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Magnetic Force Microscopy

Definition
Magnetic force microscope (MFM) is for
observation and measurement of stray
magnetic field distribution by detecting small
magnetic force or its force gradient using a
fine magnetic probe based on an atomic force
microscope (AFM).
Introduction
The principles of operation of magnetic force microscopy is that
it maps magneto static forces across the surface of a sample.

A sharp magnetized tip coated with a ferromagnetic thin film


scans a magnetic sample.

These forces, which can be either attractive or repulsive, act


between the magnetic tip supported by the flexible lever and the
magnetic sample.

The tip-sample magnetic interactions are detected and used to


reconstruct the magnetic structure of the sample surface.
Figure showing MFM mapping the magnetic domains of the sample
surface.
A flexible MFM cantilever probe oscillates
near its resonant frequency and scans laterally
at a constant height above the sample surface.
The tip interacts with the magnetic stray field
emanating from the sample, which changes
the resonance frequency of the cantilever.
The shifts in resonance frequency is in the
range of 150 Hz for cantilevers having a
resonance frequency f ~ 100 kHz
The frequency shift f of the cantilever is
proportional to the vertical gradient of the
magnetic force on the tip:
phase detection, which measures the cantilevers
phase of oscillation relative to the piezo drive;
amplitude detection, which tracks variation in
oscillation amplitude; and
frequency modulation, which detects shift in
resonant frequency directly
In MFM measurements, the magnetic force
between the sample and the tip can be expressed
as
Hz
2
F 0 v! M z
!
dV !

z
z 2

Mz is the magnetic moment of the tip,


H the stray field from the sample
V is the volume of magnetic material on the tip.
The permeability 0 has a value of 4 X 10 -7 for free
space.
Image Contrast

Magnetic image of FePt nanodot arrays (left) and schematic drawing (right)
illustrate the contrast mechanism of MFM. The magnetization of dot points from
dark to bright under an in-plane magnetic field
Modes of operation
Static (DC) mode
Static mode refers to measurements of the cantilever deflection.

Dynamic (AC) mode


Dynamic mode refers to measurements of the shifts in the
resonance frequency.
The cantilever is driven to its resonance frequency and frequency
shifts are detected.
Performances
An image taken with a magnetic tip contains information
about both the topography and the magnetic properties of a
surface.

If the tip is close to the surface, in the region where standard


non-contact AFM is operated, the image will be
predominantly topographic.

As the separation between the tip and the sample is increase,


the magnetic effects will become apparent.
Contd..
The scanning method when using an MFM is called the "lift
height" method. When the tip scans the surface of a sample at
close distances (< 100 nm), not only magnetic forces are
sensed, but also atomic and electrostatic forces.
Applications

Modeling the magnetic interaction.

Studying magnetic microstructure.

Magnetic storage device manufacturing.

Analysis of inductive thin-film heads.

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