Anlises MEV/EDS para estudo das trilhas de desgaste

OBS: As letras A, B, C e D devido a repetio, foram feitos 4 ensaios para

cada sistema
Sistema S0 (substrato):
Eltrons retroespalhados.

Eltrons secundrios.

Anlise Geral da Trilha Amostra representativa = S0 B

1400
1300

Fe

1200
1100
1000
900
800
700
600

Cr

500

Ni
Fe
Fe
Mn
Mn
Cr

400
300
200

O Ni
100
C Cr
0

Elt
O
Si
Cr
Mn
Fe
Ni
Mo
W

W
Si
W
Si

Mo

Mn
Cr

Mo

XRay
Ka
Ka
Ka
Ka
Ka
Ka
La
La

Fe Ni
W
Ni

Mn

Int
13.2
5.8
235.9
13.0
576.7
46.0
35.5
1.1

Error
0.6630
0.4401
2.8040
0.6594
4.3845
1.2380
1.0881
0.1949

K
0.0067
0.0014
0.1900
0.0125
0.6707
0.0836
0.0242
0.0108
1.0000

keV
10

Kratio
0.0067
0.0014
0.1886
0.0124
0.6660
0.0830
0.0241
0.0108
0.9929

W%
1.11
0.21
16.80
1.23
67.24
8.77
3.10
1.55
100.00

A%
3.82
0.41
17.79
1.24
66.29
8.22
1.78
0.46
100.00

ZAF
1.6662
1.4958
0.8905
0.9933
1.0097
1.0560
1.2867
1.4354

Mapeamento com Raios X nas trilhas de desgaste: Al, Fe, O, W e N.

Amostra representativa = S0 C

Al

Fe

Sistema S1 (carbonetado):
Eltrons retroespalhados.

Eltrons secundrios.

Anlise geral da trilha Amostra S1 C

1400
1300

Fe

1200
1100
1000
900
800
700

Cr

600
500
400

Fe
Cr

300
200

O Ni

100
0

Elt
O
Si
Cr
Mn
Fe
Ni
Mo
W

W
Si
W
Si

Mo

Mn
Cr

Mo

XRay
Ka
Ka
Ka
Ka
Ka
Ka
La
La

Fe Ni
W

Int
15.3
7.8
234.1
13.3
570.7
49.4
32.0
0.9

Error
0.7151
0.5086
2.7932
0.6652
4.3614
1.2835
1.0323
0.1759

K
0.0078
0.0019
0.1894
0.0128
0.6669
0.0903
0.0219
0.0089
1.0000

keV
10

Kratio
0.0078
0.0019
0.1880
0.0127
0.6619
0.0896
0.0218
0.0088
0.9925

W%
1.29
0.28
16.75
1.26
66.88
9.48
2.80
1.27
100.00

A%
4.39
0.54
17.60
1.26
65.42
8.82
1.60
0.38
100.00

ZAF
1.6514
1.5008
0.8908
0.9940
1.0103
1.0576
1.2876
1.4384

Anlise geral da trilha Amostra S1 D

1300

Fe

1200
1100
1000
900
800
700
600

Cr

500
400

Fe
Cr
O

300
200
100 C
0

Elt
O
Si
Cr
Mn
Fe
Ni
Mo
W

Ni

W
Si
W
Si

Mo

Mn
Cr

Mo

XRay
Ka
Ka
Ka
Ka
Ka
Ka
La
La

Fe Ni
W

Int
42.0
8.9
217.1
9.9
521.5
42.3
32.2
1.2

Error
1.1839
0.5442
2.6904
0.5758
4.1693
1.1870
1.0354
0.1981

K
0.0232
0.0023
0.1892
0.0103
0.6560
0.0831
0.0237
0.0121
1.0000

keV
10

Kratio
0.0226
0.0022
0.1845
0.0101
0.6398
0.0811
0.0232
0.0118
0.9752

W%
3.73
0.34
16.58
1.01
65.04
8.60
2.99
1.71
100.00

A%
12.07
0.62
16.49
0.95
60.21
7.58
1.61
0.48
100.00

ZAF
1.6537
1.4906
0.8987
1.0006
1.0166
1.0614
1.2901
1.4446

Mapeamento com Raios X nas trilhas de desgaste:

Amostra S1 C.

Al

Fe

Amostra S1 D.

Al

Fe

Sistema S2 (duplex carbonetado):

Eltrons retroespalhados.

Eltrons secundrios.

Anlise geral da trilha Amostra representativa S2 B.

Al

3000

2500

2000

1500

Cr
1000

500

N
C
0

Elt
N
O
Al
Si
Cr
Mn
Fe
Ni
Mo
W

Cr

W
W

Cr

XRay
Ka
Ka
Ka
Ka
Ka
Ka
Ka
Ka
La
La

Int
6.7
7.9
847.4
7.4
470.7
0.0
4.2
1.0
7.5
2.2

Error
0.4735
0.5117
5.3148
0.4961
3.9611
0.0000
0.3744
0.1807
0.5004
0.2710

K
0.0126
0.0065
0.3117
0.0029
0.6133
0.0001
0.0079
0.0029
0.0083
0.0339
1.0000

keV
10

Kratio
0.0103
0.0053
0.2541
0.0023
0.5001
0.0001
0.0065
0.0024
0.0068
0.0276
0.8155

W%
3.21
1.10
35.98
0.37
53.28
0.01
0.73
0.26
0.94
4.13
100.00

A%
8.42
2.53
49.04
0.48
37.69
0.01
0.48
0.16
0.36
0.83
100.00

ZAF
3.1125
2.0899
1.4156
1.5821
1.0653
1.0820
1.1266
1.0856
1.3880
1.4960

Mapeamento com Raios X nas trilhas de desgaste Amostra S2 B.

Al

Fe

Sistema S3 (sequencial = carbonetao + nitretao):

Eltrons retroespalhados.

Eltrons secundrios.

Anlise geral da trilha Amostra representativa S3 B.

1200

Fe

1100
1000
900
800
700
600

Cr

500
400

Fe
Mn
Cr

300
200

N
100
C
0

Elt
N
O
Al
Si
Cr
Mn
Fe
Ni
Mo
W

Ni

W
Si
W

Mo

Mn
Cr

XRay
Ka
Ka
Ka
Ka
Ka
Ka
Ka
Ka
La
La

Fe Ni
W

Int
0.0
13.3
4.7
10.9
218.3
10.1
524.9
44.1
32.3
0.9

Error
0.0000
0.6657
0.3945
0.6022
2.6972
0.5814
4.1828
1.2123
1.0371
0.1736

K
0.0001
0.0074
0.0012
0.0028
0.1916
0.0106
0.6655
0.0874
0.0240
0.0094
1.0000

keV
10

Kratio
0.0001
0.0073
0.0011
0.0028
0.1897
0.0105
0.6587
0.0865
0.0238
0.0093
0.9898

W%
0.02
1.22
0.22
0.42
16.93
1.04
66.60
9.15
3.06
1.33
100.00

A%
0.09
4.16
0.45
0.82
17.76
1.04
65.05
8.50
1.74
0.40
100.00

ZAF
2.4598
1.6689
1.9389
1.4983
0.8926
0.9947
1.0111
1.0573
1.2881
1.4379

Mapeamento com Raios X nas trilhas de desgaste Amostra S3 D.

Al

Fe

Sistema S4 (duplex sequencial):

Eltrons retroespalhados.

Eltrons secundrios.

Anlise geral da trilha Amostra S4 C.

Al

3000

2500

2000

1500

Cr
1000

500

N
C
0

Elt
N
O
Al
Si
Cr
Mn
Fe
Ni
Mo
W

Cr
O

W
W

Cr

XRay
Ka
Ka
Ka
Ka
Ka
Ka
Ka
Ka
La
La

Fe

Int
11.5
3.5
867.9
7.4
484.0
1.9
3.5
1.3
8.8
2.0

Error
0.6192
0.3431
5.3786
0.4950
4.0167
0.2493
0.3433
0.2072
0.5408
0.2564

K
0.0210
0.0028
0.3097
0.0028
0.6119
0.0028
0.0065
0.0037
0.0094
0.0294
1.0000

Anlise geral da trilha Amostra S4 A.

keV
10

Kratio
0.0169
0.0023
0.2496
0.0022
0.4932
0.0023
0.0052
0.0030
0.0076
0.0237
0.8060

W%
5.20
0.50
35.42
0.35
52.75
0.25
0.59
0.32
1.05
3.57
100.00

A%
13.30
1.12
47.00
0.45
36.32
0.16
0.38
0.20
0.39
0.69
100.00

ZAF
3.0793
2.1922
1.4191
1.5804
1.0695
1.0865
1.1308
1.0909
1.3836
1.5034

3500

Al
3000

2500

2000

1500

Cr
1000

500

Elt
N
O
Al
Si
Cr
Mn
Fe
Ni
Mo
W

N
C

Cr
O

W
W

Cr

XRay
Ka
Ka
Ka
Ka
Ka
Ka
Ka
Ka
La
La

Fe

Int
3.6
15.8
873.3
11.0
477.4
0.0
6.9
0.7
9.5
3.6

Error
0.3457
0.7258
5.3952
0.6055
3.9893
0.0000
0.4806
0.1516
0.5615
0.3477

K
0.0064
0.0124
0.3063
0.0041
0.5932
0.0001
0.0124
0.0019
0.0100
0.0532
1.0000

Kratio
0.0053
0.0102
0.2513
0.0033
0.4867
0.0001
0.0102
0.0016
0.0082
0.0437
0.8205

keV
10

W%
1.66
2.09
35.27
0.52
51.53
0.01
1.14
0.17
1.14
6.47
100.00

A%
4.50
4.96
49.58
0.70
37.59
0.01
0.77
0.11
0.45
1.33
100.00

Mapeamento com Raios X nas trilhas de desgaste Amostra S4 C.

ZAF
3.1544
2.0542
1.4035
1.5609
1.0586
1.0743
1.1156
1.0732
1.3986
1.4809

Al

Fe