Envios by Saqib Ali Khan

TNS.2012.2201502

TNS.2009.2037418

09_163_5 Selva_Scheick Single Event Gate Rupture and Single Event Burnout Test Results on Hi Rel Fuji Power MOSFETs 09_26 10_09 11-17-09

08_163_4_JPL_Scheick

1-s2.0-S0026271421003899-main

Physics-Based Simulation of Single-Event Effects_TDMR 2005_invited