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Instrument Introduction
Olympus NDT is pleased to introduce the newest addition to the EPOCH series flaw
detector product line, the
EN12668-1 Compliant
(Conventional UT)
PHYSICAL FEATURES
Physical Features
Full VGA Display
Transflective technology
Bright backlight for indoor use
Excellent outdoor visibility
Physical Features
Horizontal Layout
Physical Features
Physical Features
Environmental Standards
Physical Features
Multiple Input/Output Ports
The EPOCH 1000 Series features multiple input/output ports for various forms of analog
and digital communication
Physical Features
Instrument Office Door Connections
USB Host(s) For direct printing, USB memory storage, external keyboard
and/or mouse use
Compact Flash Card Phased array probe and wedge databases, image
captures, file storage (2GB standard)
INSTRUMENT ACCESSORIES
Instrument Accessories
Transport Cases
Two sizes available:
Small case (standard)
Large case (optional, extra cost)
Instrument Accessories
Small Transport Case
Foam Inserts
Cut-outs to Accommodate
Instrument
One Transducer Box
Small cables and accessories
Operators Manual
Instrument Charger
Instrument Accessories
Large Transport Case
Foam Inserts
Cut-outs to Accommodate
Instrument
Three Transducer Boxes
Small cables and accessories
Operators Manual
Instrument Charger
External Battery Charger with
Adapter
Phased Array Demonstration
Block (P/N: EP1000-PABLOCK-1)
Instrument Accessories
Communication and I/O Cables
Instrument Accessories
Batteries and Battery Chargers
Instrument Accessories
Battery Removal and Installation
Instrument Accessories
External Battery Charger
Instrument Accessories
Repair and Maintenance Accessories
Display Protectors
Pack of 10
Part Number: EP1000-DP
The display is laid out to optimize A-scan and/or image presentation, while
providing clear menu and parameter labels.
Mode Indicator
Battery Indicator
Menu Groups
Menu Group
Selection
(Current/Total)
Menu Parameters (Adjustable)
Angle/Focal
Law Cursor
S-scan Soundpath
Measurement Gate
A-scan Measurement
Gate
A-scan (Selected
Focal Law)
Angle/Focal
Law Selector
Gain Indicator
Range and
Direct Access
Parameter Box
F Group Keys
Vertical F keys activate the corresponding Group menu
P Parameter Keys
Horizontal P keys highlight the parameter above for
adjustment
Horizontal P keys activate/open the parameter function/menu
above
Gain Level
Gate Position
Screen Range
Auto-XX%
Save
Coarse and Fine Adjustment Coarse and Fine adjustment are available for most
adjustable parameters on the EPOCH 1000 Series. Once a parameter is highlighted
for adjustment, the user can toggle between Coarse and Fine adjustment of the
parameter using the
key.
Check and Escape The EPOCH 1000 Series features two new keys Check and
Escape.
Toggles between coarse and fine parameter adjustment
Activates a highlighted function, such as CAL Zero
Enters horizontal menu from a highlighted Group
Exits menus
Returns to main group from horizontal menus
Used to return to Home position
CONVENTIONAL MODE:
OVERVIEW and PERFORMANCE
Digital Narrowband Filters The EPOCH 1000 Series features two sets of
digital narrowband filters, combining to provide over 30 filter offerings!
Standard Filter Set (7): The standard set of filters are EN12668-1 compliant and
are suitable for most standard applications
Advanced Filter Set (30): The advanced set of filters provide excellent filter
flexibility that can only be matched by our EPOCH XT with the Advanced Filter
Option. The wide range of filter combinations in this set allow for excellent signal to
noise ratio and signal clarity in nearly any application.
Programmable Analog and Alarm Outputs The EPOCH 1000 Series allows
for system integration and augmented data output by providing multiple analog
and alarm outputs
4 Analog Outputs: Programmable 1V or 10V scaled output for amplitude or
thickness measurements, output at PRF or compressed to 50Hz or 60Hz
(selectable) Compression available early 2009
6 Alarm Outputs: Programmable alarm outputs for threshold or combined logic
Gate alarms Alarm outputs available early 2009
Gates and Reference Cursors The EPOCH 1000 Series allows for
three separate measurement gates and two visual reference cursors:
Gates 1 and 2: Independent
measurement gates with alarm
conditions and tracking
capabilities for Echo-to-Echo
measurements
Interface Gate (optional): Gate 1
and/or Gate 2 tracking to interface
gate, DAC/TVG tracking, and
alarm conditions
Reference Cursors A and B:
Reference cursors for visual
reference and visual sizing
Pulse Energy
Pulse Damping
Pulse Width (Square Wave Pulser)
Pulse Repetition Frequency (PRF)
Test Mode
Digital Filtering
Rectification
Gain Adjustment
Reject
When more data is acquired than can be displayed, what does the
EPOCH 1000 actually display??
Composite A-scan
Max Amplitude
Min Thickness
Averaged A-scan
SureView Visualization Mode
Persistance Mode
Baseline Break
Composite A-scan Standard display mode from the EPOCH XT, this feature
displays all A-scans acquired in between screen update rates (multiple A-scans
when PRF > 60Hz) and overlays them together on the screen.
Even at high PRF, the operator will not miss a single indication!
Can create enveloping effect with fast scanning
Screen Updates
Individual A-scans
acquired at PRF
Information Displayed
Composite A-scan Mode
Screen Updates
Individual A-scans
acquired at PRF
Information Displayed
Max Amplitude Mode
Maximum
Amplitude
A-scan
Maximum
Amplitude
A-scan
Screen Updates
Individual A-scans
acquired at PRF
Information Displayed
Min Thickness Mode
Minimum
Thickness
A-scan
Minimum
Thickness
A-scan
SureView- Revolutionary technology for advanced crack detection and sizing. This
standard feature mimics the A-scan representation of analog CRT displays, and allows the
operator to visualize peak indications from reflectors even when the instrument range
compresses these indication peaks beyond visual perception.
Expected February 2009
Averaged A-scan New functionality allows the operator to view an average of acquired Ascans. The user can select the precision of the averaging, choosing between 2X, 4X, 8X,
16X, 32X or 64X averaging to remove spurious noise signals from the A-Scan while
maintaining relevant signals.
Expected January 2009
Persistence Mode New functionality that retains previously acquired A-scans on the
instrument display for a predetermined amount of time. This feature holds A-scans on the
screen while new A-scans are drawn for a user-selectable time interval to allow small windows
of comparison to previous data.
Expected February 2009
Baseline Break Standard functionality on the EPOCH XT, this feature identified zero-cross
points of each waveform using RF data and displays these zero-cross points as lines
connecting individual A-scan lobes to the baseline on the display. This feature can help to
visually separate far surface defect echoes from the back surface echo.
Currently Available
Dynamic DAC/TVG
Onboard DGS/AVG
AWS D1.1/D1.5 Weld Rating
Phased Array Imaging The EPOCH 1000 Series provides manual phased
array imaging capabilities, either standard or optional, based on the following:
EPOCH 1000 Optional imaging requiring hardware/software upgrade
EPOCH 1000iR Optional imaging requiring only software upgrade
EPOCH 1000i Standard imaging capabilities
A-scan at 0(selected)
Gain Calibration
Curve
Automated Wedge Delay Calibration The EPOCH 1000 Series features an automated
wedge delay calibration procedure during phased array setup. This automated
procedure, based on the OmniScan wedge delay calibration, allows the user to capture
the TOF/distance measurement from a single reflector across all imaging angles (focal
laws). The instrument then uses this TOF/distance capture to adjust the wedge delay at
each angle (focal law) to provide correct TOF/distance measurements for every A-scan.
Wedge Delay
Calibration Curve
Frozen Image Analysis The EPOCH 1000i allows A-scan and image review and
analysis while in FREEZE mode
Raw A-scan data available for all angles/focal laws
Full Gain, Gate and Cursor adjustment
A-scan indication measurements live
Image sizing cursors available for X2 X1 and/or Y2 Y1 indication sizing
As easy to use as a
conventional flaw detector!
Multi-law mode will be active, allowing the operator to only view A-scans that
represent 45, 60 and 70.
Available in early 2009
TROUBLESHOOTING
Troubleshooting Techniques
It is important, especially early in a product release, to identify ways to
correct common issues or software glitches. This section describes three
methods of correcting instrument failures and/or problems.
Instrument Resets
Hard Reset
Compact Flash Reset
Troubleshooting Techniques
Instrument Resets
The EPOCH 1000 Series has several instrument resets built into the software
Troubleshooting Techniques
Hard Reset
The EPOCH 1000 Series features an external, hard reset function
Troubleshooting Techniques
Compact Flash Clear
The EPOCH 1000i stores limited phased array probe information on the Compact
Flash card. If this data gets corrupted, clearing the flash card may solve any
issues.
Rare requirement
User must have a Compact Flash reader to perform the clear
Simply delete all files on flash card, return to instrument and
turn on
Questions or Comments?
Thank you!