmit modulation. The Error Vector Magnitude (EVM) shows the difference between the reference waveform and the measured waveform. In this guide, EVM refers to the accuracy of transmit modulation.
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Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: a signal generator.

Context
Compare two testing results with standard values. Under a normal testing environment, the modulation accuracy is smaller than 17.5%. For details, refer to TS25.141 in the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. Then choose DL Test > Transmit Modulation Accuracy. The parameter area is displayed on the right part of the window, as shown in Figure 14-27. Figure 14-27 Setting parameters of the transmit modulation accuracy test

Table 14-11 describes the elements in the area for setting the transmit modulation accuracy test parameters. Table 14-11 Elements in the area for setting the transmit modulation accuracy test parameters Element PCCPCH Power(dB) PCPICH Test Option Step 2 Set the parameters.
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Description Deviation from the maximum cell transmit power. Value range: 3 dB to 44 dB. Default value: 18 dB. Value range: PCCPCH+SCH, PCCPCH+SCH+PCPICH.

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Step 3 Click Start. The Input dialog box is displayed, as shown in Figure 14-28. Figure 14-28 Input dialog box

Step 4 Enter the test item name. Step 5 Click OK. The testing flow is created. Step 6 Record the testing results from the signal tester as result 1. Step 7 Set the PCCPCH Power to another critical value. Then click Modify. The Please Confirm dialog box is displayed. Step 8 Click OK and record the testing result from the signal tester as result 2. ----End

14.4.15 Testing the Peak Code Domain Error

This describes how to test the Peak Code Domain Error (PCDE). The test discovers and limits inter-code cross-talk.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test. The following device is available: a signal generator.

Context
The code domain error is calculated by projecting the error vector onto the code domain. It is expressed in dB. The PCDE is defined as the maximum value of the code domain errors for all codes at a specific spreading factor. Under a normal testing environment, the PCDE must be smaller than 33 dB at spreading factor 256. For details, refer to TS25.141 in the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. The shortcut menu is displayed. Choose DL Test > Peak Code Domain Error. Step 2 The Input dialog box is displayed, as shown in Figure 14-29.
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Figure 14-29 Input dialog box

Step 3 Enter the test item name. Step 4 Click OK. The testing flow is created. Step 5 Record the testing results from the signal tester. ----End

14.4.16 Testing the HSDPA

This describes how to test the HSDPA. The test verifies the Error Vector Magnitude (modulation accuracy) when the QAM mode is one of the modulation modes for the NodeB DL signals. The test also verifies the NodeB DL frequency.

Prerequisite
l l

You are logged in to the NodeB LMT. The cell parameters related to this test are set. Refer to 14.2 Setting the Parameters of a Cell Under Test.

Context
NOTE

The HSDPA 141 test is only applicable to the NodeBs that support the HSDPA.

Under a normal testing environment, when the 16QAM mode is one of the modulation modes for NodeB DL composite signals, the modulation accuracy should be smaller than 12.5%. For details, refer to TS25.141 in the 3GPP protocols.

Procedure
Step 1 Right-click the cell under test in the 141 Test pane. The shortcut menu is displayed. Choose DL Test > HSDPA. Step 2 The Input dialog box is displayed, as shown in Figure 14-30.

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Figure 14-30 Input dialog box

Step 3 Enter the test item name. Step 4 Click OK. The testing flow is created. Step 5 Record the testing results from the signal tester that supports the HSDPA test. ----End

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