- DocumentoDigital Worldenviado porOka Kurniawan
- DocumentoIntegrated System-Level Electronic Design Automation (EDA) for Designing Plasmonic nanoCircuitsenviado porOka Kurniawan
- DocumentoFourier-Transform K•P Method For Modeling Electronic Structures And Optical Properties Of Low Dimensional Heterostructuresenviado porOka Kurniawan
- DocumentoImproved Calculation of Charge Collection Probability From Within the Junction Wellenviado porOka Kurniawan
- DocumentoAnalysis of Wetting Layer Effect on Electronic Structures of Truncated-pyramid Quantum Dotsenviado porOka Kurniawan
- DocumentoGeneration of Surface Plasmonenviado porOka Kurniawan
- DocumentoVocation to Married Lifeenviado porOka Kurniawan
- DocumentoScientific Methodenviado porOka Kurniawan
- DocumentoFactors affecting the extraction efficiency of surface plasmon polariton from an elliptical microdiskenviado porOka Kurniawan
- DocumentoSurface Plasmon Hybridization of Whispering Gallery Mode Microdisk Laser-Slidesenviado porOka Kurniawan
- DocumentoSurface Plasmon Hybridization of Whispering Gallery Mode Microdisk Laser - full paperenviado porOka Kurniawan
- DocumentoSurface Plasmon Hybridization of Whispering Gallery Mode Microdisk Laser - Abstractenviado porOka Kurniawan
- DocumentoModeling and Simulation of Active Plasmonics with the FDTD method by using Solid State and Lorentz-Drude Dispersive Modelenviado porOka Kurniawan
- Documentofree space optics for antenna beamformingenviado porOka Kurniawan
- Documentofreefallballenviado porOka Kurniawan
- Documentoscientificmethodenviado porOka Kurniawan
- Documentovisionofccr_6sept2008_theemmausenviado porOka Kurniawan
- DocumentoMarriage and Familyenviado porOka Kurniawan
- DocumentoA Direct Method for Charge Collection Probability Computation Using the Reciprocity Theoremenviado porOka Kurniawan
- DocumentoErrata to "Charge Collection from Within a Collecting Junction Well," IEEE Transactions on Electron Devices, vol. 55, no. 5, pp. 1220, 2008.enviado porOka Kurniawan
- DocumentoPentecost Todayenviado porOka Kurniawan
- DocumentoSchrodinger and Maxwell Equationsenviado porOka Kurniawan
- DocumentoPraise and Worship in a Catholic Settingenviado porOka Kurniawan
- DocumentoCharisms, Signs, and Gifts of a Teacher (of the faith)enviado porOka Kurniawan
- DocumentoIntegration of Plasmonics Into Nanoelectronic Circuitsenviado porOka Kurniawan
- DocumentoSimplified Model for Ballistic Current-Voltage Characteristic in Cylindrical Nanowiresenviado porOka Kurniawan
- DocumentoPoster for Computation of Charge Collection Probability for Any Collecting Junction Shapeenviado porOka Kurniawan
- DocumentoComputation of Charge Collection Probability for Any Collecting Junction Shapeenviado porOka Kurniawan
- DocumentoPresentation slides for Study of a Single Coaxial Silicon Nanowire for On-Chip Integrated Photovoltaic Applicationenviado porOka Kurniawan
- DocumentoStudy of a Single Coaxial Silicon Nanowire for On-Chip Integrated Photovoltaic Applicationenviado porOka Kurniawan
- DocumentoHenrickson’s Derivation for Electron-Photon Self-Energyenviado porOka Kurniawan
- DocumentoNon-equilibrium Green's Function Calculation of Optical Absorption in Nano Optoelectronic Devicesenviado porOka Kurniawan
- DocumentoNon-equilibrium Green's Function Calculation of Optical Absorption in Nano Optoelectronic Devicesenviado porOka Kurniawan
- DocumentoChoice of Generation Volume Models for Electron Beam Induced Current Computationenviado porOka Kurniawan
- DocumentoBallistic Calculation of Non Equilibrium Green's Function in Nanoscale Devices Using Finite Element Methodenviado porOka Kurniawan
- DocumentoAn Analysis on the Alpha Parameter Used for Extracting Surface Re Combination Velocity in EBIC Measurement-Draft3.2enviado porOka Kurniawan
- DocumentoAn Analysis of the Factors Affectingenviado porOka Kurniawan
- Documentoangerandreconciliation2008enviado porOka Kurniawan
- DocumentoDevice Parameters Characterization with the use of EBICenviado porOka Kurniawan
- Documentoinvestigation of range-energy relationships for low-energy electron beams in silicon and gallium nitrideenviado porOka Kurniawan
- DocumentoListening to the voice of Godenviado porOka Kurniawan
- DocumentoThe Science of Scientific Writingenviado porOka Kurniawan
- DocumentoA method of accurately determining the positions of the edges of depletion regions in semiconductor junctionsenviado porOka Kurniawan
- DocumentoCarbon nanotube Schottky diodeenviado porOka Kurniawan
- DocumentoCharge Collection From Within a Collecting Junction Wellenviado porOka Kurniawan
- DocumentoDetermination of diffusion lengths with the use of EBIC from a diffused junction with any values of junction depthsenviado porOka Kurniawan