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Jun 02, 2013

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power estimation technique

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power estimation technique

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Simulation based

Vectors are given, circuit is known, simulation is performed. The instantaneous currents are averaged.

Averaging of the inputs is performed first, probabilistic measures are extracted.

Power is also dissipated due to glitching activity in a circuit. Glitches occur due to different delays through different paths of the circuit. A hazardous transition occurs at the output of the AND gate due to different delays through two different paths converging at the inputs to the AND gate.

The glitches can die while propagating through a logic gate if the width of the glitch is much smaller than the inertial delay of the logic gate.

Stochastic process: Let g(t), t , be a stochastic process that takes the values of logical 0 or logical 1, transitioning from one to the other at random times. Strict-sense stationary (SSS): A stochastic process is said to be strict-sense stationary if its statistical properties are invariant to a shift of the time origin. More importantly, the mean of such a process does not change with time.

Mean ergodic: If a constant-mean process g(t) has a finite variance and is such that g(t) and g(t+) become uncorrelated as then g(t) is mean ergodic. Definition 3.1 (Signal Probability) The signal probability of signal g(t) is given by

P(g) = lim T -TT g(t) dt

Definition 3.2 (Signal Activity) The signal activity of a logic signal g(t) is given by A(g) = lim T ng(T)/T where ng(t) is the number of transitions of g(t) in the time interval between T/2 and T/2.

If the primary inputs to the circuit are modeled as mutually independent SSS mean-ergodic 0-1 process, then the probability of signal g(t) assuming the logic value 1 at any given time t becomes a constant, independent of time and is referred to as the equilibrium signal probability of random quantity g(t) and is denoted by P(g=1), which we refer to simply as signal probability. Hence, A(g) becomes the expected number of transitions per unit time.

Inputs: Signal probabilities of all the inputs to a circuit Output: Signal probabilities for all nodes of the circuit Step 1: For each input signal and gate output in the circuit, assign a unique variable. Step 2: Starting at the inputs and proceeding to the outputs, write the expression for the output of each gate as a function of its input expressions..

Step 3: Suppress all exponents in a given expression to obtain the correct probability for that signal.

Reconvergent fanout can produce expressions for the signal probability of internal nodes having exponents greater than 1. Intuitively, in probability expressions involving independent primary inputs, such exponents cannot be present.

f = i=1p (k=1n sk), where sk is either xk or xk. Since the product terms inside the summation are mutually independent, we have P(f) = i=1p (k=1n P(sk)). This expression is defined as the canonical sum of probability products of f.

The Boolean difference of fj with respect to xi is defined as follows: fj / xi = fj | xi=1 fj | xi=0 where denotes the exclusive-or operation. The Boolean difference signifies the condition under which output fj is sensitized to input xi.

If the primary inputs xi, i = 1, , n, to logic gate M are not spatially correlated, then the signal activity at output fj is given by

A(fj) = i=1n P(fj / xi) A(xi) (3.6) P(fj / xi) signifies the probability of sensitizing input xi to output fj , while P(fj / xi) A(xi) is the contribution of switching activity at output fj due to input xi only.

Equation (3.6) fails to consider the effect of simultaneous switching of signals at logic gate inputs and, hence, can grossly overestimate signal activity.

The circuit is simulated repeatedly using a logic simulator and the switching activities at various nodes are noted. Statistical mean estimation techniques are used in determining the stopping criteria in the Monte Carlo simulations.

Burch et al. experimentally determined that the power consumed by a circuit over a period t has a normal distribution. Let p and s be the measured average and the standard deviation of the random sample of the power measured over time T, respectively. Then with (1 - ) * 100% confidence we can write the following inequality: p - Pavg < t/2 s / N1/2

where t/2 is obtained from a t-distribution with N 1 degrees of freedom and Pavg is the true average power. p - Pavg / p < t/2 s / (p* N1/2) < : the desired percentage error for the given confidence level (1 - ) * 100%.

The basic idea of Monte Carlo methods for estimating activity of individual nodes is to simulate a circuit by applying randompattern inputs. The convergence of simulation can be obtained when the activities of individual nodes satisfy some stopping criteria.

Static Hazard: A static hazard is defined as the possible occurrence of a transient pulse on signal line whose static value is not supposed to change. Dynamic Hazard: A dynamic hazard is the possible occurrence of a spurious transition during the occurrence of a functional 0 1 or a 1 0 transition.

AND

0 1 X

0

0 0 0

1

0 1 X

X

0 X X

Logic simulation can be used to detect probable static hazards by using a sixvalued logic. The estimate is pessimistic because some of these hazards might not be present under certain delay conditions.

Logic representation 0 static 0 1 static 1 R - rising F - falling SH0 static 0 hazard SH1 static 1 hazard Bit sequence at t, t, t+1 000 111 0U1 1U0 0U0 1U1

AND 0

0 0

1

0

R

0

F

0

SH0

0

SH1

0

1

R F SH0 SH1

0

0 0 0 0

1

R F SH0 SH1

R

R SH0 SH0 R

F

SH0 F SH0 F

SH0

SH0 SH0 SH0 SH0

SH1

R F SH0 SH1

{1000, 1100, 1110} corresponding to fast, medium, and slow falling signals. Eight-valued logic is required for logic simulation to detect dynamic hazard.

Logic representation Bit sequence at t, t, t, t+1

0 static 0 1 static 1 R - rising F - falling SH0 static 0 hazard SH1 static 1 hazard DH0 dynamic 0 hazard DH1 dynamic 1 hazard

0000 1111 0001, 0011, 0111 1000, 1100, 1110 0100, 0010, 0110 1011, 1101, 1001 1010 0101

A circuit node where two reconvergent paths with different delays meet may have a large number of spurious transitions. However, even in a tree-structured circuit with balanced paths there can be a large number of spurious transitions due to slight variations in delays.

Delays are modeled as random variables and should be generated from time to time along the simulation. Whenever we generate a new set of delays, they correspond to another die or even the same die but with different operating conditions such as temperature and power supply voltage.

Activity a

a = F(PI, D) PI: primary input vectors, D: a random vector consisting of all the random variables of gate delays.

While the different nonzero-delay models do track each other (except for one circuit, C6288, which has a depth of about 120 levels), it is clear that the nonzero-delay models can produce very different results compared to the zero-delay case. The difference is due to the glitching activity.

For some circuits minimum and maximum average power can vary widely if uncertain specifications of primary inputs exist.

They are 20 times greater than those obtained using the zero-delay model.

Domino logic circuits do not have directpath short-circuit currents except when static pull-up devices are used to moderate the charge redistribution problem or when clock skew is not well dealt with.

B fixed: X1

Z1 X3

A Varies: X2

Y

X1 X2

Z0 X3

Cy

The gate presents a variable capacitance to the power/ground rails. The magnitude of this capacitance depends on the logic values at the input to the gate. Two signals A and B are to be connected to the two equivalent inputs x1 and x2 of the gate in Figure 3.36 such that very often A has a transition and B stays zero then A should be connected to x2 and B to x1 as this results in lower power consumption than the other case.

The signal probabilities of the lower order bits of a word are essentially uncorrelated in space and time with a signal probability of 0.5 and switching activity of 0.25 and are essentially independent of the data distributions. The higher order bits show complete dependence because they represent the sign extensions in twos complement representation.

The output entropy of Boolean functions can be used to predict the average minimized area of CMOS combinational circuits. If x is a random variable with a signal probability p, then the entropy of x is defined as H(x) = p log2 1/p + (1 p) log2 1/(1 p)

For a discrete variable x, which can take n different values, the entropy is defined as

H(x) = i=1n pi log2 1/pi, where pi is the probability that x takes the ith value xi. Given the input signal probabilities of 0.5, the output entropy of the boolean function can be used to predict the area of its average minimized implementation as A = K* (2n / n)* H(Y) where A is the area of the implementation and K is the proportionality constant, Y = f(X).

A high level technique to estimate power can be used in the following three steps: Determine the input/output entropies of combinational logic block by running RTL simulation of sequential circuits. From the input/output entropies, determine the switching activity, area, and estimate of average power. Combine with latch and clock power to determine the total power dissipation.

Two approaches to determining lower bounds of maximum dynamic power in static CMOS circuits: deterministic (automatic test generation based) and simulation-based approaches.

The instantaneous power dissipation due to two consecutive input binary vectors is proportional to Pi = for all gates T(g) * C(g), where C(g) denotes the output capacitance of gate g and T(g) is a binary variable that indicates whether gate g switches or not corresponding to the two input vectors.

To justify the transition [ i.e., to see if T(*) = 1 is achievable], the modified justification mechanism in a 5-V D algorithm (an ATG algorithm for stuck-at faults) is used. In CMOS circuits, the capacitive load of a logic gate can be approximated by the fanout of the gate. Pi = for all gates [g(V1) g(V2)] * F(g), where V1, V2 denote two consecutive input binary vectors to the circuit, g(*) represents the boolean function of gate g in term of PIs, and F(g) denotes the number of fanouts of gate

The justification mechanism in the algorithm includes two processes backtracing and implication. Two composite values to be in conflict if they have 0 and 1 at the same position. Experiments show the test generation approach is superior to the traditional simulation-based technique in both efficiency and the quality of the results.

1 a 1

GUT D h D i

b g 1

1 c 0 d 1 e

Each gate is associated with a stack to store all the composite logic values a/b that have been assigned to g [ a and b denotes g(V1) and g(V2), respectively]. The variables a and b can be 1, 0, or u (unknown). At each gate, the top of the stack stores the most recently updated value for the gate.

Extract circuit netlist description from layout

Captures internal (diffusion) and external (wiring and gate fanout) capacitances

Characterization of device models (nfets, pfets) Solution of large system of equations so very computationally intensive ( < few thousand transistors) Can accurately estimate (within a few %) dynamic and leakage power dissipation

Perform logic simulation to obtain the switching events for each net (signal)

Logic description in structural VHDL or Verilog Zero-delay or unit-delay timing models

Determine frequency of each net fy = ty/(2T), where ty if the number of logic switches of net y and T is the simulation time, to compute dynamic power Pdyn = CyVDD2fy Pre-layout so must estimate Cy

Use gate characterization (E(g, e)) and logic simulation event count (f(g, e)) to calculate the gates dynamic internal power (short circuit and charging/discharging of internal capacitors) Pint = E(g, e) f(g, e) During simulation record the fraction of time T(g, s)/T that each gate g stays in a particular states s to calculate leakage power Pleak = E(g, s) f(g, s)/T

Capacitance estimation

Device (diffusion and gate) capacitance

Depends on width/length of driving gates source/drain diffusion and fanout gates Part of characterization of cell based designs

Wiring capacitance

Depends on placement and routing Wire load predict wire length of a net from the number of pins incident to the net

Mapping table can be constructed from historical data of existing designs

Simulation vectors need to be chosen carefully (application dependent) Internal power really depends on operating voltage, temperature, process, multidimensional characterization Accuracy within 5-10% of HSPICE Signal glitches may not be modeled precisely (glitches depend on delays in the circuit)

For each internal net y determine the signal probability of the net wrt to the given signal probabilities of the primary inputs From the signal probabilities determine the transition density D(y) of each internal net y Compute the total power P = 0.5 CyVDD2 D(y) Pre-layout so must estimate Cy

Signal probability definition P1 = t1/(t0 + t1) and P0 = 1 P1 Propagate the given statistical quantities from the primary inputs to the internal signal nets and outputs of the circuit Propagate quantities using probabilistic signal propagation model

Apply Shannons decomposition to the ninput Boolean function y = f(x1, , xn) Y = xifxi + !xif!xi, where fxi(f!xi) is the new Boolean function obtained by setting xi = 1 (xi = 0) in f(xi, , xn) P(y) = P(xifxi) + P(!xif!xi) = P(xi)P(fxi ) + P(!xi)P(f!xi) Apply recursively (note: P(!xi) = 1 P(xi))

For a transition (1-to-0 or 0-to-1) to have occurred fxi f!xi = 1 the Boolean difference of y wrt xi denoted dy/dxi P(dy/dxi) is the probability that dy/dxi evaluates to 1 and D(xi) is the transition density of xi Then the total transition density of the net y is D(y) = P(dy/dxi) D(xi)

Computationally efficient

Must only compute signal probabilities and transition densities for each net to evaluate P = 0.5 CyVDD2 D(y)

Assumes given correct signal probabilities for primary inputs (and if wrong, large errors are possible) Given average power dissipation values

Perform RTL simulation to obtain the input activity for each major functional unit

Architectural description in behavioral VHDL or Verilog or C, C++ Energy characterization of functional units

Transition-sensitive energy models

System busses ALUs, register file, pipeline registers

Caches, DRAMs

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